CN215641647U

CN215641647U - Test shell fragment and testing arrangement

Info

Publication number: CN215641647U
Application number: CN202121050961.5U
Authority: CN
Inventors: 宁丽娟
Original assignee: Shenzhen Furuida Electronics Co ltd
Current assignee: Shenzhen Furuida Electronics Co ltd
Priority date: 2021-05-17
Filing date: 2021-05-17
Publication date: 2022-01-25
Anticipated expiration: 2031-05-17

Abstract

The utility model relates to the technical field of electronic chip testing, in particular to a testing elastic sheet and a testing device, comprising: a test part which is abutted with a pin of an electronic chip and is used for testing the electronic chip; the elastic part is integrally of an arc-shaped structure, is connected with the testing part and is used for buffering the rigid contact between the pins of the electronic chip and the testing elastic sheet, and at least one arc-shaped groove which is consistent with the arc-shaped direction in the arc-shaped structure is arranged on the elastic part so as to improve the toughness of the elastic part; and the fixing part is connected with the elastic part and used for fixing the test elastic sheet, and at least one pin connecting part used for being electrically connected with the PCB is arranged on the fixing part. The utility model can well prolong the service life of the testing elastic sheet so as to integrally improve the cost performance of the testing device.

Description

Test shell fragment and testing arrangement

Technical Field

The utility model relates to an electronic chip tests technical field, in particular to test shell fragment and testing arrangement.

Background

Along with the rapid development of modern electronic products, an electronic chip is taken as an important composition core, quality detection control becomes stricter in the production and processing processes, in the actual detection process, the electronic chip is placed in a limiting frame by a test fixture through an automatic production line and is pressed by applying force, and the electronic chip is communicated with a detection circuit through a test elastic sheet, so that the performance detection of the electronic chip is realized.

At present, most of detection devices for electronic chips adopt the kelvin test method to perform chip performance test, which is also called as four-terminal detection (4T detection), four-wire detection or 4-point probe method, and is an electrical impedance measurement technology, and a single pair of current-carrying and voltage-carrying detection electrodes are used, so that more accurate measurement can be performed compared with the traditional two-terminal (2T) sensing, and the kelvin four-wire detection is used for some ohm meters and impedance analyzers, and can also be used for measuring the resistance of thin layers of films or chips in the wiring configuration of a precision strain gauge and a resistance thermometer.

In the prior art, the metal elastic sheet is mostly adopted to connect the electronic chip and the detection circuit, so that the Kelvin test for the electronic chip is realized, but the metal elastic sheet in the prior art is limited by the material or the structure of the metal elastic sheet, so that defects exist in the service life, the long-term effective performance of the chip test cannot be guaranteed, or the contact of the elastic sheet is worn, or the waist of the elastic sheet is broken, and the existing method for setting tungsten gold at the contact of the elastic sheet is used for solving the wear defect, but the overall cost of the detection device is improved by the method, and the cost performance is not high.

Therefore, how to design an electronic chip detection device with long service life and high cost performance becomes a technical problem which needs to be solved urgently.

SUMMERY OF THE UTILITY MODEL

In order to overcome the above-mentioned drawbacks of the prior art, the present invention provides a testing spring and a testing apparatus, so as to solve the problems mentioned in the background art.

The technical scheme adopted by the utility model for solving the problems in the prior art is as follows: a test shell fragment and testing arrangement includes:

a test part which is abutted with a pin of an electronic chip and is used for testing the electronic chip;

the elastic part is integrally of an arc-shaped structure, is connected with the testing part and is used for buffering the rigid contact between the pins of the electronic chip and the testing elastic sheet, and at least one arc-shaped groove which is consistent with the arc-shaped direction in the arc-shaped structure is arranged on the elastic part so as to improve the toughness of the elastic part; and

the fixing part is connected with the elastic part and used for fixing the test elastic sheet, and at least one pin connecting part used for being electrically connected with the PCB is arranged on the fixing part.

In a preferred embodiment of the present invention, the fixing portion, the elastic portion, and the test portion are integrally formed.

As a preferable scheme of the present invention, the test portion further includes a test connection portion and a test abutting portion, which are integrally formed, and an included angle is provided between the test connection portion and the test abutting portion, the test connection portion is used for being connected with the elastic portion, and the test abutting portion is used for abutting against the pin of the electronic chip.

In a preferred embodiment of the present invention, the elastic portion protrudes from the test connection portion at a side connected to the test connection portion, so as to coordinate stress and elasticity applied to the elastic portion and the test portion.

As a preferable aspect of the present invention, an inclined surface is provided on an end surface of the test abutting portion abutting against the pin of the electronic chip, and the inclined surface is configured to offset a displacement amount of the test abutting portion when the pin of the electronic chip abuts against the test abutting portion, so that the test abutting portion can abut against the pin of the electronic chip more favorably.

In a preferred embodiment of the present invention, a buffer groove is further provided between the elastic portion and the fixing portion to prevent the elastic portion from interfering with the fixing portion when the elastic portion is displaced by an external force.

As a preferable aspect of the present invention, two of the pin connecting portions are provided and are respectively provided at both ends of the fixing portion.

As the preferred scheme of the utility model, the fixing part is also provided with at least two limiting grooves, so that the mounting and fixing of the testing elastic sheet are facilitated.

The testing device comprises the testing elastic sheet, and further comprises a testing seat, wherein a plurality of accommodating grooves are formed in the testing seat, a PCB is arranged at the bottom of each accommodating groove, a plurality of testing elastic sheets electrically connected with the PCB and a plurality of testing elastic sheet assemblies are arranged in each accommodating groove and are connected with pins of an electronic chip in parallel.

As a preferred scheme of the utility model, a limiting block matched with the limiting groove is further arranged in the accommodating groove, and the test elastic sheet is detachably arranged in the accommodating groove through the matching of the limiting groove and the limiting block.

Compared with the prior art, the utility model has the following technical effects:

the utility model provides a test shell fragment and testing arrangement through set up the elastic part between test portion and fixed part to still be provided with at least on the elastic part one with arc structure assorted arc wall to improve the toughness of elastic part, the elastic part simultaneously with describe the one side protrusion test connection portion setting that test connection portion are connected, in order to coordinate stress and elasticity that elastic part and test portion received, this structure can improve the life of test shell fragment well, has improved testing arrangement's price/performance ratio on the whole.

Drawings

FIG. 1 is a structural diagram of a testing spring and a testing device according to the present invention;

FIG. 2 is a structural diagram of a testing device of the testing spring and the testing device of the utility model;

fig. 3 is a cross-sectional view of a testing device in a testing device and a testing spring according to the utility model.

Reference numbers in the figures:

10. testing the elastic sheet; 11. a test section; 12. an elastic portion; 13. a fixed part; 14. a buffer tank; 111. testing the connection part; 112. testing the abutting part; 113. an inclined surface; 121. an arc-shaped slot; 122. a buffer section; 131. a pin connection part; 132. a limiting groove;

20. a test seat; 21. a containing groove; 22. a limiting block; 23. an insulating plate.

Detailed Description

In order to make the technical problems, technical solutions and advantageous effects to be solved by the present application clearer, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.

It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like, refer to an orientation or positional relationship illustrated in the drawings for convenience in describing the present application and to simplify description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present application.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.

In the test spring plate and the test device provided by the application, the test spring plate 10 can be used for testing a chip, and it should be noted that the test spring plate can be used for testing an electronic connector or other electronic components besides the chip, and the type of the electronic components is not limited herein.

As shown in figure 1: a test strip 10 comprising: a test part 11, an elastic part 12, and a fixing part 13; the testing part 11 is abutted with pins of the electronic chip and used for testing the electronic chip; the elastic part 12 is integrally of an arc-shaped structure and is connected with the testing part 11 and used for buffering pins of an electronic chip and hard contact of the testing elastic sheet 10, the fixing part 13 is connected with the elastic part 12 and used for fixing the testing elastic sheet 10, in addition, at least one pin connecting part 131 is further arranged on the fixing part 13, and the pin connecting part 131 is used for being electrically connected with a PCB.

Further, the elastic portion 12 is further provided with at least one arc-shaped groove 121 consistent with the arc-shaped direction in the arc-shaped structure, so as to improve the toughness of the elastic portion 12.

In this embodiment, the elastic portion 12 is provided with two arc-shaped slots 121 in the same direction as the arc-shaped direction of the arc-shaped structure, so as to further improve the toughness of the elastic portion 12, and further make the service life of the test spring 10 longer. In other embodiments, three arc-shaped slots 121, four arc-shaped slots 121, etc. may be further disposed on the elastic portion 12.

In addition, the test spring plate 10 in the present embodiment may be made of a copper sheet, an iron sheet, an alloy sheet, or the like.

As a preferred embodiment of the present invention, the fixing portion 13, the elastic portion 12, and the testing portion 11 are integrally formed, which not only facilitates the production and processing of the testing elastic sheet 10, but also improves the ductility, toughness, and conductivity of the whole testing elastic sheet 10, so that the testing elastic sheet 10 has a longer service life. In another embodiment, the fixing portion 13, the elastic portion 12, and the test portion 11 may be assembled, and the fixing portion 13, the elastic portion 12, and the test portion 11 may be welded together by welding or the like.

As a preferred embodiment of the present invention, the testing portion 11 further includes a testing connection portion 111 and a testing abutting portion 112, which are integrally formed, the testing connection portion 111 is used for being connected to the elastic portion 12, and the testing abutting portion 112 is used for abutting against the pins of the electronic chip, wherein an included angle is provided between the testing connection portion 111 and the testing abutting portion 112, so that the testing abutting portion 112 is convenient for abutting against the pins of the electronic chip. The test connection portion 111 serves as a connection portion between the elastic portion 12 and the test abutting portion 112, and can preferably absorb stress and elasticity applied to the elastic portion 12, thereby improving the service life of the elastic portion 12.

In a preferred embodiment of the present invention, the elastic portion 12 protrudes from the test connection portion 111 at a side connected to the test connection portion 111, so as to coordinate stress and elasticity applied to the elastic portion 12 and the test portion 11, so that the elastic portion 12 is not easily broken, and the service life of the elastic portion 12 is prolonged.

In a preferred embodiment of the present invention, an inclined surface 113 is provided on an end surface of the test abutting portion 112 abutting against the pin of the electronic chip, and the inclined surface 113 is used for offsetting a downward displacement of the test abutting portion 112 when the pin of the electronic chip abuts against the test abutting portion 112, so that the test abutting portion 112 can better abut against the pin of the electronic chip.

Further, a buffer slot 14 is disposed between the elastic portion 12 and the fixing portion 13, when the testing abutting portion 112 tests the electronic chip, the elastic portion 12 is prevented from interfering with the fixing portion 13 when being subjected to a downward pressure of the electronic chip to generate displacement, the buffer slot 14 can buffer a pressure applied to the middle portion of the elastic portion 12, so that the elastic portion 12 is not easily broken, and the service life of the elastic portion 12 is prolonged.

Furthermore, a buffer portion 122 is further disposed on a side of a connection region between the elastic portion 12 and the fixing portion 13 opposite to the buffer slot 14, and the buffer portion 122 can be used for buffering the elasticity and stress applied to the connection region, so that the connection region is not easily broken.

In this embodiment, two pin connection portions 131 may be disposed at two ends of the fixing portion 13, so that the pin connection portions 131 are electrically connected to the PCB, and each pin connection portion 131 further includes a plurality of saw-tooth-shaped contacts for electrically connecting to the PCB, so that the pin connection portion 131 is better electrically connected to the PCB.

As a preferred embodiment of the present invention, the fixing portion 13 is further provided with at least two limiting grooves 132, which is convenient for the installation and fixation of the test spring 10.

In addition, referring to fig. 2 and 3, the utility model further discloses a testing device, which includes the testing elastic sheet 10 and the testing seat 20, wherein a plurality of accommodating grooves 21 are formed in the testing seat 20, a PCB (not shown in the figure) is arranged at the bottom of each accommodating groove 21, a plurality of testing elastic sheets 10 electrically connected with the PCB are arranged in each accommodating groove 21, and a plurality of testing elastic sheets 10 are arranged in parallel to form a testing elastic sheet 10 assembly for abutting against the pins of the electronic chip.

In the present embodiment, the assembly of the test spring 10 includes at least two test springs 10, so as to prevent the test springs 10 from being processed with uneven end surfaces of the test abutting portions 112 and being unable to abut against the pins of the electronic chip. In other embodiments, the assembly of the test spring 10 may further include two test springs 10, three test springs 10, four test springs 10, and the like, and the number of the test springs 10 may be set according to the contact area between the test abutting portion 112 and the pins of the electronic chip, which is not limited herein.

Furthermore, a limiting block 22 matched with the limiting groove 132 is further arranged in the accommodating groove 21, and the test elastic sheet 10 is detachably arranged in the accommodating groove 21 through the matching of the limiting groove 132 and the limiting block 22.

Furthermore, an insulating plate 23 matched with the structure of the testing elastic sheet 10 is arranged between the two sides of each testing elastic sheet 10 assembly and the wall of the containing groove 21, so as to prevent the testing elastic sheet 10 from directly contacting the testing seat 20.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the utility model. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A test spring, comprising:

2. A test clip according to claim 1, wherein: the fixing portion, the elastic portion and the testing portion are of an integrally formed structure.

3. A test clip according to claim 1, wherein: the test part further comprises an integrally formed test connecting part and a test abutting part, an included angle is formed between the test connecting part and the test abutting part, the test connecting part is used for being connected with the elastic part, and the test abutting part is used for abutting against the pins of the electronic chip.

4. A test clip according to claim 3, wherein: the elastic part protrudes out of the test connecting part at one side connected with the test connecting part so as to coordinate stress and elasticity borne by the elastic part and the test part.

5. A test clip according to claim 3, wherein: the end face of the test abutting part abutted against the pin of the electronic chip is provided with an inclined plane, the inclined plane is used for offsetting the displacement of the test abutting part when the pin of the electronic chip is abutted against the test abutting part, and the test abutting part is convenient to be abutted against the pin of the electronic chip better.

6. A test clip according to claim 1, wherein: a buffer groove is further arranged between the elastic part and the fixing part to prevent the elastic part from interfering with the fixing part when the elastic part is subjected to external force to generate displacement.

7. A test clip according to claim 1, wherein: the pin connecting parts are arranged in two numbers and are respectively arranged at two ends of the fixing part.

8. A test clip according to claim 7, wherein: the fixing part is also provided with at least two limiting grooves, so that the elastic testing sheet can be conveniently installed and fixed.

9. A testing device, comprising the testing elastic sheet according to any one of claims 1 to 8, characterized in that the testing device further comprises a testing seat, a plurality of accommodating grooves are arranged in the testing seat, a PCB is arranged at the bottom of each accommodating groove, a plurality of testing elastic sheets electrically connected with the PCB are arranged in each accommodating groove, and a plurality of testing elastic sheets are arranged in parallel to form a testing elastic sheet assembly for abutting against pins of the electronic chip.