CN221039322U - Test structure and test device - Google Patents
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- CN221039322U CN221039322U CN202322515608.5U CN202322515608U CN221039322U CN 221039322 U CN221039322 U CN 221039322U CN 202322515608 U CN202322515608 U CN 202322515608U CN 221039322 U CN221039322 U CN 221039322U
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- 238000012360 testing method Methods 0.000 title claims abstract description 123
- 238000001514 detection method Methods 0.000 abstract description 8
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- 229910052751 metal Inorganic materials 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to the technical field of electronic chip testing, in particular to a testing structure and a testing device, wherein the testing structure comprises a first testing piece and a second testing piece; the first test piece comprises a first main body part and a first contact part arranged at one end of the first main body part; the second test piece comprises a second main body part and a second contact part arranged at one end of the second main body part; the first body part and the second body part are arranged at intervals in a first direction, the second body part is positioned above the first body part, and the first contact part and the second contact part are arranged at intervals in a second direction; the first contact portion is provided with a protruding portion higher than the second contact portion in a first direction, and a side surface of the protruding portion near the second contact portion is closer to the second contact portion than a side surface of the first contact portion near the second contact portion. The test structure of the utility model can improve the accuracy of chip detection.
Description
Technical Field
The utility model relates to the technical field of electronic chip testing, in particular to a testing structure and a testing device.
Background
Along with the rapid development of modern electronic products, electronic chips serve as important constituent cores, quality detection and control are becoming more and more strict in the production and processing processes, and in the actual detection process, the electronic chips are placed in a limiting frame by a test fixture and are pressed by force through an automatic production line, and the electronic chips are communicated with a detection circuit through the test structure, so that performance detection of the electronic chips is realized.
Currently, the electronic chip testing device mostly adopts a kelvin testing method to perform performance testing of the chip, which is also called four-terminal testing (4T testing), four-wire testing or 4-point probe method, and is an electrical impedance measuring technology, and uses separate opposite current and voltage testing electrodes, so that compared with the traditional two-terminal (2T) sensing, the kelvin four-wire testing can perform more accurate measurement, and is used for some ohm meters and impedance analyzers, and can also be used for measuring the thin layer of a film or the resistance of the chip in the wiring configuration of a precision strain gauge and a resistance thermometer.
In the prior art, a metal spring sheet connected with a detection circuit is mostly adopted to contact with a pin of an electronic chip, so that Kelvin test on the electronic chip is realized. In some tests, one pin of the chip needs to be contacted with two metal elastic sheets at the same time so as to realize multi-contact test, but in the current test device, the contact position distance between the two metal elastic sheets and the pin is far, so that the accuracy of the test is affected.
Disclosure of utility model
In order to overcome the above-mentioned drawbacks of the prior art, the present utility model provides a testing structure and a testing device, so as to solve the above-mentioned problems in the prior art.
The utility model solves the problems in the prior art by adopting the technical scheme that: a test structure comprises a first test piece and a second test piece;
The first test piece comprises a first main body part and a first contact part arranged at one end of the first main body part, and the first contact part is used for contacting with pins of a chip;
The second test piece comprises a second main body part and a second contact part arranged at one end of the second main body part, and the second contact part is also used for being in contact with the pins; wherein,
The first main body part and the second main body part are arranged at intervals in a first direction, the second main body part is positioned above the first main body part, the first contact part and the second contact part are arranged at intervals in a second direction, the first contact part is arranged at one end, far away from the second main body part, of the second contact part, and the first direction and the second direction are mutually perpendicular;
The first contact part is provided with a protruding part higher than the second contact part in a first direction, the protruding part is provided with a first contact end surface in contact with the pin in the first direction, and the second contact part is provided with a second contact end surface in contact with the pin in the first direction; and
The side of the protruding portion near the second contact portion is closer to the second contact portion than the side of the first contact portion near the second contact portion.
In other words, in the test structure of the application, the distance between the pin and the contact positions where the first test piece and the second test piece are respectively contacted is short, so that the accuracy of chip detection can be improved.
As a preferable mode of the present utility model, at least a part of the side surface of the protruding portion near the second contact portion and the side surface of the second contact portion near the first contact portion are on the same straight line along the first direction.
As a preferable mode of the present utility model, a side face of the protruding portion, which is close to the second contact portion, includes a first side portion and a second side portion connected to each other, the first side portion being located above the second side portion, the first side portion being on the same straight line as a side face of the second contact portion, which is close to the first contact portion, in a first direction; and
One end of the second side part far away from the first side part is inclined towards a direction far away from the second contact part, so that the second side part is an inclined surface.
In a preferred embodiment of the present utility model, one end of the side surface of the first contact portion, which is located on the side closer to the second contact portion, is inclined in a direction away from the second contact portion so that the side surface of the first contact portion, which is located on the side closer to the second contact portion, is inclined.
As a preferable mode of the utility model, at least a part of the side surface of the second contact part, which is close to the first contact part, is an inclined surface; and
One end of the side surface of the second contact portion of the inclined surface portion, which is away from the second contact end surface, is inclined in a direction away from the first contact portion.
As a preferable mode of the present utility model, the first contact end surface includes a contact inclined surface, and an end of the contact inclined surface remote from the first main body portion is inclined in a direction remote from the second contact end surface.
As a preferred aspect of the present utility model, the first contact end surface further includes a contact plane, and the contact plane is connected to an end of the contact inclined surface near the first body portion.
As a preferable scheme of the utility model, the inclined plane is of an arc-shaped structure, and the contact inclined plane of the arc-shaped structure is contacted with the arc-shaped structure on the pin.
As a preferred embodiment of the present utility model, the second contact end face is a plane.
A test device comprising a test structure as claimed in any one of the preceding claims.
Drawings
FIG. 1 is a schematic diagram of a test structure according to the present utility model;
Fig. 2 is an enlarged view at a in fig. 1.
Reference numerals in the drawings:
100. A first test piece; 110. a first body portion; 120. a first contact portion; 130. a protruding portion; 140. a first contact end face; 141. a contact slope; 142. a contact plane; 150. a first side portion; 160. a second side portion; 170. a first inclined surface;
200. a second test piece; 210. a second body portion; 220. a second contact portion; 230. a second contact end face; 240. a second inclined surface;
300. A chip; 310. a pin; 400. the displacement direction of the protruding part; 500. the displacement direction of the second contact portion.
Detailed Description
In order to make the technical problems, technical schemes and beneficial effects to be solved more clear, the application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
It will be understood that when an element is referred to as being "mounted" or "disposed" on another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It is to be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are merely for convenience in describing and simplifying the description based on the orientation or positional relationship shown in the drawings, and do not indicate or imply that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus are not to be construed as limiting the application.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
The test structure provided by the application can be used for testing chips, and can be used for testing electronic connectors or other electronic components besides the chips, and the types of the electronic components are not limited.
As shown in fig. 1: a test structure comprises a first test piece 100 and a second test piece 200, wherein one end of the first test piece 100 is used for being in contact with a pin 310 of an electronic chip 300, the other end of the first test piece 100 can be used for being electrically connected with a PCB in a test device, one end of the second test piece 200 is also used for being in contact with the pin 310 of the electronic chip 300, and the other end of the second test piece 200 can also be used for being electrically connected with the PCB in the test device.
In the embodiment of the present application, the first test strip 100 and the second test strip 200 are simultaneously used for contacting with the same pin 310 of the electronic chip 300 to realize the multi-point test.
The first test piece 100 and the second test piece 200 may be made of conductive materials such as copper sheets, iron sheets, or alloy sheets.
Referring to fig. 1, the first test strip 100 may include a first body portion 110 and a first contact portion 120 disposed at an end of the first body portion 110. The first contact portion 120 is configured to contact the pins 310 of the chip 300, the first body portion 110 may be used as a base element of the first test strip 100, and the first test strip 100 may be mounted in the testing device through the first body portion 110. In some embodiments, in order to facilitate the electrical connection between the first test strip 100 and the PCB in the testing device, the first test strip 100 may further include a first connection portion (not shown) disposed at an end of the first main body portion 110 away from the first contact portion 120, where the first connection portion is used for electrical connection with the PCB.
In some embodiments, the first body 110 and the first contact 120, or the first body 110, the first contact 120, and the first connection may be integrally formed, which not only facilitates the processing of the first test piece 100, but also improves the ductility, toughness, and electrical conductivity of the first test piece 100, resulting in a longer service life of the first test piece 100.
In other embodiments, the first body portion 110 and the first contact portion 120, or the first body portion 110, the first contact portion 120, and the first connection portion may be assembled, such as by welding or the like.
The second test strip 200 may include a second body portion 210 and a second contact portion 220 disposed at an end of the second body portion 210. The second contact portion 220 is configured to contact the pins 310 of the chip 300, and the second body portion 210 may serve as a base element of the second test strip 200, and the second test strip 200 may be mounted in the testing device through the second body portion 210. In some embodiments, in order to facilitate the electrical connection between the second test strip 200 and the PCB in the testing device, the second test strip 200 may further include a second connection portion (not shown) disposed at an end of the second body portion 210 away from the second contact portion 220, where the second connection portion is used for electrical connection with the PCB.
In some embodiments, the second body portion 210 and the second contact portion 220, or the second body portion 210, the second contact portion 220, and the second connection portion may be integrally formed, so that the integral formation not only facilitates the processing of the second test piece 200, but also can improve the ductility, toughness, and electrical conductivity of the second test piece 200, and make the service life of the second test piece 200 longer.
In other embodiments, the second body portion 210 and the second contact portion 220, or the second body portion 210, the second contact portion 220, and the second connection portion may be assembled, such as by welding or the like.
Further, the first body 110 and the second body 210 are spaced apart in the first direction such that the first body 110 does not contact the second body 210 and the second body 210 is located above the first body 110. The first contact portion 120 and the second contact portion 220 are disposed at intervals in the second direction, such that the first contact portion 120 does not contact the second contact portion 220, and the first contact portion 120 is at an end of the second contact portion 220 away from the second body portion 210, the first direction and the second direction are perpendicular to each other, and the first direction may be a vertical direction.
Further, the first contact portion 120 is provided with a protrusion 130 higher than the second contact portion 220 in the first direction, the protrusion 130 has a first contact end face 140 contacting the pin 310 in the first direction, and the second contact portion 220 has a second contact end face 230 contacting the pin 310 in the first direction.
Wherein, the protruding portion 130 and the first contact portion 120 may be integrally formed.
When the pins 310 of the electronic chip 300 move along the first direction to contact the first test piece 100 and the second test piece 200, the pins 310 will contact the first contact end surface 140, and then drive the first contact end surface 140 to move, so that the pins 310 can further contact the second contact end surface 230, thereby realizing that the pins 310 contact the first contact end surface 140 and the second contact end surface 230 simultaneously.
Since the pins 310 are in contact with the first test strip 100 and the second test strip 200, the pins 310 will contact with the first contact end surface 140 first because the first contact end surface 140 is higher than the second contact end surface 230, that is, the pins 310 will rub against the first contact end surface 140 that is in contact first, so that the first contact end surface 140 is more easily worn, but since the first contact end surface 140 is higher than the second contact end surface 230, the first contact end surface 140 has a height difference of wear space, so that the wear-resistant time can be greatly increased, the service life of the test structure is longer, and the service life of the test device can be further prolonged.
Still further, referring to fig. 2, the side of the protrusion 130 near the second contact portion 220 is closer to the second contact portion 220 than the side of the first contact portion 120 near the second contact portion 220.
It can be understood that, since the first body portion 110 and the second body portion 210 are disposed on the testing device, when the first contact portion 120 is disposed on the first body portion 110 and the protruding portion 130 moves under the force of the pin 310, the displacement direction of the protruding portion 130 is an arc direction (as shown in fig. 2), and when the corresponding second contact portion 220 is stressed, the displacement direction of the second contact portion 220 is also an arc direction (as shown in fig. 2), but since the side surface of the protruding portion 130, which is close to the second contact portion 220, is closer to the second contact portion 220 than the side surface of the first contact portion 120, the protruding portion 130 can intersect with the first contact portion 120 and be closer to the second contact portion 220 when the pin 310 can contact the second contact end surface 230, so that the distance between the contact position between the pin 310 and the first contact end surface 140 and the contact position between the pin 310 and the second contact end surface 230 can be shortened, and the testing accuracy of the electronic chip 300 can be improved, and the contact between the protruding portion 130 and the second test piece 200 can be prevented from contacting during the movement of the protruding portion 130.
For example, in some embodiments, at least a portion of the side of the protrusion 130 adjacent to the second contact 220 is on the same line in the first direction as the side of the second contact 220 adjacent to the first contact 120.
It can be understood that, since the first body portion 110 and the second body portion 210 are disposed on the testing device, when the protrusion 130 disposed on the first body portion 110 by the first contact portion 120 moves under the force of the pin 310, the displacement direction 400 of the protrusion is in an arc direction (as shown in fig. 2), and when the corresponding second contact portion 220 is stressed, the displacement direction 500 of the second contact portion is also in an arc direction (as shown in fig. 2), but since at least part of the side surface of the protrusion 130 near the second contact portion 220 and the side surface of the second contact portion 220 near the first contact portion 120 are on the same straight line along the first direction, when the protrusion 130 moves to the point that the pin 310 can contact the second contact end surface 230, the shortest distance between the point that the pin 310 contacts the first contact end surface 140 and the point that the pin 310 contacts the second contact end surface 230 can be ensured, so that the testing accuracy of the electronic chip 300 can be ensured, and at the same time, the manner can avoid the contact with the second test strip 200 during the movement of the protrusion 130.
That is, in the test structure of the present application, the distance between the contact positions where the pins 310 are respectively contacted with the first test piece 100 and the second test piece 200 is short, so that the accuracy of the detection of the chip 300 can be improved.
Further, referring to fig. 2, the side of the protruding portion 130 near the second contact portion 220 includes a first side portion 150 and a second side portion 160 connected to each other, and the first side portion 150 is located above the second side portion 160, where the first side portion 150 and the side of the second contact portion 220 near the first contact portion 120 are on the same straight line along the first direction. One end of the second side 160, which is far from the first side 150, is inclined in a direction away from the second contact portion 220, and the second side 160 is inclined. The second side 160 of the inclined structure can function to avoid the second contact portion 220 when the protruding portion 130 is forced to move, so as to prevent the risk that the protruding portion 130 and the second contact portion 220 contact each other.
Further, of the side surfaces of the first contact portion 120 on the side close to the second contact portion 220, one end of the side surface away from the protrusion 130 is inclined in a direction away from the second contact portion 220, so that the side surface of the first contact portion 120 on the side close to the second contact portion 220 is an inclined surface, which may be referred to as the first inclined surface 170 for convenience of distinction.
It can be appreciated that when the pin 310 contacts the first contact end surface 140 and the second contact end surface 230 respectively, due to the mutual friction, the pin 310, the first contact end surface 140 and the second contact end surface 230 will wear, and the waste chips will be generated during the wear process, so that the side surface of the first contact portion 120, which is close to the side of the second contact portion 220, is set to be an inclined surface, so that the waste chips can be prevented from adhering or accumulating on the side surface of the first contact portion 120, the waste chips can drop down vertically, and the short circuit caused by the mutual contact of the first contact portion 120 and the second contact portion 220 under the action of the waste chips can be prevented.
Further, at least a portion of the side surface of the second contact portion 220 adjacent to the first contact portion 120 is inclined, which may be referred to as a second inclined surface 240 for convenience of distinction, and an end of the side surface of the second contact portion 220 remote from the second contact end surface 230 of the inclined surface portion is inclined in a direction away from the first contact portion 120.
The side surface of the second contact part 220 of the slope part can prevent the adhesion or accumulation of the scraps on the side surface of the second contact part 220, and thus the first contact part 120 and the second contact part 220 can be prevented from being in contact with each other under the effect of the scraps to cause a short circuit.
Referring to fig. 2, in some embodiments, the first contact end surface 140 may further include a contact slope 141, wherein an end of the contact slope 141 remote from the first body portion 110 is sloped in a direction away from the second contact end surface 230. In this way, when the pin 310 contacts the first contact end surface 140, the contact inclined surface 141 can also play a role in guiding the pin 310, so as to ensure that the pin 310 can accurately contact the second contact end surface 230 in the process of driving the first contact end surface 140 to move along the first direction.
Of course, in some embodiments, the first contact end surface 140 further includes a contact plane 142, where the contact plane 142 is connected to an end of the contact inclined plane 141 near the first body portion 110 in the first direction, and the contact plane 142 may serve to support the pin 310, so that the pin 310 contacts the first contact end surface 140 more stably.
In addition, when the pin 310 has an arc structure, the contact inclined plane 141 in the first contact end surface 140 may be set to an arc structure, so that when the pin 310 contacts with the first contact end surface 140, the arc structure on the pin 310 contacts with the contact inclined plane 141 of the arc structure, so as to increase the contact area between the pin 310 and the first contact end surface 140, reduce the pressure of the pin 310 on the first contact end surface 140, and further reduce the abrasion of the pin 310 on the first contact end surface 140.
Further, to ensure the stability of the contact of the pins 310 with the first test piece 100 and the second test piece 200, the second contact end surface 230 may be planar.
The application also provides a testing device which comprises the testing structure in the embodiment. Wherein, the test structures may be provided in plural groups, and each group of test structures may be respectively contacted with one pin 310 of the electronic chip 300.
Further, the testing device may further include a PCB board (not shown), and the PCB board is electrically connected to the first test piece 100 and the second test piece 200 in the testing structure.
Finally, it should be noted that: the foregoing description is only a preferred embodiment of the present utility model, and the present utility model is not limited thereto, but it is to be understood that modifications and equivalents of some of the technical features described in the foregoing embodiments may be made by those skilled in the art, although the present utility model has been described in detail with reference to the foregoing embodiments. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model should be included in the protection scope of the present utility model.
Claims (10)
1. A test structure comprising a first test strip and a second test strip;
The first test piece comprises a first main body part and a first contact part arranged at one end of the first main body part, and the first contact part is used for contacting with pins of a chip;
The second test piece comprises a second main body part and a second contact part arranged at one end of the second main body part, and the second contact part is also used for being in contact with the pins; wherein,
The first main body part and the second main body part are arranged at intervals in a first direction, the second main body part is positioned above the first main body part, the first contact part and the second contact part are arranged at intervals in a second direction, the first contact part is arranged at one end, far away from the second main body part, of the second contact part, and the first direction and the second direction are mutually perpendicular;
The first contact part is provided with a protruding part higher than the second contact part in a first direction, the protruding part is provided with a first contact end surface in contact with the pin in the first direction, and the second contact part is provided with a second contact end surface in contact with the pin in the first direction; and
The side of the protruding portion near the second contact portion is closer to the second contact portion than the side of the first contact portion near the second contact portion.
2. A test structure according to claim 1, wherein at least part of the side of the protrusion adjacent to the second contact portion is on the same straight line in the first direction as the side of the second contact portion adjacent to the first contact portion.
3. The test structure of claim 1, wherein the side of the protrusion adjacent to the second contact portion comprises a first side and a second side connected to each other, the first side being above the second side, the first side being on the same line as the side of the second contact portion adjacent to the first contact portion in a first direction; and
One end of the second side part far away from the first side part is inclined towards a direction far away from the second contact part, so that the second side part is an inclined surface.
4. The test structure according to claim 1, wherein one end of the side surface of the first contact portion, which is away from the protruding portion, is inclined in a direction away from the second contact portion, among side surfaces of the side surface of the first contact portion, which are close to the second contact portion, so that the side surface of the first contact portion, which is close to the second contact portion, is inclined.
5. The test structure of claim 4, wherein at least a portion of a side of the second contact portion adjacent the first contact portion is beveled; and
One end of the side surface of the second contact portion of the inclined surface portion, which is away from the second contact end surface, is inclined in a direction away from the first contact portion.
6. A test structure according to claim 1, wherein the first contact end surface comprises a contact ramp surface, an end of the contact ramp surface remote from the first body portion being inclined in a direction away from the second contact end surface.
7. The test structure of claim 6, wherein the first contact end surface further comprises a contact plane, the contact plane being connected to an end of the contact ramp adjacent the first body portion.
8. The test structure of claim 6, wherein the inclined surface is an arcuate structure, and wherein the contact inclined surface of the arcuate structure contacts the arcuate structure on the pin.
9. A test structure according to claim 8, wherein the second contact end face is planar.
10. A test device comprising a test structure as claimed in any one of claims 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322515608.5U CN221039322U (en) | 2023-09-14 | 2023-09-14 | Test structure and test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202322515608.5U CN221039322U (en) | 2023-09-14 | 2023-09-14 | Test structure and test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN221039322U true CN221039322U (en) | 2024-05-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202322515608.5U Active CN221039322U (en) | 2023-09-14 | 2023-09-14 | Test structure and test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN221039322U (en) |
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2023
- 2023-09-14 CN CN202322515608.5U patent/CN221039322U/en active Active
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