CN215894846U

CN215894846U - Test piece and test mechanism

Info

Publication number: CN215894846U
Application number: CN202122079103.XU
Authority: CN
Inventors: 宁丽娟
Original assignee: Shenzhen Furuida Electronics Co ltd
Current assignee: Shenzhen Furuida Electronics Co ltd
Priority date: 2021-08-31
Filing date: 2021-08-31
Publication date: 2022-02-22
Anticipated expiration: 2031-08-31

Abstract

The utility model relates to the technical field of electronic chip testing, in particular to a test piece, which comprises: the test device comprises a first abutting part, a second abutting part and a fixing part, wherein the first abutting part abuts against a pin of an electronic chip and is used for testing the electronic chip; the second abutting part abuts against the PCB; and the fixing piece comprises a fixing part and a connecting part, the connecting part is arranged on the fixing part along the vertical direction, the end part of the connecting part is connected with the first abutting part, the end part of the fixing part is connected with the second abutting part, a protruding part is arranged on the side wall of the connecting part, and the protruding part can drive the first abutting part to move to one side after receiving vertical downward force. The test piece with the structure can move to one side after being subjected to vertical downward force, so that the test piece can be abutted against the tube wall of the pin, the structure is simple, and the production cost is lower.

Description

Test piece and test mechanism

Technical Field

The utility model relates to an electronic chip tests technical field, in particular to test piece and accredited testing organization.

Background

Along with the rapid development of modern electronic products, an electronic chip is taken as an important composition core, quality detection control becomes stricter in the production and processing processes, in the actual detection process, the electronic chip is placed in a limiting frame by a test fixture through an automatic production line and is pressed by applying force, and the electronic chip is communicated with a detection circuit through a test piece, so that the performance detection of the electronic chip is realized.

At present, most of detection devices for electronic chips adopt the kelvin test method to perform chip performance test, which is also called as four-terminal detection (4T detection), four-wire detection or 4-point probe method, and is an electrical impedance measurement technology, and a single pair of current-carrying and voltage-carrying detection electrodes are used, so that more accurate measurement can be performed compared with the traditional two-terminal (2T) sensing, and the kelvin four-wire detection is used for some ohm meters and impedance analyzers, and can also be used for measuring the resistance of thin layers of films or chips in the wiring configuration of a precision strain gauge and a resistance thermometer.

In the prior art, the electronic chip and the detection circuit are connected by adopting the metal elastic sheet, so that the Kelvin test for the electronic chip is realized, however, the metal elastic sheet in the prior art needs to drive one of the metal elastic sheets to be lapped on a pin of the electronic chip in an inclined direction through the lifting device, the mode has a complex structure, and the cost performance is not high.

Therefore, how to design an electronic chip detection device with simple structure and high cost performance becomes a technical problem which needs to be solved urgently.

SUMMERY OF THE UTILITY MODEL

In order to overcome the above-mentioned drawbacks of the prior art, the present invention provides a test strip and a test mechanism, so as to solve the problems mentioned in the above background art.

The technical scheme adopted by the utility model for solving the problems in the prior art is as follows: a test strip, comprising:

the first abutting part abuts against a pin of the electronic chip and is used for testing the electronic chip;

the second abutting part abuts against the PCB; and

the fixing piece comprises a fixing part and a connecting part, wherein the connecting part is arranged on the fixing part in the vertical direction, the end part of the connecting part is connected with the first abutting part, the end part of the fixing part is connected with the second abutting part, a protruding part is arranged on the side wall of the connecting part, and the protruding part can enable the connecting part to drive the first abutting part to move to one side after vertical downward force is applied to the protruding part.

In the test piece, the first abutting part is arranged on the fixing part and used for abutting against the pin of the electronic chip, the second abutting part is arranged on the fixing part and abutted against the PCB to test the electronic chip, in addition, the fixing part also comprises the connecting part, and the side wall of the connecting part is also provided with the protruding part, after vertical downward force is applied to the protruding part, the first abutting part can move to one side, so that the first abutting part can abut against the pipe wall of the pin, the structure is simple, and the production cost is lower.

In a preferred embodiment of the present invention, the first abutting portion, the second abutting portion, and the fixing member are formed integrally.

As a preferable scheme of the present invention, one end of the connecting portion, which is away from the fixing portion, is further extended to form a first bending portion, the first bending portion is bent toward one side away from the protruding portion, and an end of the first bending portion is provided with the first abutting portion for buffering a hard contact between the first abutting portion and a pin of the electronic chip.

In a preferred embodiment of the present invention, an end surface of the first abutting portion abutting against the pin is provided with an inclined surface to increase an abutting area of the first abutting portion and the pin.

As a preferable aspect of the present invention, a second bending portion is further extended from one end of the fixing portion away from the connecting portion, the second bending portion is bent toward one end away from the fixing portion, and the end of the second bending portion is provided with the second abutting portion.

As a preferable aspect of the present invention, the second abutting portion is provided at an end of the second bent portion in a vertical direction.

As the preferable scheme of the utility model, one side of the fixing part is also provided with at least one limiting groove so as to facilitate the installation and the positioning of the test piece.

In a preferred embodiment of the present invention, an inclined portion for receiving an external force is further provided between the protrusion portion and a side wall of the connection portion on a side close to the first abutting portion.

The utility model provides a test mechanism, includes above the test strip, test mechanism is still including test seat and actuating lever, be provided with a plurality of groups on the test seat test needle with the test strip, the actuating lever butt is in on the bellying, the test needle set up in one side of test strip, the test needle be used for with the tip butt of pin, the test strip with the pipe wall butt of pin.

As a preferable scheme of the utility model, the test seat is also provided with a limit block, and when the test piece is arranged on the test seat, the limit groove in the test piece is clamped on the limit block.

In the testing mechanism, the testing seat is provided with the testing needle and the testing sheet, wherein the testing needle is used for being abutted against the end part of the pin, and the testing sheet is used for being abutted against the pipe wall of the pin, so that the electronic chip is tested by the Kelvin testing method. In the test process, the pin through removing the electronic chip drives the vertical downstream of actuating lever on the test seat when contacting with the test pin, and then makes the actuating lever act on the bellying of test piece, and the first butt portion that sets up on the test piece moves towards one side of test pin under the effect of bellying to the butt is on the pipe wall of pin, realizes the contact to two contacts of a pin promptly. It can be seen that the test mode has simple structure and low processing cost.

Drawings

FIG. 1 is a block diagram of a test strip and test strip in a test mechanism according to the present invention;

FIG. 2 is a cross-sectional view of a test strip and a testing mechanism of the testing mechanism according to the present invention.

Reference numbers in the figures:

10. testing the sheet; 11. a first abutting portion; 12. a second abutting portion; 13. a fixing member; 14. a boss portion; 15. a first bent portion; 16. a second bent portion; 17. an inclined portion; 18. a limiting groove; 131. a fixed part; 132. a connecting portion;

20. a test seat; 21. a movable plate; 22. a base plate; 23. a limiting block; 30. a drive rod; 40. and (6) testing the needle.

Detailed Description

In order to make the technical problems, technical solutions and advantageous effects to be solved by the present application clearer, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.

It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like, refer to an orientation or positional relationship illustrated in the drawings for convenience in describing the present application and to simplify description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present application.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.

In the test strip 10 and the test mechanism provided in the present application, the test strip 10 may be used to test a chip, and it should be noted that, in addition to testing the chip, the test strip may also be used to test an electronic connector or other electronic components, and the type of the electronic component is not limited herein.

As shown in figure 1: a test strip 10 comprising: a first abutting portion 11, a second abutting portion 12, and a fixing piece 13; the first abutting portion 11 is used for abutting against a pin of an electronic chip, the second abutting portion 12 is used for abutting against a PCB to test the electronic chip, and the fixing member 13 is connected with the first abutting portion 11 and the second abutting portion 12 to provide a mounting base for the first abutting portion 11 and the second abutting portion 12, and meanwhile, the test piece 10 can also be arranged on an external test socket 20 through the fixing member 13.

Further, the fixing member 13 includes a fixing portion 131 and a connecting portion 132, the connecting portion 132 is disposed on the fixing portion 131 along the vertical direction, an end of the connecting portion 132 is connected to the first abutting portion 11, an end of the fixing portion 131 is connected to the second abutting portion 12, a protruding portion 14 is disposed on a side wall of the connecting portion 132, and the protruding portion 14 can enable the connecting portion 132 to drive the first abutting portion 11 to move to one side after receiving a vertical downward force.

In the above-mentioned test piece 10, through being provided with first butt portion 11 on mounting 13 and being used for the butt joint with the pin of electronic chip, set up second butt portion 12 on mounting 13 and PCB board butt joint and realize the test to the electronic chip, in addition, mounting 13 still includes connecting portion 132, and still is provided with bellying 14 on the lateral wall of connecting portion 132, through exerting vertical decurrent power to bellying 14 after, can realize first butt portion 11 to one side motion, make it butt on the pipe wall of pin, simple structure, manufacturing cost is also lower.

As a preferable embodiment of the present invention, the end of the connecting portion 132 away from the fixing portion 131 is further extended to form a first bending portion 15, the first bending portion 15 is bent toward the side away from the protruding portion 14, the end of the first bending portion 15 is provided with the first abutting portion 11, when the first abutting portion 11 abuts against the pin of the electronic chip, the first bending portion 15 plays a role of buffering the hard contact between the first abutting portion 11 and the pin of the electronic chip, and simultaneously the first abutting portion 11 can always keep contact with the pin under the action of the first bending portion 15, so as to improve the stability of the test strip 10 during operation.

Furthermore, the end surface of the first abutting portion 11 abutting against the pin is provided with an inclined surface to increase the abutting area of the first abutting portion 11 and the pin.

Specifically, in the process of abutting the first abutting portion 11 against the pin, the first abutting portion 11 needs to move a certain distance to one side of the pin so as to be abutted against the tube wall of the pin, so that the end face of the first abutting portion 11 is set as the inclined face, and when the end face of the first abutting portion 11 moves to be abutted against the tube wall of the pin, the end face is just located in the vertical direction, so that the end face of the first abutting portion 11 can be completely abutted against the tube wall.

In a preferred embodiment of the present invention, a second bent portion 16 is further extended from one end of the fixing portion 131 away from the connecting portion 132, the second bent portion 16 is bent toward one end away from the fixing portion 131, and the second abutting portion 12 is disposed at an end of the second bent portion 16. When the second abutting portion 12 abuts against the PCB, the second bending portion 16 plays a role of buffering the hard contact between the second abutting portion 12 and the PCB, and meanwhile, the second abutting portion 12 can always keep contact with the PCB under the effect of the second bending portion 16, so as to increase the stability of the test strip 10 during operation.

Further, the second abutting portion 12 is disposed at an end of the second bending portion 16 along the vertical direction, so that an end surface of the second abutting portion 12 can be completely contacted with the PCB, and stability during abutting is maintained.

In a preferred embodiment of the present invention, the first abutting portion 11, the second abutting portion 12, and the fixing member 13 are integrally formed, which not only facilitates the production and processing of the test strip 10, but also improves the ductility, toughness, and conductivity of the entire test strip 10, thereby prolonging the service life of the test strip 10. In another embodiment, the first contact portion 11, the second contact portion 12, and the fixing member 13 may be assembled, and the first contact portion 11, the second contact portion 12, and the fixing member 13 may be welded together by welding or the like.

In addition, the test piece 10 in the present embodiment may be made of a copper sheet, an iron sheet, an alloy sheet, or the like.

In a preferred embodiment of the present invention, an inclined portion 17 is further provided between the protruding portion 14 and a side wall of the connecting portion 132 on a side close to the first contact portion 11, and the inclined portion 17 is configured to receive an external force.

Specifically, the inclined portion 17 can convert the vertical downward external force into a force in the horizontal direction after receiving the vertical downward external force, so as to drive the connecting portion 132 to incline to one side, and further enable the first abutting portion 11 arranged on the connecting portion 132 to abut against the tube wall of the pin.

As a preferred embodiment of the present invention, at least one limiting groove 18 is further disposed on one side of the fixing portion 131 to facilitate the installation and positioning of the test strip 10.

In the present embodiment, one of the stopper grooves 18 is provided. In other embodiments, two, three or more spacing grooves 18 may be provided.

Specifically, when the test strip 10 is installed, the test strip 10 can be clamped on the test seat 20 through the limiting groove 18 to perform fixing and positioning functions, so that the installation efficiency and accuracy of the test strip 10 are improved.

In addition, as shown in fig. 2, the utility model also discloses a testing mechanism, which can implement kelvin testing (i.e. can implement contact testing of two points of a pin), the testing mechanism further comprises a testing seat 20 and a driving rod 30, a plurality of groups of testing needles 40 and the testing sheet 10 are arranged on the testing seat 20, the driving rod 30 abuts against the boss 14, the testing needles 40 are arranged on one side of the testing sheet 10, the testing needles 40 are used for abutting against the end portions of the pins, and the testing sheet 10 is used for abutting against the tube wall of the pin.

In the present embodiment, a set of the test needles 40 and the test strip 10 is described as an example.

In the process of testing the electronic chip, firstly, the end of the pin of the electronic chip needs to be abutted against the testing pin 40, and the driving rod 30 drives the testing sheet 10 to move in the direction close to the testing pin 40, so that the first abutting part 11 on the testing sheet 10 can be abutted against the pipe wall of the pin of the electronic chip, and the kelvin test of the electronic chip is realized.

As a preferred scheme of the present invention, the test seat 20 is further provided with a limit block 23, and when the test piece 10 is mounted on the test seat 20, the limit groove 18 in the test piece 10 is clamped on the limit block 23 to perform fixing and positioning functions.

For example, in one exemplary manner provided herein, test socket 20 may include a bottom plate 22 and a movable plate 21.

The bottom plate 22 is used for mounting the test piece 10 and the test needle 40, the limiting block 23 is further arranged on the bottom plate 22, and the limiting block 23 is clamped in the limiting groove 18 of the test piece 10 to fix and position the test piece 10.

The driving rod 30 is movably disposed on the bottom plate 22 along the vertical direction through the movable plate 21, when the external mechanism drives the pins of the electronic chip to abut against the testing pins 40 on the testing socket 20, the external mechanism simultaneously acts on the movable plate 21 and drives the movable plate 21 to move along the vertical downward direction, so as to drive the driving rod 30 on the movable plate 21 to move along the vertical downward direction and act on the protruding portion 14 of the testing piece 10, and the protruding portion 14 drives the first abutting portion 11 to move towards the direction close to the testing pins 40 and finally abut against the tube wall of the pins on the testing pins 40.

In the above-mentioned testing mechanism, the testing base 20 is provided with the testing needle 40 and the testing sheet 10, wherein the testing needle 40 is used for abutting against the end of the pin, and the testing sheet 10 is used for abutting against the tube wall of the pin, so as to realize the test of the kelvin detection method on the electronic chip. In the testing process, the pin of the mobile electronic chip is contacted with the testing pin 40 and simultaneously drives the driving rod 30 on the testing seat 20 to vertically move downwards, so that the driving rod 30 acts on the bulge part 14 of the testing piece 10, the first abutting part 11 arranged on the testing piece 10 moves towards one side of the testing pin 40 under the action of the bulge part 14 and abuts against the pipe wall of the pin, and the contact of two contacts of one pin is realized. It can be seen that the test mode has simple structure and low processing cost.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the utility model. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A test strip, comprising:

the second abutting part abuts against the PCB; and

2. A test strip according to claim 1, wherein: the first abutting part, the second abutting part and the fixing part are of an integrally formed structure.

3. A test strip according to claim 1, wherein: the end of the connecting part, which is far away from the fixing part, is also provided with a first bending part in an extending manner, the first bending part is bent towards one side, which is far away from the protruding part, and the end part of the first bending part is provided with the first abutting part for buffering the hard contact between the first abutting part and the pins of the electronic chip.

4. A test strip according to claim 3, wherein: the end face of the first abutting part abutting against the pin is provided with an inclined face so as to improve the abutting area of the first abutting part and the pin.

5. A test strip according to claim 1, wherein: the end of the fixing part, which is far away from the connecting part, is also provided with a second bending part in an extending manner, the second bending part is bent towards the end, which is far away from the fixing part, and the end part of the second bending part is provided with the second abutting part.

6. A test strip according to claim 5, wherein: the second abutting portion is arranged at the end portion of the second bending portion along the vertical direction.

7. A test strip according to claim 1, wherein: one side of the fixing part is also provided with at least one limiting groove so as to facilitate the installation and the positioning of the test piece.

8. A test strip according to claim 1, wherein: an inclined part is further arranged between the protruding part and the side wall of the connecting part close to one side of the first abutting part, and the inclined part is used for bearing external force.

9. A test mechanism, comprising the test strip of any one of claims 1 to 8, wherein the test mechanism further comprises a test seat and a driving rod, the test seat is provided with a plurality of groups of test needles and the test strip, the driving rod abuts against the protruding portion, the test needles are arranged on one side of the test strip and are used for abutting against the end portions of the pins, and the test strip is used for abutting against the tube wall of the pins.

10. The test mechanism of claim 9, wherein: the test seat is also provided with a limiting block, and when the test piece is installed on the test seat, the limiting groove in the test piece is clamped on the limiting block.