CN204348715U - 一种超薄封装件 - Google Patents

一种超薄封装件 Download PDF

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CN204348715U
CN204348715U CN201520003392.7U CN201520003392U CN204348715U CN 204348715 U CN204348715 U CN 204348715U CN 201520003392 U CN201520003392 U CN 201520003392U CN 204348715 U CN204348715 U CN 204348715U
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silver coating
chip
bonding line
package device
plating
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宋波
梁大钟
施保球
刘兴波
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Guangdong Style Science And Technology Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/4847Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond
    • H01L2224/48471Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a wedge bond the other connecting portion not on the bonding area being a ball bond, i.e. wedge-to-ball, reverse stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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  • Lead Frames For Integrated Circuits (AREA)

Abstract

本实用新型公开了一种超薄封装件,包括塑封体以及封装在塑封体内的芯片、镀银层、镀NiPdAu层、铜连接层和键合线,芯片、镀银层、铜连接层、镀NiPdAu层和键合线构成了电路的电源和信号通道,所述的铜连接层有多个,每个铜连接层的上表面和下表面分别设置有镀银层和镀NiPdAu层,所述的多个镀银层相互独立,所述的芯片设置在部分镀银层上,无芯片的镀银层段通过键合线与芯片连接,由于可以免电镀、免贴膜,生产成本可以大幅降低,产品更有竞争力。

Description

一种超薄封装件
技术领域
本实用新型属于集成电路封装技术领域,具体涉及一种超薄封装件。
背景技术
集成电路的QFN(Quad Flat No-leadPackage,方形扁平无引脚封装)和DFN(Dual Flat Package,双侧引脚扁平封装)近几年随着通讯设备(如基站、交换机)、智能手机、便携式设备(如平板电脑)、可穿戴设备(如智能手表、智能眼镜、智能手环等)的普及而迅速发展,特别适用于有高频、高带宽、低噪声、高导热、小体积、高速度等电性需求的大规模集成电路的封装。
QFN/DFN有效地利用了引线脚的封装空间,从而大幅度地提高了封装效率。该封装由于引线短小、塑封体尺寸小、封装体薄,可以使CPU 体积缩小30%-50%,同时具有良好的散热性能。
传统的QFN/DFN主要存在以下不足:一是设计及制作周期长,成本比较高;二是凸点的排布以及I/O 的密集程度受到框架设计及框架制造工艺的限制;三是框架在腐蚀变薄后,在模具内有滑动的风险,封装可靠性得不到保障;四是传统的QFN/DFN产品厚度仍然比较大,无法满足当前的便携式设备对小体积、高密度封装的需求。
实用新型内容
本实用新型的目的是针对上述现有技术的不足,提供一种基于键合线连接的免贴膜、免电镀的超薄封装件。
本实用新型解决其技术问题所采用的技术方案是:一种超薄封装件,包括塑封体以及封装在塑封体内的芯片、镀银层、镀NiPdAu层、铜连接层和键合线,芯片、镀银层、铜连接层、镀NiPdAu层和键合线构成了电路的电源和信号通道,所述的铜连接层有多个,每个铜连接层的上表面和下表面分别设置有镀银层和镀NiPdAu层,所述的多个镀银层相互独立,所述的芯片设置在部分镀银层上,无芯片的镀银层通过键合线与芯片连接。
所述的一种超薄封装件,其无芯片的镀银层上设置有与键合线连接的金属凸点,所述的金属凸点、芯片、镀银层、铜连接层、镀NiPdAu层和键合线构成了电路的电源和信号通道。
所述的一种超薄封装件,其镀银层和镀NiPdAu层的厚度为3—5um。
所述的一种超薄封装件,其塑封体的厚度小于0.35mm。
所述的一种超薄封装件,其铜连接层下端的一组相对边设置有倒角。
所述的一种超薄封装件,其倒角为直角倒角。
本实用新型的有益效果是:通过电镀银之后在植有的金属凸点上直接压焊,也可通过电镀银后直接打线的方法实现与外部电路的连通,封装件将镀NiPdAu层作为与外部电路的信号连接通道,相当于普通封装的“管脚”,可以省去电镀环节;在镀银层和框架基板之间增加一层铜连接层,铜连接层下端的一组相对边设置有倒角,塑封之后塑封料填充满铜倒角层的凹槽,形成有效的防拖拉结构,极大地降低了框架在腐蚀变薄后,在模具内滑动的风险。
附图说明
图1为本实用新型第一实施例的剖面图;
图2为本实用新型第二实施例的剖面图。
各附图标记为:2—金属凸点,3—芯片,4—塑封体,5—镀银层,6—镀NiPdAu层,7—铜连接层,8—键合线。
具体实施方式
下面结合附图对本实用新型作进一步详细说明。
参照图1所示,本实用新型公开了一种超薄封装件,包括塑封体4以及封装在塑封体4内的芯片3、镀银层5、镀NiPdAu层6、铜连接层7和键合线8,所述的芯片3、镀银层5、铜连接层7、镀NiPdAu层6和键合线8构成了电路的电源和信号通道,所述的铜连接层7有多个,每个铜连接层7的上表面设置有镀银层5,下表面设置有镀NiPdAu层6,所述的多个镀银层5相互独立,所述的芯片3设置在部分镀银层5上,无芯片3的镀银层5通过键合线8与芯片3连接。
进一步,如图2所示,在无芯片3的镀银层5上设置有与键合线8连接的金属凸点2,所述的金属凸点2、芯片3、镀银层5、铜连接层7、镀NiPdAu层6和键合线8构成了电路的电源和信号通道。
由于镀银层5和镀NiPdAu层6的厚度为3—5um,大大降低了QFN/DFN封装产品的厚度,可将塑封体4的厚度设置为小于0.35mm,而传统的QFN/DFN封装体厚度在0.7mm以上,本实用新型提供的技术可使封装体厚度减小100%。
更进一步,铜连接层7下端的一组相对边设置有倒角,作为一种优选的实施例,还可以将倒角设置成直角倒角,不仅形成有效的防拖拉结构,塑封之后塑封料填充满铜倒角层的凹槽,形成有效的防拖拉结构,极大地降低了框架在腐蚀变薄后,在模具内滑动的风险,还大大方便了铜连接层7的加工,同时,降低了塑封料压力,增加了塑封料与金属框架的接合面积,封装可靠性大幅提升。
本实用新型采用普通框架即可进行产品制作流程,无需过多加工框架载体,缩短设计周期,降低成本,更好地实现芯片与载体的互联,使I/O 更加密集。
传统的QFN/DFN框架,为了防止塑封时发生“溢胶”,在框架背面贴有一层膜,而本实用新型由于框架上面镀了一层NiPdAu,可以起到隔离塑封料的作用,塑封后腐蚀掉框架,同样可以起到防止“溢胶”的作用,这样就可以省去框架厂商“贴膜”的过程。
由于本实用新型提供的封装件可以免电镀、免贴膜,生产成本可以大幅降低,产品更有竞争力。
上述实施例仅例示性说明本实用新型的原理及其功效,以及部分运用的实施例,对于本领域的普通技术人员来说,在不脱离本实用新型创造构思的前提下,还可以做出若干变形和改进,这些都属于本实用新型的保护范围。

Claims (6)

1.一种超薄封装件,其特征在于:包括塑封体(4)以及封装在塑封体(4)内的芯片(3)、镀银层(5)、镀NiPdAu层(6)、铜连接层(7)和键合线(8),芯片(3)、镀银层(5)、铜连接层(7)、镀NiPdAu层(6)和键合线(8)构成了电路的电源和信号通道,所述的铜连接层(7)有多个,每个铜连接层(7)的上表面和下表面分别设置有镀银层(5)和镀NiPdAu层(6),所述的多个镀银层(5)相互独立,所述的芯片(3)设置在部分镀银层(5)上,无芯片(3)的镀银层(5)通过键合线(8)与芯片(3)连接。
2.根据权利要求1所述的一种超薄封装件,其特征在于,所述无芯片(3)的镀银层(5)上设置有与键合线(8)连接的金属凸点(2),所述的金属凸点(2)、芯片(3)、镀银层(5)、铜连接层(7)、镀NiPdAu层(6)和键合线(8)构成了电路的电源和信号通道。
3.根据权利要求1或2所述的一种超薄封装件,其特征在于,所述的镀银层(5)和镀NiPdAu层(6)的厚度为3—5um。
4.根据权利要求3所述的一种超薄封装件,其特征在于,所述的塑封体(4)的厚度小于0.35mm。
5.根据权利要求4所述的一种超薄封装件,其特征在于,所述的铜连接层(7)下端的一组相对边设置有倒角。
6.根据权利要求5所述的一种超薄封装件,其特征在于,所述的倒角为直角倒角。
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105514079A (zh) * 2015-12-08 2016-04-20 广东气派科技有限公司 集成电路封装结构及其生产工艺
CN105551971A (zh) * 2015-12-08 2016-05-04 广东气派科技有限公司 基于Flip-chip连接的集成电路封装结构及封装工艺
CN112349673A (zh) * 2020-11-10 2021-02-09 江西芯世达微电子有限公司 一种基于键合线连接的超薄封装件及其制作工艺

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105514079A (zh) * 2015-12-08 2016-04-20 广东气派科技有限公司 集成电路封装结构及其生产工艺
CN105551971A (zh) * 2015-12-08 2016-05-04 广东气派科技有限公司 基于Flip-chip连接的集成电路封装结构及封装工艺
CN112349673A (zh) * 2020-11-10 2021-02-09 江西芯世达微电子有限公司 一种基于键合线连接的超薄封装件及其制作工艺

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