CN202398542U - Solar-energy original silicon chip full-automatic measurement and separation equipment - Google Patents
Solar-energy original silicon chip full-automatic measurement and separation equipment Download PDFInfo
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- CN202398542U CN202398542U CN2011205386541U CN201120538654U CN202398542U CN 202398542 U CN202398542 U CN 202398542U CN 2011205386541 U CN2011205386541 U CN 2011205386541U CN 201120538654 U CN201120538654 U CN 201120538654U CN 202398542 U CN202398542 U CN 202398542U
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Abstract
The utility model discloses solar-energy original silicon chip full-automatic measurement and separation equipment. A double-line driving belt is arranged behind a material loading table; a sorting table is arranged behind the double-line driving belt; a detection system for detecting solar energy cells on the double-line driving belt is arranged at the double-line driving belt; the detection system comprises a thickness and resistivity detection unit, an overall dimension and warpage detection unit, a hidden crack detection unit, an oil dirt detection unit, an edge defect detection unit, a photoluminescence detection unit, an infrared spectrum detection block and a line trace measurement unit, wherein all the detection units as above are arranged in sequence and connected with a microcomputer control system. The full-automatic measurement and separation equipment is reasonable in structure and increases detection items, thereby accurately reflecting the performance of a silicon chip; the application range of the full-automatic measurement and separation equipment is expanded and the full-automatic measurement and separation equipment can be matched with new ingot casting and linear cutting technologies; and the classification requirement for the silicon chips is improved, high-quality silicon chips can be screened out and the pass percent of the cells is enhanced.
Description
Technical field
The utility model relates to former silicon chip all automatic measurement of a kind of solar energy and screening installation.
Background technology
The quality of former silicon chip is extremely important to the electrical property of solar battery sheet, and the quality of former silicon chip has directly determined the electrical property of solar battery sheet in other words.And along with the reduction of silicon material and silicon chip price, the operation cost proportion of battery machining process raises, and is also increasingly high to the detection requirement of former silicon chip.
Existing former silicon chip checkout equipment can only detect defectives such as silicon chip appearance and size, edge, and novel device can be to resistivity, dislocation, latently split, impurity, and minority carrier life time etc. detect, can reflect the whole performance of former silicon chip more accurately; Existing facilities fail detects ingot casting new technology and new cutting mode, like the cutting of Buddha's warrior attendant line, the silicon chip produced.
Summary of the invention
It is a kind of rational in infrastructure that the purpose of the utility model is to provide, and silicon chip detects accurately, and reliable realization is to the former silicon chip all automatic measurement of solar energy and the screening installation of the detection of the former silicon chip of new casting ingot process and the production of line cutting process.
The technical solution of the utility model is:
Former silicon chip all automatic measurement of a kind of solar energy and screening installation; Comprise feeding platform; The two-wire driving-belt is set behind the feeding platform, behind the two-wire driving-belt sorting table is set, it is characterized in that: the detection system that solar battery sheet detects on two-wire driving-belt position is provided with the two-wire driving-belt; Said detection system comprises thickness and resistivity detecting unit, appearance and size and angularity detecting unit, conceals and split detecting unit, greasy dirt detecting unit, edge defect detecting unit, luminescence generated by light detecting unit, infrared spectrum detection piece and stria measuring unit; And above-mentioned each detecting unit is arranged in order, and above-mentioned each detecting unit is connected with Control System of Microcomputer.
Said Control System of Microcomputer adopts the suspension type touch-screen.
The utility model is increasing luminescence generated by light and infrared spectrum detection module on the existing former silicon chip automatic checkout equipment on the market; The communication modes and the detection speed of unified each module; Increase at former silicon chip automatic separation equipment in the measuring abilities such as luminescence generated by light, fine fisssure, reduce integral device expense (frame, automation, microsystem etc.).
The utility model increases luminescence generated by light (PL) detection module in measuring system, the gray value correspondence through the PL image goes out corresponding minority carrier life time, and the PL detection module can detect second-rate former silicon chips such as dislocation, impurity, evil mind; Can just predict from former silicon chip the generation of efficiency battery sheet, thereby with the further meticulous stepping of former silicon chip, and can filter out the higher former silicon chip of quality for purposes such as research and development.
The utility model increases infrared spectrum (IR) detection module in measuring system, the infrared spectrum detection module can detect that existing sorter is can detected micron order latent to be split, and has improved the accuracy that silicon chip detects, and has reduced the generation of substandard product.And through this module, can analyze the size of crystal grain, thereby existing type of monocrystalline silicon piece discerned by software for calculation; Can carry out special test, also as requested the class monocrystalline classified the class monocrystalline;
The utility model stria measurement module can analyze different strias, and different stria sheets is classified gather, the problem that exists in the feedback outlet cutting process, and analyses such as mortar performance are provided for the line cutting process;
The utility model can be selected 25,50, reach 100 film magazines through the process menu of automatic charging platform is set, to adapt to different coming unstuck and prerinse technology.
The utility model is rational in infrastructure; Can improve former silicon chip quality testing means, improve the silicon chip accuracy of detection, realize detection the former silicon chip of new casting ingot process and the production of line cutting process; The technology of cutting for ingot casting and line provides feedback opinion; And the poor efficiency sheet predicted, thereby improve the electrical property of battery sheet and the power of assembly, cut operating costs.
Description of drawings
Below in conjunction with accompanying drawing and embodiment the utility model is described further.
Fig. 1 is the structural representation of an embodiment of the utility model.
The specific embodiment
Former silicon chip all automatic measurement of a kind of solar energy and screening installation; Comprise feeding platform 1; Two-wire driving-belt 2 is set behind the feeding platform, sorting table 6 is set behind the two-wire driving-belt, the detection system 4 that solar battery sheet detects on two-wire driving-belt position is provided with the two-wire driving-belt; Said detection system comprises thickness and resistivity detecting unit, appearance and size and angularity detecting unit, conceals and split detecting unit, greasy dirt detecting unit, edge defect detecting unit, luminescence generated by light detecting unit (PL), infrared spectrum detection piece (IR) and stria measuring unit; And above-mentioned each detecting unit is arranged in order, and above-mentioned each detecting unit is connected with Control System of Microcomputer.
Said Control System of Microcomputer adopts suspension type touch-screen 5.Measuring system adopts left and right plug-type window 3.
Each measuring unit (module) is individually fixed on the frame 8.Also has silicon chip Carrier box 7 among the figure.
The kind of the former silicon chip defective that present embodiment can detect is following:
Above-mentioned detection is entered the right side for a left side in proper order and is gone out, and detects according to sequence number 1～8 successively, and testing result is transferred to Control System of Microcomputer.
In fact former silicon chip is measured and the course of work of sorting is: under the normal condition, get into the full automatic working pattern through touch-screen.On touch-screen, set the transfer rate of each parameter that can detect defective, each detection module measurement and two-wire conveyer belt, select suitable technological parameter and start technology.Film magazine is put on the automatic charging platform; Press start button; By the two-wire conveyer belt the former silicon chip in the film magazine is sent to detection system successively, each detection module in detection system can detect silicon chip successively, thereby former silicon chip is classified by the requirement that is provided with in advance; And send instruction by microsystem, silicon chip is transported to the film magazine of corresponding classification respectively.
Equipment operating process: device power → power-on → logon operation interface → setting major parameter (input date; Position Number; Crystal numbering is selected process menu and is started) → be placed on loading bay → by running preparation → silicon box by Start start working (equipment normal operation).
Claims (2)
1. former silicon chip all automatic measurement of solar energy and screening installation; Comprise feeding platform; The two-wire driving-belt is set behind the feeding platform, behind the two-wire driving-belt sorting table is set, it is characterized in that: the detection system that solar battery sheet detects on two-wire driving-belt position is provided with the two-wire driving-belt; Said detection system comprises thickness and resistivity detecting unit, appearance and size and angularity detecting unit, conceals and split detecting unit, greasy dirt detecting unit, edge defect detecting unit, luminescence generated by light detecting unit, infrared spectrum detection piece and stria measuring unit; And above-mentioned each detecting unit is arranged in order, and above-mentioned each detecting unit is connected with Control System of Microcomputer.
2. former silicon chip all automatic measurement of solar energy according to claim 1 and screening installation is characterized in that: said Control System of Microcomputer adopts the suspension type touch-screen.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011205386541U CN202398542U (en) | 2011-12-21 | 2011-12-21 | Solar-energy original silicon chip full-automatic measurement and separation equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011205386541U CN202398542U (en) | 2011-12-21 | 2011-12-21 | Solar-energy original silicon chip full-automatic measurement and separation equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202398542U true CN202398542U (en) | 2012-08-29 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2011205386541U Expired - Lifetime CN202398542U (en) | 2011-12-21 | 2011-12-21 | Solar-energy original silicon chip full-automatic measurement and separation equipment |
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| CN (1) | CN202398542U (en) |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103311374A (en) * | 2013-06-18 | 2013-09-18 | 韩华新能源（启东）有限公司 | Photoluminescence-based solar crystalline silicon wafer quality prediction and control method |
| CN104889074A (en) * | 2015-06-19 | 2015-09-09 | 镇江苏仪德科技有限公司 | Coated wafer defect detection and sorting set |
| CN105425135A (en) * | 2015-12-25 | 2016-03-23 | 江苏盎华光伏工程技术研究中心有限公司 | Polysilicon material intelligent detection and classified transport device and method |
| CN106124525A (en) * | 2016-08-24 | 2016-11-16 | 镇江荣德新能源科技有限公司 | A kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus |
| CN107481950A (en) * | 2017-07-28 | 2017-12-15 | 苏州阿特斯阳光电力科技有限公司 | A kind of quality stepping method and device based on PL detections |
| CN108037367A (en) * | 2017-12-13 | 2018-05-15 | 日照职业技术学院 | A kind of resistive conductor resistance rate full-automatic testing instrument of DC micro |
| CN108325863A (en) * | 2018-01-19 | 2018-07-27 | 温州职业技术学院 | The sorting equipment of semiconductor chilling plate integral test system |
| CN108389808A (en) * | 2018-04-23 | 2018-08-10 | 无锡奥特维科技股份有限公司 | Silicon chip sorting machine |
| CN108745921A (en) * | 2018-03-26 | 2018-11-06 | 江苏金晖光伏有限公司 | A kind of sorting method of inspection of diamond wire saw cut list, polysilicon chip |
| CN113145553A (en) * | 2021-02-07 | 2021-07-23 | 福建新峰二维材料科技有限公司 | Classifying method for cast monocrystalline silicon wafers |
| CN116603754A (en) * | 2023-06-02 | 2023-08-18 | 曲靖阳光新能源股份有限公司 | High-speed silicon chip sorter |
-
2011
- 2011-12-21 CN CN2011205386541U patent/CN202398542U/en not_active Expired - Lifetime
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103311374A (en) * | 2013-06-18 | 2013-09-18 | 韩华新能源（启东）有限公司 | Photoluminescence-based solar crystalline silicon wafer quality prediction and control method |
| CN103311374B (en) * | 2013-06-18 | 2015-07-15 | 韩华新能源（启东）有限公司 | Photoluminescence-based solar crystalline silicon wafer quality prediction and control method |
| CN104889074A (en) * | 2015-06-19 | 2015-09-09 | 镇江苏仪德科技有限公司 | Coated wafer defect detection and sorting set |
| CN105425135A (en) * | 2015-12-25 | 2016-03-23 | 江苏盎华光伏工程技术研究中心有限公司 | Polysilicon material intelligent detection and classified transport device and method |
| CN106124525A (en) * | 2016-08-24 | 2016-11-16 | 镇江荣德新能源科技有限公司 | A kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus |
| CN107481950A (en) * | 2017-07-28 | 2017-12-15 | 苏州阿特斯阳光电力科技有限公司 | A kind of quality stepping method and device based on PL detections |
| CN108037367A (en) * | 2017-12-13 | 2018-05-15 | 日照职业技术学院 | A kind of resistive conductor resistance rate full-automatic testing instrument of DC micro |
| CN108325863A (en) * | 2018-01-19 | 2018-07-27 | 温州职业技术学院 | The sorting equipment of semiconductor chilling plate integral test system |
| CN108325863B (en) * | 2018-01-19 | 2019-10-18 | 温州职业技术学院 | The sorting equipment of semiconductor chilling plate integral test system |
| CN108745921A (en) * | 2018-03-26 | 2018-11-06 | 江苏金晖光伏有限公司 | A kind of sorting method of inspection of diamond wire saw cut list, polysilicon chip |
| CN108389808A (en) * | 2018-04-23 | 2018-08-10 | 无锡奥特维科技股份有限公司 | Silicon chip sorting machine |
| CN108389808B (en) * | 2018-04-23 | 2024-03-01 | 无锡奥特维科技股份有限公司 | Silicon chip sorting machine |
| CN113145553A (en) * | 2021-02-07 | 2021-07-23 | 福建新峰二维材料科技有限公司 | Classifying method for cast monocrystalline silicon wafers |
| CN116603754A (en) * | 2023-06-02 | 2023-08-18 | 曲靖阳光新能源股份有限公司 | High-speed silicon chip sorter |
| CN116603754B (en) * | 2023-06-02 | 2023-12-08 | 曲靖阳光新能源股份有限公司 | High-speed silicon chip sorter |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20120829 |