CN106124525A - A kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus - Google Patents

A kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus Download PDF

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Publication number
CN106124525A
CN106124525A CN201610716409.2A CN201610716409A CN106124525A CN 106124525 A CN106124525 A CN 106124525A CN 201610716409 A CN201610716409 A CN 201610716409A CN 106124525 A CN106124525 A CN 106124525A
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CN
China
Prior art keywords
crawler belt
infrared
silico briquette
crystalline silicon
mechanical arms
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610716409.2A
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Chinese (zh)
Inventor
张涛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZHENJIANG RIETECH NEW ENERGY TECHNOLOGY Co Ltd
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ZHENJIANG RIETECH NEW ENERGY TECHNOLOGY Co Ltd
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Application filed by ZHENJIANG RIETECH NEW ENERGY TECHNOLOGY Co Ltd filed Critical ZHENJIANG RIETECH NEW ENERGY TECHNOLOGY Co Ltd
Priority to CN201610716409.2A priority Critical patent/CN106124525A/en
Publication of CN106124525A publication Critical patent/CN106124525A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02Cleaning by the force of jets or sprays
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

The invention discloses a kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus, including kibbling mill, Refining apparatus, clearing and drying device, infrared detection device and band turbine;Wherein, described band turbine is provided with transmission crawler belt, transmits crawler belt and is used for placing silico briquette;The side transmitting crawler belt is disposed with kibbling mill, Refining apparatus, clearing and drying device and infrared detection device along the traffic direction transmitting crawler belt;Described infrared detection device includes two mechanical arms, infrared light supply, infrared camera and computer memory device, its mid-infrared light source, infrared camera are oppositely arranged on the both sides transmitting crawler belt, and infrared camera is connected on described computer memory device by data wire;Two mechanical arms, for clamping the two ends of silico briquette, are rotated by two mechanical arms of Serve Motor Control.The present invention saves manually, simple to operate, improves detection efficiency, decreases brilliant brick and scratches, collapses the possibility on limit, enhances the definition of silico briquette defects inspecting.

Description

A kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus
Technical field
The present invention relates to a kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus, belong to infrared acquisition field.
Background technology
The infrared defects inspecting of polysilicon block at present, after mostly taking evolution, artificial block-by-block moves the mode of detection.But Owing to after evolution, silico briquette surface exists concavo-convex stria, surface roughness is big, has bigger reflection to Infrared, causes infrared spy Wound is only able to detect some larger-size impure points, and the impure point that size is less becomes fish that has escape the net.These impure points, due to Hardness is big, easily causes line bow and become big in follow-up multi-wire saw, and gauze vibrations aggravation easily causes scuffing at silicon chip surface With stria equivalent damage, serious meeting causes broken string, causes a large amount of silicon chip to be scrapped.
For silico briquette outgoing section business, the silico briquette of outgoing has been carried out surface grinding mostly.Client is receiving silico briquette After, the supplied materials detections such as impurity flaw detection can be re-started.Due to the silico briquette smooth surface after surface grinding, the permeability to infrared light Good, it is possible to see more tiny impure point.This test result difference caused due to test mode difference, often becomes The bifurcation point of both sides of supply and demand.
For the difference of silico briquette detection before and after this flour milling, some factory carries out infrared detection after taking silicon block ground surface again Method, but this method production efficiency is low, easily causes silico briquette surface tear, collapses the feelings such as scarce during manually moving Shape.Therefore, develop a kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus is the most necessary.
Summary of the invention
Goal of the invention: in order to overcome the deficiencies in the prior art, the present invention provides a kind of crystalline silicon blocks surface grinding And defects inspecting integrated apparatus, this device is saved artificial, simple to operate, improves detection efficiency, decreases brilliant brick and scratches, collapses The possibility on limit, enhances the definition of silico briquette defects inspecting.
Technical scheme: for achieving the above object, the technical solution used in the present invention is:
A kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus, including kibbling mill, Refining apparatus, cleaning-drying Device, infrared detection device and band turbine;
Wherein, described band turbine is provided with transmission crawler belt, transmits crawler belt and is used for placing silico briquette;Transmit crawler belt side along The traffic direction transmitting crawler belt is disposed with kibbling mill, Refining apparatus, clearing and drying device and infrared detection device;
Described clearing and drying device includes cleaning machine, dehydrator, is oppositely arranged on the both sides transmitting crawler belt;
Described infrared detection device includes two mechanical arms, infrared light supply, infrared camera and computer memory device, Its mid-infrared light source, infrared camera are oppositely arranged on the both sides transmitting crawler belt, and infrared camera is connected to institute by data wire State on computer memory device;Two mechanical arms are for clamping the two ends of silico briquette, by two mechanical arms of Serve Motor Control Rotate the defects inspecting in each face of silico briquette, reduced and manually move the damage caused, and saved artificial.
Further, described cleaning machine is water jet cleaning machine, the impurity on silico briquette surface after cleaning grinding.
Further, described dehydrator is bleed type dehydrator.
Beneficial effect: a kind of crystalline silicon blocks surface grinding of present invention offer and defects inspecting integrated apparatus, will be original Surface grinding and the infrared defects inspecting two procedures of silico briquette bring together, and become one procedure;Former two people are individually operated can Become one man operation, and whole process is without manually moving silico briquette, save artificial, decrease silico briquette and scratch, collapse the possibility on limit; Infrared defects inspecting after being ground silico briquette cleaning, eliminates silico briquette surface line marker, silica flour residual and the impact of other foreign material, The impurity of more than 0.5mm size can clearly be detected, within detecting time-consuming 30 seconds, improve detection efficiency, enhance silico briquette The definition of defects inspecting.
Accompanying drawing explanation
Fig. 1 is the present invention a kind of crystalline silicon blocks surface grinding and the structural representation of defects inspecting integrated apparatus;
Figure includes: 1, crystalline silicon blocks, 2, kibbling mill, 3, Refining apparatus, 4, cleaning machine, 5, dehydrator, 6, mechanical arm, 7, Mechanical arm, 8, infrared light supply, 9, infrared camera, 10, computer operation interface, 11, band turbine.
Detailed description of the invention
Below in conjunction with the accompanying drawings the present invention is further described.
It is illustrated in figure 1 a kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus, including kibbling mill 2, fine grinding Equipment 3, clearing and drying device, infrared detection device and band turbine 11;
Wherein, described band turbine 11 is provided with transmission crawler belt, transmits crawler belt and is used for placing silico briquette 1;Transmit the side of crawler belt It is disposed with kibbling mill 2, Refining apparatus 3, clearing and drying device and infrared detection device along the traffic direction transmitting crawler belt;
Described clearing and drying device includes cleaning machine 4, dehydrator 5, is oppositely arranged on the both sides transmitting crawler belt;Described cleaning Machine 4 is water jet cleaning machine, and dehydrator 5 is bleed type dehydrator;
Described infrared detection device includes that mechanical arm 6,7, infrared light supply 8, infrared camera 9 and Computer Storage set Standby, its mid-infrared light source 8, infrared camera 9 are oppositely arranged on the both sides transmitting crawler belt, and infrared camera 9 is by data wire even Receive on described computer memory device;Two mechanical arms 6,7, for clamping the two ends of silico briquette 1, pass through Serve Motor Control Two mechanical arms 6,7 rotate.
The detailed description of the invention of the present invention is as follows:
Silico briquette 1 is rinsed by cleaning machine 4 and is dried by dehydrator 5 after corase grind and fine grinding, reaches to remove silico briquette 1 surface The purpose of impurity;Then two mechanical arms 6,7 of SERVO CONTROL rotate and make silico briquette 1 rotate 0 degree, 90 degree, 180 degree and 270 degree to see Examine the impurity situation in 1 four faces of silico briquette;The concrete image transmitting of infrared camera shooting is on computer memory device, through specialty It is presented on after software processes on computer operation interface 10, detection module the most about 30 seconds, and whole data can be stored in meter In calculation machine storage device.
The above is only the preferred embodiment of the present invention, it should be pointed out that: for the ordinary skill people of the art For Yuan, under the premise without departing from the principles of the invention, it is also possible to make some improvements and modifications, these improvements and modifications also should It is considered as protection scope of the present invention.

Claims (3)

1. a crystalline silicon blocks surface grinding and defects inspecting integrated apparatus, it is characterised in that include kibbling mill (2), fine grinding Equipment (3), clearing and drying device, infrared detection device and band turbine (11);
Wherein, described band turbine (11) is provided with transmission crawler belt, transmits crawler belt and is used for placing silico briquette (1);Transmit the edge, side of crawler belt The traffic direction transmission crawler belt is disposed with kibbling mill (2), Refining apparatus (3), clearing and drying device and infrared acquisition dress Put;
Described clearing and drying device includes cleaning machine (4), dehydrator (5), is oppositely arranged on the both sides transmitting crawler belt;
Described infrared detection device includes that two mechanical arms (6,7), infrared light supply (8), infrared camera (9) and computer are deposited Storage equipment, its mid-infrared light source (8), infrared camera (9) be oppositely arranged on transmit crawler belt both sides, infrared camera (9) lead to Cross data wire to be connected on described computer memory device;Two mechanical arms (6,7) are used for clamping the two ends of silico briquette (1), logical Cross two mechanical arms (6,7) of Serve Motor Control to rotate.
A kind of crystalline silicon blocks surface grinding the most according to claim 1 and defects inspecting integrated apparatus, it is characterised in that Described cleaning machine (4) is water jet cleaning machine.
A kind of crystalline silicon blocks surface grinding the most according to claim 1 and defects inspecting integrated apparatus, it is characterised in that Described dehydrator (5) is bleed type dehydrator.
CN201610716409.2A 2016-08-24 2016-08-24 A kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus Pending CN106124525A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610716409.2A CN106124525A (en) 2016-08-24 2016-08-24 A kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610716409.2A CN106124525A (en) 2016-08-24 2016-08-24 A kind of crystalline silicon blocks surface grinding and defects inspecting integrated apparatus

Publications (1)

Publication Number Publication Date
CN106124525A true CN106124525A (en) 2016-11-16

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108971073A (en) * 2018-10-15 2018-12-11 浙江克里蒂弗机器人科技有限公司 A kind of automated cleaning system comprising photographic device suitable for photovoltaic panel
CN109540897A (en) * 2018-12-29 2019-03-29 镇江奥博通信设备有限公司 A kind of fiber adapter detection device
CN113030181A (en) * 2019-12-24 2021-06-25 阿特斯光伏电力(洛阳)有限公司 Silicon rod impurity point position determination method
CN113751417A (en) * 2021-08-27 2021-12-07 苏州斯尔特微电子有限公司 Wafer grinding and cleaning equipment
CN117822090A (en) * 2022-09-29 2024-04-05 江苏协鑫硅材料科技发展有限公司 Purification detection method of impurity-containing silicon material, purification ingot and application of purification ingot

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CN201844980U (en) * 2010-08-31 2011-05-25 常州视觉龙机电设备有限公司 Automatic detection system of solar silicon wafer
CN202398542U (en) * 2011-12-21 2012-08-29 韩华新能源(启东)有限公司 Solar-energy original silicon chip full-automatic measurement and separation equipment
US20130081606A1 (en) * 2010-09-29 2013-04-04 Yang-Suh Kim Sawing apparatus of single crystal ingot
CN203011849U (en) * 2012-11-13 2013-06-19 上海太阳能工程技术研究中心有限公司 Silicon wafer defect detecting device
CN103592311A (en) * 2013-11-26 2014-02-19 英利集团有限公司 Infrared detection apparatus for detecting defects in silicon block, and detection method thereof
CN204248624U (en) * 2014-11-13 2015-04-08 东莞市建升压铸科技有限公司 Pipeline system numerical control environmental protection polishing machine
CN104807832A (en) * 2015-04-28 2015-07-29 华中科技大学无锡研究院 Automatic fine inspection production line of silicon ingot
CN205290610U (en) * 2015-12-31 2016-06-08 浙江华正新材料股份有限公司 A polisher for processing honeycomb panel
CN205958480U (en) * 2016-08-24 2017-02-15 镇江荣德新能源科技有限公司 Crystal silico briquette surface grinding and impurity detect integrated device

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201844980U (en) * 2010-08-31 2011-05-25 常州视觉龙机电设备有限公司 Automatic detection system of solar silicon wafer
US20130081606A1 (en) * 2010-09-29 2013-04-04 Yang-Suh Kim Sawing apparatus of single crystal ingot
CN202398542U (en) * 2011-12-21 2012-08-29 韩华新能源(启东)有限公司 Solar-energy original silicon chip full-automatic measurement and separation equipment
CN203011849U (en) * 2012-11-13 2013-06-19 上海太阳能工程技术研究中心有限公司 Silicon wafer defect detecting device
CN103592311A (en) * 2013-11-26 2014-02-19 英利集团有限公司 Infrared detection apparatus for detecting defects in silicon block, and detection method thereof
CN204248624U (en) * 2014-11-13 2015-04-08 东莞市建升压铸科技有限公司 Pipeline system numerical control environmental protection polishing machine
CN104807832A (en) * 2015-04-28 2015-07-29 华中科技大学无锡研究院 Automatic fine inspection production line of silicon ingot
CN205290610U (en) * 2015-12-31 2016-06-08 浙江华正新材料股份有限公司 A polisher for processing honeycomb panel
CN205958480U (en) * 2016-08-24 2017-02-15 镇江荣德新能源科技有限公司 Crystal silico briquette surface grinding and impurity detect integrated device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108971073A (en) * 2018-10-15 2018-12-11 浙江克里蒂弗机器人科技有限公司 A kind of automated cleaning system comprising photographic device suitable for photovoltaic panel
CN109540897A (en) * 2018-12-29 2019-03-29 镇江奥博通信设备有限公司 A kind of fiber adapter detection device
CN109540897B (en) * 2018-12-29 2024-04-02 镇江奥博通信设备有限公司 Optical fiber adapter detection device
CN113030181A (en) * 2019-12-24 2021-06-25 阿特斯光伏电力(洛阳)有限公司 Silicon rod impurity point position determination method
CN113751417A (en) * 2021-08-27 2021-12-07 苏州斯尔特微电子有限公司 Wafer grinding and cleaning equipment
CN117822090A (en) * 2022-09-29 2024-04-05 江苏协鑫硅材料科技发展有限公司 Purification detection method of impurity-containing silicon material, purification ingot and application of purification ingot

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Application publication date: 20161116