CN201315319Y - 一种多芯片3d堆叠封装结构 - Google Patents
一种多芯片3d堆叠封装结构 Download PDFInfo
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- CN201315319Y CN201315319Y CNU2008201551660U CN200820155166U CN201315319Y CN 201315319 Y CN201315319 Y CN 201315319Y CN U2008201551660 U CNU2008201551660 U CN U2008201551660U CN 200820155166 U CN200820155166 U CN 200820155166U CN 201315319 Y CN201315319 Y CN 201315319Y
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- H01—ELECTRIC ELEMENTS
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32135—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/32145—Disposition the layer connector connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being stacked
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
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- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
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- H01L2224/4809—Loop shape
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
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- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H01L2924/01—Chemical elements
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
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Abstract
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNU2008201551660U CN201315319Y (zh) | 2008-11-11 | 2008-11-11 | 一种多芯片3d堆叠封装结构 |
Applications Claiming Priority (1)
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CNU2008201551660U CN201315319Y (zh) | 2008-11-11 | 2008-11-11 | 一种多芯片3d堆叠封装结构 |
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CN201315319Y true CN201315319Y (zh) | 2009-09-23 |
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CNU2008201551660U Expired - Lifetime CN201315319Y (zh) | 2008-11-11 | 2008-11-11 | 一种多芯片3d堆叠封装结构 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012126374A1 (en) * | 2011-03-22 | 2012-09-27 | Nantong Fujitsu Microelectronics Co., Ltd. | 3d system-level packaging methods and structures |
CN102944709A (zh) * | 2011-08-16 | 2013-02-27 | 北京天中磊智能科技有限公司 | 多芯片系统级封装技术实现的电表模块结构及其封装方法 |
CN104795334A (zh) * | 2015-03-05 | 2015-07-22 | 浙江中控研究院有限公司 | 模块化封装的集成电路芯片及其制作方法 |
CN105893324A (zh) * | 2015-01-26 | 2016-08-24 | 超威半导体产品(中国)有限公司 | 一种多芯片及其制造方法 |
-
2008
- 2008-11-11 CN CNU2008201551660U patent/CN201315319Y/zh not_active Expired - Lifetime
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012126374A1 (en) * | 2011-03-22 | 2012-09-27 | Nantong Fujitsu Microelectronics Co., Ltd. | 3d system-level packaging methods and structures |
CN102944709A (zh) * | 2011-08-16 | 2013-02-27 | 北京天中磊智能科技有限公司 | 多芯片系统级封装技术实现的电表模块结构及其封装方法 |
CN105893324A (zh) * | 2015-01-26 | 2016-08-24 | 超威半导体产品(中国)有限公司 | 一种多芯片及其制造方法 |
CN104795334A (zh) * | 2015-03-05 | 2015-07-22 | 浙江中控研究院有限公司 | 模块化封装的集成电路芯片及其制作方法 |
CN104795334B (zh) * | 2015-03-05 | 2018-01-05 | 浙江中控研究院有限公司 | 模块化封装的集成电路芯片及其制作方法 |
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Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: SHANGHAI WEIZHOU MICROELECTRONIC TECHNOLOGY CO., L Free format text: FORMER OWNER: HUAYA MICROELECTRONICS, INC. Effective date: 20121108 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20121108 Address after: 201203, Shanghai 690 Zhangjiang Road, Pudong No. 5 Building No. 2 floor Patentee after: SHANGHAI WEI ZHOU MICROELECTRONICS TECHNOLOGY CO., LTD. Address before: 201203 Shanghai City Songtao road Zhangjiang hi tech Park No. 696 Lenovo 4 storey building Patentee before: Huaya Microelectronics (Shanghai) Co., Ltd. |
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CX01 | Expiry of patent term |
Granted publication date: 20090923 |
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CX01 | Expiry of patent term |