CN1982060A - 单张膜检查装置及单张膜检查方法 - Google Patents

单张膜检查装置及单张膜检查方法 Download PDF

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Publication number
CN1982060A
CN1982060A CNA2006100639129A CN200610063912A CN1982060A CN 1982060 A CN1982060 A CN 1982060A CN A2006100639129 A CNA2006100639129 A CN A2006100639129A CN 200610063912 A CN200610063912 A CN 200610063912A CN 1982060 A CN1982060 A CN 1982060A
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CN
China
Prior art keywords
individual film
inspection
border
workpiece
film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2006100639129A
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English (en)
Chinese (zh)
Inventor
鹫崎一郎
筱塚淳彦
福田修
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
Original Assignee
Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Publication of CN1982060A publication Critical patent/CN1982060A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3305—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts detector fixed; source and body moving

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Textile Engineering (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
CNA2006100639129A 2005-11-21 2006-11-15 单张膜检查装置及单张膜检查方法 Pending CN1982060A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2005336247 2005-11-21
JP2005336247A JP4755888B2 (ja) 2005-11-21 2005-11-21 枚葉フィルム検査装置及び枚葉フィルム検査方法

Publications (1)

Publication Number Publication Date
CN1982060A true CN1982060A (zh) 2007-06-20

Family

ID=38165032

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2006100639129A Pending CN1982060A (zh) 2005-11-21 2006-11-15 单张膜检查装置及单张膜检查方法

Country Status (4)

Country Link
JP (1) JP4755888B2 (ja)
KR (1) KR20070053618A (ja)
CN (1) CN1982060A (ja)
TW (1) TWI435069B (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102630299A (zh) * 2009-10-30 2012-08-08 住友化学株式会社 缺陷检查用图像处理装置和缺陷检查用图像处理方法
CN114322773A (zh) * 2021-12-31 2022-04-12 杭州电子科技大学 一种用于长条薄片零件视觉检测的装置及其检测方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6255186B2 (ja) * 2013-08-07 2017-12-27 日東電工株式会社 光学部材の検査方法、光学製品の製造方法、及び、光学部材の検査装置
KR101733018B1 (ko) * 2015-02-25 2017-05-24 동우 화인켐 주식회사 광학 필름의 불량 검출 장치 및 방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06288927A (ja) * 1993-03-30 1994-10-18 Sekisui Chem Co Ltd 画像処理検査方法
JP3330014B2 (ja) * 1996-04-23 2002-09-30 松下電工株式会社 外観検査方法
JPH11231129A (ja) * 1997-11-17 1999-08-27 Sumitomo Chem Co Ltd 光学フィルム積層中間体およびその製造方法ならびに光学フィルム積層チップの製造方法
JP2004333446A (ja) * 2003-05-12 2004-11-25 Matsushita Electric Ind Co Ltd 外観検査方法、外観検査装置、そのプログラム及びその記録媒体
JP2005241361A (ja) * 2004-02-25 2005-09-08 Jfe Steel Kk 板状被測定物の形状測定方法及び形状測定装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102630299A (zh) * 2009-10-30 2012-08-08 住友化学株式会社 缺陷检查用图像处理装置和缺陷检查用图像处理方法
CN102630299B (zh) * 2009-10-30 2014-07-30 住友化学株式会社 缺陷检查用图像处理装置和缺陷检查用图像处理方法
CN114322773A (zh) * 2021-12-31 2022-04-12 杭州电子科技大学 一种用于长条薄片零件视觉检测的装置及其检测方法

Also Published As

Publication number Publication date
KR20070053618A (ko) 2007-05-25
JP4755888B2 (ja) 2011-08-24
TW200736597A (en) 2007-10-01
JP2007139666A (ja) 2007-06-07
TWI435069B (zh) 2014-04-21

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Open date: 20070620