CN1982060A - Apparatus for inspecting sheetfed film and method for inspecting sheetfed film - Google Patents
Apparatus for inspecting sheetfed film and method for inspecting sheetfed film Download PDFInfo
- Publication number
- CN1982060A CN1982060A CNA2006100639129A CN200610063912A CN1982060A CN 1982060 A CN1982060 A CN 1982060A CN A2006100639129 A CNA2006100639129 A CN A2006100639129A CN 200610063912 A CN200610063912 A CN 200610063912A CN 1982060 A CN1982060 A CN 1982060A
- Authority
- CN
- China
- Prior art keywords
- individual film
- inspection
- border
- workpiece
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3305—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts detector fixed; source and body moving
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
Abstract
A sheetfed film apparatus comprises a roller for delivering a sheetfed film cut down along a delivering direction Y of Figure 1, a CCD line sensor for acquiring the image data of the sheetfed film from a defined region, a checking and treating part including an image treating part as a checking region take-off mechanism for detecting the boundaty of the sheetfed film and background based on the image data acquired from the CCD line sensor and taking out a checking effective region of the sheetfed film, and an defect inspecting treating part, which treat defects inspected in the effective region taken off from the image treating part. The image treating part takes off data of the sheetfed film from the acquired the image data, then determines an effective region as a checking object, at last performs defect inspecting, size inspecting, and the like to the effective region. Removing the workpiece depending on data acquired from the CCD line sensor, taking out the boundary of the inspected object, known as the sheetfed film cut down and automaticly identificating, then defect inspecting, size inspecting, and the like to the inner of the identificated region are implemented.
Description
Technical field
The present invention relates to be used to take out the defect inspection zone of individual film (sheet fed film) and individual film detection apparatus and the method thereof that defect inspection is handled carried out in this zone.
Background technology
Usually, the sheet-like formed body of thermoplastic resin (below be sometimes referred to as resin sheet) is when being shaped, the surface is applied in the processing of giving smoothness or glossiness to the thermoplastic resin of extruding from extruder by clearance between roll, Yi Bian by guide roller it is cooled off lead (with reference to patent documentation 1) on one side on carrying roller then.And, the resin sheet that so is shaped is carried out cutting and makes the film (hereinafter referred to as individual film) (with reference to patent documentation 2) that is processed into individual shape.For example, bloomings such as polarizing coating, phase retardation film are made by the processing resin sheet usually, and it is cut into individual film, are used for liquid crystal indicator etc.
In individual film manufacture process,, need carry out defect inspections such as film wound, spot, quality or carry out dimensional gaughing etc. as the operation in early stage that is cut into individual film by resin sheet.This defect inspection is undertaken by manpower sometimes, but has improved the requirement of automation in recent years.
Under the situation of the resin sheet that is web-like of cutting not, the resin sheet that can will batch on guide roller is on one side derived continuously, adopt undesirable parts such as inspection bubble, spot, foreign matter such as general transmitted light mensuration on one side, but, for individual film that is cut into various sizes and shape according to pairing product needed, adopting same inspection gimmick is impossible make correct defect inspection.For this reason, for example in patent documentation 3, disclose so a kind of technology, promptly adopted positioner that individual film is positioned assigned position, and adopted defect detector that the printing state that is positioned is differentiated.
Patent documentation 1: the spy opens the 2002-120249 communique
Patent documentation 2: the spy opens the 2005-59593 communique
Patent documentation 3: the spy opens the 2001-315309 communique
As mentioned above, the same with the inspection product of sheet-like article, be cut into individual film of wide variety of sizes and shape, even measure when for example on conveyer belt etc., transmitting in turn side by side continuously, owing to check that object is that every of plates are all discontinuous, exert an influence so the border of this individual film can be handled defect inspection.In other words, the border that can not distinguish plates is detected as the situation and the actual situation that has defective on plates of " defective ".
In addition, in patent documentation 3, what propose is a kind ofly individual film to be configured in the regulation zone that conforms with individual size, and the technology of this zone being carried out processing such as defect testing, but, when individual film stipulated that relatively frame produces skew, fault location can not detect with correct position, and the mechanism that is used to locate is complicated.In addition, individual film exists not only that to be cut into all interior angles be 90 ° correct tetragonal situation, but also has the situation that is cut into the oblique angle product that the angle as parallelogram tilts according to institute's useful articles.In situation like this, the problem that existence must correspondingly design again to the inspection area.
Summary of the invention
The present invention is based on the technical problem that exists in the prior art and propose, its purpose is, a kind of individual film detection apparatus and method thereof are provided, can will check that object is promptly taken out by the border of individual film of cutting and identification automatically from the inspection area, and the intra-zone that identifies is carried out dimensional gaughing, defect inspection etc.
In order to solve the problems of the technologies described above, individual film detection apparatus of the present invention has: the film transport mechanism, and its continuous conveyance on prescribed direction is cut into individual film of prescribed level; Image Acquisition mechanism, it obtains the view data of individual film that contains the conveyance of film transport mechanism institute; The inspection area unloading device, it detects the border of individual film and background according to this view data, takes out the inspection effective coverage in individual film; With defect inspection mechanism, its defect inspection of carrying out in the selected effective coverage of inspection area unloading device is handled, and, detect the border of individual film and background according to the view data that obtains, and then the taking-up effective coverage, the defect inspection of carrying out in the effective coverage is handled.
In individual film detection apparatus of the present invention, the inspection area unloading device is at image data memory during on a plurality of border, can distinguish to be different inspection effective coverages.At this moment, the effective coverage of defect inspection mechanism after to this difference carried out defect inspection respectively and handled.
In addition, the inspection area unloading device can have the image processor structure that view data is divided into image processing unit.At this moment, take out inspection effective coverage in individual film by each the unit image after cutting apart.And the inspection area unloading device is at the unit image memory during on a plurality of border, distinguishes to be different inspection effective coverages.Defect inspection mechanism carries out the effective coverage after to this difference defect inspection respectively and handles.
In addition, at individual film roughly during parallelogram, it is configured to individual film and conveyance direction almost parallel on one side, in individual film detection apparatus, the inspection area unloading device detects the border of individual film and background from the frame end of view data to the summit at diagonal angle, when detecting the border, at this test point, the datum line of stipulating is set with angle ground in the angle that is become with the tetragonal one side of opposing parallel, parallel mobile this datum line on the conveyance direction, and then detect the border.When an end of datum line arrives the one side in regulation zone,, and then detect the border on one side along this parallel moving.
In addition, at individual film roughly during parallelogram, method as the border on the limit that is parallel to the conveyance direction of detecting individual film, the inspection area unloading device detects the border of individual film and background to the summit at diagonal angle from an end of stipulating the zone, when detecting the border,, set and parallel on one side datum line at this test point, move this datum line in direction, and then detect the border perpendicular to the conveyance direction.
In addition, individual film inspection method of the present invention has: by on prescribed direction continuously conveyance be cut into the operation of conveyer belt conveyance film of individual film of prescribed level; Obtain the Image Acquisition operation of the view data of individual film that contains conveyance; Detect the border of individual film and background according to view data, take out the inspection area of the inspection effective coverage in individual film and take out operation; Carry out the inspection area and take out the defect inspection operation that the defect inspection in the effective coverage of selecting in the operation is handled, and, detect the border of individual film and background according to the view data that obtains, and then take out the effective coverage, the defect inspection of carrying out in the effective coverage is handled.
In operation is taken out in the inspection area, at image data memory during, can distinguish and be different inspection effective coverages on a plurality of border.In the defect inspection operation, the effective coverage after the difference is carried out defect inspection respectively handle.
In operation is taken out in the inspection area, at image data memory during, can distinguish and be different inspection effective coverages on a plurality of border.In the defect inspection operation, the effective coverage after this difference is carried out defect inspection respectively handle.In addition, take out in the operation in the inspection area, also the view data in regulation zone can be divided into image and handle unit, each the unit image after cutting apart by this takes out the inspection effective coverage in individual film.
In operation is taken out in the inspection area, at the unit image memory during, distinguish and be different inspection effective coverages on a plurality of border.At this moment, in the defect inspection operation, the effective coverage after this difference is carried out defect inspection respectively handle.
At individual film roughly during parallelogram, take out in the operation in the inspection area, detect the border of individual film and background to the summit at diagonal angle from an end of stipulating the zone, when detecting the border, at this test point, datum line is set with angle ground in the angle that is become with the tetragonal one side of opposing parallel, parallel mobile this datum line on the conveyance direction, and then detect the border.Take out in the operation in the inspection area, when an end of datum line arrives the one side in regulation zone,, and then detect the border on one side along this parallel moving.
In addition, at individual film roughly during parallelogram, method as the border on the limit that is parallel to the conveyance direction of detecting individual film, in operation is taken out in the inspection area, detect the border of individual film and background from an end of stipulating the zone to the summit at diagonal angle, when detecting the border, at this test point, set and parallel on one side datum line, move this datum line in direction, and then detect the border perpendicular to the conveyance direction.
(invention effect)
According to the present invention, have: the film transport mechanism, its continuous conveyance on prescribed direction is cut into individual film of prescribed level; Image Acquisition mechanism, it obtains the view data in the regulation zone on the film transport mechanism that contains individual film; The inspection area unloading device, its regional according to the rules view data detects the border of individual film and background, takes out the inspection effective coverage in individual film; With defect inspection mechanism, its defect inspection of carrying out in the selected effective coverage of inspection area unloading device is handled, and, detect the border of individual film and background according to the view data that obtains, and then the taking-up effective coverage, the defect inspection of carrying out in the effective coverage is handled, thus, can from the inspection area, take out and check that object promptly by the border of individual film of cutting and identification automatically, carries out dimensional gaughing, defect inspection etc. to the intra-zone of identification.
Description of drawings
Fig. 1 is the cutaway view of the major part of individual film detection apparatus of illustrating as concrete example of the present invention.
Fig. 2 is the structure chart of the inspection handling part in above-mentioned individual film detection apparatus of explanation.
Fig. 3 be explanation be cut into roughly that individual film of parallelogram is held in the outlet roller and with predetermined distance on conveyance direction Y by the schematic diagram of the state of conveyance.
Fig. 4 is that above-mentioned individual film detection apparatus of explanation takes out the flow chart that the taking-up of workpiece is handled according to obtaining data.
The skeleton diagram that has possibility of the workpiece part that is contained in Fig. 5 to be explanation made individual film of the parallelogram of institute's conveyance on the Y direction by the ccd line sensor shooting 1 frame.
Fig. 6 (a) expression contains the schematic diagram of the frame of workpiece left-half.(b) expression contains the schematic diagram of the frame of workpiece right half part.(c) there is the schematic diagram of the frame on a plurality of borders in expression.
Fig. 7 illustrates that Work inspection device and workpiece in individual film detection apparatus that illustrates as concrete example of the present invention intercept the flow chart of handling.
Fig. 8 illustrates that Work inspection device and workpiece in individual film detection apparatus that illustrates as concrete example of the present invention intercept the flow chart of handling.
Fig. 9 is the schematic diagram that illustrates that the workpiece intercepting in individual film detection apparatus that illustrates as concrete example of the present invention is handled.
Figure 10 is the schematic diagram that illustrates that the workpiece intercepting in individual film detection apparatus that illustrates as concrete example of the present invention is handled.
Figure 11 illustrates the skeleton diagram of handling the workpiece profile that intercepts in individual film detection apparatus that illustrates as concrete example of the present invention by the intercepting of the workpiece shown in Fig. 7 and Fig. 8.
Figure 12 is the flow chart that explanation angular deflection revisal is handled.
Figure 13 is the skeleton diagram that explanation angular deflection revisal is handled.
Figure 14 is the skeleton diagram that explanation angular deflection revisal is handled.
Figure 15 is the skeleton diagram that explanation angular deflection revisal is handled.
Figure 16 is the processing of effective inspection area is determined in explanation from the workpiece of intercepting a skeleton diagram.
Figure 17 is that explanation contains the frame of workpiece and by the schematic diagram of the detected example of ccd line sensor.
Figure 18 is explanation frame F1
LInterior detected part workpiece W
1Schematic diagram.
Figure 19 is that explanation is by part workpiece W
1The parallelogram P that imagination generates
1Schematic diagram.
Figure 20 is that explanation is by part workpiece W
2The parallelogram P that imagination generates
2Schematic diagram.
Figure 21 is declaratives workpiece W
3Self can be used as parallelogram P
3The time schematic diagram.
Figure 22 is that explanation is by part workpiece W
4The parallelogram P that imagination generates
4Schematic diagram.
Figure 23 is that whether identical the explanation judegment part divide the schematic diagram of workpiece processing.
Figure 24 is that whether identical the explanation judegment part divide the schematic diagram of workpiece processing.
Figure 25 is the flow chart that the key diagram picture synthesizes the processing of in the portion detected workpiece being synthesized as same workpiece.
Figure 26 is that explanation is by part workpiece W
4The parallelogram P that generates
4And be the schematic diagram of the situation of different workpiece by the parallelogram P` that part workpiece W` generates.
Among the figure: individual film detection apparatus of 1-; Individual film of 2-; 11a, 11b, 12a, 12b-outlet roller; 13a, 13b, 14a, 14b-accept roller; The 15-CCD line sensor; The 16-light source; 17-checks handling part; 18a, 18b, 19a, 19b, 20a, 20b-film detecting sensor.
The specific embodiment
Below, be described in detail with reference to accompanying drawing individual film detection apparatus the expression embodiment of the present invention.Shown in Fig. 1 from the cutaway view of the major part of individual film detection apparatus 1 of transverse observation.
Individual film detection apparatus 1 is individual film that is cut into prescribed level in the prescribed direction conveyance, in this conveyance process, face is made a video recording, automatically take out the zone of carrying out defect inspection in the image that obtains from shooting, the part that promptly is equivalent to individual film, and the testing fixture that defect inspection is carried out in the zone of taking out.
Thermoplastic resin applicable to present embodiment for example can be methacryl resin, methyl methacrylate-styrene copolymer (MS resin), polyethylene (PE), polypropylene polyolefin such as (PP), Merlon (PC), polyvinyl chloride (PVC), polystyrene (PS), polyvinyl alcohol (PVA), triacetyl cellulose resin (TAC) etc., and individual film refers to can be continuously extruded with above-mentioned thermoplastic resin and sheet-like formed type that be shaped is cut into the film of individual shape of regulation shape.Sheet-like formed body is the single-layer sheet of these thermoplastic resins or lamination sheet etc.
And individual film in this concrete example is cut into the almost parallel quadrangle that each summit is the regulation angle.In the following explanation, this individual film is called workpiece (work).
The concrete formation of individual film detection apparatus 1 is to have: as outlet roller 11a, 11b, 12a, the 12b of film transport mechanism, its conveyance direction Y conveyance mounting along Fig. 1 has the conveyer belt etc. of individual film 2 of the prescribed level of being cut into; And accept roller 13a, 13b, 14a, 14b.At outlet roller 12a with accept between the roller 13a, be provided with the Image Acquisition mechanism that is used to obtain by the view data in the regulation zone of individual film of conveyance.In this concrete example, adopt ccd line sensor 15 as Image Acquisition mechanism, but, except ccd line sensor, also can use CCD area sensor etc. as sensor.In addition, clip by the ccd line sensor under the state of individual film of conveyance 15 relatively to the position on, be provided with and be used to send the light source 16 of checking light.In this concrete example, with relative conveyance direction Y with ccd line sensor 15 during as the border nearby roller as outlet roller, with after roller be for the convenience on defining as accepting roller, and be not limited to this.Conveyance speed is about 2m～12m/ minute at the Y direction setting in this concrete example.
In addition, individual film detection apparatus 1 possesses the handling part 17 of inspection, this inspection handling part 17 possesses: as the image processing part of inspection area unloading device, its view data of being obtained according to ccd line sensor 15 detects the border of individual film and background, takes out the inspection effective coverage in individual film; And the defect inspection handling part, the defect inspection in its effective coverage of carrying out being taken out by image processing part is handled.
In addition, individual film detection apparatus 1 is at outlet roller and accept suitably to be provided with film detecting sensor 18a, 18b, 19a, 19b, 20a, 20b in the interval of roller, constitutes the structure that can detect by the position of individual film of conveyance etc.
Each structure to above-mentioned individual film detection apparatus 1 specifically describes below.The ccd line sensor 15 that uses in this concrete example is at the width line sensor about 5000 pixels side by side, the incident light by the super close-up lens of 55mm.Although not shown among Fig. 1, in this concrete example, corresponding with the width length of individual film by 2 ccd line sensors 15 of configuration arranged side by side.
As light source 16,, then be not particularly limited if adopt metal-halide lamp, halogen to transmit the light source that lamp, fluorescent lamp etc. send the light that can not influence individual film composition and character.
Inspection light from light source 16 sees through in individual film and is detected by ccd line sensor 15, is sent to as view data then and checks handling part 17.
Then, with Fig. 2 the structure of checking handling part 17 is described.Check that handling part 17 has: interface portion 171, it is used for importing the view data that ccd line sensor 15 obtains; Memory driver 172, it is stored in to read in the memory 173 or from memory to the view data with input and controls; The image processing part 174 of working as the inspection area unloading device, its according to ccd line sensor 15 obtained be stored in view data in the memory 173, detect the border of individual film and background, and take out the inspection effective coverage in individual film; Defect inspection handling part 175, the defect inspection in its effective coverage of carrying out being taken out by image processing part 174 is handled; As the synthetic portion 176 of the image of combination mechanism, it synthesizes the inspection effective coverage of taking out in the constituent parts image that is divided into image processing unit in the defect inspection handling part, individual film of a slice is carried out synthesizing again, and these each component parts are all totally controlled by control part 177.In addition, check that handling part 17 is except that said structure, can also have the guidance panel 178 that carries out input operation for the user, be used to show the information relevant and the display device driver 179 and the display device 180 of check result, and then have not shown sound effect efferent etc. with inspection.
Below, the processing of the part of the taking-up workpiece that carries out in the image processing part 174, the processing that detects the defective in the workpiece are described.
Individual film of institute's conveyance by be positioned at ccd line sensor 15 under photolineation.This state shown in Figure 3.Be cut into shown in Fig. 3 that tetragonal individual film 21,22,23 of almost parallel is held in the outlet roller and with predetermined distance on conveyance direction Y by the state of conveyance.In addition, in this embodiment, by preparation ccd line sensor 15a, 15b and with they configurations arranged side by side, thus the effective field of view zone of guaranteeing the width of corresponding individual film.In addition, for the convenience that illustrates, being cut into roughly, individual film of parallelogram is transmitted under the state of its 1 group of opposite side and conveyance direction Y almost parallel.At this moment, the hypotenuse of opposite side is called side cut relatively.In addition, the front of individual film that will transmit on conveyance direction Y is as the place ahead, and the summit at diagonal angle that will be positioned at the acute angle of front is defined as summit, the place ahead.
Handle processing before as defect inspection, image processing part 174 compares the briliancy of the view data of being obtained by ccd line sensor 15, with the background outside difference workpiece part and the workpiece, and only takes out the zone that the inspection object promptly is equivalent to individual film.The detection of workpiece can be adopted existing universal methods such as transmitted light mensuration.The detailed description of workpiece sensing as described later.
Transmit individual film 2 at conveyance direction Y shown in Figure 3, and by the ccd line sensor 15a that is labeled as test point, the photolineation of 15b.Through after specified time limit, the image data storage of individual film 21,22,23 is in memory 173.In addition, when taking out the workpiece part, image processing part 174 will comprise that a series of view data of a plurality of individual membrane portions that are temporary in the memory 173 is divided into image and handles unit, and by each unit image of cutting apart the inspection effective coverage in individual film is taken out, defect processing is carried out in this zone.Then, repeat this processing by each specified time limit (specified data amount).In addition, in this concrete example, should handle unit and be called frame (frame).In addition, in present embodiment shown in Figure 2, although be to be connected with ccd line sensor 15a, 15b by interface portion 171,, also can be the structure that relative each ccd line sensor is provided with interface portion, memory, memory driver respectively.
Then, as shown in Figure 4, be illustrated in the image processing part 174, take out the summary of the taking-up processing of workpiece according to the data that CCD line sensing 15 is obtained.Image processing part 174 as step S1, is divided into the view data in the memory 173 the frame unit of regulation by control part 177 controls.At this moment, information that frame is suitable with which part of original image on earth is stored in the memory etc. of operation usefulness in advance.In addition, as step S2, detect the view data that is equivalent to the workpiece part that frame contains, and will preserve with the information (so-called workpiece information or intercepting message) of the workpiece part correlation that from frame, intercepts.In this concrete example, owing to dispose 2 ccd line sensors 15 side by side, be contained in the information in the zone of which support in 2 sensors so also be saved in the end.
Below, with reference to the flow chart of Fig. 4 and Fig. 5 the detection of workpiece, workpiece taking-up etc. are described in detail.Fig. 5 represents a certain frame F that individual film of the parallelogram of institute's conveyance on the drawing Y direction is intercepted from the area of visual field that (for example 15a) of ccd line sensor 15 made a video recording
LIn the various figures of the workpiece part that contained.The dotted line L of Fig. 5 represents that one side of workpiece 21 is a boundary line of workpiece and background.As the possibility that exists of the workpiece area in the frame, can be divided into several classes of Fig. 5 (a)～(e).That is, the summit, the place ahead of workpiece be contained in slightly situation in the frame (Fig. 5 a), workpiece 21 is contained in the frame substantially and exist the situation (Fig. 5 b) on the border of the place ahead hypotenuse and background, situation (Fig. 5 c), workpiece 21 that frame is occupied by the part of workpiece 21 to be contained in the frame substantially and exist the border of rear hypotenuse and background situation (Fig. 5 d), and the summit, rear be contained in situation (Fig. 5 e) in the frame slightly.
Image processing part 174 is checked the briliancy of the each point in the frame workpiece to the angular direction, and the point that will have luminance variations at first is as test point T.Image processing part 174 can be checked the point on the diagonal that the summit from the summit of frame to the diagonal angle is linked to be, if but a side on the workpiece border of institute's conveyance drops within the error range on dotted line L, then can also in advance the some workpiece border or boundary vicinity that is positioned at frame Y direction be determined as parameter.In other words, shown in Fig. 6 (a), from be not on the frame end on frame summit determined point (for example the n * n point) begin to check that each point is checked on the summit up to the diagonal angle in order.In addition, when checking the frame FR of right half part, shown in Fig. 6 (b), along the angular direction is begun check that the some place that determines finishes to check on the frame end that is not the frame summit from the frame summit.Image processing part 174 is still proceeded to check after taking out test point T, carries out the taking-up processing of the test point of other workpiece, determined point on the frame summit at diagonal angle or frame end.Shown in Fig. 6 (c), exist a plurality of frame boundaries and repeated detection to go out under the situation of luminance variations, after the frame boundaries T1 of the rear hypotenuse that detects workpiece 22, then detect frame boundaries T2, and the frame boundaries T3 of the rear hypotenuse of workpiece 21 of the place ahead hypotenuse of workpiece 22.
As described in this concrete example, workpiece is roughly during parallelogram, as the image processing part 174 of inspection area unloading device effect determined border from background to the summit at diagonal angle that detect workpiece and from frame, when detecting the border, this test point (being designated as T), set the datum line (be called BL) parallel with the hypotenuse of parallelogram.As shown in Figure 9, with this datum line BL by each point, as BL1, BL2, BL3 ... shown in, move and detect luminance variations and detect the workpiece border along the VB direction is parallel.Below this flow process is described.
Image processing part 174 is checked the each point on the scan line in order in step S11, this scan line links frame summit or is not determined point on the frame end on frame summit, and the summit at diagonal angle or the arbitrfary point on non-summit.Perhaps check in order on the scan line that fixed point connects to really on the frame end on frame summit and the non-summit that is positioned at the diagonal angle.In step S12, whether 174 pairs of image processing parts detect the border of workpiece is made not, if do not take out test point, then in step S13, is judged as no workpiece in this frame and end process.In step S12, when detecting the test point T on workpiece border, as step S14, image processing part 174 is set test point T.In addition, in step S15, obtain the some Tf before the test point T that is positioned on the scan line, the brightness value of some Tb nearby, in step S16, they are compared.In step S16, when nearby the brightness value of Tb was big, image processing part 174 will contain test point T in step S17 VA vector was defined as datum line BL at test point.Datum line BL also can be BM line itself.Then, in step S18, detect the workpiece border to the+parallel moving reference line of VB direction BL and by every line from test point.If detect the workpiece border in step S19, then in step S20, the VA vector that will contain detected workpiece border is defined as the BP line.If in step S19, do not detect the workpiece border, then in step S21, the frame frame is defined as the BP line.
Next, in the step S22 of Fig. 8 of the A of continuity among Fig. 7, to-VA direction each point is checked brightness value successively from test point T.At this, VB vector that will be by test point T is as datum line BL`, and this datum line BL` is detected luminance variations to-VA direction every parallel moving of point on the BM line.When in step S23, detecting the workpiece border of VA direction, in step S24, will be defined as the AM line by the VB vector (datum line BL`) of this test point T`.On the other hand, when in step S23, not detecting the workpiece border of VA direction, in step S25, the frame frame is defined as the AM line.Then, in step S26,,, press each point on the BM line, as BL` with determined datum line BL` among the step S24 from test point T` (+VA direction) round about
1, BL`
2, BL`
3... shown in, move in that+VA direction is parallel, and detect luminance variations and detect the workpiece border.In step S27, detect+during the workpiece border of VA direction, in step S28, will be defined as the AP line by the VB vector (datum line BL`) of this test point.In addition, in step S27, on the BM line, do not detect+during the workpiece border of VA direction, in step S29, the frame frame is defined as the AP line.
On the other hand, for image processing part 174, in step S16, when the brightness value of the point Tf before the test point T on scan line is big, enter step S30, the VA vector that will contain this test point T is defined as the BM line.Then, in step S31, the BM line parallel is moved and detect the workpiece border to-VB direction by every line from test point.In step S32, if detect the workpiece border, then in step S33, the VB vector that will contain the workpiece border is defined as the BM line.In addition, if in step S32, do not detect the workpiece border, then in step S34, the frame frame is defined as the BM line.Enter step S22 operation afterwards below.
As mentioned above, image processing part 174 can be handled and workpiece area in the temporary detecting frame according to the intercepting of the workpiece that specifically illustrates among Fig. 7, Fig. 8.Then, as the processing of the step S3 shown in Fig. 4, the correct intercepting of image processing part 174 workpiece area, and in definite workpiece area as the effective coverage of checking object.According to the information of the workpiece profile that intercepts roughly by the intercepting of the workpiece shown in Fig. 7, Fig. 8 processing, further try to achieve the [of correct workpiece trim line.With reference to Figure 11 this edge calculations is described below.
In Figure 11, illustrate in the frame F through above-mentioned processing and each limit of definite AP line, AM line, BP line, BM line as the workpiece part W on border.At this moment, from the enterprising line scanning of some direction laterally of the stated number inboard of workpiece part W and correctly measure the workpiece border and calculate the position and the angle on each limit.As required AP line, AM line, BP line, BM line are revised.
An example of the processing of revisal angular deflection is shown below.After adopting the illustrated execution of Fig. 7 and Fig. 8 workpiece intercepting processing substantially,, correctly try to achieve the processing of the [of trim line for the revisal angular deflection.Adopt Figure 12 to Figure 15 to describe to this.The zone of the left-half FL of the frame that the ccd line sensor 15a on the left of Figure 13, Figure 14, Figure 15 illustrate and be positioned at is detected.Solid line among the figure is represented each limit of the workpiece that is detected, and dotted line is represented actual workpiece border.
The flow chart that Figure 12 handles for the angular deflection revisal.In step S41, image processing part 174 is at frame F
LIn the interior detected workpiece area, determine any 2 some BP1, the BP2 that separate at the width of workpiece as far as possible.In step S42, these 2 points are scanned each point to the workpiece outside (direction of arrow of Figure 13) in turn as scan start point and from this scan start point.In step S43, differentiate whether detecting luminance variations, by from 2 points to the scanning in the workpiece outside and when BP`1, BP`2 detect luminance variations, in step S44, carry out revisal with detecting the test point BP1 of luminance variations and line that BP2 connects to as correct boundary line, to frame F
LIn detected other boundary lines also carry out identical revisal, adopt above-mentioned processing, revisal is carried out on the workpiece border of the cardinal principle of trying to achieve.
Processing according to this Figure 12, non-angular skew ground mounting individual film on conveyer belt, when perhaps there is a small amount of angular deflection in individual film that blocks with predetermined crop angle, by any 2 points at two frames of the width of the workpiece part that is contained near frame, scan luminance variations laterally from the workpiece inboard, can try to achieve the correct border of workpiece.In addition, by correctly trying to achieve this one side, based on the size of predefined individual film, even also can obtain correct position relation and angle for each limit of detected other in the workpiece.
On the other hand, as shown in figure 14, under individual film on the conveyer belt obviously is displaced to situation more than the angular deflection of allowing, any 2 points at two frames of the width of the workpiece part that is contained near frame, when luminance variations is scanned laterally in the workpiece inboard, crop angle according to predefined individual film, even the starting point of scanning is set in the inboard of detected workpiece, also exist initial point position to be positioned at the outside of actual workpiece boundary position, or actual workpiece boundary position is positioned at the situation in the outside of frame.At this moment, in step S43, can not carry out correct calculating even scan luminance variations to the workpiece outside from any 2.At this moment, in step S45, scan start point moved near width of the workpiece direction (Figure 15 arrow A) or in the inside of workpiece area (Figure 15 arrow B) with ormal weight form new scan start point.Then,, repeat the later step of step S42, even the mounting angle of workpiece takes place also can correctly obtain the border of the reality on the scan line under the situation of skew significantly thus up to till finding the border on the scan line.
The AP line, AM line, BP line, the BM line that obtain by above processing are the lines of correctly representing the workpiece part in the frame.And, carry out from the workpiece area of this intercepting, removing further according to the processing of the part outside the not inspection areas specified, shown in Figure 16 such as user's setting, determine effective inspection area (in the dotted line of Figure 16).At last, the synthetic portion 176 of image carries out frame management and same panel (panel) judgement.Each frame is carried out above a series of processing and carries out the real time parsing processing, the inspection effective coverage of being taken out in each frame is partly synthesized at same workpiece.
Next, an example to the synthetic processing in the synthetic portion 176 of image describes.The synthetic portion 176 of image is received in the workpiece information (intercepting message) of being preserved among the step S1, and based on the view data of this workpiece information basis from synthetic individual film of view data of the detected workpiece of each frame.In this concrete example,,, be detected as 2 view data roughly being cut apart at width so a workpiece has a part of repeat region owing to dispose 2 ccd line sensor 15a, 15b side by side.Therefore, need differentiation whether will handle as same frame (or same workpiece) by the data and the workpiece information (intercepting message) of the detected frame of each sensor difference.
The frame and the detection of adopting ccd line sensor 15 to carry out that contains workpiece shown in Figure 17.In Figure 17, schematically illustrate by ccd line sensor 15a, 15b detects in order by the state of individual film of conveyance, in Figure 17, the detected frame F1 with width ma by ccd line sensor 15a is shown
L, with frame F1
LHas the repetition width of regulation and by the detected frame F1 of ccd line sensor 15b with width mb
R, at conveyance direction and frame F1
LThe frame F2 that has the repetition width of regulation and be detected
L, at conveyance direction and frame F1
RThe frame F2 that has regulation repetition width and be detected
R, the frame F3 that similarly is detected
L, frame F3
RThe conveyance direction is from the direction of paper lower limb to top edge.Therefore, according to frame F1
L, F1
R, follow frame F2
L, F2
R, further frame F3
L, F3
ROrder photography and be detected.
Detecting a certain workpiece from frame F1 across frame F2 as shown in figure 17, by ccd line sensor 15a, 15b respectively about when detecting separately, in step S1, as the synthetic processing of handling in early stage, from the part imagination generation parallelogram of the detected workpiece of the processing that comes from frame with Figure 13～Figure 15 explanation.As shown in figure 18, at frame F1
LThe part of interior workpiece (being called the part workpiece) W
1When being detected, as shown in figure 19, by part workpiece W
1Generate parallelogram P
1Equally, as shown in figure 20, by part workpiece W
2Generate parallelogram P
2, as shown in figure 22, by part workpiece W
4Generate parallelogram P
4But, as shown in figure 21, also have part workpiece W
3Self can become parallelogram P
3Situation.Each parallelogram that is removed also comprises frame F1
L, frame F1
RThe neighboring area, and performance and the storages such as coordinate of adopting imagination to launch.
After carrying out this processing in early stage, the synthetic portion 176 of image carries out judges synthetic processing.Adopt the schematic diagram of Figure 23, Figure 24 and the flow chart of Figure 25 that synthetic the processing described.
In step S51, the synthetic portion 176 of image compares by frame F1
LIn detected workpiece W
1The parallelogram P that generates
1With by frame F1
RIn detected workpiece W
2The parallelogram P that generates
2, setting is by the imaginary vertical line V at the center of a little side's part workpiece.
In step S52, the synthetic portion 176 of image in step S53, calculates the top of each several part workpiece and the intersection point V1 of following and imaginary line V as shown in figure 23
u, V1
b, V2
u, V2
b, in step S54, try to achieve V1
u～V1
b, V2
u～V2
bThe amount of repetition, in step S55, compare.Exist under the situation of the amount of repetition, in step S56, these part workpiece are synthesized.At this moment, as shown in figure 24, when synthetic, 4 limits are up and down adopted the limit of more lateral of two parts workpiece and the zone that its extended line surrounds become new part workpiece.On the other hand, in step S54, when being differentiated for the amount of repetition not, in step S57, these part workpiece become other workpiece.
To workpiece W
3, W
4Repeat above-mentioned processing, differentiate the synthetic of each workpiece.
At this moment, for example, can carry out workpiece W according to above-mentioned flow chart
3With workpiece W
1, or workpiece W
3With workpiece W
2Whether be the differentiation of same workpiece, but also can be with new part workpiece and the workpiece W that in step S56, makes
3Relatively, whether be included in the same workpiece thereby differentiate these part workpiece.To workpiece W
4Carry out same processing.
Therefore, according to above-mentioned processing, can be with workpiece W
1, W
2, W
3, W
4Differentiation constitutes for same workpiece, in addition, can detect by workpiece W
4The parallelogram P that generates
4, with as shown in figure 26 at same number of frames F2
RIn the part of detected next workpiece W` be that the parallelogram P` that part workpiece W` is generated is the workpiece that has nothing in common with each other.
As mentioned above, according to individual film detection apparatus 1,, can correctly obtain by the defect information and the dimension information of individual each sheet of film of cutting by above-mentioned processing.In addition, as individual film detection apparatus shown in the concrete example of the present invention, individual film that can on one side will be cut into prescribed level is in the continuous conveyance of prescribed direction, according to the view data that contain the regulation zone of individual film and background correctly detect the border of individual film on one side.
In addition, the processing by execution such as each structure of checking handling part 17, image processing part 174, defect inspection handling part 175, synthetic handling parts 176 realizes as controlled 176 software module of carrying out usually.On the basis of the common multitask OS with functions such as device control, multitask operating environment, timers, can each software module be moved by the program that a series of individual film inspections that each Structural Interrelationship realized in the execution graph 2 are handled and realize.
Claims (17)
1, individual film detection apparatus is characterized in that, has:
The film transport mechanism, its continuous conveyance on prescribed direction is cut into individual film of prescribed level;
Image Acquisition mechanism, it obtains the view data of individual film that contains the conveyance of described film transport mechanism institute;
The inspection area unloading device, it takes out the inspection effective coverage in described individual film by the border of each described view data described individual film of detection and background;
Defect inspection mechanism, its defect inspection of carrying out in the effective coverage that described inspection area unloading device taken out is handled.
2, individual film detection apparatus as claimed in claim 1 is characterized in that,
Described inspection area unloading device at described image data memory during on a plurality of described border, is distinguished and is different inspection effective coverages, and described defect inspection mechanism carries out defect inspection respectively in the effective coverage after to this difference and handles.
3, individual film detection apparatus as claimed in claim 1 is characterized in that,
Described inspection area unloading device has the image processor structure that described view data is divided into image processing unit, and the unit image after this is cut apart by each takes out the inspection effective coverage in described individual film.
4, individual film detection apparatus as claimed in claim 3 is characterized in that,
Described inspection area unloading device at described unit image memory during on a plurality of described border, is distinguished and is different inspection effective coverages, and described defect inspection mechanism carries out defect inspection respectively in the effective coverage after to this difference and handles.
5, individual film detection apparatus as claimed in claim 4 is characterized in that,
Possess combination mechanism, this combination mechanism will synthesize by same relatively individual film in inspection effective coverage that each described unit image takes out.
6, individual film detection apparatus as claimed in claim 1 is characterized in that,
Described individual film is parallelogram roughly.
7, individual film detection apparatus as claimed in claim 6 is characterized in that,
Described individual film, be configured to and conveyance direction almost parallel on one side, described inspection area unloading device detects the border of described individual film and background to the summit at diagonal angle from the frame end of described view data, when detecting described border, at this test point, set the datum line of stipulating with the angle that described one side became of relative described parallelogram with angle ground, parallel mobile this datum line on described conveyance direction, and then detect the border.
8, individual film detection apparatus as claimed in claim 7 is characterized in that,
When described inspection area unloading device arrives one side of view data at an end of described datum line,, and then detect the border on one side along this parallel moving.
9, individual film detection apparatus as claimed in claim 6 is characterized in that,
Described individual film, be configured to and conveyance direction almost parallel on one side, described inspection area unloading device detects the border of described individual film and background to the summit at diagonal angle from the frame end of described view data, when detecting described border, at this test point, set the datum line parallel, move this datum line in direction, and then detect the border perpendicular to described conveyance direction with described one side.
10, a kind of individual film inspection method is characterized in that having:
By on prescribed direction continuously conveyance be cut into the operation of conveyer belt conveyance film of individual film of prescribed level;
Obtain the Image Acquisition operation of the view data of individual film that contains described conveyance;
According to the border of described view data described individual film of detection and background, take out the inspection area of the inspection effective coverage in described individual film and take out operation;
Carry out described inspection area and take out the defect inspection operation that the defect inspection in the effective coverage of taking out in the operation is handled.
11, individual film inspection method as claimed in claim 10 is characterized in that,
Take out in the operation in described inspection area, at described image data memory during, distinguish and be different inspection effective coverages, in described defect inspection operation, the effective coverage after this difference is carried out the defect inspection processing respectively on a plurality of described border.
12, individual film inspection method as claimed in claim 10 is characterized in that,
Take out in the operation in described inspection area, described view data is divided into image and handles unit, and each the unit image after cutting apart by this takes out the inspection effective coverage in described individual film.
13, individual film inspection method as claimed in claim 12 is characterized in that,
Take out in the operation in described inspection area, at described unit image memory during, distinguish and be different inspection effective coverages, in described defect inspection operation, the effective coverage after this difference is carried out the defect inspection processing respectively on a plurality of described border.
14, individual film inspection method as claimed in claim 13 is characterized in that,
Has the synthesis procedure that will synthesize by same relatively individual film in inspection effective coverage that each described unit image takes out.
15, individual film inspection method as claimed in claim 10 is characterized in that,
Described individual film is parallelogram roughly, be configured to and conveyance direction almost parallel on one side, take out in the operation in described inspection area, detect the border of described individual film and background to the summit at diagonal angle from the frame end of described view data, when detecting described border,, set datum line with angle ground with the angle that described one side became of relative described parallelogram at this test point, parallel mobile this datum line on described conveyance direction, and then detect the border.
16, individual film inspection method as claimed in claim 15 is characterized in that,
Take out in the operation in described inspection area, when an end of described datum line arrives described frame end,, and then detect the border on one side along this parallel moving.
17, individual film inspection method as claimed in claim 10 is characterized in that,
Described individual film is parallelogram roughly, be configured to and conveyance direction almost parallel on one side, take out in the operation in described inspection area, detect the border of described individual film and background to the summit at diagonal angle from an end in described regulation zone, when detecting described border,, set the datum line parallel with described one side at this test point, move this datum line in direction, and then detect the border perpendicular to described conveyance direction.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005336247 | 2005-11-21 | ||
| JP2005336247A JP4755888B2 (en) | 2005-11-21 | 2005-11-21 | Sheet-fed film inspection apparatus and sheet-fed film inspection method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1982060A true CN1982060A (en) | 2007-06-20 |
Family
ID=38165032
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2006100639129A Pending CN1982060A (en) | 2005-11-21 | 2006-11-15 | Apparatus for inspecting sheetfed film and method for inspecting sheetfed film |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP4755888B2 (en) |
| KR (1) | KR20070053618A (en) |
| CN (1) | CN1982060A (en) |
| TW (1) | TWI435069B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102630299A (en) * | 2009-10-30 | 2012-08-08 | 住友化学株式会社 | Image processing device for defect inspection and image processing method for defect inspection |
| CN114322773A (en) * | 2021-12-31 | 2022-04-12 | 杭州电子科技大学 | Device and method for visual detection of strip sheet part |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6255186B2 (en) * | 2013-08-07 | 2017-12-27 | 日東電工株式会社 | Optical member inspection method, optical product manufacturing method, and optical member inspection apparatus |
| KR101733018B1 (en) * | 2015-02-25 | 2017-05-24 | 동우 화인켐 주식회사 | Apparatus and method for detecting defect of optical film |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06288927A (en) * | 1993-03-30 | 1994-10-18 | Sekisui Chem Co Ltd | Image process inspection method |
| JP3330014B2 (en) * | 1996-04-23 | 2002-09-30 | 松下電工株式会社 | Appearance inspection method |
| JPH11231129A (en) * | 1997-11-17 | 1999-08-27 | Sumitomo Chem Co Ltd | Optical film laminate intermediate body, its manufacture, and manufacture of optical film laminste chip |
| JP2004333446A (en) * | 2003-05-12 | 2004-11-25 | Matsushita Electric Ind Co Ltd | Appearance inspection method, appearance inspection apparatus, program therefor, and recording medium therefor |
| JP2005241361A (en) * | 2004-02-25 | 2005-09-08 | Jfe Steel Kk | Profile measuring method and profile measuring system for slab shape object to be measured |
-
2005
- 2005-11-21 JP JP2005336247A patent/JP4755888B2/en not_active Expired - Fee Related
-
2006
- 2006-11-15 CN CNA2006100639129A patent/CN1982060A/en active Pending
- 2006-11-16 TW TW095142439A patent/TWI435069B/en active
- 2006-11-17 KR KR1020060113676A patent/KR20070053618A/en not_active Application Discontinuation
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102630299A (en) * | 2009-10-30 | 2012-08-08 | 住友化学株式会社 | Image processing device for defect inspection and image processing method for defect inspection |
| CN102630299B (en) * | 2009-10-30 | 2014-07-30 | 住友化学株式会社 | Image processing device for defect inspection and image processing method for defect inspection |
| CN114322773A (en) * | 2021-12-31 | 2022-04-12 | 杭州电子科技大学 | Device and method for visual detection of strip sheet part |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4755888B2 (en) | 2011-08-24 |
| TW200736597A (en) | 2007-10-01 |
| KR20070053618A (en) | 2007-05-25 |
| JP2007139666A (en) | 2007-06-07 |
| TWI435069B (en) | 2014-04-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TWI471542B (en) | Tire shape inspection device and tire shape inspection method | |
| US8965110B2 (en) | Device and method for measuring diameter of cylindrical object | |
| KR102168724B1 (en) | Method And Apparatus for Discriminating Normal and Abnormal by using Vision Inspection | |
| KR102580389B1 (en) | Apparatus and method for inspecting a glass sheet | |
| US10169855B2 (en) | Method and device for detecting defects on a display subtrate | |
| KR20160022044A (en) | Inspection device for optical film | |
| WO2006137385A1 (en) | Film inspection apparatus and method | |
| CN1982060A (en) | Apparatus for inspecting sheetfed film and method for inspecting sheetfed film | |
| JP2002005846A (en) | Defect inspecting apparatus | |
| KR20140148067A (en) | Method for discriminating defect of optical films | |
| JP2010025586A (en) | Configuration determination method and configuration determination apparatus | |
| US9217713B1 (en) | System and method for detecting pin-holes in fiberglass and composite parts | |
| JP5509465B2 (en) | Glass bottle inspection equipment | |
| JP4215473B2 (en) | Image input method, image input apparatus, and image input program | |
| WO2010055551A1 (en) | Treatment liquid ejection inspecting method, treatment liquid ejection inspecting apparatus and computer readable recording medium | |
| KR102091014B1 (en) | Machine vision inspection device and product inspection method using machine vision | |
| KR101559941B1 (en) | A system for detecting fault of print pattern | |
| JP2002243583A (en) | Inspection method for image quality of flat display panel and inspection device for image quality of flat display panel | |
| KR100691433B1 (en) | Electronic part vision inspection method | |
| KR102495565B1 (en) | How to inspect optical display panels for damage | |
| US20130278925A1 (en) | Detecting device and method for substrate | |
| JPH10197455A (en) | Surface defect inspection device | |
| CN109870293A (en) | The detection method and detection device of display panel | |
| CN112838018B (en) | Optical measuring method | |
| JPH0663734B2 (en) | Deviation inspection device for display pattern |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Open date: 20070620 |