TW200736597A - An apparatus for inspecting defects of sheetfed film and a method for inspecting defects of sheetfed film - Google Patents
An apparatus for inspecting defects of sheetfed film and a method for inspecting defects of sheetfed filmInfo
- Publication number
- TW200736597A TW200736597A TW095142439A TW95142439A TW200736597A TW 200736597 A TW200736597 A TW 200736597A TW 095142439 A TW095142439 A TW 095142439A TW 95142439 A TW95142439 A TW 95142439A TW 200736597 A TW200736597 A TW 200736597A
- Authority
- TW
- Taiwan
- Prior art keywords
- inspection
- film
- sheet film
- processing part
- area
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
- G01N2223/3305—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts detector fixed; source and body moving
Abstract
To extract a boundary in a cut sheet film of an inspection object from an inspection area to be recognized automatically, and to inspect a dimension and a defect within an recognized area. This sheet film inspection 1 is provided with an inspection processing part 17 provided with an image processing part as an inspection area extracting means provided with a roller for conveying the cut sheet film along a conveying direction Y as shown in Fig.1, and a CCD line sensor 15 for acquiring an image data in a prescribed area of the conveyed sheet film, to detect the boundary between the sheet film and a background from the image data acquired by the CCD line sensor 15, and to extract an inspection effective area in the film sheet, and a defect inspection processing part for inspection-processing the defect within the effective area extracted by the image processing part. The inspection processing part 17 extracts a data of the sheet film from the acquired image data, determines further the effective area of the inspection object, and conducts finally the defect inspection, the dimension inspection and the like, within the effective area. A work is extracted from the acquired data by the CCD line sensor 15.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005336247A JP4755888B2 (en) | 2005-11-21 | 2005-11-21 | Sheet-fed film inspection apparatus and sheet-fed film inspection method |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200736597A true TW200736597A (en) | 2007-10-01 |
TWI435069B TWI435069B (en) | 2014-04-21 |
Family
ID=38165032
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095142439A TWI435069B (en) | 2005-11-21 | 2006-11-16 | An apparatus for inspecting defects of sheetfed film and a method for inspecting defects of sheetfed film |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4755888B2 (en) |
KR (1) | KR20070053618A (en) |
CN (1) | CN1982060A (en) |
TW (1) | TWI435069B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI630380B (en) * | 2013-08-07 | 2018-07-21 | 日東電工股份有限公司 | Optical member inspection method, optical product manufacturing method, and optical member inspection apparatus |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4726983B2 (en) * | 2009-10-30 | 2011-07-20 | 住友化学株式会社 | Defect inspection system, and defect inspection imaging apparatus, defect inspection image processing apparatus, defect inspection image processing program, recording medium, and defect inspection image processing method used therefor |
KR101733018B1 (en) * | 2015-02-25 | 2017-05-24 | 동우 화인켐 주식회사 | Apparatus and method for detecting defect of optical film |
CN114322773A (en) * | 2021-12-31 | 2022-04-12 | 杭州电子科技大学 | Device and method for visual detection of strip sheet part |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06288927A (en) * | 1993-03-30 | 1994-10-18 | Sekisui Chem Co Ltd | Image process inspection method |
JP3330014B2 (en) * | 1996-04-23 | 2002-09-30 | 松下電工株式会社 | Appearance inspection method |
JPH11231129A (en) * | 1997-11-17 | 1999-08-27 | Sumitomo Chem Co Ltd | Optical film laminate intermediate body, its manufacture, and manufacture of optical film laminste chip |
JP2004333446A (en) * | 2003-05-12 | 2004-11-25 | Matsushita Electric Ind Co Ltd | Appearance inspection method, appearance inspection apparatus, program therefor, and recording medium therefor |
JP2005241361A (en) * | 2004-02-25 | 2005-09-08 | Jfe Steel Kk | Profile measuring method and profile measuring system for slab shape object to be measured |
-
2005
- 2005-11-21 JP JP2005336247A patent/JP4755888B2/en not_active Expired - Fee Related
-
2006
- 2006-11-15 CN CNA2006100639129A patent/CN1982060A/en active Pending
- 2006-11-16 TW TW095142439A patent/TWI435069B/en active
- 2006-11-17 KR KR1020060113676A patent/KR20070053618A/en not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI630380B (en) * | 2013-08-07 | 2018-07-21 | 日東電工股份有限公司 | Optical member inspection method, optical product manufacturing method, and optical member inspection apparatus |
Also Published As
Publication number | Publication date |
---|---|
TWI435069B (en) | 2014-04-21 |
KR20070053618A (en) | 2007-05-25 |
JP4755888B2 (en) | 2011-08-24 |
JP2007139666A (en) | 2007-06-07 |
CN1982060A (en) | 2007-06-20 |
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