CN1977351A - 等离子体离子注入系统的原位处理室制备方法 - Google Patents
等离子体离子注入系统的原位处理室制备方法 Download PDFInfo
- Publication number
- CN1977351A CN1977351A CNA2005800203293A CN200580020329A CN1977351A CN 1977351 A CN1977351 A CN 1977351A CN A2005800203293 A CNA2005800203293 A CN A2005800203293A CN 200580020329 A CN200580020329 A CN 200580020329A CN 1977351 A CN1977351 A CN 1977351A
- Authority
- CN
- China
- Prior art keywords
- process chamber
- plasma
- coating
- substrate
- plasma ion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32477—Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
- H01J37/32495—Means for protecting the vessel against plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32412—Plasma immersion ion implantation
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma & Fusion (AREA)
- High Energy & Nuclear Physics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Toxicology (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/850,222 US20050260354A1 (en) | 2004-05-20 | 2004-05-20 | In-situ process chamber preparation methods for plasma ion implantation systems |
| US10/850,222 | 2004-05-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1977351A true CN1977351A (zh) | 2007-06-06 |
Family
ID=34970469
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2005800203293A Pending CN1977351A (zh) | 2004-05-20 | 2005-05-19 | 等离子体离子注入系统的原位处理室制备方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20050260354A1 (enExample) |
| JP (1) | JP2007538413A (enExample) |
| KR (1) | KR20070026608A (enExample) |
| CN (1) | CN1977351A (enExample) |
| TW (1) | TW200602510A (enExample) |
| WO (1) | WO2005114692A2 (enExample) |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8080813B2 (en) | 2007-07-10 | 2011-12-20 | Komico Ltd. | Ion implanter, internal structure of ion implanter and method of forming a coating layer in the ion implanter |
| CN102576655A (zh) * | 2009-08-11 | 2012-07-11 | 瓦里安半导体设备公司 | 脉冲沉积与再结晶以及利用结晶化/非晶物质的堆叠式太阳能电池设计 |
| CN103774121A (zh) * | 2012-10-19 | 2014-05-07 | 陕西拓日新能源科技有限公司 | 一种用于非晶硅沉积的控制系统 |
| CN103928280A (zh) * | 2013-01-16 | 2014-07-16 | 日新离子机器株式会社 | 离子注入装置和离子注入装置的运转方法 |
| CN104241067A (zh) * | 2013-06-10 | 2014-12-24 | Fei公司 | 电子束感应蚀刻 |
| CN104465292A (zh) * | 2014-11-28 | 2015-03-25 | 上海华力微电子有限公司 | 一种离子注入机的预处理方法 |
| CN105900213A (zh) * | 2013-12-30 | 2016-08-24 | Gtat公司 | 用于cad反应器的改善的辐射屏障 |
| TWI562226B (en) * | 2010-06-11 | 2016-12-11 | Varian Semiconductor Equipment | Techniques for plasma processing a substrate |
| CN107039227A (zh) * | 2015-11-13 | 2017-08-11 | 住友重机械离子技术有限公司 | 离子生成装置及离子生成装置的控制方法 |
| CN110085499A (zh) * | 2014-09-01 | 2019-08-02 | 恩特格里斯公司 | 利用增强源技术进行磷或砷离子植入 |
| CN110828272A (zh) * | 2018-08-09 | 2020-02-21 | 北京北方华创微电子装备有限公司 | 腔室内衬、下电极装置和半导体处理设备 |
| CN112086381A (zh) * | 2015-10-02 | 2020-12-15 | 朗姆研究公司 | 用于原子层沉积的动态前体投配 |
| CN112154534A (zh) * | 2018-06-01 | 2020-12-29 | 应用材料公司 | 控制金属污染的腔室的原位cvd和ald涂布 |
| US12448687B2 (en) | 2014-08-22 | 2025-10-21 | Lam Research Corporation | Dynamic precursor dosing for atomic layer deposition |
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|---|---|---|---|---|
| US7819981B2 (en) * | 2004-10-26 | 2010-10-26 | Advanced Technology Materials, Inc. | Methods for cleaning ion implanter components |
| US20060205192A1 (en) * | 2005-03-09 | 2006-09-14 | Varian Semiconductor Equipment Associates, Inc. | Shallow-junction fabrication in semiconductor devices via plasma implantation and deposition |
| EP1866074A4 (en) * | 2005-03-16 | 2017-01-04 | Entegris Inc. | System for delivery of reagents from solid sources thereof |
| US7528386B2 (en) * | 2005-04-21 | 2009-05-05 | Board Of Trustees Of University Of Illinois | Submicron particle removal |
| TWI402098B (zh) | 2005-06-22 | 2013-07-21 | Advanced Tech Materials | 整合式氣體混合用之裝置及方法 |
| US7943204B2 (en) | 2005-08-30 | 2011-05-17 | Advanced Technology Materials, Inc. | Boron ion implantation using alternative fluorinated boron precursors, and formation of large boron hydrides for implantation |
| US7595271B2 (en) * | 2005-12-01 | 2009-09-29 | Asm America, Inc. | Polymer coating for vapor deposition tool |
| JP2010503977A (ja) * | 2006-04-26 | 2010-02-04 | アドバンスト テクノロジー マテリアルズ,インコーポレイテッド | 半導体処理システムの洗浄方法 |
| JP5241499B2 (ja) * | 2006-09-19 | 2013-07-17 | 東京エレクトロン株式会社 | プラズマクリーニング方法、プラズマcvd方法、およびプラズマ処理装置 |
| US20080090392A1 (en) * | 2006-09-29 | 2008-04-17 | Varian Semiconductor Equipment Associates, Inc. | Technique for Improved Damage Control in a Plasma Doping (PLAD) Ion Implantation |
| US7619229B2 (en) * | 2006-10-16 | 2009-11-17 | Varian Semiconductor Equipment Associates, Inc. | Technique for matching performance of ion implantation devices using an in-situ mask |
| DE102007037527B4 (de) * | 2006-11-10 | 2013-05-08 | Schott Ag | Verfahren zum Beschichten von Gegenständen mit Wechselschichten |
| JP5252613B2 (ja) * | 2006-12-25 | 2013-07-31 | 国立大学法人東北大学 | イオン注入装置およびイオン注入方法 |
| US7691755B2 (en) * | 2007-05-15 | 2010-04-06 | Applied Materials, Inc. | Plasma immersion ion implantation with highly uniform chamber seasoning process for a toroidal source reactor |
| US7875125B2 (en) | 2007-09-21 | 2011-01-25 | Semequip, Inc. | Method for extending equipment uptime in ion implantation |
| US7968439B2 (en) * | 2008-02-06 | 2011-06-28 | Applied Materials, Inc. | Plasma immersion ion implantation method using a pure or nearly pure silicon seasoning layer on the chamber interior surfaces |
| KR101755970B1 (ko) * | 2008-02-11 | 2017-07-07 | 엔테그리스, 아이엔씨. | 이온 공급원 챔버를 포함하는 이온 주입 시스템의 성능 향상 및 수명 연장 방법 |
| US7659184B2 (en) * | 2008-02-25 | 2010-02-09 | Applied Materials, Inc. | Plasma immersion ion implantation process with chamber seasoning and seasoning layer plasma discharging for wafer dechucking |
| US20090297409A1 (en) * | 2008-05-30 | 2009-12-03 | Buchanan Walter R | Discharge plasma reactor |
| JP5178342B2 (ja) * | 2008-06-23 | 2013-04-10 | キヤノン株式会社 | 堆積物除去方法及び堆積膜形成方法 |
| JP2010050188A (ja) * | 2008-08-20 | 2010-03-04 | Panasonic Corp | プラズマドーピング装置 |
| CN102405511B (zh) * | 2009-04-20 | 2014-06-11 | 应用材料公司 | 使用处理腔室壁上的硅涂层增强清除残余的氟自由基的方法 |
| US11615941B2 (en) | 2009-05-01 | 2023-03-28 | Advanced Energy Industries, Inc. | System, method, and apparatus for controlling ion energy distribution in plasma processing systems |
| US20110021011A1 (en) | 2009-07-23 | 2011-01-27 | Advanced Technology Materials, Inc. | Carbon materials for carbon implantation |
| US9627180B2 (en) * | 2009-10-01 | 2017-04-18 | Praxair Technology, Inc. | Method for ion source component cleaning |
| US8598025B2 (en) | 2010-11-15 | 2013-12-03 | Varian Semiconductor Equipment Associates, Inc. | Doping of planar or three-dimensional structures at elevated temperatures |
| KR101982903B1 (ko) | 2012-02-14 | 2019-05-27 | 엔테그리스, 아이엔씨. | 주입 용품에서 인 축적을 최소화하기 위한 대체 물질 및 혼합물 |
| US9685297B2 (en) | 2012-08-28 | 2017-06-20 | Advanced Energy Industries, Inc. | Systems and methods for monitoring faults, anomalies, and other characteristics of a switched mode ion energy distribution system |
| US9209032B2 (en) * | 2013-03-15 | 2015-12-08 | Tokyo Electron Limited | Electric pressure systems for control of plasma properties and uniformity |
| US9524849B2 (en) * | 2013-07-18 | 2016-12-20 | Varian Semiconductor Equipment Associates, Inc. | Method of improving ion beam quality in an implant system |
| SG11201601015RA (en) | 2013-08-16 | 2016-03-30 | Entegris Inc | Silicon implantation in substrates and provision of silicon precursor compositions therefor |
| JP6412573B2 (ja) * | 2013-11-26 | 2018-10-24 | ヴァリアン セミコンダクター イクイップメント アソシエイツ インコーポレイテッド | ワークピースを処理する方法 |
| JP5750496B2 (ja) * | 2013-12-11 | 2015-07-22 | 株式会社日立ハイテクノロジーズ | プラズマ処理方法 |
| US10553411B2 (en) | 2015-09-10 | 2020-02-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Ion collector for use in plasma systems |
| US10010854B2 (en) | 2015-10-01 | 2018-07-03 | Ion Inject Technology Llc | Plasma reactor for liquid and gas |
| US12296313B2 (en) | 2015-10-01 | 2025-05-13 | Milton Roy, Llc | System and method for formulating medical treatment effluents |
| US11452982B2 (en) | 2015-10-01 | 2022-09-27 | Milton Roy, Llc | Reactor for liquid and gas and method of use |
| US10882021B2 (en) | 2015-10-01 | 2021-01-05 | Ion Inject Technology Llc | Plasma reactor for liquid and gas and method of use |
| US10187968B2 (en) | 2015-10-08 | 2019-01-22 | Ion Inject Technology Llc | Quasi-resonant plasma voltage generator |
| JP6169666B2 (ja) * | 2015-10-20 | 2017-07-26 | 株式会社日立ハイテクノロジーズ | プラズマ処理方法 |
| US10046300B2 (en) | 2015-12-09 | 2018-08-14 | Ion Inject Technology Llc | Membrane plasma reactor |
| FR3045206B1 (fr) * | 2015-12-10 | 2020-01-03 | Ion Beam Services | Procede de commande pour un implanteur fonctionnant en immersion plasma |
| US10460941B2 (en) | 2016-11-08 | 2019-10-29 | Varian Semiconductor Equipment Associates, Inc. | Plasma doping using a solid dopant source |
| US20180247800A1 (en) * | 2017-02-28 | 2018-08-30 | International Business Machines Corporation | Gallium implantation cleaning method |
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| JP7236954B2 (ja) * | 2019-08-06 | 2023-03-10 | 東京エレクトロン株式会社 | プラズマ処理装置 |
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| US12165852B2 (en) * | 2022-03-05 | 2024-12-10 | Applied Materials, Inc. | Cover ring to mitigate carbon contamination in plasma doping chamber |
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| US11978613B2 (en) | 2022-09-01 | 2024-05-07 | Advanced Energy Industries, Inc. | Transition control in a bias supply |
| US20240266149A1 (en) * | 2023-02-03 | 2024-08-08 | Tokyo Electron Limited | Methods for Semiconductor Process Chamber |
| WO2025250609A1 (en) * | 2024-05-30 | 2025-12-04 | Lam Research Corporation | Coating surfaces within a pumping path of a processing tool |
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-
2004
- 2004-05-20 US US10/850,222 patent/US20050260354A1/en not_active Abandoned
-
2005
- 2005-05-19 KR KR1020067026723A patent/KR20070026608A/ko not_active Withdrawn
- 2005-05-19 TW TW094116323A patent/TW200602510A/zh unknown
- 2005-05-19 WO PCT/US2005/017699 patent/WO2005114692A2/en not_active Ceased
- 2005-05-19 JP JP2007527467A patent/JP2007538413A/ja not_active Withdrawn
- 2005-05-19 CN CNA2005800203293A patent/CN1977351A/zh active Pending
Cited By (25)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US8080813B2 (en) | 2007-07-10 | 2011-12-20 | Komico Ltd. | Ion implanter, internal structure of ion implanter and method of forming a coating layer in the ion implanter |
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Also Published As
| Publication number | Publication date |
|---|---|
| KR20070026608A (ko) | 2007-03-08 |
| TW200602510A (en) | 2006-01-16 |
| WO2005114692A3 (en) | 2006-03-02 |
| US20050260354A1 (en) | 2005-11-24 |
| WO2005114692A9 (en) | 2006-01-19 |
| WO2005114692A2 (en) | 2005-12-01 |
| JP2007538413A (ja) | 2007-12-27 |
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