CN1953181B - 模拟数字转换器 - Google Patents

模拟数字转换器 Download PDF

Info

Publication number
CN1953181B
CN1953181B CN2006101320182A CN200610132018A CN1953181B CN 1953181 B CN1953181 B CN 1953181B CN 2006101320182 A CN2006101320182 A CN 2006101320182A CN 200610132018 A CN200610132018 A CN 200610132018A CN 1953181 B CN1953181 B CN 1953181B
Authority
CN
China
Prior art keywords
analog
channel transistor
digital converter
electrodes
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN2006101320182A
Other languages
English (en)
Chinese (zh)
Other versions
CN1953181A (zh
Inventor
小松茂行
山根一郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nuvoton Technology Corp Japan
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Publication of CN1953181A publication Critical patent/CN1953181A/zh
Application granted granted Critical
Publication of CN1953181B publication Critical patent/CN1953181B/zh
Anticipated expiration legal-status Critical
Active legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08—Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • H03M1/0827—Continuously compensating for, or preventing, undesired influence of physical parameters of noise of electromagnetic or electrostatic field noise, e.g. preventing crosstalk by shielding or optical isolation
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/68—Digital/analogue converters with conversions of different sensitivity, i.e. one conversion relating to the more significant digital bits and another conversion to the less significant bits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/78—Simultaneous conversion using ladder network
    • H03M1/785—Simultaneous conversion using ladder network using resistors, i.e. R-2R ladders
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/80—Simultaneous conversion using weighted impedances
    • H03M1/802—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices
    • H03M1/804—Simultaneous conversion using weighted impedances using capacitors, e.g. neuron-mos transistors, charge coupled devices with charge redistribution

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
CN2006101320182A 2005-10-21 2006-10-19 模拟数字转换器 Active CN1953181B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2005306928 2005-10-21
JP2005-306928 2005-10-21
JP2005306928 2005-10-21

Publications (2)

Publication Number Publication Date
CN1953181A CN1953181A (zh) 2007-04-25
CN1953181B true CN1953181B (zh) 2010-10-13

Family

ID=37984816

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2006101320182A Active CN1953181B (zh) 2005-10-21 2006-10-19 模拟数字转换器

Country Status (3)

Country Link
US (1) US7394416B2 (enExample)
JP (1) JP5420485B2 (enExample)
CN (1) CN1953181B (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7645675B2 (en) * 2006-01-13 2010-01-12 International Business Machines Corporation Integrated parallel plate capacitors
JP2008226998A (ja) * 2007-03-09 2008-09-25 Matsushita Electric Ind Co Ltd 半導体集積回路
DE102009056562A1 (de) * 2009-12-03 2011-06-09 Telefunken Semiconductors Gmbh & Co. Kg Integrierter Schaltungsteil
US20110133286A1 (en) * 2009-12-03 2011-06-09 Franz Dietz Integrierter schaltungsteil
JP5899565B2 (ja) * 2013-09-22 2016-04-06 光俊 菅原 スイッチ付容量及びスイッチ付容量を含む回路
JP6244967B2 (ja) * 2014-02-19 2017-12-13 株式会社ソシオネクスト キャパシタアレイおよびａｄ変換器
CN106033951A (zh) * 2015-03-19 2016-10-19 中国科学院微电子研究所 高效率功率放大器电路
US9520461B1 (en) * 2015-08-28 2016-12-13 Texas Instruments Incorporated Integrated circuit with lateral flux capacitor
JPWO2017168521A1 (ja) * 2016-03-28 2019-01-31 オリンパス株式会社 Ａ／ｄ変換器およびａ／ｄ変換装置
FR3063387B1 (fr) 2017-02-24 2021-05-21 Commissariat Energie Atomique Composant electronique muni d'un transistor et de doigts interdigites pour former au moins une partie d'un composant capacitif au sein du composant electronique
US10574249B2 (en) 2018-05-02 2020-02-25 Apple Inc. Capacitor structure with correlated error mitigation and improved systematic mismatch in technologies with multiple patterning
CN110677155B (zh) * 2019-08-21 2022-10-14 电子科技大学 一种应用于逐次逼近模数转换器的中位选取电容校正方法
CN111262585B (zh) * 2020-02-14 2023-03-28 深圳市紫光同创电子有限公司 一种电容器及模拟数字转换器芯片
JP2025017247A (ja) * 2023-07-24 2025-02-05 合肥晶合集成電路股▲ふん▼有限公司 半導体装置及び半導体装置の設計支援装置
CN116976261A (zh) * 2023-08-03 2023-10-31 重庆吉芯科技有限公司 一种n位r2r电阻网络版图布局方法及版图

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1149790A (zh) * 1995-06-21 1997-05-14 朗迅科技公司 模拟-数字转换器信号存储电容的扰动
CN2413436Y (zh) * 2000-02-01 2001-01-03 周宇 利用微处理器积分的模拟/数字转换器
US6567024B1 (en) * 1999-10-27 2003-05-20 Nec Corporation Analog switch and A/D converter having the same
US6734817B2 (en) * 2001-12-26 2004-05-11 Matsushita Electric Industrial Co., Ltd. A/D converter, method of A/D conversion, and signal processing device
CN1636323A (zh) * 1999-08-04 2005-07-06 印芬龙科技股份有限公司 Sigma－delta A/D转换器

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61263251A (ja) 1985-05-17 1986-11-21 Nec Corp 半導体装置
JP2700959B2 (ja) 1991-02-25 1998-01-21 三菱電機株式会社 集積回路のキャパシタ
JP3058387B2 (ja) * 1993-11-01 2000-07-04 シャープ株式会社 Ａ／ｄコンバータ
JPH11103254A (ja) * 1997-09-26 1999-04-13 Toshiba Corp アナログデジタル変換回路装置及びその変換方法
US6166367A (en) * 1998-03-26 2000-12-26 Photobit Corporation Programmable analog arithmetic circuit for imaging sensor
JP3942793B2 (ja) * 2000-03-30 2007-07-11 シャープ株式会社 電荷量検出回路
US6747307B1 (en) * 2000-04-04 2004-06-08 Koninklijke Philips Electronics N.V. Combined transistor-capacitor structure in deep sub-micron CMOS for power amplifiers
JP2002009623A (ja) * 2000-06-27 2002-01-11 Nec Corp ディジタルアナログ変換回路
JP4582890B2 (ja) * 2000-09-28 2010-11-17 ルネサスエレクトロニクス株式会社 アナログスイッチ回路、アナログマルチプレクサ回路、ａｄ変換器及びアナログ信号処理システム
US6737698B1 (en) * 2002-03-11 2004-05-18 Silicon Laboratories, Inc. Shielded capacitor structure
JP2004165559A (ja) * 2002-11-15 2004-06-10 Toshiba Corp 半導体装置
JP3843942B2 (ja) * 2002-12-25 2006-11-08 株式会社デンソー Ｄ／ａ変換器およびａ／ｄ変換器
US7268383B2 (en) * 2003-02-20 2007-09-11 Infineon Technologies Ag Capacitor and method of manufacturing a capacitor
JP3851898B2 (ja) * 2003-09-26 2006-11-29 株式会社東芝 容量素子を含む電子回路装置
JP4371799B2 (ja) * 2003-12-19 2009-11-25 株式会社リコー 容量素子

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1149790A (zh) * 1995-06-21 1997-05-14 朗迅科技公司 模拟-数字转换器信号存储电容的扰动
CN1636323A (zh) * 1999-08-04 2005-07-06 印芬龙科技股份有限公司 Sigma－delta A/D转换器
US6567024B1 (en) * 1999-10-27 2003-05-20 Nec Corporation Analog switch and A/D converter having the same
CN2413436Y (zh) * 2000-02-01 2001-01-03 周宇 利用微处理器积分的模拟/数字转换器
US6734817B2 (en) * 2001-12-26 2004-05-11 Matsushita Electric Industrial Co., Ltd. A/D converter, method of A/D conversion, and signal processing device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
CN 2413436 Y,全文.

Also Published As

Publication number Publication date
US20070090986A1 (en) 2007-04-26
JP5420485B2 (ja) 2014-02-19
US7394416B2 (en) 2008-07-01
CN1953181A (zh) 2007-04-25
JP2010278450A (ja) 2010-12-09

Similar Documents

Publication Publication Date Title
JP5420485B2 (ja) アナログディジタル変換器
JP2010278450A5 (enExample)
KR102210313B1 (ko) 금속-온-금속 커패시터
US10892099B2 (en) Fringe capacitor for high resolution ADC
JP6244967B2 (ja) キャパシタアレイおよびａｄ変換器
JP3549499B2 (ja) 半導体集積回路装置ならびにｄ／ａ変換装置およびａ／ｄ変換装置
CN109037211B (zh) 电容阵列结构
US20200006314A1 (en) Shielding in a unit capacitor array
CN113543470B (zh) 基于电阻串数模转换器的版图结构和芯片
JPH03235423A (ja) Ｄ／ａ変換装置
JP4927494B2 (ja) アナログディジタル変換器、およびアナログディジタル変換器の設計方法
JP4463528B2 (ja) 半導体集積回路装置およびデルタ・シグマａｄ変換装置
JP5899565B2 (ja) スイッチ付容量及びスイッチ付容量を含む回路
JP2004214692A (ja) 半導体集積回路装置ならびにｄ／ａ変換装置およびａ／ｄ変換装置
JPS60105323A (ja) デイジタル−アナログ変換器
TWI897434B (zh) 電阻陣列電路、數位類比轉換器電路及其佈局方法
CN100492643C (zh) 电阻网络例如电阻梯形网络及其制造方法
JP2002246911A (ja) 抵抗ラダー型ディジタル／アナログ変換器
JP2604374B2 (ja) アナログ・ディジタル変換器
CN119815841A (zh) 电容单元及模数转换器
CN105448963A (zh) 晶体管以及电流源装置
JPH10178344A (ja) Ａ／ｄコンバータ

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20200529

Address after: Kyoto Japan

Patentee after: Panasonic semiconductor solutions Co.,Ltd.

Address before: Osaka Japan

Patentee before: Panasonic Corp.

TR01 Transfer of patent right