CN1893005A - Method for preventing overflow of glue of package element - Google Patents
Method for preventing overflow of glue of package element Download PDFInfo
- Publication number
- CN1893005A CN1893005A CN 200510081895 CN200510081895A CN1893005A CN 1893005 A CN1893005 A CN 1893005A CN 200510081895 CN200510081895 CN 200510081895 CN 200510081895 A CN200510081895 A CN 200510081895A CN 1893005 A CN1893005 A CN 1893005A
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- substrate
- glue
- die cavity
- package element
- molds
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- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
Abstract
The method provides a base plate with a zone for a thimble to apply force. Through the said zone, a force downwards can be applied to make total contact between base plate and die. Since there is no gap between base plate and die, thus sealing colloid will not flow between base plate and die so that colloid flooding will not be happened.
Description
Technical field
The present invention relates to a kind of formation method of potted element, more particularly a kind of method that prevents overflow of glue of package element that is applied to form potted element.
Background technology
At present relevant sphere grid array (BGA) N-type semiconductor N component package processing procedure, it mainly is that chip is attached to substrate, and make chip and substrate constitute with the routing juncture to electrically connect, the substrate that then will stick together chip more places set of molds to carry out the sealing step, chip is coated in the colloid, treat that colloid solidifies the back and takes out, again each weld pad of substrate bottom surface is planted Metal Ball and cuts moulding, and produce semiconductor element.
Yet, above-mentioned semiconductor element is in the sealing process, though the set of molds that its sizing shaped is used has the mould of high precision, but because the restriction of machining accuracy, make mold and bed die matched moulds have error afterwards, and make and have slit between composition surface between mold and the substrate, so when sealing, liquid adhesive material pours in die cavity through pressurization, the adhesive material that promptly has a little liquid state overflows in die cavity, and enter in the slit between mold and substrate, the colloid that causes overflowing can be attached on substrate or the mold.
Therefore, when the colloid that overflows is attached to substrate, because of face shaping does not meet the quality management standard, need the step through removing photoresist and repairing again, thereby the inconvenience and the processing procedure cost that increase processing procedure increase, and when removing photoresist operation, produce defective products, so that influence the product yield of this encapsulation procedure because of cutter injures substrate surface easily.
When the colloid that overflows was attached to mold, the accuracy in the time of can influencing the set of molds matched moulds so operating personnel need often cleaning mould, so that can influence the yield of manufacture procedure of adhesive, and easily made set of molds impaired, and shortens its useful life again.
In addition, mention also that in the prior art another kind prevents the method for excessive glue, it is included in has a substrate in the semiconductor encapsulating structure, an embankment, and a chip and a plurality of soldered ball form a plurality of leads and several weld pads on the surface of substrate.Embankment is taken from a lead frame and is attached to the upper surface of substrate with viscose, corresponding to the window of upper surface of base plate, overflows to prevent packing colloid.Chip is attached on the substrate with viscose, a plurality of outputs/input pad forms the center part of chip surface, and is positioned at the window on the substrate, and plural wires is in order to electrically connect substrate and I/o pad, a plurality of soldered balls then are to be set up on each weld pad, in order to electrically connect with the outside.Though the situation that prevents excessive glue that this kind mode can reach to a certain degree takes place, the embankment that is positioned on the substrate is the surface that additionally is additional to substrate, and is cumbersome on processing procedure.
Summary of the invention
The objective of the invention is to overcome the deficiencies in the prior art and defective, a kind of method that prevents overflow of glue of package element is proposed, by the external connection end around on the substrate as the thimble end, by withstanding the thimble end downwards, make and contact fully between substrate and the mould, and exist between substrate and the mould without any the space, make that after the encapsulating, the phenomenon that does not have the glue that overflows takes place.
For reaching above-mentioned purpose, the invention provides a kind of method that prevents excessive glue, this method comprises:
Substrate with a chip is provided, and this substrate has a plurality of external connection end and this chip and this substrate and electrically connects;
Set of molds with a die cavity is provided, and this set of molds has a mold and a bed die, and this die cavity can ccontaining this substrate;
This substrate is placed in the die cavity of this bed die;
Carry out a matched moulds step, this mold combines with this bed die;
Withstand these a plurality of external connection end of this substrate downwards, make this substrate contact fully with this time die cavity, and without any the space between this substrate and this time die cavity; And
Pour into have insulate heat solidity composite properties an adhesive body between this substrate and this set of molds, wherein this adhesive body covers between the upper surface of mold and this substrate, and this substrate around.
Provide substrate because this method comprises, on substrate, have chip and plural wires in order to electrically connect substrate and chip with a plurality of external connection end.Then, provide the set of molds of a sealing shaping usefulness, and set of molds is made of a mold and a bed die, and the size of the die cavity between mold and bed die can ccontaining substrate.Then, substrate is placed in the bed die, make a plurality of external connection end around this substrate can expose to bed die around.Carry out a matched moulds step then, mold is combined with bed die.Then, withstand the external connection end of substrate downwards, make between substrate and the mould to contact fully by thimble.Then, carry out an encapsulating step and since between substrate and the mould without any the space can allow adhesive body flow between substrate and the bed die, therefore when matched moulds, the situation that does not have the glue that overflows takes place.
Description of drawings
Fig. 1 is disclosed technology according to the present invention, and expression prevents the flow chart of the method for excessive glue;
Fig. 2 A to Fig. 2 B is disclosed technology according to the present invention, and expression prevents each step schematic diagram of excessive gluing method.
Symbol description among the figure
1-6 prevents the steps flow chart of the method for excessive glue
10 substrates
12 external connection end
14 thimble application of force zones
20 bed dies
22 times die cavitys
30 adhesive materials
Embodiment
Some embodiments of the present invention can be described in detail as follows.Yet except describing in detail, the present invention can also be widely implements at other embodiment, and scope of the present invention do not limited, and its scope with claims is as the criterion.
See also Fig. 1 is applied to the method that prevents excessive glue of potted element for the present invention is disclosed flow chart of steps.Step 1 expression provides the substrate with a plurality of external connection end.Step 2 expression provides the set of molds with a die cavity, and this set of molds comprises the mold with upper mould cave, and the bed die with following die cavity.Step 3 expression is placed in substrate in the following die cavity of bed die, is positioned at substrate a plurality of external connection end all around and can exposes to bed die all around.Then, carry out a matched moulds step, mold is combined with bed die, withstand the external connection end of substrate simultaneously downwards, make substrate contact fully with mould in step 4.Then, adhesive body is poured in the die cavity of set of molds,, therefore between substrate and bed die, can allow adhesive body flow into, therefore do not have the phenomenon generation of the glue that overflows without any the space owing to contact fully between substrate and the mould in step 5.At last,, carry out a curing schedule, finish encapsulation step to solidify adhesive body in step 6.
Next, Fig. 2 A to Fig. 2 B is the step schematic diagram that prevents excessive glue represented according to the above-mentioned steps flow chart.At first, please refer to Fig. 2 A, expression has the vertical view of the substrate of a plurality of external connection end.More comprise a chip (not expression in the drawings) on this substrate 10, this chip can be routing chip or crystal covered chip.If this chip is the routing chip, then then be to electrically connect between chip and the substrate 10 by plural wires (not expression in the drawings); If chip is a crystal covered chip, then crystal covered chip then is by electrically connecting between plurality of solder projection and the substrate 10.
In addition, substrate 10 also comprises one or a plurality of external connection end 12, and these external connection end 12 can be made of lead frame (lead-frame), and these lead frames can be to be shaped on the substrate 10.The purpose of these external connection end 12 more comprises the thimble application of force zone 14 that contacts with mould as with substrate downwards except electrically connecting with electronic component.When thimble withstands the external connection end 12 of substrate 10 both sides downwards, because substrate 10 contacts fully with the following die cavity 22 of bed die 20, this means, between substrate 10 and following die cavity 22 without any the space existence, and when follow-up encapsulating step, adhesive body can't flow between substrate and the following die cavity.When also can or not making tolerance and cause excessive glue because of the tolerance of application of force inequality, size supplied materials.
In addition, the material in these external connection end 12 and thimble application of force zone 14 can be that metallic plate or metal derby are formed, or nonmetallic materials constitute.What deserves to be mentioned is that the material of substrate 10 can be dielectric material, insulating material, also or by following form selected material: the hybrid system of metal, single face comprise the hybrid system and the two-sided hybrid system that comprises metal of metal.
Then, please refer to Fig. 2 B.In Fig. 2 B, the part of solid line is represented following die cavity 22, and in order to ccontaining substrate 10, the size of therefore following die cavity 22 can correspond to the size of substrate 10.
Then, be feature of the present invention, carry out a matched moulds step, make mold combine with bed die 20, simultaneously, thimble withstands the external connection end 14 of substrate 10 downwards, make substrate 10 can contact completely, do not exist and do not have any space with the following die cavity 22 of bed die 20.Because, between substrate 10 and following die cavity 22 without any the space, this makes follow-up when irritating the mould step, adhesive body 30 can't flow between substrate 10 and the following die cavity 22,30 of adhesive bodies are present between the upper surface of mold and substrate 10, therefore when sealing, the phenomenon that does not have the glue that overflows takes place.Wherein, adhesive body 30 can be an insulate heat solidity compound, for example silica packing material (silica filler) or epoxy resin (epoxy).
At last, carry out one again and solidify (curing) step, to solidify adhesive body 30, make the upper surface of substrate 10 and all around, and the element that is positioned on the substrate 10 is coated simultaneously by adhesive body 30.In addition because between substrate 10 and the following die cavity 22 without any the existence in space, do not have the below that there is substrate 10 in any adhesive body 30, so the lower surface of substrate 10 then is to expose out.
The above is preferred embodiment of the present invention only, is not in order to limit claim scope of the present invention; All other do not break away from the equivalence of being finished under the disclosed spirit and changes or modification, all should be included in the scope of claims.
Claims (9)
1. a method that prevents overflow of glue of package element is characterized in that, this method comprises:
Substrate with a chip is provided, and this substrate has a plurality of external connection end and this chip and this substrate and electrically connects;
Set of molds with a die cavity is provided, and this set of molds has a mold and a bed die, and this die cavity can ccontaining this substrate;
This substrate is placed in the die cavity of this bed die;
Carry out a matched moulds step, this mold combines with this bed die;
Withstand these a plurality of external connection end of this substrate downwards, make this substrate contact fully with this time die cavity, and without any the space between this substrate and this time die cavity; And
Pour into have insulate heat solidity composite properties an adhesive body between this substrate and this set of molds, wherein this adhesive body covers between the upper surface of mold and this substrate, and this substrate around.
2. the method that prevents overflow of glue of package element as claimed in claim 1, wherein, the material of this substrate is selected from one of following group: the hybrid system of dielectric material, insulating material, metal, single face comprise the hybrid system or the two-sided hybrid system that comprises metal of metal.
3. the method that prevents overflow of glue of package element as claimed in claim 1, wherein, the mode that this chip and this substrate electrically connect is selected from one of following group: plural wires or a plurality of soldering projection.
4. the method that prevents overflow of glue of package element as claimed in claim 1, wherein, the material of these a plurality of external connection end is selected from one of following group: lead frame or be shaped in the lead frame of this substrate.
5. the method that prevents overflow of glue of package element as claimed in claim 1, wherein, this insulate heat solidity compound is selected from one of following group: epoxy resin or silica packing material.
6. a method that prevents overflow of glue of package element is characterized in that, this method comprises:
One substrate is provided, has the both sides that at least one pair of thimble application of force zone is positioned at this substrate;
Set of molds with a die cavity is provided, and this set of molds has a mold and a bed die, and this die cavity can ccontaining this substrate;
Ccontaining this substrate is in the die cavity once of this bed die, and this thimble application of force zone of this substrate exposes to the outside of this bed die;
Carry out a matched moulds step, make this mold combine with this bed die;
Withstand this thimble application of force zone downwards, make this substrate contact fully with this time die cavity and without any the space exist;
Pour into have insulate heat solidity composite properties an adhesive body in this substrate and this set of molds; And
Solidify this adhesive body, this adhesive body only envelope a upper surface of this substrate and this substrate around, and expose a lower surface of this substrate.
7. the method that prevents overflow of glue of package element as claimed in claim 6, wherein, the material of this substrate is selected from one of following group: the hybrid system of dielectric material, insulating material, metal, single face comprise the hybrid system or the two-sided hybrid system that comprises metal of metal.
8. the method that prevents overflow of glue of package element as claimed in claim 6, wherein, the material in this thimble application of force zone is formed in one in the lead frame of this substrate.
9. the method that prevents overflow of glue of package element as claimed in claim 6, wherein, this insulate heat solidity compound is selected from one of following group: epoxy resin or silica packing material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100818957A CN100394569C (en) | 2005-07-06 | 2005-07-06 | Method for preventing overflow of glue of package element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100818957A CN100394569C (en) | 2005-07-06 | 2005-07-06 | Method for preventing overflow of glue of package element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1893005A true CN1893005A (en) | 2007-01-10 |
| CN100394569C CN100394569C (en) | 2008-06-11 |
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ID=37597702
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005100818957A Active CN100394569C (en) | 2005-07-06 | 2005-07-06 | Method for preventing overflow of glue of package element |
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| Country | Link |
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| CN (1) | CN100394569C (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101154601B (en) * | 2006-09-29 | 2010-12-01 | 冲电气工业株式会社 | Semiconductor device and manufacturing method thereof |
| CN102756457A (en) * | 2011-04-27 | 2012-10-31 | 无锡华润安盛科技有限公司 | Die for pre-plastic package of sensor chip |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03239349A (en) * | 1990-02-16 | 1991-10-24 | Clarion Co Ltd | Manufacture of resin-sealed semiconductor device |
| JP3281859B2 (en) * | 1997-12-22 | 2002-05-13 | 三洋電機株式会社 | Manufacturing method of hybrid integrated circuit device |
| CN2502404Y (en) * | 2001-08-30 | 2002-07-24 | 南茂科技股份有限公司 | Mould pressing tool for preventing glue-spilling semicondcutor encapsulating die press |
| CN2566454Y (en) * | 2002-08-21 | 2003-08-13 | 南茂科技股份有限公司 | Circuit board preventing moulding-die glue-overflow |
-
2005
- 2005-07-06 CN CNB2005100818957A patent/CN100394569C/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101154601B (en) * | 2006-09-29 | 2010-12-01 | 冲电气工业株式会社 | Semiconductor device and manufacturing method thereof |
| CN102756457A (en) * | 2011-04-27 | 2012-10-31 | 无锡华润安盛科技有限公司 | Die for pre-plastic package of sensor chip |
| CN102756457B (en) * | 2011-04-27 | 2015-03-25 | 无锡华润安盛科技有限公司 | Die for pre-plastic package of sensor chip |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100394569C (en) | 2008-06-11 |
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