CN1890573B - 缓冲电路、驱动电路、半导体测试装置及半导体集成电路 - Google Patents

缓冲电路、驱动电路、半导体测试装置及半导体集成电路 Download PDF

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Publication number
CN1890573B
CN1890573B CN2004800368003A CN200480036800A CN1890573B CN 1890573 B CN1890573 B CN 1890573B CN 2004800368003 A CN2004800368003 A CN 2004800368003A CN 200480036800 A CN200480036800 A CN 200480036800A CN 1890573 B CN1890573 B CN 1890573B
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CN
China
Prior art keywords
voltage
transistor
base
diode
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2004800368003A
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English (en)
Chinese (zh)
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CN1890573A (zh
Inventor
松本直木
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Advantest Corp
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Advantest Corp
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Publication date
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Publication of CN1890573A publication Critical patent/CN1890573A/zh
Application granted granted Critical
Publication of CN1890573B publication Critical patent/CN1890573B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1057—Data output buffers, e.g. comprising level conversion circuits, circuits for adapting load
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current
    • G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
    • G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
    • G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • G05F1/569—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for protection
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1078—Data input circuits, e.g. write amplifiers, data input buffers, data input registers, data input level conversion circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22—Control and timing of internal memory operations
    • G11C2207/2227—Standby or low power modes

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Amplifiers (AREA)
  • Logic Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
CN2004800368003A 2003-12-09 2004-12-07 缓冲电路、驱动电路、半导体测试装置及半导体集成电路 Expired - Fee Related CN1890573B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2003410115 2003-12-09
JP410115/2003 2003-12-09
PCT/JP2004/018214 WO2005057229A1 (ja) 2003-12-09 2004-12-07 バッファー回路及びドライバ回路

Publications (2)

Publication Number Publication Date
CN1890573A CN1890573A (zh) 2007-01-03
CN1890573B true CN1890573B (zh) 2010-06-16

Family

ID=34674921

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2004800368003A Expired - Fee Related CN1890573B (zh) 2003-12-09 2004-12-07 缓冲电路、驱动电路、半导体测试装置及半导体集成电路

Country Status (8)

Country Link
US (1) US7355432B2 (de)
EP (1) EP1703291B1 (de)
JP (1) JP4806567B2 (de)
KR (1) KR101071463B1 (de)
CN (1) CN1890573B (de)
DE (1) DE602004029193D1 (de)
TW (1) TWI359277B (de)
WO (1) WO2005057229A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7652466B2 (en) * 2007-07-29 2010-01-26 Advantest Corporation Buffer circuit, amplifier circuit, and test apparatus
US7962110B2 (en) * 2008-02-14 2011-06-14 Advantest Corporation Driver circuit and test apparatus
US8230281B2 (en) * 2009-04-13 2012-07-24 Altera Corporation Techniques for boundary scan testing using transmitters and receivers
KR101629793B1 (ko) 2014-03-17 2016-06-15 주식회사 앤코스메슈 모렐버섯의 생산을 위한 배지 조성물
US11119155B2 (en) 2019-04-25 2021-09-14 Teradyne, Inc. Voltage driver circuit
US10942220B2 (en) * 2019-04-25 2021-03-09 Teradyne, Inc. Voltage driver with supply current stabilization
US11283436B2 (en) 2019-04-25 2022-03-22 Teradyne, Inc. Parallel path delay line

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1419274A (zh) * 2001-11-12 2003-05-21 三菱电机株式会社 半导体电路装置及半导体装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS601965B2 (ja) * 1977-12-02 1985-01-18 株式会社日立製作所 増幅回路
JPS5646310A (en) * 1979-09-21 1981-04-27 Pioneer Electronic Corp Amplifying circuit
US4791312A (en) * 1987-06-08 1988-12-13 Grumman Aerospace Corporation Programmable level shifting interface device
WO1991020125A1 (en) * 1990-06-18 1991-12-26 Harris Corporation Low offset unity gain buffer amplifier
DE4111999A1 (de) * 1991-04-12 1992-10-15 Hartmut Koellner Wandlerschaltung
US5365118A (en) * 1992-06-04 1994-11-15 Linear Technology Corp. Circuit for driving two power mosfets in a half-bridge configuration
JPH0738343A (ja) * 1993-07-19 1995-02-07 Columbia Techno:Kk 増幅器の保護回路
KR0181307B1 (ko) * 1994-05-27 1999-04-01 오우라 히로시 반도체 시험장치용 드라이버회로
JP3490165B2 (ja) * 1994-12-15 2004-01-26 株式会社アドバンテスト ドライバ回路
JP3399742B2 (ja) * 1996-05-31 2003-04-21 株式会社日立製作所 入力バッファ回路
KR100433799B1 (ko) * 1998-12-03 2004-06-04 가부시키가이샤 히타치세이사쿠쇼 전압구동형 스위칭 소자의 게이트 구동회로
US6275023B1 (en) * 1999-02-03 2001-08-14 Hitachi Electronics Engineering Co., Ltd. Semiconductor device tester and method for testing semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1419274A (zh) * 2001-11-12 2003-05-21 三菱电机株式会社 半导体电路装置及半导体装置

Also Published As

Publication number Publication date
JP4806567B2 (ja) 2011-11-02
WO2005057229A1 (ja) 2005-06-23
EP1703291A4 (de) 2009-07-01
DE602004029193D1 (de) 2010-10-28
US7355432B2 (en) 2008-04-08
CN1890573A (zh) 2007-01-03
EP1703291A1 (de) 2006-09-20
KR20060122895A (ko) 2006-11-30
EP1703291B1 (de) 2010-09-15
TWI359277B (en) 2012-03-01
JPWO2005057229A1 (ja) 2007-07-05
KR101071463B1 (ko) 2011-10-10
TW200525158A (en) 2005-08-01
US20060273832A1 (en) 2006-12-07

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SE01 Entry into force of request for substantive examination
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CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20100616

Termination date: 20131207