CN1864062B - 使用在固定角位置的源和检测器的原位x射线衍射系统 - Google Patents

使用在固定角位置的源和检测器的原位x射线衍射系统 Download PDF

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CN1864062B
CN1864062B CN2004800289849A CN200480028984A CN1864062B CN 1864062 B CN1864062 B CN 1864062B CN 2004800289849 A CN2004800289849 A CN 2004800289849A CN 200480028984 A CN200480028984 A CN 200480028984A CN 1864062 B CN1864062 B CN 1864062B
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sample
ray
source
radiation
detector
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CN1864062A (zh
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戴维·M·吉布森
沃尔特·M·吉布森
黄华鹏
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X Ray Optical Systems Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials

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  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN2004800289849A 2003-08-04 2004-08-04 使用在固定角位置的源和检测器的原位x射线衍射系统 Expired - Fee Related CN1864062B (zh)

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Application Number Priority Date Filing Date Title
US49240003P 2003-08-04 2003-08-04
US60/492,400 2003-08-04
PCT/US2004/025112 WO2005031329A1 (en) 2003-08-04 2004-08-04 In-situ x-ray diffraction system using sources and detectors at fixed angular positions

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CN1864062A CN1864062A (zh) 2006-11-15
CN1864062B true CN1864062B (zh) 2011-11-02

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US (1) US7236566B2 (enExample)
EP (1) EP1660874B1 (enExample)
JP (1) JP4753872B2 (enExample)
CN (1) CN1864062B (enExample)
WO (1) WO2005031329A1 (enExample)

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CN105683741B (zh) * 2013-07-08 2019-07-05 诺威量测设备股份有限公司 用于确定样本中的应变分布的方法和系统
CN105659073B (zh) 2013-10-25 2019-06-04 新日铁住金株式会社 合金化热浸镀锌钢板的在线镀覆密合性判定装置及合金化热浸镀锌钢板制造生产线
JP6397690B2 (ja) * 2014-08-11 2018-09-26 株式会社日立ハイテクノロジーズ Ｘ線透過検査装置及び異物検出方法
JP6084993B2 (ja) * 2015-01-07 2017-02-22 株式会社リガク Ｘ線回折方法及びそれを用いた可搬型ｘ線回折装置
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CN104749692B (zh) * 2015-03-18 2017-12-08 中国建筑材料科学研究总院 一种平行光筛选器及其制备方法
WO2016193687A1 (en) * 2015-05-29 2016-12-08 University Of Leicester X-ray analysis device
CN104897705B (zh) * 2015-06-26 2019-05-21 北京师范大学 一种识别液体种类的x射线衍射谱仪与方法
CN105353778B (zh) * 2015-11-04 2017-11-17 中国北方发动机研究所(天津) 一种用于残余应力测试的自动调姿装置
EP3456159B1 (en) * 2016-05-12 2023-04-26 Neutron Therapeutics Inc. Ion beam filter for a neutron generator
KR102198053B1 (ko) 2016-08-30 2021-01-04 유니버시티 오브 휴스턴 시스템 고성능 초전도체 테이프의 품질 관리
WO2019006102A1 (en) * 2017-06-28 2019-01-03 University Of Maryland College Park SYSTEM AND METHOD FOR REAL-TIME MONITORING BASED ON IN SITU X-RAY DIFFRACTION OF MICROSTRUCTURE PROPERTIES OF PRINTING OBJECTS
JP7033246B2 (ja) * 2018-01-29 2022-03-10 パルステック工業株式会社 搬送物の応力測定装置
CN109490346B (zh) * 2018-10-15 2021-07-02 内蒙古科技大学 一种通过x射线衍射测量取向硅钢取向偏离角的方法
US11614414B2 (en) * 2018-10-19 2023-03-28 Commonwealth Scientific And Industrial Research Organisation Energy-dispersive X-ray diffraction analyser comprising a substantially X-ray transparent member having an improved reflection geometry
CN110726386B (zh) * 2019-09-19 2020-11-06 西安交通大学 基于劳厄照相法的材料全应力应变张量的测量方法
CN110608827B (zh) * 2019-09-19 2020-12-25 西安交通大学 基于单色x射线衍射的单晶或定向晶检测系统
KR102235852B1 (ko) * 2019-11-11 2021-04-02 가천대학교 산학협력단 광을 이용한 측정 장치 및 측정 방법
JP7547195B2 (ja) * 2020-12-24 2024-09-09 浜松ホトニクス株式会社 Ｘ線検出装置
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JP2007501395A (ja) 2007-01-25
JP4753872B2 (ja) 2011-08-24
EP1660874B1 (en) 2014-05-07
CN1864062A (zh) 2006-11-15
US20060140343A1 (en) 2006-06-29
EP1660874A1 (en) 2006-05-31
US7236566B2 (en) 2007-06-26
WO2005031329A1 (en) 2005-04-07

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