CN1849508A - 检测玻璃板缺陷的方法及装置 - Google Patents
检测玻璃板缺陷的方法及装置 Download PDFInfo
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- CN1849508A CN1849508A CNA200480024850XA CN200480024850A CN1849508A CN 1849508 A CN1849508 A CN 1849508A CN A200480024850X A CNA200480024850X A CN A200480024850XA CN 200480024850 A CN200480024850 A CN 200480024850A CN 1849508 A CN1849508 A CN 1849508A
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- 239000011521 glass Substances 0.000 title claims abstract description 162
- 238000000034 method Methods 0.000 title claims description 19
- 230000007547 defect Effects 0.000 title description 26
- 238000001514 detection method Methods 0.000 claims description 9
- 230000000007 visual effect Effects 0.000 claims description 8
- 238000002360 preparation method Methods 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 description 11
- 238000010586 diagram Methods 0.000 description 10
- 230000002950 deficient Effects 0.000 description 6
- 238000005520 cutting process Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005755 formation reaction Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
- G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
- G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
- G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Artificial Intelligence (AREA)
- Textile Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003392786A JP4176622B2 (ja) | 2003-11-21 | 2003-11-21 | 板状ガラスの欠陥検出方法及び欠陥検出装置 |
JP392786/2003 | 2003-11-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN1849508A true CN1849508A (zh) | 2006-10-18 |
Family
ID=34616465
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNA200480024850XA Pending CN1849508A (zh) | 2003-11-21 | 2004-11-16 | 检测玻璃板缺陷的方法及装置 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP4176622B2 (ja) |
KR (1) | KR20060096984A (ja) |
CN (1) | CN1849508A (ja) |
TW (1) | TW200525142A (ja) |
WO (1) | WO2005050184A1 (ja) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102192972A (zh) * | 2010-02-26 | 2011-09-21 | 旭硝子株式会社 | 矩形板状物的裂纹检查方法及检查装置 |
CN101484775B (zh) * | 2006-07-04 | 2012-11-28 | 株式会社尼康 | 表面检查设备 |
CN103175569A (zh) * | 2011-12-21 | 2013-06-26 | 北京兆维电子(集团)有限责任公司 | 单光源双相机的采集装置 |
CN105143862A (zh) * | 2013-03-19 | 2015-12-09 | 亨内克系统有限责任公司 | 检测系统 |
CN107131832A (zh) * | 2016-02-29 | 2017-09-05 | 深圳市升瑞科仪光电有限公司 | Lcd玻璃磨边效果检测方法和装置 |
CN107843604A (zh) * | 2017-12-19 | 2018-03-27 | 苏州精濑光电有限公司 | 一种用于检测双层基板边缘缺陷的装置及检测方法 |
CN109855672A (zh) * | 2019-04-25 | 2019-06-07 | 佛山市南海区广工大数控装备协同创新研究院 | 一种带倒角弧度玻璃板自动检测装置 |
CN109916910A (zh) * | 2019-03-27 | 2019-06-21 | 中建材凯盛机器人(上海)有限公司 | 光伏玻璃边部缺陷检测系统及相应的方法 |
CN112710675A (zh) * | 2019-12-25 | 2021-04-27 | 上野精机株式会社 | 电子部件的处理装置 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100791277B1 (ko) * | 2006-09-12 | 2008-01-04 | 주식회사 케이엔제이 | 평판 디스플레이 패널 검사장치 |
JP2007147433A (ja) * | 2005-11-28 | 2007-06-14 | Nano Scope Ltd | セラミック板の欠陥検出方法と装置 |
KR101318246B1 (ko) * | 2007-02-21 | 2013-10-16 | 엘지디스플레이 주식회사 | 액정표시장치의 불량 판별 장치 및 방법 |
WO2012153718A1 (ja) * | 2011-05-12 | 2012-11-15 | コニカミノルタホールディングス株式会社 | ガラスシートの端面検査方法、及びガラスシートの端面検査装置 |
TWI557407B (zh) * | 2014-03-05 | 2016-11-11 | 晶元光電股份有限公司 | 晶粒檢測方法 |
KR102580389B1 (ko) * | 2018-02-13 | 2023-09-19 | 코닝 인코포레이티드 | 유리 시트 검사 장치 및 방법 |
CN110596138A (zh) * | 2019-08-14 | 2019-12-20 | 深圳格兰达智能装备股份有限公司 | 一种ic料条视觉检测及墨点标记设备 |
TWI805931B (zh) * | 2020-06-23 | 2023-06-21 | 方碼科技有限公司 | 物件之符碼的讀取方法及其讀取設備 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3013903B2 (ja) * | 1991-01-31 | 2000-02-28 | セントラル硝子株式会社 | 板ガラスの欠点検出装置 |
JP3141974B2 (ja) * | 1993-12-24 | 2001-03-07 | 日立電子エンジニアリング株式会社 | ガラスディスクの外周欠陥検出装置および外周欠陥検出方法 |
JP2738300B2 (ja) * | 1994-06-20 | 1998-04-08 | 白柳式撰果機株式会社 | 塊状青果物のカメラ選別機に用いる間接照明型多面撮影装置 |
JP2001208702A (ja) * | 2000-01-31 | 2001-08-03 | Nippon Sheet Glass Co Ltd | 欠点検査方法及び欠点検査装置 |
JP2003098122A (ja) * | 2001-09-21 | 2003-04-03 | Toshiba Ceramics Co Ltd | ガラス基板の外観検査装置 |
-
2003
- 2003-11-21 JP JP2003392786A patent/JP4176622B2/ja not_active Expired - Lifetime
-
2004
- 2004-11-16 KR KR1020067003605A patent/KR20060096984A/ko not_active Application Discontinuation
- 2004-11-16 CN CNA200480024850XA patent/CN1849508A/zh active Pending
- 2004-11-16 WO PCT/JP2004/017022 patent/WO2005050184A1/ja active Application Filing
- 2004-11-17 TW TW093135241A patent/TW200525142A/zh unknown
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101484775B (zh) * | 2006-07-04 | 2012-11-28 | 株式会社尼康 | 表面检查设备 |
CN102192972B (zh) * | 2010-02-26 | 2015-01-28 | 旭硝子株式会社 | 矩形板状物的裂纹检查方法及检查装置 |
CN102192972A (zh) * | 2010-02-26 | 2011-09-21 | 旭硝子株式会社 | 矩形板状物的裂纹检查方法及检查装置 |
CN103175569A (zh) * | 2011-12-21 | 2013-06-26 | 北京兆维电子(集团)有限责任公司 | 单光源双相机的采集装置 |
CN103175569B (zh) * | 2011-12-21 | 2015-07-15 | 北京兆维电子(集团)有限责任公司 | 单光源双相机的采集装置 |
CN105143862B (zh) * | 2013-03-19 | 2019-07-09 | 亨内克系统有限责任公司 | 检测系统 |
CN105143862A (zh) * | 2013-03-19 | 2015-12-09 | 亨内克系统有限责任公司 | 检测系统 |
CN107131832A (zh) * | 2016-02-29 | 2017-09-05 | 深圳市升瑞科仪光电有限公司 | Lcd玻璃磨边效果检测方法和装置 |
CN107843604A (zh) * | 2017-12-19 | 2018-03-27 | 苏州精濑光电有限公司 | 一种用于检测双层基板边缘缺陷的装置及检测方法 |
CN107843604B (zh) * | 2017-12-19 | 2024-04-05 | 苏州精濑光电有限公司 | 一种用于检测双层基板边缘缺陷的装置及检测方法 |
CN109916910A (zh) * | 2019-03-27 | 2019-06-21 | 中建材凯盛机器人(上海)有限公司 | 光伏玻璃边部缺陷检测系统及相应的方法 |
CN109855672A (zh) * | 2019-04-25 | 2019-06-07 | 佛山市南海区广工大数控装备协同创新研究院 | 一种带倒角弧度玻璃板自动检测装置 |
CN112710675A (zh) * | 2019-12-25 | 2021-04-27 | 上野精机株式会社 | 电子部件的处理装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20060096984A (ko) | 2006-09-13 |
WO2005050184A1 (ja) | 2005-06-02 |
JP4176622B2 (ja) | 2008-11-05 |
TW200525142A (en) | 2005-08-01 |
JP2005156254A (ja) | 2005-06-16 |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
WD01 | Invention patent application deemed withdrawn after publication |