CN1768271B - 测试头定位系统和方法 - Google Patents
测试头定位系统和方法 Download PDFInfo
- Publication number
- CN1768271B CN1768271B CN2004800088159A CN200480008815A CN1768271B CN 1768271 B CN1768271 B CN 1768271B CN 2004800088159 A CN2004800088159 A CN 2004800088159A CN 200480008815 A CN200480008815 A CN 200480008815A CN 1768271 B CN1768271 B CN 1768271B
- Authority
- CN
- China
- Prior art keywords
- measuring head
- docking facilities
- motion
- connection module
- peripherals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Manipulator (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
Description
Claims (22)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US45901903P | 2003-03-31 | 2003-03-31 | |
US60/459,019 | 2003-03-31 | ||
US10/813,362 | 2004-03-30 | ||
US10/813,362 US7235964B2 (en) | 2003-03-31 | 2004-03-30 | Test head positioning system and method |
PCT/US2004/009774 WO2004090558A2 (en) | 2003-03-31 | 2004-03-31 | Test head positioning system and method |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010150668.6A Division CN101806817B (zh) | 2003-03-31 | 2004-03-31 | 测试头定位系统和方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1768271A CN1768271A (zh) | 2006-05-03 |
CN1768271B true CN1768271B (zh) | 2010-05-05 |
Family
ID=33162197
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010150668.6A Expired - Fee Related CN101806817B (zh) | 2003-03-31 | 2004-03-31 | 测试头定位系统和方法 |
CN2004800088159A Expired - Fee Related CN1768271B (zh) | 2003-03-31 | 2004-03-31 | 测试头定位系统和方法 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201010150668.6A Expired - Fee Related CN101806817B (zh) | 2003-03-31 | 2004-03-31 | 测试头定位系统和方法 |
Country Status (8)
Country | Link |
---|---|
US (3) | US7235964B2 (zh) |
EP (1) | EP1618394A2 (zh) |
JP (2) | JP5183061B2 (zh) |
KR (1) | KR20050109615A (zh) |
CN (2) | CN101806817B (zh) |
DE (1) | DE04758607T1 (zh) |
SG (2) | SG158747A1 (zh) |
WO (1) | WO2004090558A2 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI612311B (zh) * | 2013-07-11 | 2018-01-21 | 瓊斯科技國際公司 | 用於積體測試之中心上導電針腳 |
Families Citing this family (55)
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US6954577B2 (en) * | 2003-07-25 | 2005-10-11 | Adc Dsl Systems, Inc. | System and devices for routing and managing data cables from a telecommunications enclosure |
EP1894027A1 (en) | 2005-04-27 | 2008-03-05 | Aehr Test Systems, Inc. | Apparatus for testing electronic devices |
KR100709114B1 (ko) * | 2006-01-23 | 2007-04-18 | (주)테크윙 | 테스트핸들러 |
US20070213847A1 (en) * | 2006-03-01 | 2007-09-13 | Sprague William T | Apparatus for, and method of, positioning an interface unit of an automatic test system |
US7583100B2 (en) * | 2006-11-30 | 2009-09-01 | Sts Instruments, Inc. | Test head for testing electrical components |
TWI439709B (zh) | 2006-12-29 | 2014-06-01 | Intest Corp | 用於使負載沿平移軸線平移之操縱器與負載定位系統 |
EP2104862B1 (en) * | 2006-12-29 | 2012-08-08 | inTEST Corporation | Test head positioning system and method |
US7667466B2 (en) * | 2007-01-31 | 2010-02-23 | Benchmark Electronics | Target tester interface |
US7764076B2 (en) * | 2007-02-20 | 2010-07-27 | Centipede Systems, Inc. | Method and apparatus for aligning and/or leveling a test head |
EP2150823A4 (en) * | 2007-05-07 | 2016-12-21 | Intest Corp | BOWL AND SHELL HANDLER FOR A TEST HEAD MANIPULATOR |
DE102007024949B3 (de) * | 2007-05-30 | 2009-01-22 | Hubertus Heigl | Handhabungsvorrichtung zum Positionieren eines Testkopfs, insbesondere an einer Prüfeinrichtung |
KR100892519B1 (ko) * | 2007-06-27 | 2009-04-10 | 현대자동차주식회사 | 차량용 오디오 성능 검사장치 |
KR100996233B1 (ko) * | 2008-10-16 | 2010-11-23 | 한전케이피에스 주식회사 | 비파괴 검사 장비 |
US8030957B2 (en) | 2009-03-25 | 2011-10-04 | Aehr Test Systems | System for testing an integrated circuit of a device and its method of use |
GB201118994D0 (en) * | 2010-11-18 | 2011-12-14 | Xyratex Tech Ltd | A method and device for mapping the magnetic field or magnetic field sensitivity of a recording head |
US20140317453A1 (en) * | 2011-07-12 | 2014-10-23 | Intest Corporation | Method and apparatus for docking a test head with a peripheral |
US8640558B2 (en) * | 2011-09-12 | 2014-02-04 | Honeywell International Inc. | System for the automated inspection of structures at height |
US8896333B2 (en) * | 2012-05-18 | 2014-11-25 | Honeywell International Inc. | Automatic test equipment control device |
JP6125298B2 (ja) * | 2013-04-04 | 2017-05-10 | 株式会社東芝 | 移動式炉心内計装用弁支持装置および移動式炉心内計装装置 |
JP6114615B2 (ja) * | 2013-04-05 | 2017-04-12 | モレックス エルエルシー | コネクタ嵌合装置、及び電子機器の検査方法 |
DE102013109055A1 (de) * | 2013-08-21 | 2015-02-26 | Turbodynamics Gmbh | Ausrichteinrichtung und Handhabungsvorrichtung |
TW201508294A (zh) * | 2013-08-26 | 2015-03-01 | Chiuan Yan Technology Co Ltd | 床台式光學元件對位與導電性之檢測機構 |
EP3052951A1 (en) * | 2013-09-30 | 2016-08-10 | inTEST Corporation | Method and apparatus for docking a test head with a peripheral |
KR101748239B1 (ko) | 2014-03-25 | 2017-06-16 | 가부시키가이샤 어드밴티스트 | 액추에이터, 핸들러 장치 및 시험 장치 |
US9526908B2 (en) | 2014-04-01 | 2016-12-27 | Medtronic, Inc. | Method and apparatus for discriminating tachycardia events in a medical device |
US10376705B2 (en) | 2014-04-01 | 2019-08-13 | Medtronic, Inc. | Method and apparatus for discriminating tachycardia events in a medical device |
DE102014206412A1 (de) * | 2014-04-03 | 2015-10-08 | Siemens Aktiengesellschaft | Vorrichtung zur Aufnahme eines Prüflings, Anordnung und Verfahren zur Prüfung eines Prüflings |
US9808640B2 (en) | 2014-04-10 | 2017-11-07 | Medtronic, Inc. | Method and apparatus for discriminating tachycardia events in a medical device using two sensing vectors |
US9352165B2 (en) | 2014-04-17 | 2016-05-31 | Medtronic, Inc. | Method and apparatus for verifying discriminating of tachycardia events in a medical device having dual sensing vectors |
US10278601B2 (en) | 2014-04-24 | 2019-05-07 | Medtronic, Inc. | Method and apparatus for selecting a sensing vector configuration in a medical device |
US9795312B2 (en) | 2014-04-24 | 2017-10-24 | Medtronic, Inc. | Method and apparatus for adjusting a blanking period for selecting a sensing vector configuration in a medical device |
US10244957B2 (en) | 2014-04-24 | 2019-04-02 | Medtronic, Inc. | Method and apparatus for selecting a sensing vector configuration in a medical device |
US10252067B2 (en) | 2014-04-24 | 2019-04-09 | Medtronic, Inc. | Method and apparatus for adjusting a blanking period during transitioning between operating states in a medical device |
US9610025B2 (en) | 2014-07-01 | 2017-04-04 | Medtronic, Inc. | Method and apparatus for verifying discriminating of tachycardia events in a medical device having dual sensing vectors |
US10060475B2 (en) | 2014-12-24 | 2018-08-28 | Teradyne, Inc. | Braking system |
CN105158520B (zh) * | 2015-08-07 | 2018-05-29 | 湖南红太阳新能源科技有限公司 | 一种测试用接触器 |
CN105182014B (zh) * | 2015-09-11 | 2018-02-09 | 国网福建省电力有限公司 | 一种互感器测试装夹系统 |
CN105158676B (zh) * | 2015-09-21 | 2019-02-12 | 大西电子仪器(昆山)有限公司 | 精密电子产品基板功能自动检测装置 |
US10094854B2 (en) * | 2015-10-23 | 2018-10-09 | Teradyne, Inc. | Manipulator in automatic test equipment |
CN108780114B (zh) | 2016-01-08 | 2021-11-16 | 雅赫测试系统公司 | 用于电子测试器中的器件的温度控制的方法和系统 |
JP2017151011A (ja) * | 2016-02-26 | 2017-08-31 | セイコーエプソン株式会社 | 電子部品搬送装置および電子部品検査装置 |
EP3589965B1 (en) | 2017-03-03 | 2023-12-06 | AEHR Test Systems | Electronics tester |
US20180364131A1 (en) * | 2017-06-14 | 2018-12-20 | Optofidelity Oy | Testing apparatus |
CN107941542A (zh) * | 2017-11-23 | 2018-04-20 | 广东恒鑫智能装备股份有限公司 | 自动配水机构 |
KR102465584B1 (ko) * | 2018-06-15 | 2022-11-09 | 한국전기연구원 | 멀티프로버 시스템의 웨이퍼 카트리지 얼라인용 틸팅을 위한 가변 잠금장치 |
TWI676031B (zh) * | 2018-09-06 | 2019-11-01 | 致茂電子股份有限公司 | 滑移式電子元件測試裝置 |
CN109633316B (zh) * | 2018-12-19 | 2021-04-20 | 深圳市博瑞信科技有限公司 | 三轴无线充电器自动测试系统 |
CN109856554A (zh) * | 2019-04-22 | 2019-06-07 | 星云智能装备(昆山)有限公司 | 一种自动对插机构及电池包测试装置 |
US11041879B2 (en) * | 2019-06-06 | 2021-06-22 | International Business Machines Corporation | Fluidized alignment of a semiconductor die to a test probe |
JP7371885B2 (ja) * | 2019-07-08 | 2023-10-31 | ヤマハファインテック株式会社 | 電気検査装置及び保持ユニット |
KR20210063164A (ko) * | 2019-11-22 | 2021-06-01 | (주)테크윙 | 테스터 결합부 |
JP2020145446A (ja) * | 2020-04-30 | 2020-09-10 | 東京エレクトロン株式会社 | ウエハ検査装置 |
US11498207B2 (en) | 2021-01-08 | 2022-11-15 | Teradyne, Inc. | Test head manipulator configured to address uncontrolled test head rotation |
CN114113708B (zh) * | 2021-11-29 | 2024-03-29 | 广东省华科应急管理技术服务有限公司 | 一种消防电气设施安全检测仪 |
CN117074939A (zh) * | 2023-08-17 | 2023-11-17 | 潮州市汇能电机有限公司 | 一种水轮发电机组模拟试验系统 |
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-
2004
- 2004-03-30 US US10/813,362 patent/US7235964B2/en not_active Expired - Lifetime
- 2004-03-31 SG SG200706423-1A patent/SG158747A1/en unknown
- 2004-03-31 WO PCT/US2004/009774 patent/WO2004090558A2/en active Application Filing
- 2004-03-31 EP EP04758607A patent/EP1618394A2/en not_active Withdrawn
- 2004-03-31 JP JP2006509493A patent/JP5183061B2/ja not_active Expired - Fee Related
- 2004-03-31 CN CN201010150668.6A patent/CN101806817B/zh not_active Expired - Fee Related
- 2004-03-31 KR KR1020057018541A patent/KR20050109615A/ko not_active Application Discontinuation
- 2004-03-31 SG SG200706422-3A patent/SG162618A1/en unknown
- 2004-03-31 CN CN2004800088159A patent/CN1768271B/zh not_active Expired - Fee Related
- 2004-03-31 DE DE04758607T patent/DE04758607T1/de active Pending
-
2007
- 2007-05-17 US US11/749,988 patent/US7728579B2/en not_active Expired - Fee Related
-
2010
- 2010-04-19 US US12/762,573 patent/US8035406B2/en not_active Expired - Fee Related
-
2011
- 2011-03-07 JP JP2011049456A patent/JP5564004B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2279238Y (zh) * | 1996-10-17 | 1998-04-22 | 华南理工大学 | 封闭电流式开放功率型齿轮传动实验台 |
CN1208935A (zh) * | 1997-07-25 | 1999-02-24 | 株式会社爱德万测试 | 半导体器件测试装置的测试头定位装置 |
US5949002A (en) * | 1997-11-12 | 1999-09-07 | Teradyne, Inc. | Manipulator for automatic test equipment with active compliance |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI612311B (zh) * | 2013-07-11 | 2018-01-21 | 瓊斯科技國際公司 | 用於積體測試之中心上導電針腳 |
Also Published As
Publication number | Publication date |
---|---|
WO2004090558A2 (en) | 2004-10-21 |
SG162618A1 (en) | 2010-07-29 |
US20100264907A1 (en) | 2010-10-21 |
JP2011149950A (ja) | 2011-08-04 |
CN1768271A (zh) | 2006-05-03 |
US8035406B2 (en) | 2011-10-11 |
US20040227534A1 (en) | 2004-11-18 |
EP1618394A2 (en) | 2006-01-25 |
WO2004090558A3 (en) | 2005-05-19 |
US7728579B2 (en) | 2010-06-01 |
JP5564004B2 (ja) | 2014-07-30 |
JP2007524814A (ja) | 2007-08-30 |
CN101806817B (zh) | 2014-01-08 |
JP5183061B2 (ja) | 2013-04-17 |
KR20050109615A (ko) | 2005-11-21 |
US20080122432A1 (en) | 2008-05-29 |
SG158747A1 (en) | 2010-02-26 |
US7235964B2 (en) | 2007-06-26 |
DE04758607T1 (de) | 2006-07-13 |
CN101806817A (zh) | 2010-08-18 |
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