CN1603836B - 用于内部特征重构的方法 - Google Patents

用于内部特征重构的方法 Download PDF

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Publication number
CN1603836B
CN1603836B CN2004100851999A CN200410085199A CN1603836B CN 1603836 B CN1603836 B CN 1603836B CN 2004100851999 A CN2004100851999 A CN 2004100851999A CN 200410085199 A CN200410085199 A CN 200410085199A CN 1603836 B CN1603836 B CN 1603836B
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China
Prior art keywords
artificial reference
artificial
thickness
imager
data
Prior art date
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Expired - Fee Related
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CN2004100851999A
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English (en)
Chinese (zh)
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CN1603836A (zh
Inventor
K·G·哈丁
A·B·F·雷贝洛
D·R·霍瓦德
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General Electric Co
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General Electric Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
CN2004100851999A 2003-09-30 2004-09-30 用于内部特征重构的方法 Expired - Fee Related CN1603836B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/676,990 US7015473B2 (en) 2003-09-30 2003-09-30 Method and apparatus for internal feature reconstruction
US10/676990 2003-09-30

Publications (2)

Publication Number Publication Date
CN1603836A CN1603836A (zh) 2005-04-06
CN1603836B true CN1603836B (zh) 2011-02-09

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CN2004100851999A Expired - Fee Related CN1603836B (zh) 2003-09-30 2004-09-30 用于内部特征重构的方法

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US (1) US7015473B2 (https=)
EP (1) EP1521056B1 (https=)
JP (1) JP4959930B2 (https=)
CN (1) CN1603836B (https=)

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US10362962B2 (en) 2008-11-18 2019-07-30 Synx-Rx, Ltd. Accounting for skipped imaging locations during movement of an endoluminal imaging probe
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CN101655355B (zh) * 2009-09-03 2010-12-08 无锡吉兴汽车部件有限公司 汽车天窗遮阳板型面变形量的检测方法
US10704958B2 (en) * 2010-10-21 2020-07-07 Siemens Energy, Inc. Method for monitoring a high-temperature region of interest in a turbine engine
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US9410905B2 (en) * 2013-03-27 2016-08-09 United Technologies Corporation Non-destructive inspection of an article using cross-sections through internal feature
JP6595841B2 (ja) * 2015-08-24 2019-10-23 株式会社荏原製作所 測定方法、傾向管理方法及び診断方法。
TWI659205B (zh) 2017-09-19 2019-05-11 財團法人工業技術研究院 即位量測系統、基準校準方法、誤差量測方法與電腦可讀取記錄媒體
DE102018218516A1 (de) 2018-10-29 2020-04-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Ermittlung von Designparametern eines Rotorblattes
KR102379295B1 (ko) * 2019-01-30 2022-03-25 바이두닷컴 타임즈 테크놀로지(베이징) 컴퍼니 리미티드 자율 주행 차량을 위한 rgb 포인트 클라우드 기반의 맵 생성 시스템
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Also Published As

Publication number Publication date
EP1521056B1 (en) 2015-09-09
CN1603836A (zh) 2005-04-06
US20050067568A1 (en) 2005-03-31
EP1521056A2 (en) 2005-04-06
JP2005106824A (ja) 2005-04-21
US7015473B2 (en) 2006-03-21
JP4959930B2 (ja) 2012-06-27
EP1521056A3 (en) 2005-04-13

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