CN118575064A - 柔性传感器以及柔性传感器的制造方法 - Google Patents
柔性传感器以及柔性传感器的制造方法 Download PDFInfo
- Publication number
- CN118575064A CN118575064A CN202280089744.8A CN202280089744A CN118575064A CN 118575064 A CN118575064 A CN 118575064A CN 202280089744 A CN202280089744 A CN 202280089744A CN 118575064 A CN118575064 A CN 118575064A
- Authority
- CN
- China
- Prior art keywords
- support substrate
- flexible sensor
- main substrate
- adhesive layer
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/225—Measuring circuits therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N79/00—Integrated devices, or assemblies of multiple devices, comprising at least one solid-state element covered by group H10N70/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/16—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge
- G01B7/18—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring the deformation in a solid, e.g. by resistance strain gauge using change in resistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/18—Measuring force or stress, in general using properties of piezo-resistive materials, i.e. materials of which the ohmic resistance varies according to changes in magnitude or direction of force applied to the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2206—Special supports with preselected places to mount the resistance strain gauges; Mounting of supports
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
- G01L5/16—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force
- G01L5/161—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using variations in ohmic resistance
- G01L5/1627—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using variations in ohmic resistance of strain gauges
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022009277 | 2022-01-25 | ||
| JP2022-009277 | 2022-01-25 | ||
| PCT/JP2022/043157 WO2023145220A1 (ja) | 2022-01-25 | 2022-11-22 | フレキシブルセンサ及びフレキシブルセンサの製造方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN118575064A true CN118575064A (zh) | 2024-08-30 |
Family
ID=87471416
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202280089744.8A Pending CN118575064A (zh) | 2022-01-25 | 2022-11-22 | 柔性传感器以及柔性传感器的制造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20240377180A1 (https=) |
| JP (1) | JPWO2023145220A1 (https=) |
| KR (1) | KR20240127396A (https=) |
| CN (1) | CN118575064A (https=) |
| WO (1) | WO2023145220A1 (https=) |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0758234B2 (ja) * | 1992-04-16 | 1995-06-21 | 株式会社エニックス | 半導体マトリクス型微細面圧分布センサ |
| JP3418561B2 (ja) | 1997-12-26 | 2003-06-23 | 豊明 木村 | 導電性粒子−高分子系による歪みセンサー |
| JP2003203523A (ja) * | 2002-01-08 | 2003-07-18 | Fujikura Ltd | 導電ペースト |
| US20050110767A1 (en) * | 2003-11-24 | 2005-05-26 | Elo Touchsystems, Inc. | Method of manufacturing touch sensor with switch tape strips |
| JP2005283329A (ja) * | 2004-03-30 | 2005-10-13 | Sanyo Electric Co Ltd | 感圧センサーパネルの製造方法 |
| JP2014228454A (ja) * | 2013-05-24 | 2014-12-08 | 株式会社フジクラ | 圧力センサ |
| JP6274029B2 (ja) * | 2014-06-18 | 2018-02-07 | 大日本印刷株式会社 | 圧力センサ装置およびその製造方法 |
| JP6358081B2 (ja) * | 2014-12-25 | 2018-07-18 | 大日本印刷株式会社 | 圧力センサ |
| JP6198804B2 (ja) * | 2015-12-01 | 2017-09-20 | 日本写真印刷株式会社 | 多点計測用のひずみセンサとその製造方法 |
| JP6912170B2 (ja) * | 2016-09-14 | 2021-07-28 | エルジー ディスプレイ カンパニー リミテッド | 接触検知装置及びその駆動方法 |
| KR102772195B1 (ko) * | 2017-02-28 | 2025-02-26 | 삼성디스플레이 주식회사 | 표시 장치 및 표시 장치의 제조 방법 |
| JP2018189583A (ja) * | 2017-05-10 | 2018-11-29 | 大日本印刷株式会社 | 圧力センサ装置 |
| US11243126B2 (en) * | 2017-07-27 | 2022-02-08 | Nextinput, Inc. | Wafer bonded piezoresistive and piezoelectric force sensor and related methods of manufacture |
| JP2020085613A (ja) * | 2018-11-22 | 2020-06-04 | ムネカタインダストリアルマシナリー株式会社 | 歪みセンサアレイおよびその製造方法 |
| JP7367932B2 (ja) * | 2020-01-23 | 2023-10-24 | 大日本印刷株式会社 | センサモジュール |
| JP7567196B2 (ja) * | 2020-04-20 | 2024-10-16 | Toppanホールディングス株式会社 | 圧力センサおよび圧力センサアレイ |
| CN111883556B (zh) * | 2020-07-13 | 2022-11-25 | 浙江清华柔性电子技术研究院 | 柔性触觉传感器及其制备方法 |
| CN112284581B (zh) * | 2020-10-27 | 2022-04-15 | 湖北长江新型显示产业创新中心有限公司 | 一种传感器、显示面板及电子设备 |
-
2022
- 2022-11-22 WO PCT/JP2022/043157 patent/WO2023145220A1/ja not_active Ceased
- 2022-11-22 JP JP2023576648A patent/JPWO2023145220A1/ja active Pending
- 2022-11-22 KR KR1020247024154A patent/KR20240127396A/ko active Pending
- 2022-11-22 CN CN202280089744.8A patent/CN118575064A/zh active Pending
-
2024
- 2024-07-22 US US18/779,202 patent/US20240377180A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2023145220A1 (https=) | 2023-08-03 |
| WO2023145220A1 (ja) | 2023-08-03 |
| KR20240127396A (ko) | 2024-08-22 |
| US20240377180A1 (en) | 2024-11-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20251121 Address after: Tokyo, Japan Applicant after: Nikon Country or region after: Japan Address before: Tokyo, Japan Applicant before: National Research and Development Corporation Industrial Technology Comprehensive Research Institute Country or region before: Japan Applicant before: Nikon |
|
| TA01 | Transfer of patent application right |