CN117890636A - Inspection socket and inspection device - Google Patents
Inspection socket and inspection device Download PDFInfo
- Publication number
- CN117890636A CN117890636A CN202311184570.6A CN202311184570A CN117890636A CN 117890636 A CN117890636 A CN 117890636A CN 202311184570 A CN202311184570 A CN 202311184570A CN 117890636 A CN117890636 A CN 117890636A
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- Prior art keywords
- probe
- inspection
- electrode
- housing
- inspection socket
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- 238000007689 inspection Methods 0.000 title claims abstract description 131
- 239000000523 sample Substances 0.000 claims abstract description 149
- 238000012986 modification Methods 0.000 description 12
- 230000004048 modification Effects 0.000 description 12
- 230000000694 effects Effects 0.000 description 3
- 230000005855 radiation Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 235000012149 noodles Nutrition 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Abstract
The invention provides an inspection socket and an inspection device, which have high contact reliability. The inspection socket includes at least 1 plate-like probe, a housing, and a conductive member. The probe has a first end portion disposed in one of the first directions and a second end portion disposed in the other of the first directions. The housing accommodates the probe therein with the first end portion exposed to the outside. The conductive member is disposed at a portion of the case closer to the second end than the first end in the first direction, and is electrically connected to the second end. The case extends in a second direction intersecting the first direction, and the probe is housed in the case so that the second direction is a thickness direction.
Description
Technical Field
The present disclosure relates to an inspection socket and an inspection apparatus.
Background
Patent document 1 describes an inspection device for a solar cell electrode.
Prior art literature
Patent literature
Patent document 1: japanese patent laid-open No. 2008-071989
Generally, in an inspection apparatus including an inspection apparatus of patent document 1, a spring probe (so-called spring probe) having a cylindrical shape is used. However, in general, the pogo pins do not have an end suitable for the shape of the electrode having a narrow width of the solar cell, and contact failure may occur during inspection.
Disclosure of Invention
An object of the present disclosure is to provide an inspection socket and an inspection apparatus with high contact reliability.
An inspection socket according to one embodiment of the present disclosure includes:
at least 1 plate-like probe having a first end portion provided in one of the first directions and a second end portion provided in the other of the first directions;
A case that houses the probe inside in a state in which the first end is exposed to the outside; and
A conductive member provided at a portion of the housing closer to the second end than the first end in the first direction and electrically connected to the second end,
The housing extends along a second direction intersecting the first direction,
The probe is accommodated in the housing so that the second direction is a thickness direction,
The first end of the probe is configured to face the electrode of the inspection object including the elongated electrode extending in the second direction in the first direction, and is configured to be capable of contacting the electrode in a state of intersecting the electrode.
An inspection device according to one embodiment of the present disclosure includes at least 1 inspection socket according to the above embodiment. According to the present disclosure, an inspection socket and an inspection apparatus with high contact reliability can be provided.
Drawings
Fig. 1 is a perspective view showing an inspection apparatus according to an embodiment of the present disclosure.
Fig. 2 is an enlarged front view of the inspection apparatus of fig. 1.
Fig. 3 is a cross-sectional view taken along line III-III of fig. 2.
Fig. 4 is a perspective view showing an inspection socket according to an embodiment of the present disclosure.
Fig. 5 is a sectional view taken along the line V-V of fig. 4.
Fig. 6 is a perspective view showing a probe of the inspection socket of fig. 4.
Fig. 7 is an enlarged perspective view showing the inspection socket of fig. 4 in a state where the pressing member is removed.
Fig. 8 is a cross-sectional view showing a first modification of the inspection socket of fig. 4.
Fig. 9 is an enlarged perspective view showing the inspection socket of fig. 8 with the pressing member removed.
Fig. 10 is a perspective view showing a probe according to a second modification of the inspection socket of fig. 4.
Fig. 11 is an enlarged plan view showing a second modification of the inspection socket of fig. 4.
Fig. 12 is an enlarged plan view of a probe pin showing a third modification of the inspection socket of fig. 4.
Fig. 13 is an enlarged plan view of a probe pin showing a fourth modification of the inspection socket of fig. 4.
Fig. 14 is an enlarged front view showing a fifth modification of the inspection socket of fig. 4.
Fig. 15 is a bottom view showing a conductive member of a sixth modification of the inspection socket of fig. 4.
Fig. 16 is a plan view showing a conductive member of a sixth modification of the inspection socket of fig. 4.
Description of the reference numerals
1 Inspection apparatus
10 Inspection socket
20 Probes
21 First end portion
22 Second end portion
30 Shell body
31 First shell
32 Second shell
33 First receiving portion
34 A second receiving portion
35 Hole part
36 Base member
40 Conductive member
41 First part
42 Second part
43 First body portion
44 First projection
45 Second body part
46 Second projection
47 Connection part
48 Third part
50 Pressing member
60 Fastening component
61 Locating pin
70 Terminal
100 Objects to be inspected
110 Electrode
120 First probe
201 First contact portion
202 Second contact portion
203 Elastic portion
204 Parts
205 Gap
206 First part
207 Second part
208 Side surfaces
211 Plane
220 Second probe
221 Projection
301 Window portion
321 Bottom surface
322 Upper surface
341. 342 Opening part
481. 482 Noodles
483 First electrode pattern
484 Second electrode pattern
Detailed Description
An example of the present disclosure will be described below with reference to the accompanying drawings. The following description is merely exemplary in nature and is not intended to limit the present disclosure, its application, or uses. The drawings are schematic, and the ratio of the dimensions and the like are not necessarily the same as in reality.
As shown in fig. 1, an inspection apparatus 1 according to an embodiment of the present disclosure includes at least 1 inspection socket 10. As shown in fig. 2 and 3, the inspection apparatus 1 is configured such that a first end 21 of a probe 20 of an inspection socket 10, which will be described later, faces an elongated electrode 110 of an inspection object (for example, a solar panel) 100 in a first direction (for example, Z direction), and is capable of contacting the electrode 110 in a state of intersecting (for example, being orthogonal to) the electrode 110. The electrode 110 extends, for example, along a second direction (e.g., X-direction) intersecting the first direction Z.
In the present embodiment, the inspection object 100 has a plurality of electrodes 110 arranged at intervals, for example, at equal intervals, in a third direction (for example, Y direction) intersecting the first direction Z and the second direction X, and the inspection apparatus 1 includes a plurality of inspection sockets 10 equal in number to the plurality of electrodes 110. The plurality of inspection sockets 10 are arranged at intervals, for example, at equal intervals in the third direction Y so that the first end 21 of the probe 20 of each inspection socket 10 can be in contact with each electrode 110. The inspection apparatus 1 is configured such that all inspection sockets 10 can be moved in the Z direction toward the inspection object 100 at the same time.
The inspection apparatus 1 may be configured as follows.
The dimension W1 of the probe 20 in the third direction Y is larger than the dimension W2 of the electrode 110 in the third direction Y.
The dimension W3 in the third direction Y of the inspection socket 10 is smaller than the straight-line distance W4 between the adjacent electrodes 110.
As shown in fig. 4 and 5, the inspection socket 10 includes: at least 1 plate-like probe 20; a housing 30 for accommodating the probe 20 therein; and a conductive member 40. In the present embodiment, the inspection socket 10 includes a plurality of probes 20 arranged at intervals in the second direction X. The plurality of probes 20 includes a first probe 120 and a second probe 220. The first probe 120 is, for example, a force probe (force pin), and the second probe 220 is, for example, a sense probe (sense pin). Each probe 20 is formed from a single piece.
As shown in fig. 6, the probe 20 has a first end 21 provided in one of the first directions Z and a second end 22 provided in the other of the first directions Z. In the present embodiment, the probe 20 includes: a first contact portion 201 having a first end portion 21; a second contact portion 202 having a second end 22; and an elastic portion 203 located between the first contact portion 201 and the second contact portion 202. The first contact portion 201 and the second contact portion 202 are positioned on an imaginary straight line L1 extending along the first direction Z, and are connected by an elastic portion 203.
The first contact portion 201 has a substantially rectangular plate shape extending along the first direction Z. An end of the first contact portion 201 that is farther from the second contact portion 202 in the first direction Z constitutes a first end 21. As an example, the surface of the first end portion 21 that can be in contact with the electrode 110 is curved. The elastic portion 203 is connected from the third direction Y to an end of the first contact portion 201 that is closer to the second contact portion 202 in the first direction Z.
The second contact portion 202 has a substantially rectangular plate shape extending along the first direction Z. The second contact portion 202 has a length in the first direction Z smaller than the first contact portion 201. An end of the second contact portion 202, which is farther from the first contact portion 201 in the first direction Z, constitutes the second end 22. The elastic portion 203 is connected from the third direction Y to an end of the second contact portion 202 that is closer to the first contact portion 201 in the first direction Z.
The elastic portion 203 includes a plurality of members 204 arranged with gaps 205 therebetween. Each member 204 has a plurality of first portions 206 and a plurality of second portions 207. The first portions 206 are arranged at intervals along the first direction Z, and each linearly extends along the third direction Y. Each second portion 207 has a substantially semicircular arc shape extending along the first direction Z, and both ends thereof are connected to the ends of the adjacent first portions 206, respectively. The first portions 206 located at both ends of each member 204 in the first direction Z are connected to the first contact portion 201 and the second contact portion 202, respectively, from the same side in the third direction Y. All of the first portion 206 and the second portion 207 are located on the same side with respect to a side 208 of the first contact 201. The side surface 208 is a side surface opposite to the side surface to which the first portion 206 of each member 204 is connected, of a pair of side surfaces of the first contact portion 201 intersecting the third direction Y.
As shown in fig. 4, the housing 30 extends along the second direction X, and as shown in fig. 5, the housing 30 is configured to be able to house the probe 20 inside in a state where the first end 21 is exposed to the outside. In the present embodiment, the housing 30 includes: a first housing 31 for housing the probe 20; and a second housing 32 capable of receiving and holding the first housing 31.
As shown in fig. 5, the first housing 31 has a substantially T-shaped cross section. The first housing 31 has a plurality of slit-shaped first storage portions 33, and the first storage portions 33 can store 1 probe 20 in a state where the first end portions 21 are exposed to the outside. The first housing 31 is provided with the first storage portions 33 having the number of probes 20 or more. The probe 20 is accommodated in the first accommodating portion 33 so that the second direction X is the thickness direction thereof. The plurality of first storage portions 33 are arranged along the second direction X so that the first end portions 21 of the stored probes 20 are aligned along the second direction X (see fig. 3).
As shown in fig. 4, the second housing 32 has a substantially rectangular parallelepiped shape. As shown in fig. 5, the second housing 32 has: a second housing 34 that can house and hold the first housing 31; and a plurality of hole portions 35 that can receive fastening members 60 for fixing the pressing member 50 to be described later to the housing 30. The second housing 34 penetrates the second housing 32 in the first direction Z, and the opening 342 that opens at the upper surface 322 that is closer to the second end 22 is larger than the opening 341 that opens at the bottom surface 321 that is closer to the first end 21 of the probe 20 in the first direction Z. As an example, the first end 311 of the first housing 31 stored in the second storage portion 34 protrudes slightly from the opening 341 to the outside of the second housing 32. The plurality of hole portions 35 are provided on the upper surface 322 of the second housing 32. The first housing 31 stored in the second storage portion 34 is positioned with respect to the second housing 32 by, for example, a positioning pin 61 (see fig. 7).
As shown in fig. 4, base members 36 are attached to both ends of the housing 30 in the second direction X. Each base member 36 extends from an upper surface 322 of the second housing 32 along the first direction Z.
As shown in fig. 5, the conductive member 40 is provided at a portion of the housing 30 closer to the second end 22 than the first end 21 of the probe 20 in the first direction Z, and is electrically connected to the second end 22. In the present embodiment, the conductive member 40 includes 2 electrically independent conductive sheets (hereinafter, referred to as a first member 41 and a second member 42). The first part 41 is in electrical contact with the first probe 120 and the second part 42 is in electrical contact with the second probe 220. The first member 41 and the second member 42 contain copper, for example.
As shown in fig. 7, the first member 41 has a first main body portion 43 and a first protruding portion 44 extending in the second direction X. The first protruding portion 44 extends from the first body portion 43 in a direction approaching the second member 42 in the third direction Y, and contacts the second end portion 22 of the first probe 120 as shown in fig. 5. In fig. 7, the pressing member 50 is omitted.
As shown in fig. 7, the second member 42 is disposed at a distance from the first member 41 in the third direction Y. The second member 42 has a second main body portion 45 and a second protruding portion 46 extending in the second direction X. The second protruding portion 46 extends from the second body portion 45 in a direction approaching the first member 41 in the third direction Y, and is in electrical contact with the second end portion 22 of the second probe 220 as shown in fig. 5.
As shown in fig. 5, the conduction member 40 is located between the case 30 and the pressing member 50, and is fixed to the case 30 by the pressing member 50. As shown in fig. 4, connection portions 47 connected to terminals 70 are provided at both ends of the conductive member 40 in the second direction X. One of the connection portions 47 is electrically connected to the first member 41, and the other of the connection portions 47 is electrically connected to the second member 42.
The inspection socket 10 can exhibit the following effects.
The inspection socket 10 includes at least 1 plate-like probe 20, a housing 30, and a conductive member 40. The probe 20 has a first end 21 provided in one of the first directions and a second end 22 provided in the other of the first directions. The case 30 accommodates the probe 20 therein in a state where the first end 21 is exposed to the outside. The conductive member 40 is provided at a portion of the case 30 closer to the second end 22 than the first end 21 in the first direction, and is electrically connected to the second end 22. The case 30 extends in a second direction intersecting the first direction, and the probe 20 is housed in the case 30 so that the second direction is the thickness direction. The first end 21 of the probe 20 faces the electrode 110 of the inspection object 100 including the elongated electrode 110 extending in the second direction in the first direction, and is configured to be capable of contacting the electrode 110 in a state of intersecting the electrode 110. With this configuration, the probe 20 can be more reliably brought into contact with the electrode 110 having a narrow width, and thus occurrence of contact failure can be reduced. As a result, the inspection socket 10 with high contact reliability can be realized.
Since the pogo pin is generally composed of a plurality of parts, current characteristics are unstable in an inspection socket using the pogo pin. In addition, for example, in the case of inspecting the function of a solar panel, it is necessary to irradiate light to the entire surface of the solar panel to be inspected. Therefore, in order to prevent the light irradiated to the solar panel from being blocked as much as possible, it is desirable to miniaturize or thin the inspection socket used for inspecting the solar panel. In order to meet this demand, it is necessary to miniaturize the probe housed in the inspection socket, but if the probe is miniaturized, a conduction path through which a high current flows is narrowed, and the probe generates heat during conduction, so there is a demand for improving heat dissipation of the inspection socket. In the inspection socket 10, since the plate-shaped probe 20 is used as a single member, the current characteristics can be stabilized, and the measured value can be stabilized during the inspection. Further, since the area of the plate-shaped probe 20 in contact with air can be increased as compared with the pogo pin, the heat radiation performance of the inspection socket 10 can be improved, and the rise in the resistance value of the probe 20 can be suppressed.
The inspection socket 10 can arbitrarily take any 1 or more of the following plural structures. That is, 1 or more of the structures shown below can be deleted arbitrarily when they are included in the above embodiment, and added arbitrarily when they are not included in the above embodiment. By adopting such a configuration, the inspection socket 10 having high contact reliability can be realized more reliably.
The inspection socket 10 includes a plurality of probes 20 arranged at intervals in the second direction.
The plurality of probes 20 includes a first probe 120 and a second probe 220. The conduction member 40 includes: a first member 41 in electrical contact with the first probe 120; and a second member 42 disposed at a spacing in the third direction with respect to the first member 41, electrically independent of the first member 41, and in electrical contact with the second probe 220. The first member 41 has: a first main body portion 43 extending in a second direction; and a first protruding portion 44 extending from the first body portion 43 in a direction approaching the second member 42 in the third direction and electrically contacting the second end portion 22 of the first probe 120. The second member 42 has: a second main body portion 45 extending in a second direction; and a second protruding portion 46 extending from the second body portion 45 in a direction approaching the first member 41 in the third direction and electrically contacting the second end portion 22 of the second probe 220.
The inspection apparatus 1 can exhibit the following effects.
The inspection device 1 includes an inspection socket 10. By means of the inspection socket 10, the inspection device 1 with high contact reliability can be realized.
The inspection apparatus 1 can arbitrarily employ any 1 or more of the following plural configurations. That is, 1 or more of the structures shown below can be deleted arbitrarily when they are included in the above embodiment, and added arbitrarily when they are not included in the above embodiment. By adopting such a configuration, the inspection apparatus 1 having high contact reliability can be realized more reliably.
The dimension W1 of the probe 20 in the third direction is larger than the dimension W2 of the electrode 110 in the third direction.
The dimension W3 of the inspection socket 10 in the third direction is smaller than the distance W4 between the adjacent electrodes 110.
The inspection device 1 and the inspection socket 10 may be configured as follows.
The number of probes 20 of the inspection socket 10 may be 1 or 3 or more. Fig. 8 and 9 show the inspection socket 10 in which the housing 30 includes a plurality of first housings 31, and a plurality of probes 20 are accommodated in each of the first housings 31. In fig. 9, the pressing member 50 is omitted.
In the inspection socket 10 of fig. 8 and 9, the plurality of probes 20 includes 4 first probes 120 and 2 second probes 220, and are arranged in order of 2 first probes 120, 2 second probes 220, and 2 first probes 120 along the second direction X. As shown in fig. 9, the conductive member 40 has 2 first protrusions 44 and 1 second protrusion 46. The first protruding portions 44 and the second protruding portions 46 are arranged at intervals along the second direction X, and the second protruding portions 46 are located between 2 first protruding portions 44. As shown in fig. 8, 2 first probes 120 are in contact with each first protrusion 44, and 2 second probes 220 are in contact with the second protrusions 46. That is, the inspection socket 10 may be configured such that the number of the first probes 120 is larger than the number of the second probes 220, and the number of the first protruding portions 44 is larger than the number of the second protruding portions 46.
The first probe 120 and the second probe 220 may have the same structure or may have different structures. For example, the probe 20 shown in fig. 10 may be used as the first probe 120, and the probe 20 of fig. 6 may be used as the second probe 220. The second contact portion 202 of the probe 20 of fig. 10 is located not on the virtual straight line L1 but on the virtual straight line L2, and the virtual straight line L2 is arranged at a distance from the virtual straight line L1 in the third direction Y and parallel to the virtual straight line L1. The probe 20 of fig. 10 has a smaller number of first portions 206 and second portions 207 in each member 204 of the elastic portion 203 than the probe 20 of fig. 6.
It is assumed that the probe 20 shown in fig. 10 is used as the first probe 120 and the probe 20 of fig. 6 is used as the second probe 220. In this case, for example, as shown in fig. 11, the shape of the second protruding portion 46 may be changed by aligning it with the position of the second end 22 of the second probe 220. In contrast, when the probe 20 of fig. 6 is used as the first probe 120 and the probe 20 of fig. 10 is used as the second probe 220, for example, the shape of the first protruding portion 44 may be changed by aligning it with the position of the first probe 120. That is, the number and shape of the first protruding portions 44 and the second protruding portions 46 can be changed according to the design of the inspection socket 10, and the like. In the inspection socket 10 of fig. 11, the second end portions 22 of the 4 first probes 120 are located on an imaginary straight line L3 extending along the second direction X, and the second end portions 22 of the 2 second probes 220 are located on an imaginary straight line L4, the imaginary straight line L4 being arranged at a spacing in the third direction Y with respect to the imaginary straight line L3 and being parallel to the imaginary straight line L3.
The probe 20 may be plate-shaped and have a first end 21 and a second end 22. For example, as shown in fig. 12, the first end 21 of the probe 20 may also have a flat surface 211 that can be in contact with the electrode 110. As shown in fig. 13, the second end 22 of the probe 20 may also have 2 protrusions 221. The probe 20 of fig. 13 includes 2 second contact portions 202 located at both ends in the third direction Y, and 1 protrusion 221 is provided in each of the second contact portions 202.
As shown in fig. 14, the housing 30 may have a window 301 through which the probe 20 housed inside can be visually checked from the outside of the housing 30. By providing the window 301, the state of the housed probe 20 can be checked and the heat radiation performance of the inspection socket 10 can be improved without detaching the first housing 31 from the second housing 32.
The conductive member 40 is not limited to a sheet, and may be a substrate (hereinafter referred to as a third member 48), for example. For example, as shown in fig. 15 and 16, the third member 48 has a pair of faces 481, 482 intersecting the first direction Z, on which electrode patterns are formed. The surface 481 of the third member 48 faces the housing 30, and the surface 482 of the third member 48 faces the pressing member 50. The electrode patterns include a first electrode pattern 483 electrically connected to the first probe 120 and a second electrode pattern 484 electrically connected to the second probe 220.
Various embodiments of the present disclosure have been described in detail above with reference to the drawings, and finally various embodiments of the present disclosure have been described. In the following description, reference numerals are given to the same examples.
The inspection socket 10 according to the first aspect of the present disclosure includes:
At least 1 plate-like probe 20 having a first end 21 provided in one of the first directions and a second end 22 provided in the other of the first directions;
a case 30 that houses the probe 20 in a state where the first end 21 is exposed to the outside; and
A conduction member 40 which is provided at a portion of the housing 30 closer to the second end 22 than the first end 21 in the first direction, and is electrically connected to the second end 22,
The housing 30 extends in the second direction,
The probe 20 is accommodated in the housing 30 so that a second direction intersecting the first direction is a thickness direction,
The first end 21 of the probe 20 faces the electrode of the inspection object including the elongated electrode extending in the second direction in the first direction, and is configured to be capable of contacting the electrode in a state of intersecting the electrode.
The inspection socket 10 according to the second aspect of the present disclosure includes a plurality of the probes 20 arranged at intervals along the second direction in the inspection socket 10 according to the first aspect.
The inspection socket 10 of the third aspect of the present disclosure includes, in the inspection socket 10 of the second aspect, a plurality of the probes 20 including a first probe 120 and a second probe 220 different from the first probe 120.
The inspection socket 10 of the fourth aspect of the present disclosure is in the inspection socket 10 of the second aspect,
The plurality of probes 20 includes a first probe 120 and a second probe 220,
The conduction member 40 includes:
a first member 41 in electrical contact with the first probe 120; and
A second member 42 disposed at a distance from the first member 41 in a third direction intersecting the first direction and the second direction, and electrically independent of the first member 41 and in electrical contact with the second probe 220,
The first member 41 includes:
a first body portion 43 extending along the second direction; and
A first protruding portion 44 extending from the first body portion 43 in a direction approaching the second member 42 in the third direction, in electrical contact with the second end portion 22 of the first probe 120,
The second member 42 has:
A second body portion 45 extending in the second direction; and
A second protruding portion 46 extending from the second body portion 45 in a direction approaching the first member 41 in the third direction and electrically contacting the second end portion 22 of the second probe 220.
The inspection socket 10 according to the fifth aspect of the present disclosure is the inspection socket 10 according to the third or fourth aspect, wherein the number of the first probes 120 is greater than the number of the second probes 220, and the number of the first protrusions 44 is greater than the number of the second protrusions 46.
In the inspection socket 10 according to the sixth aspect of the present disclosure, in the inspection socket 10 according to any one of the first to fifth aspects, the housing 30 has a window 301 in which the probe 20 housed therein can be visually confirmed from the outside.
The inspection device 1 according to the seventh aspect of the present disclosure includes at least 1 inspection socket 10 according to any one of the first to sixth aspects.
An inspection apparatus 1 according to an eighth aspect of the present disclosure is the inspection apparatus 1 according to the seventh aspect, wherein a dimension of the probe 20 in a third direction intersecting the first direction and the second direction is larger than a dimension of the electrode in the third direction.
An inspection apparatus 1 according to a ninth aspect of the present disclosure is the inspection apparatus 1 according to the seventh or eighth aspect, wherein the first end portion 21 of the probe 20 has a flat surface 211 that can be in contact with the electrode.
An inspection apparatus 1 according to a tenth aspect of the present disclosure is the inspection apparatus 1 according to any one of the seventh to ninth aspects, wherein the inspection object includes a plurality of the electrodes arranged at intervals in a third direction intersecting the first direction and the second direction, and the dimension of the inspection socket 10 in the third direction is smaller than the distance between the adjacent electrodes.
The effects of the respective embodiments and modifications can be exerted by appropriately combining any of the various embodiments and modifications. In addition, combinations of the embodiments or examples or combinations of the embodiments and examples can be performed, and combinations of features in different embodiments or examples can also be performed.
The present disclosure has been fully described in relation to the preferred embodiments with reference to the accompanying drawings, but various modifications and corrections can be made by those skilled in the art. It should be understood that such variations and modifications are included therein without departing from the scope of the present disclosure as set forth in the following claims.
[ Industrial applicability ]
The inspection socket of the present disclosure can be applied to, for example, an inspection device used for inspecting a solar panel.
The inspection apparatus of the present disclosure can be applied as an inspection apparatus for a solar panel, for example.
Claims (10)
1. An inspection socket, characterized in that,
The inspection socket includes:
at least 1 plate-like probe having a first end portion provided in one of the first directions and a second end portion provided in the other of the first directions;
A case that houses the probe inside in a state in which the first end is exposed to the outside; and
A conductive member provided at a portion of the housing closer to the second end than the first end in the first direction and electrically connected to the second end,
The housing extends along a second direction intersecting the first direction,
The probe is accommodated in the housing so that the second direction is a thickness direction,
The first end of the probe is configured to face the electrode of the inspection object including the elongated electrode extending in the second direction in the first direction, and to be capable of contacting the electrode in a state of intersecting the electrode.
2. The inspection receptacle of claim 1 wherein the inspection receptacle,
The inspection socket includes a plurality of probes arranged at intervals along the second direction.
3. The inspection receptacle of claim 2 wherein the inspection receptacle,
The plurality of probes includes a first probe and a second probe different from the first probe.
4. The inspection receptacle of claim 2 wherein the inspection receptacle,
The plurality of probes includes a first probe and a second probe,
The conductive member includes:
a first component in electrical contact with the first probe; and
A second member disposed at a spacing from the first member in a third direction intersecting the first direction and the second direction, electrically independent of the first member, and in electrical contact with the second probe,
The first member has:
a first body portion extending in the second direction; and
A first protruding portion extending from the first body portion in a direction approaching the second member in the third direction, in electrical contact with the second end portion of the first probe,
The second member has:
A second body portion extending along the second direction; and
And a second protruding portion extending from the second body portion in a direction approaching the first member in the third direction and electrically contacting the second end portion of the second probe.
5. The inspection receptacle of claim 4 wherein the inspection receptacle,
The number of the first probes is greater than the number of the second probes,
The number of the first protruding parts is larger than the number of the second protruding parts.
6. The inspection socket of any one of claims 1 to 4, wherein,
The housing has a window portion in which the probe accommodated therein can be visually checked from the outside.
7. An inspection apparatus comprising at least 1 inspection socket according to any one of claims 1 to 4.
8. The inspection apparatus of claim 7, wherein,
A dimension of the probe in a third direction intersecting the first direction and the second direction is larger than a dimension of the electrode in the third direction.
9. The inspection apparatus of claim 7, wherein,
The first end of the probe has a planar surface capable of contacting the electrode.
10. The inspection apparatus of claim 7, wherein,
The inspection object includes a plurality of electrodes arranged at intervals in a third direction intersecting the first direction and the second direction,
The dimension of the inspection socket in the third direction is smaller than the distance between adjacent electrodes.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022-164684 | 2022-10-13 | ||
| JP2022164684A JP2024057787A (en) | 2022-10-13 | 2022-10-13 | Inspection socket and inspection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN117890636A true CN117890636A (en) | 2024-04-16 |
Family
ID=88338660
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320042767.5U Active CN219871495U (en) | 2022-10-13 | 2023-01-06 | Inspection socket and inspection device |
| CN202311184570.6A Pending CN117890636A (en) | 2022-10-13 | 2023-09-14 | Inspection socket and inspection device |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320042767.5U Active CN219871495U (en) | 2022-10-13 | 2023-01-06 | Inspection socket and inspection device |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP2024057787A (en) |
| KR (1) | KR20240051822A (en) |
| CN (2) | CN219871495U (en) |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4781948B2 (en) | 2006-09-15 | 2011-09-28 | 信越半導体株式会社 | Solar cell electrode inspection apparatus and solar cell electrode inspection method |
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2022
- 2022-10-13 JP JP2022164684A patent/JP2024057787A/en active Pending
-
2023
- 2023-01-06 CN CN202320042767.5U patent/CN219871495U/en active Active
- 2023-09-13 KR KR1020230121533A patent/KR20240051822A/en unknown
- 2023-09-14 CN CN202311184570.6A patent/CN117890636A/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| KR20240051822A (en) | 2024-04-22 |
| CN219871495U (en) | 2023-10-20 |
| JP2024057787A (en) | 2024-04-25 |
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