CN117805539A - Dynamic parameter testing device and sorting machine for power device - Google Patents
Dynamic parameter testing device and sorting machine for power device Download PDFInfo
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- CN117805539A CN117805539A CN202410225230.1A CN202410225230A CN117805539A CN 117805539 A CN117805539 A CN 117805539A CN 202410225230 A CN202410225230 A CN 202410225230A CN 117805539 A CN117805539 A CN 117805539A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
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Abstract
The invention relates to the technical field of power device testing, and discloses a dynamic parameter testing device and a sorting machine of a power device, wherein the testing device comprises: the device comprises a first driving unit, a second driving unit, a driving switching unit and a testing mode switching unit, wherein the first end of the driving switching unit is connected with the first driving unit and the second driving unit respectively, the second end of the driving switching unit is connected with a first power device to be tested and a second power device to be tested respectively, and the first power device to be tested and the second power device to be tested are connected in series; the test mode switching unit is respectively connected with the first power device to be tested and the second power device to be tested. By driving different switching states of the switching unit and the test mode switching unit, synchronous abnormal dynamic parameter measurement can be carried out on two power devices DUT to be tested at the same time, and a single test device can obtain required test data only by executing 2 test actions, so that the aim of shortening test time is fulfilled.
Description
Technical Field
The invention relates to the technical field of power device testing, in particular to a dynamic parameter testing device and a sorting machine for a power device.
Background
The existing measuring system (AC test) of the dynamic parameter TESTER for the power device in the market generally uses a single channel and a single station for testing, and has the defect of overlong testing time due to the fact that the measuring system needs to be communicated with an oscilloscope continuously to collect test data. In order to reduce the testing time of dynamic parameters, a dual tester may be used, where DUT (Device Under Test, which refers to the device to be tested in the communication system) on two testing stations on the same sorter (Handler) are measured separately, and then the testing data are combined and printed out, so that the testing equipment cost is doubled, and more space resources are needed to place the tester, although the time can be shortened by half. The test device is also a single tester, a double-channel and double-station, the DUT1 and the DUT2 are respectively tested by switching the relays, the DUT2 is tested after the DUT1 is tested, and the dynamic parameter test efficiency is not obviously improved although the movement efficiency of the test claw of the sorting machine is improved.
Disclosure of Invention
In view of the above, the present invention provides a dynamic parameter testing device and a sorting machine for power devices, so as to solve the problem of low testing efficiency of the current dynamic parameter tester.
In a first aspect, the present invention provides a dynamic parameter testing apparatus for a power device, including: a first driving unit, a second driving unit, a driving switching unit and a test mode switching unit, wherein,
the first end of the driving switching unit is connected with the first driving unit and the second driving unit respectively, the second end of the driving switching unit is connected with a first power device to be tested and a second power device to be tested respectively, and the first power device to be tested and the second power device to be tested are connected in series;
the test mode switching unit is respectively connected with the first power device to be tested and the second power device to be tested;
the driving switching unit and the test mode switching unit work cooperatively, and the first power device to be tested and the second power device to be tested are controlled to synchronously and differently measure dynamic parameters through different switching states of the driving switching unit and the test mode switching unit.
In an alternative embodiment, the driving switching unit includes: a first double-knife double-placed relay and a second double-knife double-placed relay, wherein,
the first moving contact of the first double-blade double-placed relay is connected with the control end of the first power device to be tested, the second moving contact of the first double-blade double-placed relay is connected with the second end of the first power device to be tested, the first normally closed contact and the second normally closed contact of the first double-blade double-placed relay are connected with the second driving unit, and the first normally open contact and the second normally open contact of the first double-blade double-placed relay are connected with the first driving unit;
the first moving contact of the second double-pole double-placed relay is connected with the control end of the second power device to be tested, the second moving contact of the second double-pole double-placed relay is connected with the second end of the second power device to be tested, the first normally closed contact and the second normally closed contact of the second double-pole double-placed relay are connected with the first driving unit, the first normally open contact and the second normally open contact of the second double-pole double-placed relay are connected with the second driving unit, and the second end of the second power device to be tested is grounded.
In an alternative embodiment, the test mode switching unit includes: a first switch, a second switch, a third switch and a fourth switch, wherein,
the first end of the first switch is connected with the first end of the first power device to be tested, the second end of the first switch is connected with the first end of the second switch, and the second end of the second switch is connected with the second end of the second power device to be tested;
the first end of the third switch is connected with the first end of the first power device to be tested, the second end of the third switch is connected with the first end of the fourth switch, and the second end of the fourth switch is connected with the second end of the second power device to be tested.
In an alternative embodiment, the dynamic parameter testing apparatus of a power device further includes: the first end of the programmable power supply unit is connected with the first end of the first power device to be tested, and the second end of the programmable power supply unit is connected with the second end of the second power device to be tested.
In an alternative embodiment, the programmable power supply unit includes: the programmable power supply, the bus switching device and the first capacitor group, wherein,
the positive electrode of the programmable power supply is respectively connected with the first end of the bus switching device and the first end of the first capacitor bank, the negative electrode of the programmable power supply and the second end of the first capacitor bank are both connected with the second end of the second power device to be tested, the control end of the bus switching device is connected with a driving signal and the driving power supply, and the second end of the bus switching device is connected with the first end of the first power device to be tested.
In an alternative embodiment, the dynamic parameter testing apparatus of a power device further includes: the power sensor comprises an adjustable power inductor and a current sensor, wherein the first end of the adjustable power inductor is respectively connected with the second end of the first power device to be measured, the first end of the second power device to be measured, the second end of the third switch and the first end of the fourth switch, the second end of the adjustable power inductor is connected with the first end of the current sensor, and the second end of the current sensor is respectively connected with the second end of the first switch and the first end of the second switch.
In an alternative embodiment, the dynamic parameter testing apparatus of a power device further includes: the first end of the second capacitor is connected with the first end of the first power device to be tested, and the second end of the second capacitor is connected with the second end of the second power device to be tested.
In an alternative embodiment, the dynamic parameter testing apparatus of a power device further includes: and the oscilloscope is used for measuring the switching time parameter, the latch current parameter, the grid charge parameter and the reverse recovery time parameter of the first power device to be tested and the second power device to be tested.
In an alternative embodiment, the oscilloscope is an 8-channel or more high-speed digital oscilloscope.
In a second aspect, the present invention provides a sorting machine, including the dynamic parameter testing apparatus of the power device of the first aspect or any embodiment corresponding to the first aspect.
The invention provides a dynamic parameter testing device of a power device, which comprises: the device comprises a first driving unit, a second driving unit, a driving switching unit and a testing mode switching unit, wherein the first end of the driving switching unit is connected with the first driving unit and the second driving unit respectively, the second end of the driving switching unit is connected with a first power device to be tested and a second power device to be tested respectively, and the first power device to be tested and the second power device to be tested are connected in series; the test mode switching unit is respectively connected with the first power device to be tested and the second power device to be tested, the driving switching unit and the test mode switching unit work cooperatively, and the first power device to be tested and the second power device to be tested are controlled to synchronously and abnormally measure dynamic parameters through different switching states of the driving switching unit and the test mode switching unit. By driving different switching states of the switching unit and the test mode switching unit, synchronous abnormal dynamic parameter measurement can be carried out on two power devices DUT to be tested at the same time, and a single test device can obtain required test data only by executing 2 test actions, so that the aim of shortening test time is fulfilled.
The invention provides a sorting machine, which applies a dynamic parameter testing device of a power device to the sorting machine to realize synchronous abnormal measurement of dynamic parameters of two DUTs, thereby achieving the purpose of reducing testing time.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are needed in the description of the embodiments or the prior art will be briefly described, and it is obvious that the drawings in the description below are some embodiments of the present invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a functional block diagram of a dynamic parameter testing apparatus for a power device according to an embodiment of the present invention;
FIG. 2 is a circuit block diagram of a dynamic parameter testing apparatus for a power device according to an embodiment of the present invention;
FIG. 3 is yet another circuit block diagram of a dynamic parameter testing apparatus of a power device according to an embodiment of the present invention;
FIG. 4 is yet another circuit block diagram of a dynamic parameter testing apparatus of a power device according to an embodiment of the present invention;
FIG. 5 is a timing diagram of a dynamic parameter testing process according to an embodiment of the present invention;
FIG. 6 is yet another circuit block diagram of a dynamic parameter testing apparatus of a power device according to an embodiment of the present invention;
FIG. 7 is yet another timing diagram of a dynamic parameter testing process according to an embodiment of the present invention;
FIG. 8 is yet another circuit block diagram of a dynamic parameter testing apparatus of a power device according to an embodiment of the present invention;
FIG. 9 is yet another circuit block diagram of a dynamic parameter testing apparatus of a power device according to an embodiment of the present invention;
FIG. 10 is yet another timing diagram of a dynamic parameter testing process according to an embodiment of the present invention;
FIG. 11 is a top view of a schematic of a translational classifier according to an embodiment of the invention;
FIG. 12 is a schematic illustration of bridge type dynamic parameter test station placement in accordance with an embodiment of the present invention;
FIG. 13 is yet another schematic illustration of bridge type dynamic parameter test station placement in accordance with an embodiment of the present invention;
FIG. 14 is yet another schematic illustration of bridge type dynamic parameter test station placement in accordance with an embodiment of the present invention;
FIG. 15 is a schematic front and left view of a gravity separator according to an embodiment of the present invention;
FIG. 16 is yet another schematic illustration of bridge type dynamic parameter test station placement in accordance with an embodiment of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the present invention, it should be noted that the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; the two components can be directly connected or indirectly connected through an intermediate medium, or can be communicated inside the two components, or can be connected wirelessly or in a wired way. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
In addition, the technical features of the different embodiments of the present invention described below may be combined with each other as long as they do not collide with each other.
The invention provides a dynamic parameter testing device of a power device, as shown in figure 1, comprising: a first driving unit 11, a second driving unit 12, a driving switching unit 13, and a test mode switching unit 14. The first end of the driving switching unit 13 is connected to the first driving unit 11 and the second driving unit 12, and the second end of the driving switching unit 13 is connected to the first power device under test h_dut and the second power device under test l_dut, which are connected in series. The test mode switching unit 14 is connected to the first power device under test h_dut and the second power device under test l_dut, respectively.
Specifically, the drive switching unit 13 controls the first power device under test h_dut and the second power device under test l_dut to connect different drive signals and drive power supplies using different switching states. The test mode switching unit 14 controls the first power device under test h_dut and the second power device under test l_dut to be connected to different dynamic parameter measurement circuits using different switching states. The driving switching unit 13 and the test mode switching unit 14 work cooperatively, and the first power device to be tested H_DUT and the second power device to be tested L_DUT are controlled to synchronously and differently measure dynamic parameters through different switching states of the driving switching unit 13 and the test mode switching unit 14.
The invention provides a dynamic parameter testing device of a power device, which comprises: the device comprises a first driving unit, a second driving unit, a driving switching unit and a testing mode switching unit, wherein the first end of the driving switching unit is connected with the first driving unit and the second driving unit respectively, the second end of the driving switching unit is connected with a first power device to be tested and a second power device to be tested respectively, and the first power device to be tested and the second power device to be tested are connected in series; the test mode switching unit is respectively connected with the first power device to be tested and the second power device to be tested, the driving switching unit and the test mode switching unit work cooperatively, and the first power device to be tested and the second power device to be tested are controlled to synchronously and abnormally measure dynamic parameters through different switching states of the driving switching unit and the test mode switching unit. By driving different switching states of the switching unit and the test mode switching unit, synchronous abnormal dynamic parameter measurement can be carried out on two power devices DUT to be tested at the same time, and a single test device can obtain required test data only by executing 2 test actions, so that the aim of shortening test time is fulfilled.
In an alternative embodiment, as shown in fig. 2, the driving switching unit 13 includes: a first double-knife double-placed relay K5 and a second double-knife double-placed relay K6. The first moving contact of the first double-knife double-placed relay K5 is connected with the control end of the first power device to be tested H_DUT, the second moving contact of the first double-knife double-placed relay K5 is connected with the second end of the first power device to be tested H_DUT, the first normally-closed contact and the second normally-closed contact of the first double-knife double-placed relay K5 are connected with the second driving unit 12, and the first normally-open contact and the second normally-open contact of the first double-knife double-placed relay K5 are connected with the first driving unit 11. The first moving contact of the second double-knife double-placed relay K6 is connected with the control end of the second power device to be tested L_DUT, the second moving contact of the second double-knife double-placed relay K6 is connected with the second end of the second power device to be tested L_DUT, the first normally-closed contact and the second normally-closed contact of the second double-knife double-placed relay K6 are connected with the first driving unit 11, the first normally-open contact and the second normally-open contact of the second double-knife double-placed relay K6 are connected with the second driving unit 12, and the second end of the second power device to be tested L_DUT is grounded.
Specifically, the first power device under test h_dut may be connected to the first driving unit 11 or the second driving unit 12 through the first two-knife two-position relay K5. The second power device under test l_dut may be connected to the first driving unit 11 or the second driving unit 12 through the second double-pole double-relay K6.
The first driving unit 11 includes an operational amplifier, a first diode d_p, a second diode d_n, a first adjustable gate driving resistor array r_p, and a second adjustable gate driving resistor array r_n. The input end of the operational amplifier is connected with the driving signal VG, the positive power supply is connected with the driving power supply VG+, the negative power supply is connected with the driving power supply VG-, and the output end of the operational amplifier is respectively connected with the anode of the first diode D_P and the cathode of the second diode D_N. The cathode of the first diode D_P is connected with the first end of the first adjustable grid driving resistor array R_P, and the anode of the second diode D_N is connected with the first end of the second adjustable grid driving resistor array R_N. The second end of the first adjustable grid driving resistor array R_P is respectively connected with the second end of the second adjustable grid driving resistor array R_N, the first normally-open contact of the first double-knife double-placed relay K5 and the first normally-closed contact of the second double-knife double-placed relay K6.
Further, the second normally closed contact of the second double-pole double-relay K6 is connected to the ground terminal vg_gnd of the first driving unit 11. The first normally open contact of the second double-pole relay K6 is connected with the negative voltage VEE of the second driving unit 12, and the second normally open contact of the second double-pole relay K6 is connected with the ground end GND of the second driving unit 12. The first normally closed contact of the first double-knife double-placed relay K5 is connected with the negative pressure VEE of the second driving unit 12, and the second normally closed contact of the first double-knife double-placed relay K5 is connected with the grounding end GND of the second driving unit 12. The second normally open contact of the first double-pole double-relay K5 is connected to the ground vg_gnd of the first drive unit 11.
In the embodiment of the invention, the driving power supply VG+, the driving power supply VG and the driving power supply VEE are adjustable low-voltage isolation driving power supplies, and a user can set the voltage value of the adjustable low-voltage isolation driving power supplies according to the requirement. The driving power supply VG+ and the driving power supply VG-are connected in common, and the grid on and off voltages of the first power device to be tested H_DUT and the second power device to be tested L_DUT are regulated by regulating the driving power supply VG+ and the driving power supply VG-. And regulating the grid closing voltage of the first power device to be tested H_DUT and the grid closing voltage of the second power device to be tested L_DUT by regulating the driving power supply VEE. When the driving signal VG controls the second power device under test l_dut, the second power device under test l_dut enters an on state, and the first power device under test h_dut enters an off state by connecting the negative voltage VEE, and vice versa. The first diode D_P, the second diode D_N, the first adjustable grid driving resistor array R_P and the second adjustable grid driving resistor array R_N are respectively used for adjusting the opening and closing speeds of the DUT.
In an alternative embodiment, as shown in fig. 2, the test mode switching unit 14 includes: a first switch K1, a second switch K2, a third switch K3 and a fourth switch K4. The first end of the first switch K1 is connected to the first end of the first power device under test h_dut, the second end of the first switch K1 is connected to the first end of the second switch K2, and the second end of the second switch K2 is connected to the second end of the second power device under test l_dut. The first end of the third switch K3 is connected with the first end of the first power device to be tested H_DUT, the second end of the third switch K3 is connected with the first end of the fourth switch K4, and the second end of the fourth switch K4 is connected with the second end of the second power device to be tested L_DUT.
Specifically, the first switch K1, the second switch K2, the third switch K3, and the fourth switch K4 are single-pole single-set relays. The purpose of switching test modes is achieved by controlling the switching state of the 4 single-pole single-position relays.
Illustratively, on the basis of releasing the third switch K3 and the fourth switch K4, the first switch K1 and the second switch K2 are sequentially closed, and the dynamic parameter testing device of the power device is sequentially controlled to perform the switching time parameter test, the latch current test, the gate charge test and the reverse recovery time test of the power devices h_dut and l_dut to be tested. And on the basis of releasing the first switch K1 and the second switch K2, sequentially closing the third switch K3 and the fourth switch K4, and sequentially controlling a dynamic parameter testing device of the power device to perform short-circuit parameter testing of the power device to be tested L_DUT and the H_DUT.
Further, in the application case that the DUT needs a high-current short circuit test, in order to avoid the influence of the internal resistance of the relay being large, the single-pole single-relay K1, K2, K3, K4 can replace the high-power IGBT device, as shown in fig. 3.
In an alternative embodiment, the specific process of controlling the first power device under test h_dut and the second power device under test l_dut to perform dynamic parameter measurement through different switching states of the driving switching unit 13 and the test mode switching unit 14 is as follows:
the first switch K1 is closed, the second switch K2, the third switch K3, the fourth switch K4, the first double-knife double-placed relay K5 and the second double-knife double-placed relay K6 are released, the driving signal VG is connected to the second power device to be tested L_DUT, the second power device to be tested L_DUT is opened, the first power device to be tested H_DUT is connected with the negative pressure VEE to be in an off state, and the test loop is simplified as shown in FIG. 4. At the moment, the switching time parameter test, the latch current test and the grid charge test can be performed on the second power device to be tested L_DUT, and the reverse recovery time test can be performed on the first power device to be tested H_DUT. The corresponding time sequence diagram is shown in fig. 5, the oscillograph transmits the waveforms of channels 1-8 back to the upper computer for data analysis and test result output, and the output results comprise: the second power device under test L_DUT switching time and its associated parameter data, the latch current and its associated parameter data, the gate charge and its associated parameter data, and the reverse recovery time of the first power device under test H_DUT and its associated parameter data.
The second switch K2, the first double-knife double-placed relay K5 and the second double-knife double-placed relay K6 are closed, the first switch K1, the third switch K3 and the fourth switch K4 are released, the driving signal VG is connected to the first device to be tested H_DUT, the first device to be tested H_DUT is opened, the second device to be tested L_DUT is connected with the negative pressure VEE to be in a cut-off state, and the test loop is simplified as shown in figure 6. At the moment, the switching time parameter test, the latch current test and the grid charge test can be performed on the first power device to be tested H_DUT, and the reverse recovery time test can be performed on the second power device to be tested L_DUT. The corresponding time sequence diagram is shown in fig. 7, the oscillograph transmits the waveforms of channels 1-8 back to the upper computer for data analysis and test result output, and the output results comprise: the reverse recovery time of the second power device under test L_DUT and related parameter data thereof, and the switching time of the first power device under test H_DUT and related parameter data thereof, the latch current and related parameter data thereof, and the gate charge and related parameter data thereof.
When the test items are performed by using the current commercially available testers, since separate data measurement is required for the two DUTs, a single tester needs to perform 4 test actions (two tests for each of the h_dut and the l_dut) to obtain the test data of the test items. By the test device, synchronous abnormal state parameter measurement can be carried out on two DUTs at the same time, and the same test data can be obtained by only executing 2 test actions by a single test device, so that the aim of shortening the test time is fulfilled.
Since the large current short circuit parameter test is not needed to use a test accompanying tube in principle, the first power device under test h_dut and the second power device under test l_dut still need to be tested separately.
When the short-circuit parameters of the second power device to be tested L_DUT are tested, the third switch K3 is closed, the first switch K1, the second switch K2, the fourth switch K4, the first double-knife double-placed relay K5 and the second double-knife double-placed relay K6 are released, the driving signal VG is connected to the second power device to be tested L_DUT, the second power device to be tested L_DUT is opened, the first power device to be tested H_DUT is connected with the negative pressure VEE in a cut-off state and is short-circuited by the third switch K3, and the measuring loop is simplified at the moment as shown in fig. 8.
When the short-circuit parameters of the first to-be-tested power device H_DUT are tested, the fourth switch K4, the first double-knife double-placed relay K5 and the second double-knife double-placed relay K6 are closed, the first switch K1, the second switch K2 and the third switch K3 are released, the driving signal VG is connected to the first to-be-tested power device H_DUT, the first to-be-tested power device H_DUT is opened, the second to-be-tested power device L_DUT is connected with the negative pressure VEE in a cut-off state and is short-circuited by the fourth switch K4, and the measuring loop is simplified at the moment as shown in fig. 9.
The time sequence diagram corresponding to the large-current short-circuit parameter test is shown in fig. 10, and due to the specificity of the test item, the oscilloscopes are divided into two times to transmit waveforms of channels 1-4 and channels 5-8 back to the upper computer for data analysis processing and test result output.
In an alternative embodiment, as shown in fig. 2, the dynamic parameter testing apparatus of a power device further includes: the power-adjustable power inductor L and the current sensor I_Sense are respectively connected with the second end of the first power device to be measured H_DUT, the first end of the second power device to be measured L_DUT, the second end of the third switch K3 and the first end of the fourth switch K4, the second end of the power-adjustable inductor L is connected with the first end of the current sensor I_Sense, and the second end of the current sensor I_Sense is respectively connected with the second end of the first switch K1 and the first end of the second switch K2.
Specifically, in order to avoid the excessive rising speed of the loop current in the dynamic parameter testing process, an adjustable power inductor L may be set in the dynamic parameter testing device of the power device. The current sensor I_sense is used for sampling the current value flowing through the adjustable power inductor and uploading the current value to the upper computer.
In an alternative embodiment, as shown in fig. 2, the dynamic parameter testing apparatus of a power device further includes: the first end of the programmable power supply unit is connected with the first end of the first power device to be tested H_DUT, and the second end of the programmable power supply unit is connected with the second end of the second power device to be tested L_DUT.
Specifically, as shown in fig. 2, the programmable power supply unit includes: program-controlled POWER source HV_POWER, bus switch device S1 and first capacitor group C1. The positive electrode of the programmable POWER source HV_POWER is respectively connected with the first end of the bus switching device S1 and the first end of the first capacitor group C1, the negative electrode of the programmable POWER source HV_POWER and the second end of the first capacitor group C1 are both connected with the second end of the second POWER device to be tested L_DUT, the control end of the bus switching device S1 is connected with the driving signal VS and the driving POWER source HVCC, and the second end of the bus switching device S1 is connected with the first end of the first POWER device to be tested H_DUT.
In the embodiment of the present invention, the programmable POWER source hv_power is used for setting a test voltage value to charge the first capacitor group C1. The bus switching device S1 is used for switching on before testing and switching off bus current output after testing, and can also be used for rapidly switching off a main loop when the dynamic parameter testing device outputs abnormal current. The bus switching device S1 is composed of a plurality of high-power IGBT modules connected in parallel. The driving power source HVCC is used for adjusting the maximum upper limit current value of the IGBT module in the bus switch device S1, preventing the dynamic parameter testing device from being damaged and playing a role in protection. The driving power source HVCC is also an adjustable low-voltage isolation driving power source, and a user can set the voltage value of the driving power source HVCC according to needs. The first capacitor group C1 is a thin film high voltage capacitor group, and is used for providing energy during testing, especially for high current short circuit testing. The driving signal VS is used to control the on and off of the bus bar switching device S1. A resistor R is connected in series between the driving signal VS and the control terminal of the busbar switching device S1, and is used for adjusting the switching speed of the busbar switching device S1.
In an alternative embodiment, as shown in fig. 2, the dynamic parameter testing apparatus of a power device further includes: and a first end of the second capacitor C2 is connected with a first end of the first power device to be tested H_DUT, and a second end of the second capacitor C2 is connected with a second end of the second power device to be tested L_DUT.
Specifically, the second capacitor C2 is used to improve the switching time measurement waveforms of the power devices under test h_dut and l_dut.
In an alternative embodiment, as shown in fig. 2, the dynamic parameter testing apparatus of a power device further includes: OSC for measuring a switching time parameter, a latch current parameter, a gate charge parameter, and a reverse recovery time parameter of the first and second power devices under test h_dut and l_dut.
Specifically, the oscillograph OSC is an 8-channel or more high-speed digital oscilloscope, and is used for sampling a waveform related to a test and uploading waveform data related to the sampling test to an upper computer, so that processing of measurement data and outputting a measurement result are performed in the upper computer. As shown in fig. 2, the signal sampling terminal related to the second power device under test l_dut includes: the measuring end of the differential voltage probe is connected to the G pole and the S pole of the L_DUT, and the differential voltage probe is output to the oscilloscope channel 1 to measure the L_VGS signal; the measuring end of the differential voltage probe is connected to the D pole and the S pole of the L_DUT, and the differential voltage probe is output to the oscilloscope channel 2 to measure the L_VDS signal; the current sensors l_ids and l_ig are directly connected to oscilloscope channels 3 and 4, respectively. Signal sampling terminal related to first device under test h_dut: the measurement end of the differential voltage probe is connected to the G pole and the S pole of the H_DUT, and the measurement end is output to the oscilloscope channel 5 to measure the H_VGS signal; the measuring end of the differential voltage probe is connected to the D pole and the S pole of the H_DUT, and the differential voltage probe is output to an oscilloscope channel 6 to measure H_VDS signals; the current sensors h_ids and h_ig are directly connected to oscilloscope channels 7 and 8, respectively.
The invention provides a sorting machine, which comprises the dynamic parameter testing device of the power device in the embodiment.
Particularly, the sorting machine is used for testing devices with larger size before packaging such as wafers, KGD, IGBT modules, MOSFET modules and the like. The separator may be classified into a translational separator, a gravity separator, and a turret separator according to the separator structure.
As shown in fig. 11, a schematic top view of the translational classifier is shown. From left to right are the Feed zone (Feed Area), static parameter test station (DC test), bridge dynamic parameter test station (AC test), avalanche parameter test station (EAS TESTER), post static parameter test station (DC test), and discharge zone (out Feed Area), respectively. The DUT is placed in the Feed Area, the DUT is placed in each TEST station for testing through movement and grabbing of a manipulator, the TEST sequence is DC TEST- > AC TEST- > EAS TEST- > DC TEST, and then the DUT is placed in steps according to different TEST results. The sorting machine is in the form of a double-guide-rail sorting machine, and can test twice more DUTs simultaneously in the same time, so that the test productivity is effectively improved; the dynamic parameter testing device of the power device in the embodiment is applied to a bridge type dynamic parameter testing station.
Among these tests, dynamic parametric tests require that the tester be placed close to the DUT and that the closer the test waveform and data are, the more accurate the test data and waveform are due to the excessively high switching speeds (di/dt current rise (speed) and dv/dt voltage rise (speed) rates).
FIG. 12 illustrates the placement of a bridge dynamic parameter test station (AC TESTER). The AC test is placed below the DUT, and the test needle or the copper sheet pressing block is exposed at the top of the AC test and is directly and effectively contacted with the DUT, so that the situation of line stray inductance increase caused by long test line length is reduced. The line stray inductance directly affects the performance of the tester, and the more stable the tester stray inductance is, the smaller the tester stray inductance is.
As shown in fig. 13, the user can put the AC test upside down on the DUT according to the actual situation such as the mounting position of the sorter and the pin-out manner of the DUT, and the purpose of shortening the test line length can be achieved.
If the user site environment space location is limited and a large-volume classifier cannot be configured, referring to fig. 14, a DUT Module (DUT Module) may be added, the gate driving circuit, the non-inductive capacitance, a part of the storage capacitance, and the test item switching circuit of the DUT may be placed in the DUT Module, and then connected to the AC test by way of wires, and the AC test may be placed in a cabinet close to the classifier. However, due to the length of the connecting wire, the limited number of noninductive capacitors and the like, stray inductance is increased correspondingly, and most of energy storage capacitors are also in the AC test, so that the large current power-out capability required by a short circuit test item is sacrificed under the condition that the internal resistance of the wire length is increased. But this is a compromise for limited application environments.
Fig. 15 is a schematic front and left view of a bridge dynamic parameter test station (AC test) applied to a gravity separator. The gravity separator is mainly used for testing packaged small and medium-sized integrator devices, such as packaged SiC and GaN MOSFET devices of TO-247 packages, TPAK packages and the like. Similar to the above, in order to solve the problem that the lead length affects the high switching speed of the third generation semiconductor material device, the AC test is fixed to the back surface of the AC test station of the gravity separator, and the distance from the DUT is shortened as much as possible.
Also if the DUT Module is added in a limited space application environment, referring to fig. 16, the gate drive circuit, non-inductive capacitance, partial storage capacitance and test item switching circuit of the DUT are placed in the DUT Module and then connected to the AC test by way of leads, which may be placed in a cabinet close to the sorter.
The invention provides a sorting machine, which is characterized in that the dynamic parameter testing device of the power device in the embodiment is applied to a double-track sorting machine, so that two DUTs can synchronously and differently carry out dynamic parameter measurement, such as L_DUT testing on-off time parameter and H_DUT testing reverse recovery time parameter simultaneously, and vice versa, thereby reducing equipment cost and maintenance cost, optimizing customer application environment resources and shortening testing time.
Although embodiments of the present invention have been described in connection with the accompanying drawings, various modifications and variations may be made by those skilled in the art without departing from the spirit and scope of the invention, and such modifications and variations fall within the scope of the invention as defined by the appended claims.
Claims (10)
1. A dynamic parameter testing apparatus for a power device, comprising: a first driving unit, a second driving unit, a driving switching unit and a test mode switching unit, wherein,
the first end of the driving switching unit is connected with the first driving unit and the second driving unit respectively, the second end of the driving switching unit is connected with a first power device to be tested and a second power device to be tested respectively, and the first power device to be tested and the second power device to be tested are connected in series;
the test mode switching unit is respectively connected with the first power device to be tested and the second power device to be tested;
the driving switching unit and the test mode switching unit work cooperatively, and the first power device to be tested and the second power device to be tested are controlled to synchronously and differently measure dynamic parameters through different switching states of the driving switching unit and the test mode switching unit.
2. The dynamic parameter testing apparatus of a power device according to claim 1, wherein the driving switching unit comprises: a first double-knife double-placed relay and a second double-knife double-placed relay, wherein,
the first moving contact of the first double-blade double-placed relay is connected with the control end of the first power device to be tested, the second moving contact of the first double-blade double-placed relay is connected with the second end of the first power device to be tested, the first normally closed contact and the second normally closed contact of the first double-blade double-placed relay are connected with the second driving unit, and the first normally open contact and the second normally open contact of the first double-blade double-placed relay are connected with the first driving unit;
the first moving contact of the second double-pole double-placed relay is connected with the control end of the second power device to be tested, the second moving contact of the second double-pole double-placed relay is connected with the second end of the second power device to be tested, the first normally closed contact and the second normally closed contact of the second double-pole double-placed relay are connected with the first driving unit, the first normally open contact and the second normally open contact of the second double-pole double-placed relay are connected with the second driving unit, and the second end of the second power device to be tested is grounded.
3. The apparatus according to claim 2, wherein the test mode switching unit comprises: a first switch, a second switch, a third switch and a fourth switch, wherein,
the first end of the first switch is connected with the first end of the first power device to be tested, the second end of the first switch is connected with the first end of the second switch, and the second end of the second switch is connected with the second end of the second power device to be tested;
the first end of the third switch is connected with the first end of the first power device to be tested, the second end of the third switch is connected with the first end of the fourth switch, and the second end of the fourth switch is connected with the second end of the second power device to be tested.
4. The dynamic parameter testing apparatus of a power device according to claim 1, further comprising: the first end of the programmable power supply unit is connected with the first end of the first power device to be tested, and the second end of the programmable power supply unit is connected with the second end of the second power device to be tested.
5. The dynamic parameter testing apparatus of a power device according to claim 4, wherein the programmable power supply unit comprises: the programmable power supply, the bus switching device and the first capacitor group, wherein,
the positive electrode of the programmable power supply is respectively connected with the first end of the bus switching device and the first end of the first capacitor bank, the negative electrode of the programmable power supply and the second end of the first capacitor bank are both connected with the second end of the second power device to be tested, the control end of the bus switching device is connected with a driving signal and the driving power supply, and the second end of the bus switching device is connected with the first end of the first power device to be tested.
6. The dynamic parameter testing apparatus of a power device according to claim 3, further comprising: the power sensor comprises an adjustable power inductor and a current sensor, wherein the first end of the adjustable power inductor is respectively connected with the second end of the first power device to be measured, the first end of the second power device to be measured, the second end of the third switch and the first end of the fourth switch, the second end of the adjustable power inductor is connected with the first end of the current sensor, and the second end of the current sensor is respectively connected with the second end of the first switch and the first end of the second switch.
7. The dynamic parameter testing apparatus of a power device according to claim 1, further comprising: the first end of the second capacitor is connected with the first end of the first power device to be tested, and the second end of the second capacitor is connected with the second end of the second power device to be tested.
8. The dynamic parameter testing apparatus of a power device according to claim 1, further comprising: and the oscilloscope is used for measuring the switching time parameter, the latch current parameter, the grid charge parameter and the reverse recovery time parameter of the first power device to be tested and the second power device to be tested.
9. The dynamic parameter testing apparatus of power device according to claim 8, wherein the oscilloscope is an 8-channel or more high-speed digital oscilloscope.
10. A sorter comprising a dynamic parameter testing apparatus of a power device according to any one of claims 1 to 9.
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Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113640556A (en) * | 2021-08-11 | 2021-11-12 | 山东大学 | Probe card of probe station |
| CN215833546U (en) * | 2021-06-10 | 2022-02-15 | 绍兴中芯集成电路制造股份有限公司 | Semiconductor power module switching test structure |
| CN114188238A (en) * | 2021-04-20 | 2022-03-15 | 山东大学 | Semiconductor device wafer dynamic parameter testing and sorting system and method |
| CN114675152A (en) * | 2020-12-24 | 2022-06-28 | 上海贝岭股份有限公司 | Dynamic characteristic test system for power semiconductor device |
| CN218727483U (en) * | 2022-10-25 | 2023-03-24 | 东莞南方半导体科技有限公司 | Power switch module test box |
| CN115932525A (en) * | 2022-12-13 | 2023-04-07 | 重庆云潼科技有限公司 | Dynamic parameter and reliability test system and test method for power device |
| CN116068360A (en) * | 2023-03-24 | 2023-05-05 | 佛山市联动科技股份有限公司 | Dynamic parameter test system |
| CN116626462A (en) * | 2023-04-27 | 2023-08-22 | 佛山市联动科技股份有限公司 | Dynamic characteristic testing device and method for power device |
| CN116626465A (en) * | 2023-05-22 | 2023-08-22 | 佛山市联动科技股份有限公司 | Power device characteristic test circuit and method |
| CN117007932A (en) * | 2023-07-19 | 2023-11-07 | 佛山市联动科技股份有限公司 | Dual-channel power device testing device |
| CN117007931A (en) * | 2023-07-19 | 2023-11-07 | 佛山市联动科技股份有限公司 | Power device testing device |
| CN117074838A (en) * | 2023-10-16 | 2023-11-17 | 北京华峰测控技术股份有限公司 | Method and circuit for testing dynamic switching characteristics of power device |
| CN117607650A (en) * | 2023-11-22 | 2024-02-27 | 佛山市联动科技股份有限公司 | Dynamic parameter test system based on third-generation semiconductor device |
-
2024
- 2024-02-29 CN CN202410225230.1A patent/CN117805539A/en active Pending
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114675152A (en) * | 2020-12-24 | 2022-06-28 | 上海贝岭股份有限公司 | Dynamic characteristic test system for power semiconductor device |
| CN114188238A (en) * | 2021-04-20 | 2022-03-15 | 山东大学 | Semiconductor device wafer dynamic parameter testing and sorting system and method |
| CN215833546U (en) * | 2021-06-10 | 2022-02-15 | 绍兴中芯集成电路制造股份有限公司 | Semiconductor power module switching test structure |
| CN113640556A (en) * | 2021-08-11 | 2021-11-12 | 山东大学 | Probe card of probe station |
| CN218727483U (en) * | 2022-10-25 | 2023-03-24 | 东莞南方半导体科技有限公司 | Power switch module test box |
| CN115932525A (en) * | 2022-12-13 | 2023-04-07 | 重庆云潼科技有限公司 | Dynamic parameter and reliability test system and test method for power device |
| CN116068360A (en) * | 2023-03-24 | 2023-05-05 | 佛山市联动科技股份有限公司 | Dynamic parameter test system |
| CN116626462A (en) * | 2023-04-27 | 2023-08-22 | 佛山市联动科技股份有限公司 | Dynamic characteristic testing device and method for power device |
| CN116626465A (en) * | 2023-05-22 | 2023-08-22 | 佛山市联动科技股份有限公司 | Power device characteristic test circuit and method |
| CN117007932A (en) * | 2023-07-19 | 2023-11-07 | 佛山市联动科技股份有限公司 | Dual-channel power device testing device |
| CN117007931A (en) * | 2023-07-19 | 2023-11-07 | 佛山市联动科技股份有限公司 | Power device testing device |
| CN117074838A (en) * | 2023-10-16 | 2023-11-17 | 北京华峰测控技术股份有限公司 | Method and circuit for testing dynamic switching characteristics of power device |
| CN117607650A (en) * | 2023-11-22 | 2024-02-27 | 佛山市联动科技股份有限公司 | Dynamic parameter test system based on third-generation semiconductor device |
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