CN202815167U - Double pulse IGBT testing device - Google Patents
Double pulse IGBT testing device Download PDFInfo
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- CN202815167U CN202815167U CN201220471832.8U CN201220471832U CN202815167U CN 202815167 U CN202815167 U CN 202815167U CN 201220471832 U CN201220471832 U CN 201220471832U CN 202815167 U CN202815167 U CN 202815167U
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Abstract
The utility model provides a double pulse IGBT testing device. The double pulse IGBT testing device comprises a processing module, an oscilloscope, a data acquisition module and an IGBT signal monitoring conditioning board. The processing module is used for sending a double pulse control signal to the data acquisition module, for analyzing and storing the current waveform and the voltage waveform of the oscilloscope, and for real-time monitoring an IGBT signal monitoring conditioning board. The oscilloscope is used for acquiring a current signal and a voltage signal of the IGBT signal monitoring conditioning board and for sending the current waveform and the voltage waveform which are produced after acquisition to the processing module. The data acquisition module is used for sending a double pulse signal to the IGBT signal monitoring conditioning board when receiving the double pulse control signal, for acquiring the current signal and the voltage signal of the IGBT signal monitoring conditioning board and for carrying out sending to the processing module. The IGBT signal monitoring conditioning board is used for testing an IGBT module under the double pulse signal and for sending the current signal and the voltage signal which are acquired by testing to the oscilloscope. The double pulse IGBT testing device provided by the utility model has the advantages of automated testing process, flexible control, safe and reliable testing process, convenient data analysis, good data traceability and the like.
Description
Technical field
The utility model relates to a kind of IGBT proving installation, particularly relates to a kind of dipulse IGBT proving installation.
Background technology
IGBT (Insulated Gate Bipolar Transistor), insulated gate bipolar transistor, by the compound full-control type voltage driven type power semiconductor device that BJT (double pole triode) and MOS (insulating gate type field effect tube) form, have the advantage of low conduction voltage drop two aspects of the high input impedance of MOSFET and GTR concurrently.The GTR saturation pressure reduces, and current carrying density is large, but drive current is larger; The MOSFET driving power is very little, and switching speed is fast, but conduction voltage drop is large, and current carrying density is little.IGBT combines the advantage of above two kinds of devices, and the little and saturation pressure of driving power reduces.Be fit to very much to be applied to DC voltage and be the fields such as 600V and above converter system such as alternating current generator, frequency converter, Switching Power Supply, lighting circuit, Traction Drive.
In recent years, electronics industry development power component and system, and use the quantity of IGBT device also to increase rapidly in the power electronics industry.The manufacturer of semiconductor and power product all wishes can have the cost of efficient preferably and lower industrial process in these have the process of producing product of IGBT device, thereby the perfect control that all must obtain of the control procedure from the research and development of product to the final product quality.For reaching the above object, it is extremely important that the test of product relatively becomes, and accurately essential and reliable.For in production run, testing apparatus must possess various characteristics and cooperate different testing requirements.The research and development slip-stick artist need to know that the characteristic of product is so that its design, the personnel that produce then need quick and easy-to-use instrument, accelerating their procedure for producing, the characteristic of the product that the quality control personnel then need to check that they make up and the result who collects them do statistical study.
Usually IGBT has corresponding databook, but in fact, parameter described in the databook is based on that some given external parameter tests get, and the external parameter in the practical application all is that each is discrepant, so these parameters can not be brought direct usefulness a bit.The parameter that will obtain in the design under actual conditions need to realize by testing.
The method major part of test I GBT switch behavioral parameters is the dipulse method of testing at present, generally is by oscillograph, multimeter, signal generator, the instrument manual measurements such as reometer.But above dipulse method of testing, the general manual measurement method that adopts, inefficiency, because signal is high pressure, high electric current, so security is low, and data analysis is very complicated, although data can preserve by the USB interface on the oscillograph, but initial conditions can't be preserved simultaneously, needs follow-up edit, therefore might produce because the randomness mistake that people's fatigue is brought.
The utility model content
The shortcoming of prior art in view of the above, the purpose of this utility model is to provide a kind of dipulse IGBT proving installation, is used for solving prior art to the inefficiency of IGBT test, and security is low, the problems such as data analysis more complicated.
Reach for achieving the above object other relevant purposes, the utility model provides a kind of dipulse IGBT proving installation, and described proving installation comprises at least:
Processing module, oscillograph, data acquisition module, IGBT signal monitoring conditioning plate;
Described processing module is connected in described data acquisition module and oscillograph, be used for sending the dipulse control signal and being used for described oscillographic current waveform and voltage waveform are analyzed and stored to described data acquisition module, and to described IGBT signal monitoring conditioning plate Real Time Monitoring;
Described data acquisition module is connected in described processing module and described IGBT signal monitoring conditioning plate, be used for when receiving the dipulse control signal, sending the dipulse signal to described IGBT signal monitoring conditioning plate, and gather the current signal of described IGBT signal monitoring conditioning plate and voltage signal to described processing module;
Described IGBT signal monitoring conditioning plate is connected in described data acquisition module and oscillograph, be used under the dipulse signal IGBT module being tested, and current signal and the voltage signal that will test gained sends to oscillograph;
Described oscillograph is connected in described IGBT signal monitoring conditioning plate and processing module, is used for gathering current signal and the voltage signal of IGBT signal monitoring conditioning plate, and the current waveform and the voltage waveform that will produce after will gathering send to described processing module.
In dipulse IGBT proving installation of the present utility model, described proving installation also comprises and is connected in described processing module and oscillographic insulating power supply.
In dipulse IGBT proving installation of the present utility model, described IGBT signal monitoring conditioning plate comprises that at least storage capacitor, an IGBT and the 2nd IGBT of series connection, the inductance that is parallel to a described IGBT, the high-voltage power supply that is parallel to described storage capacitor, the driver that is connected in the 2nd IGBT, the dipulse that is connected in the power module of a described IGBT and described driver and is connected in described driver monitor protective device.
Preferably, described inductance is air-core inductance, and described power module is programmable power supply.
In dipulse IGBT proving installation of the present utility model; described IGBT signal monitoring conditioning plate also comprises the high tension protection circuit that is connected in described storage capacitor and high-voltage power supply; described high tension protection circuit comprises the first load and the second load in parallel; and described the first load is in series with upper electrical switch; described the second load is in series with EmS; described the first load is used for discharging when proving installation normally moves the electric weight of described storage capacitor, and described the second load is used for discharging the electric weight of described storage capacitor when EmS receives the EmS signal.
Preferably, described the first load and the second load are power drain resistance, and described EmS is the IGBT switching tube.
A kind of preferred version as dipulse IGBT proving installation of the present utility model, described proving installation also comprises the radome that wraps up described proving installation, described radome is equiped with an anti-electric shock apparatus, this anti-electric shock apparatus is used for cutting off the connection of described high-voltage power supply and described storage capacitor when radome is opened, and sends the EmS signal to described EmS.
As mentioned above, the utility model provides a kind of dipulse IGBT proving installation, comprise for sending the dipulse control signal to described data acquisition module and being used for described oscillographic current waveform and voltage waveform are analyzed and stored, and to the processing module of described IGBT signal monitoring conditioning plate Real Time Monitoring, be used for gathering current signal and the voltage signal of IGBT signal monitoring conditioning plate, and will gather the current waveform of rear generation and the oscillograph that voltage waveform sends to described processing module, be used for when receiving the dipulse control signal, sending the dipulse signal to described IGBT signal monitoring conditioning plate, and gather the current signal of described IGBT signal monitoring conditioning plate and voltage signal to the data acquisition module of described processing module, and be used under the dipulse signal IGBT module being tested, and current signal and the voltage signal that will test gained send to oscillographic IGBT signal monitoring conditioning plate.The utlity model has following beneficial effect: 1) control flexibly: the width that utilizes two pulses of computer control, first pulse makes IGBT reach certain electric current, pulse width is 1us ~ 2ms, can change flexibly, second pulse makes IGBT carry out switch motion at prospective current, and 0.1us ~ 100us is adjustable flexibly, two recurrent intervals also can be controlled with computing machine, and 1us ~ 20us is adjustable flexibly; Computing machine is communicated by letter based on LAN with oscillograph or GPIB communicates by letter, and observes IGBT dynamic perfromance waveform, and automatically carries out the infinitesimal analysis computing according to family curve, draws the dynamic characteristic parameter of IGBT, judges whether the dynamic perfromance of IGBT is qualified; 2) dual safety control: when applying driving voltage to IGBT, time control is very accurate, if the long damage that might cause IGBT of IGBT opening time, therefore dual safety guarantees extremely important, native system carries special detection single-chip microcomputer, and whether the width of Real-Time Monitoring dipulse is identical with default width, if there is inconsistent, turn-off immediately output, guarantee safety; 3) data analysis is convenient: the curve that the IGBT dynamic characteristic test obtains can calculate automatically by software, directly draws test result and is presented on the host computer interface; 4) retrospective is good: test has the data keeping records after finishing, and data preservation meeting preserves all initial conditions and test result in the lump, is convenient to follow-up IGBT be analyzed, and retrospective is good.
Description of drawings
Fig. 1 is shown as the modular structure synoptic diagram of dipulse IGBT proving installation of the present utility model.
Fig. 2 is shown as the concrete structure synoptic diagram of dipulse IGBT proving installation of the present utility model.
Fig. 3 is shown as the insulating power supply structural representation of dipulse IGBT proving installation of the present utility model.
Fig. 4 is shown as the IGBT signal monitoring conditioning plate structural representation of dipulse IGBT proving installation of the present utility model.
Fig. 5 is shown as the work schedule synoptic diagram of dipulse IGBT proving installation of the present utility model.
The element numbers explanation
10 processing modules
11 data acquisition modules
12 IGBT signal monitoring conditioning plates
13 oscillographs
121 storage capacitors
122 the one IGBT
123 the 2nd IGBT
124 inductance
125 drivers
126 power modules
127 high-voltage power supplies
128 high tension protection circuits
129 monitor protective device
20 insulating power supplies
Embodiment
Below by specific instantiation embodiment of the present utility model is described, those skilled in the art can understand other advantages of the present utility model and effect easily by the disclosed content of this instructions.The utility model can also be implemented or be used by other different embodiment, and the every details in this instructions also can be based on different viewpoints and application, carries out various modifications or change under the spirit of the present utility model not deviating from.
See also 1 ~ Fig. 5.Need to prove, the diagram that provides in the present embodiment only illustrates basic conception of the present utility model in a schematic way, satisfy only show in graphic with the utility model in relevant assembly but not component count, shape and size drafting when implementing according to reality, kenel, quantity and the ratio of each assembly can be a kind of random change during its actual enforcement, and its assembly layout kenel also may be more complicated.
Such as Fig. 1 ~ shown in Figure 4, present embodiment provides a kind of dipulse IGBT proving installation, and described proving installation comprises at least:
Described processing module 10 is connected in described data acquisition module 11 and oscillograph 13, be used for sending the dipulse control signals and being used for current waveform and the voltage waveform of described oscillograph 13 are analyzed and stored to described data acquisition module 11, and to described IGBT signal monitoring conditioning plate 12 Real Time Monitorings;
Described data acquisition module 11 is connected in described processing module 10 and described IGBT signal monitoring conditioning plate 12, be used for when receiving the dipulse control signal, sending the dipulse signals to described IGBT signal monitoring conditioning plate 12, and gather the current signal of described IGBT signal monitoring conditioning plate 12 and voltage signal to described processing module 10;
Described IGBT signal monitoring conditioning plate 12 is connected in described data acquisition module 11 and oscillograph 13, be used under the dipulse signal IGBT module being tested, and current signal and the voltage signal that will test gained sends to oscillograph 13;
Described oscillograph 13 is connected in described IGBT signal monitoring conditioning plate 12 and processing module 10, be used for gathering current signal and the voltage signal of IGBT signal monitoring conditioning plate 12, and the current waveform and the voltage waveform that will produce after will gathering send to described processing module 10.
Fig. 2 is a concrete proving installation exemplary plot, and the function of described processing module 10 is by computer realization, and described data acquisition module 11 is data collecting card, and the annexation of described IGBT signal monitoring conditioning plate 12 and oscillograph 13 and each parts as shown in the figure.
In the present embodiment, described proving installation also comprises the insulating power supply that is connected in described processing module 10 and oscillograph 13, as shown in Figure 3.Described insulating power supply is to use transformer that 220V voltage is dropped to lower voltage by transformer with voltage, and then is rectified into direct current output for computing machine and oscillograph.Because the main coil of transformer bears 220V voltage, secondary coil only bears the low alternating voltage of output, and does not directly connect between the primary and secondary coil.Insulating power supply can be kept apart dipulse test macro and other consumers (oscillograph and computing machine), makes the planning of whole laboratory safer, more reasonable.The selection index of insulating power supply mainly is the power that can provide enough.
As shown in Figure 4, described IGBT signal monitoring conditioning plate 12 comprise at least series connection storage capacitor 121, an IGBT122 and the 2nd IGBT123, be parallel to a described IGBT122 inductance 124, be parallel to described storage capacitor 121 high-voltage power supply 127, be connected in the 2nd IGBT123 driver 125, be connected in the power module 126 of a described IGBT122 and described driver 125 and be connected in described driver 125 and be used for monitoring under the dipulse signal test circuit dipulse that whether works and monitor protective device 129.In the present embodiment, described inductance 124 is air core inductor 124 coils, and described power module 126 is programmable power supply.
Described IGBT signal monitoring conditioning plate 12 also comprises the high tension protection circuit 128 that is connected in described storage capacitor 121 and high-voltage power supply 127; described high tension protection circuit 128 comprises the first load and the second load in parallel; and described the first load is in series with upper electrical switch; described the second load is in series with EmS; described the first load is used for discharging when proving installation normally moves the electric weight of described storage capacitor 121, and described the second load is used for discharging the electric weight of described storage capacitor 121 when EmS receives the EmS signal.In the present embodiment, described the first load and the second load are power drain resistance, and described EmS is the IGBT switching tube.
Described proving installation also comprises the radome that wraps up described proving installation, described radome is equiped with an anti-electric shock apparatus, this anti-electric shock apparatus is used for cutting off the connection of described high-voltage power supply 127 and described storage capacitor 121 when radome is opened, and sends the EmS signal to described EmS.The major function of this equipment is after radome is opened (radome is opened and made protection against electric shock equipment performance function by some mechanical hook-ups such as travel switches), disconnects immediately the inside of radome and the path of external high pressure power supply 127.And the electric charge on the internal high pressure storage capacitor 121 bled off rapidly by power drain resistance, making the voltage in the internal high pressure loop is zero, and the HT pilot on the equipment is extinguished, and the voltage indicating gauge is zero.Thereby the electric shock hidden danger in fundamentally having eliminated staff's experimentation.
Lower mask body is introduced specific implementation process of the present utility model, may further comprise the steps:
1) connects described processing module 10, oscillograph 13, data acquisition module 11 and IGBT signal monitoring conditioning plate 12;
2) send the first pulse of the first width and the second pulse of the second width to described IGBT signal monitoring conditioning plate 12 successively by the described data acquisition module 11 of described processing module 10 controls.Described the first pulse charges to predetermined current to the IGBT test circuit in the IGBT signal monitoring conditioning plate 12, and described the second pulse is carried out switch motion to described IGBT test circuit under described predetermined current.
Particularly, this step comprises following substep:
2-1) described driver 125 sends out the first pulse to the door of described the 2nd IGBT123, make the IGBT circuit turn-on, the electromotive force of storage capacitor 121 is added on the inductance 124, control described the first pulse the time chien shih inductance 124 Current rise to predetermined current value, stop pulse turn-offs the IGBT circuit.At this moment, the electric current of described inductance 124 is linear and rises, and current expression is: I=U*T1/L.Wherein, U is the voltage at memory capacitance two ends, and L is inductance 124, T
1It is the time of the first pulse.As seen, in the process of the first pulse, the numerical value of inductance 124 electric currents determines by U and L, and when U and L determined, the numerical value of electric current was determined that by T1 the time is longer, and electric current is larger.Therefore can be according to the described predetermined current value of the autonomous setting of this formula.In the present embodiment, the time of described the first pulse is 1us ~ 2ms, and in a concrete implementation process, the time of adopting the first pulse is 1ms.
2-2) described driver 125125 sends out the second pulse to described the 2nd IGBT123 door, make the again conducting of IGBT circuit, the fly-wheel diode of IGBT enters reverse recovery, and reverse recovery current passes IGBT, and surveys this reverse recovery current by the current probe of oscillograph 13.In the process of the second pulse, emphasis is the opening process of observing IGBT.Reverse recovery current is important monitored object, and the form of this reverse recovery current directly has influence on many important indicators of commutation course.In the present embodiment, the time of described the second pulse is 0.1us ~ 100us, and in a concrete implementation process, the time of described the second pulse is 5us.
2-3) stop the second pulse, the IGBT circuit is turn-offed again, and visit the electric current of surveying IGBT circuit this moment by the current probe of oscillograph 13.Electric current was larger when the IGBT circuit turn-offed, because the existence of bus stray inductance 124 can produce certain due to voltage spikes, this process emphasis is the turn off process of observing IGBT.The due to voltage spikes that diode reverse recovery current stray inductance 124 produces is important monitored object.Need to prove that this step also comprises before sending the first pulse by the step of described high-voltage power supply 127 to described storage capacitor 121 chargings, it is saturated to charge to described storage capacitor 121, also can charge to according to demand default voltage.The leading indicator of described storage capacitor 121 is sizes of its withstand voltage and capacity.In the situation that capacity and withstand voltage all meet the demands, equivalent internal resistance ESR and the equivalent inductance 124ESL of described storage capacitor 121 are the smaller the better.High withstand voltage is collector and the maximum rated withstand voltage of voltage Vce between emitter (driver 125HP1 and driver 125HP2 are 650V) that covers IGBT in order to satisfy, large capacity is the demand that need to satisfy in the test event electric current, because the electric current fan-out capability of high-voltage power supply 127 only has 0.5A, can not be in the in short-term loss of additional capacitance charge.HP2 need to provide larger electric weight in short circuit experiment, if electric capacity is little, voltage on the bus falls can be very severe, so the capacity of the storage capacitor 121 that adopts in the present embodiment is 1800uF, maximum voltage is reduced to 13V, busbar voltage at most only falls 5%, can regard this storage capacitor 121 as constant pressure source.
In the present embodiment, described step 2) comprises that also the current signal and the voltage signal that gather IGBT signal monitoring conditioning plate 12 by described data acquisition module 11 are sent to described processing module 10, so that described IGBT signal monitoring conditioning plate 12 is carried out Real Time Monitoring, and the step of when abnormal signal, turn-offing test circuit.In a concrete implementation process, when the deviation of the time that listens to dipulse and target setting surpasses 1us, then close the output of pulse signal.
The time interval between described the first pulse and the second pulse is controlled by described processing module 10, and to guarantee its accuracy, in the present embodiment, the described time interval is 1us ~ 20us, and adjustable flexibly.
3) current signal and the voltage signal that produce by 13 pairs of described IGBT signal monitoring conditioning plates 12 of described oscillograph gather and are converted to current waveform and voltage waveform, then are sent to described processing module 10.
4) analyze by 10 pairs of described current waveforms of described processing module and voltage waveform, whether satisfy the technical parameter requirement of device to determine tested IGBT.In the present embodiment, described step 4) also comprises the step that the analysis result of data that described processing module 10 is received from oscillograph 13 and data is stored, and this step can be so that follow-uply analyze IGBT, and retrospective is good.
Fig. 5 is shown as the monitoring sequential chart of the electric current I c of the collector of implementation process relevant parameters pulse voltage Vge, an IGBT of present embodiment and the voltage Vce between emitter and IGBT collector, in t0 ~ t1 stage, send the first pulse Vge to IGBT, Vce is zero, and electric current I c linearly rises; In t1 ~ t2 stage, the first pulse Vge is closed, and Vge is zero, and Vce rises and is constant substantially, and electric current I c is zero; In t2 ~ t3 stage, send the second pulse Vge to IGBT, electric current I c through collector is reverse recovery current, it is linear with the burst length and rises, when t3 closes the second pulse constantly, because the existence of bus stray inductance produces certain due to voltage spikes, this voltage sword cutting edge of a knife or a sword causes the puncture of IGBT easily, is important monitoring target of this stage.If the monitoring parameter value in each stage is consistent or basically identical with preset value, can judge that then this IGBT passes, if the parameter value that monitors is large or breakdown in observation process with the preset value deviation, then this IGBT does not meet request for utilization.
In sum, the utility model provides a kind of dipulse IGBT proving installation, comprise for sending the dipulse control signal to described data acquisition module 11 and being used for current waveform and the voltage waveform of described oscillograph 13 are analyzed and stored, and to the processing module 10 of described IGBT signal monitoring conditioning plate 12 Real Time Monitorings, be used for gathering current signal and the voltage signal of IGBT signal monitoring conditioning plate 12, and will gather the current waveform of rear generation and the oscillograph 13 that voltage waveform sends to described processing module 10, be used for when receiving the dipulse control signal, sending the dipulse signal to described IGBT signal monitoring conditioning plate 12, and gather the current signal of described IGBT signal monitoring conditioning plate 12 and voltage signal to the data acquisition module 11 of described processing module 10, and be used under the dipulse signal, the IGBT module being tested, and will test the current signal of gained and the IGBT signal monitoring conditioning plate 12 that voltage signal sends to oscillograph 13.The utlity model has following beneficial effect: 1) control flexibly: the width that utilizes two pulses of computer control, first pulse makes IGBT reach certain electric current, pulse width is 1us ~ 2ms, can change flexibly, second pulse makes IGBT carry out switch motion at prospective current, and 0.1us ~ 100us is adjustable flexibly, two recurrent intervals also can be controlled with computing machine, and 1us ~ 20us is adjustable flexibly; Computing machine is communicated by letter based on LAN with oscillograph 13 or GPIB communicates by letter, and observes IGBT dynamic perfromance waveform, and automatically carries out the infinitesimal analysis computing according to family curve, draws the dynamic characteristic parameter of IGBT, judges whether the dynamic perfromance of IGBT is qualified; 2) dual safety control: when applying driving voltage to IGBT, time control is very accurate, if the long damage that might cause IGBT of IGBT opening time, therefore dual safety guarantees extremely important, native system carries special detection single-chip microcomputer, and whether the width of Real-Time Monitoring dipulse is identical with default width, if there is inconsistent, turn-off immediately output, guarantee safety; 3) data analysis is convenient: the curve that the IGBT dynamic characteristic test obtains can calculate automatically by software, directly draws test result and is presented on the host computer interface; 4) retrospective is good: test has the data keeping records after finishing, and data preservation meeting preserves all initial conditions and test result in the lump, is convenient to follow-up IGBT be analyzed, and retrospective is good.So the utility model has effectively overcome various shortcoming of the prior art and the tool high industrial utilization.
Above-described embodiment is illustrative principle of the present utility model and effect thereof only, but not is used for restriction the utility model.Any person skilled in the art scholar all can be under spirit of the present utility model and category, and above-described embodiment is modified or changed.Therefore, have in the technical field under such as and know that usually the knowledgeable modifies or changes not breaking away from all equivalences of finishing under spirit that the utility model discloses and the technological thought, must be contained by claim of the present utility model.
Claims (7)
1. dipulse IGBT proving installation is characterized in that described proving installation comprises at least:
Processing module, oscillograph, data acquisition module, IGBT signal monitoring conditioning plate;
Described processing module is connected in described data acquisition module and oscillograph, be used for sending the dipulse control signal and being used for described oscillographic current waveform and voltage waveform are analyzed and stored to described data acquisition module, and to described IGBT signal monitoring conditioning plate Real Time Monitoring;
Described data acquisition module is connected in described processing module and described IGBT signal monitoring conditioning plate, be used for when receiving the dipulse control signal, sending the dipulse signal to described IGBT signal monitoring conditioning plate, and gather the current signal of described IGBT signal monitoring conditioning plate and voltage signal to described processing module;
Described IGBT signal monitoring conditioning plate is connected in described data acquisition module and oscillograph, be used under the dipulse signal IGBT module being tested, and current signal and the voltage signal that will test gained sends to oscillograph;
Described oscillograph is connected in described IGBT signal monitoring conditioning plate and processing module, is used for gathering current signal and the voltage signal of IGBT signal monitoring conditioning plate, and the current waveform and the voltage waveform that will produce after will gathering send to described processing module.
2. dipulse IGBT proving installation according to claim 1 is characterized in that: described proving installation also comprises and is connected in described processing module and oscillographic insulating power supply.
3. dipulse IGBT proving installation according to claim 1 is characterized in that: described IGBT signal monitoring conditioning plate comprises that at least storage capacitor, an IGBT and the 2nd IGBT of series connection, the inductance that is parallel to a described IGBT, the high-voltage power supply that is parallel to described storage capacitor, the driver that is connected in the 2nd IGBT, the dipulse that is connected in the power module of a described IGBT and described driver and is connected in described driver monitor protective device.
4. dipulse IGBT proving installation according to claim 3, it is characterized in that: described inductance is air-core inductance, described power module is programmable power supply.
5. dipulse IGBT proving installation according to claim 3; it is characterized in that: described IGBT signal monitoring conditioning plate also comprises the high tension protection circuit that is connected in described storage capacitor and high-voltage power supply; described high tension protection circuit comprises the first load and the second load in parallel; and described the first load is in series with upper electrical switch; described the second load is in series with EmS; described the first load is used for discharging when proving installation normally moves the electric weight of described storage capacitor, and described the second load is used for discharging the electric weight of described storage capacitor when EmS receives the EmS signal.
6. dipulse IGBT proving installation according to claim 5, it is characterized in that: described the first load and the second load are power drain resistance, described EmS is the IGBT switching tube.
7. dipulse IGBT proving installation according to claim 5, it is characterized in that: described proving installation also comprises the radome that wraps up described proving installation, described radome is equiped with an anti-electric shock apparatus, this anti-electric shock apparatus is used for cutting off the connection of described high-voltage power supply and described storage capacitor when radome is opened, and sends the EmS signal to described EmS.
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| CN103592591A (en) * | 2013-11-20 | 2014-02-19 | 西安永电电气有限责任公司 | IGBT module testing circuit and method on condition of no antiparallel diode |
| CN104198906A (en) * | 2014-08-27 | 2014-12-10 | 华北电力大学 | Device and method for dynamic characteristic measurement of IGBT |
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2012
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| CN109581177A (en) * | 2018-12-14 | 2019-04-05 | 天津瑞能电气有限公司 | IGBT power module dipulse automatically testing platform and its test method |
| CN112595947A (en) * | 2019-09-17 | 2021-04-02 | 株洲中车时代电气股份有限公司 | Double-pulse test method and device for converter module |
| CN112540279A (en) * | 2020-12-04 | 2021-03-23 | 荣信汇科电气股份有限公司 | Crimping formula IGBT module current conversion testing arrangement |
| CN112731190A (en) * | 2020-12-04 | 2021-04-30 | 南京轨道交通系统工程有限公司 | Universal tester and method applied to subway train inverter module |
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