CN211206700U

CN211206700U - IGBT drive module dipulse testing arrangement

Info

Publication number: CN211206700U
Application number: CN201922111349.3U
Authority: CN
Inventors: 金明星
Original assignee: Muling Beiyi Semiconductor Technology Co ltd
Current assignee: Muling Beiyi Semiconductor Technology Co ltd
Priority date: 2019-11-30
Filing date: 2019-11-30
Publication date: 2020-08-07
Anticipated expiration: 2029-11-30

Abstract

The utility model discloses a IGBT drive module dipulse testing arrangement, including device body, data input module, power module, load inductance, data acquisition module, data processing module, oscilloscope and IGBT module, data input module, power module, load inductance, data acquisition module and data processing module all connect integrated locating device originally internally, power module is the power supply of device body, data acquisition module connect in digital quantity input module reaches the IGBT module, data processing module connect in the IGBT module reaches the oscilloscope. The utility model relates to a IGBT pulse test technical field specifically indicates a test power unit's that can be accurate actual behavior, avoids electronic components's damage, can preserve the analysis of being convenient for to look over test data result automatically, the batch production of being convenient for's the IGBT drive module dipulse testing arrangement who dispatches batch test.

Description

IGBT drive module dipulse testing arrangement

Technical Field

The utility model relates to a IGBT pulse test technical field specifically indicates a IGBT drive module dipulse testing arrangement.

Background

An insulated gate bipolar transistor (igbt), i.e., an insulated gate bipolar transistor, is a composite fully-controlled voltage-driven power semiconductor device composed of a Bipolar Junction Transistor (BJT) and an insulated gate field effect transistor (MOS), and has the advantages of both high input impedance of the MOSFET and low on-state voltage drop of the GTR. The GTR saturation voltage is reduced, the current carrying density is high, but the driving current is large; the MOSFET has small driving power, high switching speed, large conduction voltage drop and small current carrying density. The IGBT integrates the advantages of the two devices, has small driving power and reduced saturation voltage, and is very suitable for being applied to the fields of converter systems such as a high-voltage frequency converter, a high-voltage static var generator, a locomotive traction converter, a wind power generation converter, light direct current transmission and the like.

The application of the IGBT is so wide, and it follows that the types and manufacturers of the IGBT are more and more, so the performance test of the IGBT becomes particularly important, and the data analysis in the test of the IGBT is very complicated, and although the data can be saved through the USB interface on the oscilloscope, the input conditions cannot be saved at the same time, and the subsequent manual editing is required, so that there is a possibility that a random error due to human fatigue may be generated.

Disclosure of Invention

For solving the above-mentioned current difficult problem, the utility model provides a can be true accurate test power unit's actual behavior to avoid electronic components's damage, increase its life-span extension, can preserve the analysis of being convenient for and look over the test data result automatically, and need not loaded down with trivial details test rack, the IGBT drive module dipulse testing arrangement of the batch production that dispatches from the factory batch test of being convenient for.

The utility model adopts the following technical scheme: the utility model relates to a double-pulse testing device of an IGBT driving module, which comprises a device body, a data input module, a power supply module, a load inductor, a data acquisition module, a data processing module, an oscilloscope and an IGBT module, wherein the data input module, the power supply module, the load inductor, the data acquisition module and the data processing module are connected and integrated in the device body; the power module supplies power to the device body, the power module comprises a three-phase adjustable power supply and a low-voltage power supply, the three-phase adjustable power supply outputs high voltage, and the low-voltage power supply outputs low voltage; the data input module comprises an analog quantity input module and a digital quantity input module, the analog quantity input module is provided with an analog signal interface and used for receiving various analog signals, the digital quantity input module is provided with a digital signal interface and used for receiving various digital signals, the digital quantity input module comprises a pulse enable input module and a double-pulse input module, the double-pulse input module is used for sending double-pulse signals, the first pulse is used for enabling the IGBT module to reach rated working current, and the second pulse signal is used for testing the dynamic characteristics of the IGBT module; the data acquisition module is connected with the digital quantity input module and the IGBT module and is used for acquiring a double-pulse signal sent by the digital quantity input module and sending the acquired double-pulse signal to the IGBT module; the data processing module is connected with the IGBT module and the oscilloscope, can process modulation signals of pulse width, measure three phases of the IGBT module and output test signals to the oscilloscope, and can also evaluate and correct performance according to data and waveforms displayed by the oscilloscope and store the data and waveforms displayed by the waveform display; the oscilloscope comprises a waveform display screen and a probe head, wherein the probe head comprises a high-voltage testing end probe, a low-voltage testing end probe and a current testing end probe, and the probe head is connected to the data processing module and used for collecting voltage signals and current signals of the data processing module and transmitting the collected voltage signals and current signals to the waveform display for display.

Further, the load inductor is connected with the IGBT module, and the load inductor is formed by connecting two inductors in series.

Further, the load inductance is an adjustable load inductance.

Further, the detecting head is a movable detecting head.

Further, the current test end probe is a rogowski coil current probe.

Adopt above-mentioned structure the utility model discloses the beneficial effect who gains as follows: this scheme IGBT drive module dipulse testing arrangement reasonable in design, the actual operating conditions of power unit that can be more true and accurate, obtain more accurate test result, and can avoid electronic components's damage, make it prolong, utilize computer control pulse, it is nimble adjustable, all connect the integration with data input module, power module, load inductance, data acquisition module and locate the device originally internal, do not need loaded down with trivial details test rack, the batch production's of being convenient for batch production batch test that dispatches, data processing module can be saved the test data result automatically and is convenient for the analysis look over, the improvement test accuracy that this device can be great, the production efficiency is improved.

Drawings

Fig. 1 is a schematic diagram of the IGBT driving module dipulse testing apparatus of the present invention;

fig. 2 is the utility model discloses IGBT drive module dipulse testing arrangement's schematic structure diagram.

The device comprises a device body 1, a data input module 2, a data input module 3, a power supply module 4, a load inductor 5, a data acquisition module 6, a data processing module 7, an oscilloscope 8, an IGBT module 9, a waveform display screen 10 and a probe.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings.

As shown in fig. 1-2, the utility model relates to an IGBT drive module dipulse testing arrangement, including device body 1, data input module 2, power module 3, load inductance 4, data acquisition module 5, data processing module 6, oscilloscope 7 and IGBT module 8, data input module 2, power module 3, load inductance 4, data acquisition module 5 and data processing module 6 all connect the integration and locate in device body 1; the power module 3 supplies power to the device body 1, the power module 3 comprises a three-phase adjustable power supply and a low-voltage power supply, the three-phase adjustable power supply outputs high voltage, and the low-voltage power supply outputs low voltage; the data input module 2 comprises an analog quantity input module and a digital quantity input module, the analog quantity input module is provided with an analog signal interface and used for receiving various analog signals, the digital quantity input module is provided with a digital signal interface and used for receiving various digital signals, the digital quantity input module comprises a pulse enable input module and a double-pulse input module, the double-pulse input module is used for sending double-pulse signals, the first pulse is used for enabling the IGBT module 8 to reach rated working current, and the second pulse signal is used for testing the dynamic characteristics of the IGBT module; the data acquisition module 5 is connected to the digital quantity input module and the IGBT module 8, and is used for acquiring a double-pulse signal sent by the digital quantity input module and sending the acquired double-pulse signal to the IGBT module 8; the data processing module 6 is connected to the IGBT module 8 and the oscilloscope 7, the data processing module 6 may process a pulse width modulation signal and measure three phases of the IGBT module 8, and output a test signal to the oscilloscope 7, and the data processing module 6 may also evaluate and correct performance according to data and waveforms displayed by the oscilloscope 7, and store the data and waveforms displayed by the waveform display; the oscilloscope 7 comprises a waveform display screen 9 and a probe head 10, the probe head 10 comprises a high-voltage testing end probe, a low-voltage testing end probe and a current testing end probe, and the probe head 10 is connected to the data processing module 6 and used for collecting voltage signals and current signals of the data processing module 6 and transmitting the collected voltage signals and current signals to the waveform display for display.

The load inductor 4 is connected with the IGBT module 8, the load inductor 4 is formed by connecting two inductors in series, the load inductor 4 is an adjustable load inductor 4, the probe head 10 is a movable probe head, and the current testing end probe is a Rogowski coil current probe.

When the device is used specifically, a data input module 2, a power supply module 3, a load inductor 4, a data acquisition module 5 and a data processing module 6 are connected and integrated in a device body 1, a digital quantity input module in the data input module 2 sends out a double-pulse signal by using the double-pulse input module, the data acquisition module 5 acquires the double-pulse signal and sends the double-pulse signal to an IGBT module 8 to carry out double-pulse test on the IGBT module 8, the data input module 2 outputs two continuous pulse width modulation signals to control a power unit to be switched on and off twice, the data processing module 6 can process the pulse width modulation signals and measure three phases of the IGBT module 8, taking the U phase of the IGBT module 8 as an example, the data processing module 6 controls a U phase leading-out wire of the IGBT module 8 to output corresponding signals and transmits the signals to an oscilloscope 7 to display test data and waveforms, and the performance of the IGBT module 8 is evaluated according to the test data and waveforms displayed by the oscilloscope, meanwhile, the data processing module 6 can correct the IGBT module 8 and store the data and the waveform displayed by the waveform display 9, so that observation and analysis are facilitated.

The present invention and the embodiments thereof have been described above, but the description is not limited thereto, and the embodiment shown in the drawings is only one of the embodiments of the present invention, and the actual structure is not limited thereto. In summary, those skilled in the art should understand that they should not be limited to the embodiments described above, and that they can design the similar structure and embodiments without departing from the spirit of the invention.

Claims

1. The utility model provides a IGBT drive module dipulse testing arrangement which characterized in that: the device comprises a device body, a data input module, a power supply module, a load inductor, a data acquisition module, a data processing module, an oscilloscope and an IGBT module, wherein the data input module, the power supply module, the load inductor, the data acquisition module and the data processing module are connected and integrated in the device body; the power module supplies power to the device body, the power module comprises a three-phase adjustable power supply and a low-voltage power supply, the three-phase adjustable power supply outputs high voltage, and the low-voltage power supply outputs low voltage; the data input module comprises an analog quantity input module and a digital quantity input module, the analog quantity input module is provided with an analog signal interface and used for receiving various analog signals, the digital quantity input module is provided with a digital signal interface and used for receiving various digital signals, the digital quantity input module comprises a pulse enable input module and a double-pulse input module, the double-pulse input module is used for sending double-pulse signals, the first pulse is used for enabling the IGBT module to reach rated working current, and the second pulse signal is used for testing the dynamic characteristics of the IGBT module; the data acquisition module is connected with the digital quantity input module and the IGBT module and is used for acquiring a double-pulse signal sent by the digital quantity input module and sending the acquired double-pulse signal to the IGBT module; the data processing module is connected with the IGBT module and the oscilloscope, can process modulation signals of pulse width, measure three phases of the IGBT module and output test signals to the oscilloscope, and can also evaluate and correct performance according to data and waveforms displayed by the oscilloscope and store the data and waveforms displayed by the waveform display; the oscilloscope comprises a waveform display screen and a probe head, wherein the probe head comprises a high-voltage testing end probe, a low-voltage testing end probe and a current testing end probe, and the probe head is connected to the data processing module and used for collecting voltage signals and current signals of the data processing module and transmitting the collected voltage signals and current signals to the waveform display for display.

2. The double-pulse testing device for the IGBT driving module according to claim 1, characterized in that: the load inductor is connected with the IGBT module and is formed by connecting two inductors in series.

3. The double-pulse testing device for the IGBT driving module according to claim 1, characterized in that: the load inductor is an adjustable load inductor.

4. The double-pulse testing device for the IGBT driving module according to claim 1, characterized in that: the probe is a movable probe.

5. The double-pulse testing device for the IGBT driving module according to claim 1, characterized in that: the current test end probe is a Rogowski coil current probe.