CN112731191A - Automatic test table for pulse power supply - Google Patents
Automatic test table for pulse power supply Download PDFInfo
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- CN112731191A CN112731191A CN202011423325.2A CN202011423325A CN112731191A CN 112731191 A CN112731191 A CN 112731191A CN 202011423325 A CN202011423325 A CN 202011423325A CN 112731191 A CN112731191 A CN 112731191A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/025—General constructional details concerning dedicated user interfaces, e.g. GUI, or dedicated keyboards
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Human Computer Interaction (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
One embodiment of the present invention discloses an automatic test stand for a pulse power supply, the test stand comprising: the device comprises a test fixture, a digital signal processing module, a touch screen module, first to fourth modulator modules and first to fourth resistors; the test fixture is used for connecting a tested array surface power supply module; the digital signal processing module is used for performing enable control on the tested array surface power supply module; collecting and processing the voltage and current output by the array surface power supply module to be tested to obtain test result data, and processing the test result data; generating a modulator pulse signal; the touch screen module is used for setting test parameter information and displaying test result data on the touch screen; the combination of the first through fourth modulator blocks and the first through fourth resistors simulate four different pulsed load conditions.
Description
Technical Field
The invention relates to the technical field of power supply testing, in particular to an automatic test bench for a pulse power supply.
Background
With the rapid development and wide application of the solid-state phased array technology, it has become a very urgent need to develop various power modules with small volume, high power, wide pulse and low ripple for the solid-state phased array radar system. The current array plane of the solid-state phased array radar antenna mainly comprises thousands of transmitting components, and each component is generally divided into 2-8 channels. In the power supply mode, each component comprises a high-power DC-DC power supply module, and the DC-DC power supply module supplies power to each channel after passing through the LDO. Because the solid-state phased array radar generally works in a pulse mode, the load of the array surface power supply module belongs to a pulse load. The top drop, ripple waves and the like of the power supply during the pulse load have great influence on the performance parameters of the whole radar, and how to quickly and effectively detect the performance parameters in the production process of the array surface power supply module is a very critical problem when the power supply module is produced in a large scale.
In summary, since thousands of array surface power modules are used in the radar, a miniaturized automatic test platform capable of simulating radar pulse load is urgently needed to improve the quality control degree in the production process of the power modules and automatically test the pulse load performance of the power modules quickly, accurately and effectively.
Disclosure of Invention
The invention aims to provide an automatic test table for a pulse power supply, which can be used for quickly, accurately and effectively automatically testing the pulse load performance index of a radar array surface power supply module in the production process of the radar array surface power supply module so as to improve the production efficiency and quality of the power supply module.
In order to achieve the purpose, the invention adopts the following technical scheme:
the invention provides an automatic test bench for a pulse power supply, which comprises:
the device comprises a test fixture, a digital signal processing module, a touch screen module, first to fourth modulator modules and first to fourth resistors;
wherein the content of the first and second substances,
the test fixture is used for connecting the tested array surface power supply module and is used as an intermediary for signal interaction between the tested array surface power supply module and other modules of the test bench;
the digital signal processing module is used for receiving the test parameter information sent by the touch screen module, generating a corresponding enabling control signal according to the test parameter information and sending the enabling control signal to the tested array surface power supply module so as to enable and control the tested array surface power supply module on the test fixture; acquiring and processing the voltage and current output by the array surface power supply module to be tested to obtain test result data, processing the test result data to enable the test result data to be displayed on the touch screen module, and sending the processed test result data to the touch screen module; generating a modulator pulse signal and sending the modulated pulse signal to the first to fourth modulator modules;
the touch screen module is used for setting test parameter information and sending the test parameter information to the digital signal processing module; receiving the processed test result data sent by the digital signal processing module, and displaying the test result data on the touch screen;
the first modulator module, the second modulator module, the third modulator module, the fourth modulator module and the fourth modulator module are used for chopping the direct-current power supply sent by the tested array power supply module into a pulse power supply; receiving a modulator pulse signal sent by a digital signal processing module;
the first to fourth resistors are used to simulate actual loads of different sizes.
In a specific embodiment, a first input end of the test fixture is connected with a first output end of the digital signal processing module;
the first output end of the test fixture is connected with the first input ends of the first modulator module, the second modulator module, the third modulator module and the fourth modulator module and the first input end of the digital signal processing module;
the grounding end of the test fixture is grounded;
the second output end of the digital signal processing module is connected with the first input end of the touch screen module;
the second input end of the digital signal processing module is connected with the first output end of the touch screen module;
the third output end of the digital signal processing module is connected with the second input end of the first modulator module; the fourth output end of the digital signal processing module is connected with the third input end of the first modulator module;
the fifth output end of the digital signal processing module is connected with the second input end of the second modulator module; the sixth output end of the digital signal processing module is connected with the third input end of the second modulator module;
the seventh output end of the digital signal processing module is connected with the second input end of the third modulator module; the eighth output end of the digital signal processing module is connected with the third input end of the third modulator module;
the ninth output end of the digital signal processing module is connected with the second input end of the fourth modulator module; the tenth output end of the digital signal processing module is connected with the third input end of the fourth modulator module;
the first output end of the first modulator module is connected with one end of a first resistor, and the other end of the first resistor is grounded;
the first output end of the second modulator module is connected with one end of a second resistor, and the other end of the second resistor is grounded;
the first output end of the third modulator module is connected with one end of a third resistor, and the other end of the third resistor is grounded;
and a first output end of the fourth modulator module is connected with one end of a fourth resistor, and the other end of the fourth resistor is grounded.
In a specific embodiment, the test fixture is a terminal fixture.
In one embodiment, the digital signal processing module is a TMS320F28335 core module.
In a specific embodiment, the touch screen module employs an HMI touch screen.
In one embodiment, the first to fourth modulator modules employ electronic switches with PMOS transistors as cores.
In a specific embodiment, the first resistor is a power resistor of 15 ohms.
In a specific embodiment, the second resistor is a power resistor of 4 ohms.
In a specific embodiment, the third resistor is a power resistor of 2 ohms.
In a specific embodiment, the fourth resistor is a power resistor of 1 ohm.
The invention has the following beneficial effects:
the automatic test board for the pulse power supply provided by the invention simulates four pulse load conditions by using the modulator and the power resistor, can automatically test the pulse load performance indexes of the radar in the production process of the array surface power supply module under the automatic control of a Digital Signal Processing (DSP) module, and can improve the efficiency and quality of the power supply module in mass production.
Drawings
In order to more clearly illustrate the embodiments of the present application or the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are one embodiment of the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 shows a schematic block diagram of an automatic test stand for pulsed power supply according to an embodiment of the present invention.
Detailed Description
In order to make the technical solution of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and examples. The present invention will be described in detail with reference to specific examples, but the present invention is not limited to these examples. Variations and modifications may be made by those skilled in the art without departing from the principles of the invention and should be considered within the scope of the invention.
The present embodiment provides an automatic test stand for a pulse power supply, and as shown in fig. 1, fig. 1 shows a functional block diagram of an automatic test stand for a pulse power supply according to an embodiment of the present invention. The test bench includes:
the device comprises a test fixture J1, a digital signal processing module U1, a touch screen module L1, first to fourth modulator modules M1 to M4 and first to fourth resistors R1 to R4;
as can be seen from fig. 1, the first input terminal EN2 of the test fixture is connected to the first output terminal EN1 of the digital signal processing module;
the first output end VO of the test fixture is connected with the first input ends IN 1-IN 4 of the first to fourth modulator modules and the first input end VO _ S of the digital signal processing module;
the grounding end GND of the test fixture is grounded;
the second output end TX1 of the digital signal processing module is connected with the first input end RX2 of the touch screen module;
the second input end RX1 of the digital signal processing module is connected with the first output end TX2 of the touch screen module;
the third output terminal PULS1 of the digital signal processing module is connected to the second input terminal PULS11 of the first modulator module M1; the fourth output terminal Io1 of the digital signal processing module is connected to the third input terminal Io11 of the first modulator module M1;
the fifth output terminal PULS2 of the digital signal processing module is connected to the second input terminal PULS22 of the second modulator module M2; the sixth output Io2 of the digital signal processing module is connected to the third input Io22 of the second modulator module M2;
the seventh output terminal PULS3 of the digital signal processing module is connected to the second input terminal PULS33 of the third modulator module M3; the eighth output Io3 of the digital signal processing module is connected to the third input Io33 of the third modulator module M3;
a ninth output terminal PULS4 of the digital signal processing module is connected to a second input terminal PULS44 of the fourth modulator module M4; a tenth output Io4 of the digital signal processing module is connected to a third input Io44 of the fourth modulator module M4;
the first output end OUT1 of the first modulator module M1 is connected to one end of a first resistor R1, and the other end of the first resistor is grounded GND;
the first output end OUT2 of the second modulator module M2 is connected to one end of a second resistor R2, and the other end of the second resistor is grounded GND;
the first output end OUT3 of the third modulator module M3 is connected to one end of a third resistor R3, and the other end of the third resistor is grounded GND;
the first output terminal OUT4 of the fourth modulator module M4 is connected to one end of a fourth resistor R4, the other end of which is connected to ground GND.
In the embodiment, the test fixture adopts a standard terminal fixture;
the digital signal processing module adopts a module taking TMS320F28335 as a core;
the touch screen module adopts an HMI touch screen;
the first modulator module, the second modulator module, the third modulator module and the fourth modulator module adopt electronic switches with PMOS tubes as cores;
the first resistor is a power resistor of 15 ohms;
the second resistor is a power resistor of 4 ohms;
the third resistor is a power resistor of 2 ohms;
the fourth resistor adopts a power resistor of 1 ohm.
Wherein the content of the first and second substances,
the test fixture is used for connecting the tested array surface power supply module and is used as an intermediary for signal interaction between the tested array surface power supply module and other modules of the test bench;
for example, the tested front power supply module sends the direct current power supply to the first to fourth modulator modules through the first output terminal VO of the test fixture; the tested array surface power supply module receives the enabling control signal sent by the digital signal processing module through a first input end EN2 of the test fixture;
the digital signal processing module is used for receiving the test parameter information sent by the touch screen module, generating a corresponding enabling control signal according to the test parameter information and sending the enabling control signal to the tested array surface power supply module so as to enable and control the tested array surface power supply module on the test fixture; acquiring and processing the voltage and current output by the array surface power supply module to be tested to obtain test result data, processing the test result data to enable the test result data to be displayed on the touch screen module, and sending the processed test result data to the touch screen module; generating a modulator pulse signal according to the test parameter information, and sending the modulated pulse signal to the first modulator module, the second modulator module, the third modulator module and the fourth modulator module;
the touch screen module is used for setting test parameter information and sending the test parameter information to the digital signal processing module; receiving the processed test result data sent by the digital signal processing module, and displaying the test result data on the touch screen;
the first modulator module, the second modulator module, the third modulator module, the fourth modulator module and the fourth modulator module are used for chopping the direct-current power supply sent by the tested array power supply module into a pulse power supply; receiving a modulator pulse signal sent by a digital signal processing module;
the first resistor, the second resistor, the third resistor, the fourth resistor and the fourth resistor belong to high-power resistors and are used for simulating actual loads with different sizes;
the combination of the first through fourth modulator modules and the first through fourth resistors simulate four different pulsed load conditions.
The flow of the test bench provided by this embodiment when working is as follows:
the touch screen module is used for setting test parameter information and sending the test parameter information to the digital signal processing module;
the digital signal processing module receives the test parameter information sent by the touch screen module, generates a corresponding enabling control signal according to the test parameter information, sends the enabling control signal to the tested array surface power supply module, further enables the tested array surface power supply module on the test fixture to be controlled, simultaneously generates a modulator pulse signal, and sends the modulation pulse signal to the first modulator module, the second modulator module, the third modulator module and the fourth modulator module;
the first modulator module, the second modulator module, the third modulator module, the fourth modulator module and the digital signal processing module are connected in series; the combination of the first through fourth modulator modules and the first through fourth resistors simulates four different pulse load conditions;
the tested array surface power supply module receives and responds to the signal sent by the digital signal processing module through the test fixture, outputs a voltage signal and a current signal to the digital signal processing module, and simultaneously sends a direct current power supply to the first modulator module, the second modulator module, the third modulator module and the fourth modulator module;
the first modulator module, the second modulator module, the third modulator module, the fourth modulator module and the fourth modulator module are connected in series;
the digital signal processing module collects and processes the voltage and current output by the array surface power supply module to be tested to obtain test result data, processes the test result data to enable the test result data to be displayed on the touch screen module, and sends the processed test result data to the touch screen module;
and the touch screen module receives the processed test result data sent by the digital signal processing module and displays the test result data on the touch screen.
According to the automatic test bench for the pulse power supply, the modulator and the power resistor are used for simulating four pulse load conditions, under the automatic control of a DSP (digital signal processing module), the automatic test bench can be used for quickly, accurately and effectively automatically testing the pulse load performance indexes in the production process of the radar array surface power supply module, and the efficiency and the quality of the power supply module in mass production can be improved.
It should be understood that the above-mentioned embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and it will be obvious to those skilled in the art that other variations or modifications may be made on the basis of the above description, and all embodiments may not be exhaustive, and all obvious variations or modifications may be included within the scope of the present invention.
Claims (10)
1. An automatic test station for pulsed power supplies, said test station comprising:
the device comprises a test fixture, a digital signal processing module, a touch screen module, first to fourth modulator modules and first to fourth resistors;
wherein the content of the first and second substances,
the test fixture is used for connecting the tested array surface power supply module and is used as an intermediary for signal interaction between the tested array surface power supply module and other modules of the test bench;
the digital signal processing module is used for receiving the test parameter information sent by the touch screen module, generating a corresponding enabling control signal according to the test parameter information and sending the enabling control signal to the tested array surface power supply module so as to enable and control the tested array surface power supply module on the test fixture; acquiring and processing the voltage and current output by the array surface power supply module to be tested to obtain test result data, processing the test result data to enable the test result data to be displayed on the touch screen module, and sending the processed test result data to the touch screen module; generating a modulator pulse signal and sending the modulated pulse signal to the first to fourth modulator modules;
the touch screen module is used for setting test parameter information and sending the test parameter information to the digital signal processing module; receiving the processed test result data sent by the digital signal processing module, and displaying the test result data on the touch screen;
the first modulator module, the second modulator module, the third modulator module, the fourth modulator module and the fourth modulator module are used for chopping the direct-current power supply sent by the tested array power supply module into a pulse power supply; receiving a modulator pulse signal sent by a digital signal processing module;
the first to fourth resistors are used to simulate actual loads of different sizes.
2. The test bench of claim 1, wherein the first input terminal of the test fixture is connected to the first output terminal of the digital signal processing module;
the first output end of the test fixture is connected with the first input ends of the first modulator module, the second modulator module, the third modulator module and the fourth modulator module and the first input end of the digital signal processing module;
the grounding end of the test fixture is grounded;
the second output end of the digital signal processing module is connected with the first input end of the touch screen module;
the second input end of the digital signal processing module is connected with the first output end of the touch screen module;
the third output end of the digital signal processing module is connected with the second input end of the first modulator module; the fourth output end of the digital signal processing module is connected with the third input end of the first modulator module;
the fifth output end of the digital signal processing module is connected with the second input end of the second modulator module; the sixth output end of the digital signal processing module is connected with the third input end of the second modulator module;
the seventh output end of the digital signal processing module is connected with the second input end of the third modulator module; the eighth output end of the digital signal processing module is connected with the third input end of the third modulator module;
the ninth output end of the digital signal processing module is connected with the second input end of the fourth modulator module; the tenth output end of the digital signal processing module is connected with the third input end of the fourth modulator module;
the first output end of the first modulator module is connected with one end of a first resistor, and the other end of the first resistor is grounded;
the first output end of the second modulator module is connected with one end of a second resistor, and the other end of the second resistor is grounded;
the first output end of the third modulator module is connected with one end of a third resistor, and the other end of the third resistor is grounded;
and a first output end of the fourth modulator module is connected with one end of a fourth resistor, and the other end of the fourth resistor is grounded.
3. The test bench of claim 1, wherein said test fixture is a terminal fixture.
4. The test bench of claim 1, wherein the digital signal processing module is a TMS320F28335 core module.
5. The test bench of claim 1, wherein said touch screen module employs an HMI touch screen.
6. The test bench of claim 1, wherein said first through fourth modulator modules employ electronic switches with PMOS transistors as cores.
7. The test bench of claim 1, wherein said first resistor is a 15 ohm power resistor.
8. The test bench of claim 1, wherein said second resistor is a power resistor of 4 ohms.
9. The test bench of claim 1, wherein said third resistor is a 2 ohm power resistor.
10. The test bench of claim 1, wherein said fourth resistor is a 1 ohm power resistor.
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