CN116964443B - Zeta电位测量方法以及测量装置 - Google Patents

Zeta电位测量方法以及测量装置

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Publication number
CN116964443B
CN116964443B CN202280018597.5A CN202280018597A CN116964443B CN 116964443 B CN116964443 B CN 116964443B CN 202280018597 A CN202280018597 A CN 202280018597A CN 116964443 B CN116964443 B CN 116964443B
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China
Prior art keywords
potential
pressure
time
zeta potential
flow
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CN202280018597.5A
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English (en)
Chinese (zh)
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CN116964443A (zh
Inventor
水畑穣
冈江功弥
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe University NUC
Murata Manufacturing Co Ltd
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Kobe University NUC
Murata Manufacturing Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing

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  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
CN202280018597.5A 2021-03-13 2022-03-10 Zeta电位测量方法以及测量装置 Active CN116964443B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021040878 2021-03-13
JP2021-040878 2021-03-13
PCT/JP2022/010701 WO2022196533A1 (ja) 2021-03-13 2022-03-10 ゼータ電位測定方法及び測定装置

Publications (2)

Publication Number Publication Date
CN116964443A CN116964443A (zh) 2023-10-27
CN116964443B true CN116964443B (zh) 2026-02-17

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CN202280018597.5A Active CN116964443B (zh) 2021-03-13 2022-03-10 Zeta电位测量方法以及测量装置

Country Status (4)

Country Link
US (1) US12313590B2 (https=)
JP (1) JP7496979B2 (https=)
CN (1) CN116964443B (https=)
WO (1) WO2022196533A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116587320A (zh) * 2023-05-08 2023-08-15 西安交通大学 一种静电黏附装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103954657A (zh) * 2013-06-24 2014-07-30 浙江赛特膜技术有限公司 流动电位和ZeTa电位测定方法及测定仪器
CN105705934A (zh) * 2013-09-03 2016-06-22 Izon科技有限公司 颗粒电荷的测量

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Publication number Priority date Publication date Assignee Title
JPS5818157A (ja) * 1981-07-24 1983-02-02 Shimadzu Corp ゼ−タ電位測定装置
HU194998B (en) * 1986-10-28 1988-03-28 Mta Kutatasi Eszkoezoeket Kivi Test method for detecting zeta potential of suspended substance in liquid medium
JP3211530B2 (ja) * 1993-12-28 2001-09-25 株式会社島津製作所 流動電位測定装置
JP3456004B2 (ja) * 1994-04-20 2003-10-14 日本製紙株式会社 ゼータ電位測定方法及びパルプスラリーの調製方法
JPH08101158A (ja) 1994-09-30 1996-04-16 Shimadzu Corp 流動電位測定法
JP3376721B2 (ja) 1994-10-31 2003-02-10 株式会社島津製作所 流動電位測定法
JP3367234B2 (ja) 1994-11-11 2003-01-14 株式会社島津製作所 流動電位測定法
JPH0968514A (ja) * 1995-08-31 1997-03-11 Shimadzu Corp 流動電位測定装置
JP3533815B2 (ja) * 1996-03-19 2004-05-31 株式会社島津製作所 ゼータ電位測定方法および装置
JPH1038835A (ja) * 1996-07-18 1998-02-13 Shimadzu Corp ゼータ電位測定方法および装置
JP2957509B2 (ja) * 1997-03-07 1999-10-04 新潟日本電気株式会社 インクジェット記録装置
JP2000019144A (ja) * 1998-06-30 2000-01-21 Shimadzu Corp ゼータ電位測定方法および測定装置
WO2002021517A1 (en) * 2000-09-04 2002-03-14 Zeon Corporation Magnetic disk substrate and magnetic disk
CN1808149B (zh) * 2006-02-24 2010-12-22 国家海洋局杭州水处理技术研究开发中心 平流式膜表面电位测定仪
CA2857307A1 (en) * 2011-12-01 2013-06-06 Barofold, Inc. Methods and systems for protein refolding
GB2501530A (en) * 2012-04-29 2013-10-30 Univ Sheffield Rheometer and rheometric method
AT515744B1 (de) * 2014-05-13 2016-08-15 Anton Paar Gmbh Verfahren und Vorrichtung zum Ermitteln des Zetapotenzials zum Charakterisieren einer Fest-Flüssig-Phasengrenze mit gesteuerter Druckprofilbeaufschlagung
US10493172B2 (en) * 2016-06-02 2019-12-03 California Institute Of Technology Gas-filled structures and related compositions, methods and systems to image a target site
CN109507264B (zh) * 2018-11-14 2022-11-01 南京工业大学 膜表面Zeta电位自动检测仪

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103954657A (zh) * 2013-06-24 2014-07-30 浙江赛特膜技术有限公司 流动电位和ZeTa电位测定方法及测定仪器
CN105705934A (zh) * 2013-09-03 2016-06-22 Izon科技有限公司 颗粒电荷的测量

Also Published As

Publication number Publication date
JPWO2022196533A1 (https=) 2022-09-22
JP7496979B2 (ja) 2024-06-10
CN116964443A (zh) 2023-10-27
US20230408445A1 (en) 2023-12-21
WO2022196533A1 (ja) 2022-09-22
US12313590B2 (en) 2025-05-27

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