JPWO2022196533A1 - - Google Patents
Info
- Publication number
- JPWO2022196533A1 JPWO2022196533A1 JP2023507051A JP2023507051A JPWO2022196533A1 JP WO2022196533 A1 JPWO2022196533 A1 JP WO2022196533A1 JP 2023507051 A JP2023507051 A JP 2023507051A JP 2023507051 A JP2023507051 A JP 2023507051A JP WO2022196533 A1 JPWO2022196533 A1 JP WO2022196533A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/60—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrostatic variables, e.g. electrographic flaw testing
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021040878 | 2021-03-13 | ||
| JP2021040878 | 2021-03-13 | ||
| PCT/JP2022/010701 WO2022196533A1 (ja) | 2021-03-13 | 2022-03-10 | ゼータ電位測定方法及び測定装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2022196533A1 true JPWO2022196533A1 (https=) | 2022-09-22 |
| JPWO2022196533A5 JPWO2022196533A5 (https=) | 2023-10-24 |
| JP7496979B2 JP7496979B2 (ja) | 2024-06-10 |
Family
ID=83320638
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023507051A Active JP7496979B2 (ja) | 2021-03-13 | 2022-03-10 | ゼータ電位測定方法及び測定装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12313590B2 (https=) |
| JP (1) | JP7496979B2 (https=) |
| CN (1) | CN116964443B (https=) |
| WO (1) | WO2022196533A1 (https=) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116587320A (zh) * | 2023-05-08 | 2023-08-15 | 西安交通大学 | 一种静电黏附装置 |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5818157A (ja) * | 1981-07-24 | 1983-02-02 | Shimadzu Corp | ゼ−タ電位測定装置 |
| WO1988003265A1 (en) * | 1986-10-28 | 1988-05-05 | Mta Kutatási Eszközöket Kivitelezo^" Vállalat | Process for measuring and determining zeta-potential in a laminarly flowing medium for practical purposes |
| JPH07198655A (ja) * | 1993-12-28 | 1995-08-01 | Shimadzu Corp | 流動電位測定装置 |
| JPH07286984A (ja) * | 1994-04-20 | 1995-10-31 | Nippon Paper Ind Co Ltd | ゼータ電位測定方法及びパルプスラリーの調製方法 |
| JPH0968514A (ja) * | 1995-08-31 | 1997-03-11 | Shimadzu Corp | 流動電位測定装置 |
| JPH09257739A (ja) * | 1996-03-19 | 1997-10-03 | Shimadzu Corp | ゼータ電位測定方法および装置 |
| JPH1038835A (ja) * | 1996-07-18 | 1998-02-13 | Shimadzu Corp | ゼータ電位測定方法および装置 |
| JP2000019144A (ja) * | 1998-06-30 | 2000-01-21 | Shimadzu Corp | ゼータ電位測定方法および測定装置 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08101158A (ja) | 1994-09-30 | 1996-04-16 | Shimadzu Corp | 流動電位測定法 |
| JP3376721B2 (ja) | 1994-10-31 | 2003-02-10 | 株式会社島津製作所 | 流動電位測定法 |
| JP3367234B2 (ja) | 1994-11-11 | 2003-01-14 | 株式会社島津製作所 | 流動電位測定法 |
| JP2957509B2 (ja) * | 1997-03-07 | 1999-10-04 | 新潟日本電気株式会社 | インクジェット記録装置 |
| WO2002021517A1 (en) * | 2000-09-04 | 2002-03-14 | Zeon Corporation | Magnetic disk substrate and magnetic disk |
| CN1808149B (zh) * | 2006-02-24 | 2010-12-22 | 国家海洋局杭州水处理技术研究开发中心 | 平流式膜表面电位测定仪 |
| CA2857307A1 (en) * | 2011-12-01 | 2013-06-06 | Barofold, Inc. | Methods and systems for protein refolding |
| GB2501530A (en) * | 2012-04-29 | 2013-10-30 | Univ Sheffield | Rheometer and rheometric method |
| CN103954657A (zh) * | 2013-06-24 | 2014-07-30 | 浙江赛特膜技术有限公司 | 流动电位和ZeTa电位测定方法及测定仪器 |
| CN105705934B (zh) * | 2013-09-03 | 2019-01-08 | Izon科技有限公司 | 用于确定测量颗粒的电荷的方法和设备 |
| AT515744B1 (de) * | 2014-05-13 | 2016-08-15 | Anton Paar Gmbh | Verfahren und Vorrichtung zum Ermitteln des Zetapotenzials zum Charakterisieren einer Fest-Flüssig-Phasengrenze mit gesteuerter Druckprofilbeaufschlagung |
| US10493172B2 (en) * | 2016-06-02 | 2019-12-03 | California Institute Of Technology | Gas-filled structures and related compositions, methods and systems to image a target site |
| CN109507264B (zh) * | 2018-11-14 | 2022-11-01 | 南京工业大学 | 膜表面Zeta电位自动检测仪 |
-
2022
- 2022-03-10 JP JP2023507051A patent/JP7496979B2/ja active Active
- 2022-03-10 CN CN202280018597.5A patent/CN116964443B/zh active Active
- 2022-03-10 WO PCT/JP2022/010701 patent/WO2022196533A1/ja not_active Ceased
-
2023
- 2023-08-30 US US18/240,220 patent/US12313590B2/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5818157A (ja) * | 1981-07-24 | 1983-02-02 | Shimadzu Corp | ゼ−タ電位測定装置 |
| WO1988003265A1 (en) * | 1986-10-28 | 1988-05-05 | Mta Kutatási Eszközöket Kivitelezo^" Vállalat | Process for measuring and determining zeta-potential in a laminarly flowing medium for practical purposes |
| JPH07198655A (ja) * | 1993-12-28 | 1995-08-01 | Shimadzu Corp | 流動電位測定装置 |
| JPH07286984A (ja) * | 1994-04-20 | 1995-10-31 | Nippon Paper Ind Co Ltd | ゼータ電位測定方法及びパルプスラリーの調製方法 |
| JPH0968514A (ja) * | 1995-08-31 | 1997-03-11 | Shimadzu Corp | 流動電位測定装置 |
| JPH09257739A (ja) * | 1996-03-19 | 1997-10-03 | Shimadzu Corp | ゼータ電位測定方法および装置 |
| JPH1038835A (ja) * | 1996-07-18 | 1998-02-13 | Shimadzu Corp | ゼータ電位測定方法および装置 |
| JP2000019144A (ja) * | 1998-06-30 | 2000-01-21 | Shimadzu Corp | ゼータ電位測定方法および測定装置 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116587320A (zh) * | 2023-05-08 | 2023-08-15 | 西安交通大学 | 一种静电黏附装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7496979B2 (ja) | 2024-06-10 |
| CN116964443A (zh) | 2023-10-27 |
| US20230408445A1 (en) | 2023-12-21 |
| WO2022196533A1 (ja) | 2022-09-22 |
| CN116964443B (zh) | 2026-02-17 |
| US12313590B2 (en) | 2025-05-27 |
Similar Documents
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230727 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230727 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20230802 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20240510 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20240520 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 7496979 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |