CN116057204A - 用于将金属层无电流地施加到基板上的方法 - Google Patents

用于将金属层无电流地施加到基板上的方法 Download PDF

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CN116057204A
CN116057204A CN202180054787.8A CN202180054787A CN116057204A CN 116057204 A CN116057204 A CN 116057204A CN 202180054787 A CN202180054787 A CN 202180054787A CN 116057204 A CN116057204 A CN 116057204A
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维尼斯·贝尤加
托尔斯滕·托伊奇
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Pac Tech Packaging Technologies GmbH
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Abstract

本发明涉及一种用于将金属层无电流地施加到基板上的方法,包括以下按照时间顺序的工作步骤:a)用蚀刻溶液处理要覆层的基板表面;b)用聚电解质或有机硅烷化合物处理要覆层的基板表面;c)用包含金属颗粒的溶液处理要覆层的表面;d)用包含要施加到基板上的金属的至少一种盐的溶液处理要覆层的表面。

Description

用于将金属层无电流地施加到基板上的方法
技术领域
本发明涉及一种用于将金属层无电流地施加到基板上的方法,以便提供经济的方法,借助于所述方法能够无真空地将非常薄的金属层施加在基板上。
背景技术
从现有技术中已知多种方法,以便给基板设置金属层。因此,无电流的方法以及借助电覆层来工作的方法提供经济的解决方案,而其他方法,例如借助真空或蒸汽工作的方法大多数情况下是明显成本更高的。
在已知的湿化学方法中,要覆层的表面通常首先经受清洁预处理。随后,要覆层的表面通常借助锡颗粒或钯颗粒来活化。基于钯的活化自1950年代起就在工业中执行。在活化之后,将表面在已知的方法中用金属盐溶液处理,所述金属盐溶液在表面上减少。当较厚的金属层是所期望的时,使用电镀覆层。与之相反,尤其在半导体技术的领域中使用无电流覆层,以便以相对低的耗费得到非常薄的金属覆层。
在所提及的方法中的挑战之一是实现所提及的金属种子层的足够强的附着并且这是有待实现的。为了实现该挑战,最常见的方法是使表面经受蚀刻工艺。这尤其在由玻璃构成的表面中执行,以便实现活性试剂在基板表面上的机械连接。然而,玻璃表面通过蚀刻工艺的粗糙化尤其对于高频应用是不理想的。聚合物在金属化之前也通常经受膨胀和蚀刻工艺,因为所述聚合物通常在再钝化法和再分配法中被使用。
发明内容
本发明基本如下目的,提供用于将金属层无电流地施加到基板上的方法,借助所述方法能够将超薄且平滑的金属层尽可能低成本地施加到基板上,其中金属层应当尽可能牢固地附着在基板上。
该目的根据本发明通过具有权利要求1的特征的方法实现。
在用蚀刻溶液处理要覆层的基板表面之后,首先用聚电解质或有机硅烷化合物处理要覆层的基板表面。接着,执行借助金属颗粒,尤其借助金颗粒、银颗粒、铜颗粒和/或铂颗粒的处理,以活化基板表面。这些金属颗粒通过之前施加的聚电解质或有机硅烷化合物固定在基板上。由此明显地提高起活化作用的金属颗粒在基板表面上的粘附。在接着用包含要施加到基板上的金属的盐的溶液对要覆层的表面进行处理时,能够将厚度为50nm至1000nm的超薄且平滑的金属层低成本地施加到基板上。通常,溶液在工作步骤d)中包含铜离子,例如硫酸铜。已证实的是,借助根据本发明的方法能够将特别薄且平滑的铜层施加到基板上。
将要覆层的基板表面在工作步骤b)中优选用聚电解质处理,所述聚电解质选自聚二烯丙基二甲铵(PDDA)、聚环氧乙烷(PEI)、聚丙烯酸(PAA)、聚苯乙烯磺酸盐(PSS)、聚环氧乙烷PEO和聚赖氨酸。这些聚电解质证实为对于金属颗粒,尤其金颗粒、银颗粒、铜颗粒和/或铂颗粒的固定是特别有效的。
在根据本发明的方法的一个特别优选的变型形式中,溶液在工作步骤d)中包含至少一种多聚糖,优选浓度为0.05%或更低。已证实的是,在覆层溶液中的多聚糖能够改变离子相互作用以及所施加的颗粒的大小,由此改进要施加的金属层的粘附。此外已观察到,借助多聚糖实现在无电流地施加金属层时的均匀的层生长。此外已证实的是,多聚糖用作为用于覆层溶液的稳定剂。假设,要施加的金属的颗粒大小,尤其铜颗粒的大小通过多聚糖减小。通过在覆层溶液中使用多聚糖还实现,可能减少玻璃基板的蚀刻。作为多聚糖源例如能够使用琼脂。
有利地,在方法步骤c)中存在金颗粒、银颗粒、铜颗粒和/或铂颗粒作为金纳米颗粒、银纳米颗粒、铜纳米颗粒和/或铂纳米颗粒,其中纳米颗粒优选具有大约5nm至100nm的直径并且优选具有带电的官能团。借助带电的官能团造成纳米颗粒和之前施加的聚电解质或之前施加的有机硅烷化合物之间的特别有利的静电的离子相互作用,由此纳米颗粒特别稳定地固定在要覆层的基板的表面上。有利地,工作步骤c)包含金纳米颗粒,尤其具有氯化金和柠檬酸的纳米颗粒,和优选至少一种表面活性剂,例如
Figure BDA0004109503110000021
是基于聚乙二醇的表面活性剂。尤其地,这种表面活性剂将颗粒的聚集趋势减小2倍。空间障碍将纳米颗粒稳定,其中聚乙二醇附加地改善润湿。可选地,也能够添加柠檬酸钠,以提高稳定性。
有利地,在工作步骤d)中金属盐以微型颗粒形式存在,尤其具有大约100nm至1000nm的直径。以这种方式方法能够由产生由聚电解质、纳米颗粒和微型颗粒构成的过渡层,借助于所述过渡层最终能够产生极其薄且极其平滑的金属覆层。
基板能够由聚合物或基于硅制成。然而,优选地,基板由玻璃制成,其中基板优选是具有留空部的中介层。玻璃中介层尤其应用在半导体领域中。因此,玻璃中介层允许热膨胀系数直接匹配于硅芯片。此外,由玻璃构成的中介层与硅相比提供更好的电特性。此外,这种中介层能够以面板大小获得并且提供高的互连密度。在玻璃中介层上的金属种子层还提供用于高传输和内存带宽应用的很有希望的解决方案。
通常,基板在工作步骤a)中用酸来处理。
优选地,将塑料基板在工作步骤b)之前用二甲基亚砜(DMSO)或N-甲基-2-吡咯烷酮(NMP)在大约25℃至60℃下并且接着用例如为DMSO的膨胀剂、例如为Triton-X的基于聚乙二醇的表面活性剂、氢氧化铵和/或氢氧化钠以及例如为甲醇、异丙醇或乙醇的醇来处理。玻璃基板通常用至少一种酸,例如硝酸、硫酸、食人鱼溶液、盐酸或王水或用钾盐、钠盐和/或双氟化铵盐来处理。
在根据本发明的方法的一个改进形式时,在工作步骤d)之后执行对经覆层的基板表面的电镀覆层。通过这种由无电流覆层和电镀覆层构成的组合能够填满中介层中的留空部。通过所述组合能够实现大于1μm的覆层厚度。
有利地,将基板在每个工作步骤之前和每个工作步骤之后用水,尤其蒸馏水冲洗,其中将基板在工作步骤d)之后优选用水和酸处理。
在根据本发明的方法的一个优选的变型形式中,在工作步骤d)中溶液还包含还原剂,尤其甲醛、联氨和/或乙醛酸。所述还原剂将工作步骤d)的金属盐的金属阳离子还原为元素金属。由此得到厚度为50nm至1000nm的超薄金属层。
如果作为工作步骤b)中的固定试剂应使用有机硅烷化合物,那么所述有机硅烷化合物优选选自亚烷基硅烷、氯丙基硅烷、氨丙基硅烷、硫代丙基硅烷和/或氰乙基硅烷和/或醚取代的、酯取代的和/或环氧树脂取代的烷基硅烷。
通常,在工作步骤d)中溶液具有大约10至12的pH值。
有利地,在工作步骤d)中溶液包含至少一种络合剂,例如EDTA,N,N,N’,N’-四基斯(2-羟丙基)乙二胺(四元)或酒石酸钾钠。
通常,在25℃至90℃的温度下执行工作步骤b)。
在设有贵金属颗粒的表面上能够形成金属层的根据本发明的方法也适合于表面等离子共振应用(OPR)以及适用于热敏的光子和光电的应用。所使用的纳米颗粒的大小,覆层率,pH值以及纳米颗粒密度影响要产生的金属层的形态学的和机械的特性。
具体实施方式
实例1:
将玻璃基板用丙酮和食人鱼溶液清洗一小时并且随后在10-20%的PDDA溶液中温育两小时。接着将样品用蒸馏水冲洗并且提供到具有金纳米颗粒的溶液中,所述溶液根据特克维奇法制造,其中颗粒大小<100nm。溶液包含1%的氯化金、0.01%的Triton-X和0.3g/L的柠檬酸三钠。在纳米颗粒固定在基板上至少两小时之后,将样品重新冲洗并且提供到具有0.05%的琼脂、3.2g/L的五水硫酸铜、11.3g/L的酒石酸钾钠、5g的氢化钠(pH值为10至12)和32ML/L的甲醛的覆层浴中。在这种情况下,将琼脂用作为多聚糖源。通过在室温下改变2至20分钟的覆层时间,得到厚度为30μm至150μm的种子层。根据ASTM的胶带测试得到5B程度,这显示出强的粘附性。
实例2:
实例2根据实例1执行,除了PDDA由1g/L的支化聚乙烯(分子量25000至750000,PEI)替代。
实例3:
实例3根据实例1执行,除了PDDA由0.946g/L的(3-氨丙基)三乙氧基硅烷或APTES替代。
实例4:
实例4根据实例1执行,除了光反应性的、固化的聚酰亚胺或干层-环氧树脂-基板替代玻璃基板施加到硅基板或玻璃基板上。在PDDA/APTES中执行温育之前,将附加的膨胀处理和蚀刻处理作为预处理的一部分集成到所述方法中。在质子惰性的溶剂,例如二甲酰亚砜(DMSO)中的膨胀,在25℃至60℃下执行一分钟。随后,在溶液中进行20分钟至1小时的微蚀刻,所述溶液包含0.5至1%的例如为DMSO的水溶的膨胀剂、0.5至1%的例如为
Figure BDA0004109503110000051
的基于聚乙二醇的表面活性剂、1至3%的氢氧化铵和氢氧化钠化合物和10至30%的例如为甲醇、异丙醇或乙醇的醇化合物。随后,在基板被冲洗并且浸入聚电解质溶液中之前,用10%的硫酸处理所述基板。

Claims (18)

1.一种用于将金属层无电流地施加到基板上的方法,所述方法包括以下按照时间顺序的工作步骤:
a)用蚀刻溶液处理要覆层的基板表面;
b)用聚电解质或有机硅烷化合物处理要覆层的基板表面;
c)用包含金属颗粒的溶液处理要覆层的表面;
d)用包含要施加到所述基板上的金属的至少一种盐的溶液处理要覆层的表面。
2.根据权利要求1所述的方法,
其特征在于,
在工作步骤c)中所述溶液包含金颗粒、银颗粒、铜颗粒和/或铂颗粒,尤其胶体金。
3.根据权利要求1或2所述的方法,
其特征在于,
在工作步骤d)中所述溶液包含铜离子,例如硫酸铜。
4.根据上述权利要求中任一项所述的方法,
其特征在于,
在工作步骤b)中将所述要覆层的基板表面用聚电解质处理,所述聚电解质选自聚二烯丙基二甲铵(PDDA)、聚环氧乙烷(PEI)、聚丙烯酸(PAA)、聚苯乙烯磺酸盐(PSS)、聚环氧乙烷PEO和聚赖氨酸。
5.根据上述权利要求中任一项所述的方法,
其特征在于,
在工作步骤d)中所述溶液包含至少一种多聚糖,优选浓度为0.05%或更小。
6.根据权利要求2至5中任一项所述的方法,
其特征在于,
在工作步骤c)中所述金颗粒、银颗粒、铜颗粒和/或铂颗粒作为金纳米颗粒、银纳米颗粒、铜纳米颗粒和/或铂纳米颗粒存在,其中所述纳米颗粒优选具有大约5nm至100nm的直径并且优选具有带电的官能团。
7.根据上述权利要求中任一项所述的方法,
其特征在于,
在工作步骤c)中所述溶液包含金纳米颗粒,尤其是具有氯化金和柠檬酸的纳米颗粒,和优选至少一种表面活性剂,例如
Figure FDA0004109503100000021
8.根据上述权利要求中任一项所述的方法,
其特征在于,
在工作步骤d)中所述金属盐以微型颗粒的形式存在,尤其具有大约100nm至1000nm的直径。
9.根据上述权利要求中任一项所述的方法,
其特征在于,
所述基板由玻璃、聚合物或在硅的基础上制成,其中所述基板优选是具有留空部的中介层。
10.根据上述权利要求中任一项所述的方法,
其特征在于,
在工作步骤a)中,用酸处理所述基板。
11.根据上述权利要求中任一项所述的方法,
其特征在于,
将塑料基板在工作步骤b)之前用二甲酰亚砜(DMSO)或N-甲基-2-吡咯烷酮(NMP)在大约25℃至60℃下并且接着用例如为DMSO的膨胀剂、例如为
Figure FDA0004109503100000031
的基于聚乙二醇的表面活性剂、氢氧化铵和/或氢氧化钠以及例如为甲醇、异丙醇或乙醇的醇处理;或者其中用至少一种酸例如硝酸、硫酸、食人鱼溶液、盐酸或王水或用钾盐、钠盐和/或双氟化铵盐处理玻璃基板。
12.根据上述权利要求中任一项所述的方法,
其特征在于,
在工作步骤d)之后执行对经覆层的基板表面的电镀覆层。
13.根据上述权利要求中任一项所述的方法,
其特征在于,
将所述基板在每个工作步骤之前和之后用水处理,尤其用蒸馏水处理,其中所述基板在工作步骤d)之后优选用水和酸处理。
14.根据上述权利要求中任一项所述的方法,
其特征在于,
在工作步骤d)中,所述溶液还包含还原剂,尤其甲醛、联氨和/或乙醛酸。
15.根据上述权利要求中任一项所述的方法,
其特征在于,
作为有机硅烷化合物使用亚烷基硅烷、氯丙基硅烷、氨丙基硅烷、硫代丙基硅烷和/或氰乙基硅烷和/或醚取代的、酯取代的和/或环氧树脂取代的烷基硅烷。
16.根据上述权利要求中任一项所述的方法,
其特征在于,
在工作步骤d)中所述溶液具有大约10至12的pH值。
17.根据上述权利要求中任一项所述的方法,
其特征在于,
在工作步骤d)中,所述溶液包含至少一种络合剂,例如EDTA,N,N,N’,N’-四基斯(2-羟丙基)乙二胺(四元)或酒石酸钾钠。
18.根据上述权利要求中任一项所述的方法,
其特征在于,
在25℃至90℃的温度执行工作步骤b)。
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