CN115004856B - 控制装置及异常检测方法 - Google Patents

控制装置及异常检测方法 Download PDF

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Publication number
CN115004856B
CN115004856B CN202080094099.XA CN202080094099A CN115004856B CN 115004856 B CN115004856 B CN 115004856B CN 202080094099 A CN202080094099 A CN 202080094099A CN 115004856 B CN115004856 B CN 115004856B
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China
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value
time
abnormality detection
operation amount
measured value
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Chinese (zh)
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CN115004856A (zh
Inventor
池田凌太
木原健
成田贵光
细田佑磨
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RKC Instrument Inc
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RKC Instrument Inc
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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B3/00—Ohmic-resistance heating

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  • Testing And Monitoring For Control Systems (AREA)
  • Control Of Resistance Heating (AREA)
CN202080094099.XA 2020-04-03 2020-04-03 控制装置及异常检测方法 Active CN115004856B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/015334 WO2021199429A1 (ja) 2020-04-03 2020-04-03 制御装置及び異常検知方法

Publications (2)

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CN115004856A CN115004856A (zh) 2022-09-02
CN115004856B true CN115004856B (zh) 2024-11-26

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CN202080094099.XA Active CN115004856B (zh) 2020-04-03 2020-04-03 控制装置及异常检测方法

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JP (1) JP7266169B2 (https=)
CN (1) CN115004856B (https=)
WO (1) WO2021199429A1 (https=)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002343537A (ja) * 2001-03-15 2002-11-29 Omron Corp ヒータ断線検出方法、温度調節器および熱処理装置
CN104380838A (zh) * 2012-08-31 2015-02-25 株式会社美铃工业 加热器以及具备该加热器的定影装置、图像形成装置及加热装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5576371A (en) * 1978-12-01 1980-06-09 Minolta Camera Co Ltd Failure detecting method in heat fixing device of electrophotographic copier
JP2005228732A (ja) * 2004-01-15 2005-08-25 Omron Corp 故障検出装置
JP5373550B2 (ja) 2009-10-26 2013-12-18 アズビル株式会社 温度制御装置および異常判定方法
JP2018174047A (ja) * 2017-03-31 2018-11-08 アズビル株式会社 劣化診断装置および方法
JP6800072B2 (ja) 2017-03-31 2020-12-16 アズビル株式会社 劣化診断方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002343537A (ja) * 2001-03-15 2002-11-29 Omron Corp ヒータ断線検出方法、温度調節器および熱処理装置
CN104380838A (zh) * 2012-08-31 2015-02-25 株式会社美铃工业 加热器以及具备该加热器的定影装置、图像形成装置及加热装置

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Publication number Publication date
CN115004856A (zh) 2022-09-02
JP7266169B2 (ja) 2023-04-28
WO2021199429A1 (ja) 2021-10-07
JPWO2021199429A1 (https=) 2021-10-07

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