CN114026482B - 摄像机构以及具有摄像机构的试样分析装置 - Google Patents

摄像机构以及具有摄像机构的试样分析装置 Download PDF

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Publication number
CN114026482B
CN114026482B CN201980097911.1A CN201980097911A CN114026482B CN 114026482 B CN114026482 B CN 114026482B CN 201980097911 A CN201980097911 A CN 201980097911A CN 114026482 B CN114026482 B CN 114026482B
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China
Prior art keywords
sample
peltier element
temperature
support member
heat
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CN201980097911.1A
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English (en)
Chinese (zh)
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CN114026482A (zh
Inventor
三山敏史
土居昭
宫田仁史
庄司智广
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/28—Base structure with cooling device
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/30—Base structure with heating device
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
    • B01L7/00—Heating or cooling apparatus; Heat insulating devices
    • B01L7/52—Heating or cooling apparatus; Heat insulating devices with provision for submitting samples to a predetermined sequence of different temperatures, e.g. for treating nucleic acid samples

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
CN201980097911.1A 2019-07-18 2019-07-18 摄像机构以及具有摄像机构的试样分析装置 Active CN114026482B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/028208 WO2021009892A1 (ja) 2019-07-18 2019-07-18 撮像機構並びに撮像機構を備えた試料分析装置

Publications (2)

Publication Number Publication Date
CN114026482A CN114026482A (zh) 2022-02-08
CN114026482B true CN114026482B (zh) 2023-11-14

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ID=74210315

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CN201980097911.1A Active CN114026482B (zh) 2019-07-18 2019-07-18 摄像机构以及具有摄像机构的试样分析装置

Country Status (5)

Country Link
US (1) US12174360B2 (https=)
EP (1) EP4001990A4 (https=)
JP (1) JP7161622B2 (https=)
CN (1) CN114026482B (https=)
WO (1) WO2021009892A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115373878B (zh) * 2022-10-27 2023-03-28 麒麟软件有限公司 基于x框架的防截屏扩展协议实现系统
JP2024104564A (ja) * 2023-01-24 2024-08-05 キヤノン株式会社 振れ補正機構及び撮像装置
EP4613840A1 (en) 2024-03-05 2025-09-10 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Microscope temperature stage

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2628215A1 (fr) * 1988-03-02 1989-09-08 Helena Lab Corp Procede et appareil automatique d'electrophorese
CN2444231Y (zh) * 2000-11-20 2001-08-22 中国科学院物理研究所 一种显微镜样品观测台
JP2005283796A (ja) * 2004-03-29 2005-10-13 Research Organization Of Information & Systems 試料温度調節装置
JP2006126364A (ja) * 2004-10-27 2006-05-18 Olympus Corp 培養標本観察装置
JP2011234681A (ja) * 2010-05-12 2011-11-24 Hitachi High-Technologies Corp 核酸配列解析装置に用いられる温度制御装置
CN102954837A (zh) * 2011-08-16 2013-03-06 莱卡微系统Cms有限责任公司 检测器设备
JP2015090458A (ja) * 2013-11-07 2015-05-11 株式会社日立ハイテクノロジーズ 分析装置
JP2017183533A (ja) * 2016-03-30 2017-10-05 株式会社Uacj 回路基板付きヒートシンク及びその製造方法
CN107564795A (zh) * 2016-06-30 2018-01-09 东亚Dkk株式会社 光电倍增管、测定装置、制造用夹具

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6730883B2 (en) 2002-10-02 2004-05-04 Stratagene Flexible heating cover assembly for thermal cycling of samples of biological material
JP2006090749A (ja) 2004-09-21 2006-04-06 Olympus Corp 温度調整装置
EP2925450B1 (en) * 2012-12-03 2017-09-13 Leica Biosystems Melbourne Pty Ltd Thermal module for a sample processing assembly

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2628215A1 (fr) * 1988-03-02 1989-09-08 Helena Lab Corp Procede et appareil automatique d'electrophorese
CN2444231Y (zh) * 2000-11-20 2001-08-22 中国科学院物理研究所 一种显微镜样品观测台
JP2005283796A (ja) * 2004-03-29 2005-10-13 Research Organization Of Information & Systems 試料温度調節装置
JP2006126364A (ja) * 2004-10-27 2006-05-18 Olympus Corp 培養標本観察装置
JP2011234681A (ja) * 2010-05-12 2011-11-24 Hitachi High-Technologies Corp 核酸配列解析装置に用いられる温度制御装置
CN102954837A (zh) * 2011-08-16 2013-03-06 莱卡微系统Cms有限责任公司 检测器设备
JP2015090458A (ja) * 2013-11-07 2015-05-11 株式会社日立ハイテクノロジーズ 分析装置
JP2017183533A (ja) * 2016-03-30 2017-10-05 株式会社Uacj 回路基板付きヒートシンク及びその製造方法
CN107564795A (zh) * 2016-06-30 2018-01-09 东亚Dkk株式会社 光电倍增管、测定装置、制造用夹具

Also Published As

Publication number Publication date
EP4001990A1 (en) 2022-05-25
US12174360B2 (en) 2024-12-24
WO2021009892A1 (ja) 2021-01-21
CN114026482A (zh) 2022-02-08
JPWO2021009892A1 (https=) 2021-01-21
JP7161622B2 (ja) 2022-10-26
US20220350124A1 (en) 2022-11-03
EP4001990A4 (en) 2023-04-19

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