CN114007024A - 摄像元件及摄像装置 - Google Patents

摄像元件及摄像装置 Download PDF

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Publication number
CN114007024A
CN114007024A CN202111356352.7A CN202111356352A CN114007024A CN 114007024 A CN114007024 A CN 114007024A CN 202111356352 A CN202111356352 A CN 202111356352A CN 114007024 A CN114007024 A CN 114007024A
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CN
China
Prior art keywords
signal
unit
photoelectric conversion
output
pixels
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Pending
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CN202111356352.7A
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English (en)
Chinese (zh)
Inventor
驹井敦
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Nikon Corp
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Nikon Corp
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Application filed by Nikon Corp filed Critical Nikon Corp
Publication of CN114007024A publication Critical patent/CN114007024A/zh
Pending legal-status Critical Current

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/811Interconnections
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/65Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/617Noise processing, e.g. detecting, correcting, reducing or removing noise for reducing electromagnetic interference, e.g. clocking noise
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/71Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75Circuitry for providing, modifying or processing image signals from the pixel array
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/014Manufacture or treatment of image sensors covered by group H10F39/12 of CMOS image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/199Back-illuminated image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/803Pixels having integrated switching, control, storage or amplification elements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/806Optical elements or arrangements associated with the image sensors
    • H10F39/8063Microlenses
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/18Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
CN202111356352.7A 2016-02-29 2017-02-27 摄像元件及摄像装置 Pending CN114007024A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2016038161 2016-02-29
JP2016-038161 2016-02-29
CN201780025799.1A CN109076180B (zh) 2016-02-29 2017-02-27 摄像元件及摄像装置

Related Parent Applications (1)

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CN201780025799.1A Division CN109076180B (zh) 2016-02-29 2017-02-27 摄像元件及摄像装置

Publications (1)

Publication Number Publication Date
CN114007024A true CN114007024A (zh) 2022-02-01

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CN202111356352.7A Pending CN114007024A (zh) 2016-02-29 2017-02-27 摄像元件及摄像装置

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US (3) US10879300B2 (enExample)
EP (1) EP3425902B1 (enExample)
JP (2) JP7075881B2 (enExample)
CN (2) CN109076180B (enExample)
WO (1) WO2017150469A1 (enExample)

Family Cites Families (29)

* Cited by examiner, † Cited by third party
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JP4809999B2 (ja) 2001-05-25 2011-11-09 キヤノン株式会社 放射線撮像装置及び放射線撮像システム
JP4724313B2 (ja) 2001-05-18 2011-07-13 キヤノン株式会社 撮像装置、放射線撮像装置及びそれを用いた放射線撮像システム
US6855937B2 (en) * 2001-05-18 2005-02-15 Canon Kabushiki Kaisha Image pickup apparatus
JP4323772B2 (ja) * 2002-10-31 2009-09-02 キヤノン株式会社 固体撮像装置、カメラ及びカメラ制御システム
JP2005303621A (ja) * 2004-04-09 2005-10-27 Link Research Kk 高速撮像装置
US8049293B2 (en) 2005-03-07 2011-11-01 Sony Corporation Solid-state image pickup device, electronic apparatus using such solid-state image pickup device and method of manufacturing solid-state image pickup device
TW201101476A (en) * 2005-06-02 2011-01-01 Sony Corp Semiconductor image sensor module and method of manufacturing the same
JP4830502B2 (ja) 2006-01-17 2011-12-07 株式会社ニコン 撮像装置
JP5173503B2 (ja) 2008-03-14 2013-04-03 キヤノン株式会社 撮像装置及び撮像システム
JP4835710B2 (ja) * 2009-03-17 2011-12-14 ソニー株式会社 固体撮像装置、固体撮像装置の製造方法、固体撮像装置の駆動方法、及び電子機器
JP5627244B2 (ja) 2010-02-08 2014-11-19 キヤノン株式会社 固体撮像素子及びその駆動方法及び撮像装置
JP2011204797A (ja) 2010-03-24 2011-10-13 Sony Corp 固体撮像装置とその製造方法、及び電子機器
US8274587B2 (en) * 2010-04-13 2012-09-25 Aptina Imaging Corporation Image sensor pixels with vertical charge transfer
JP5500007B2 (ja) 2010-09-03 2014-05-21 ソニー株式会社 固体撮像素子およびカメラシステム
JP5508356B2 (ja) 2011-07-26 2014-05-28 シャープ株式会社 固体撮像装置およびその駆動方法、固体撮像装置の製造方法、並びに電子情報機器
JP5924924B2 (ja) 2011-12-15 2016-05-25 キヤノン株式会社 電子回路
JP6023437B2 (ja) * 2012-02-29 2016-11-09 キヤノン株式会社 固体撮像装置及びカメラ
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JP2015095874A (ja) * 2013-11-14 2015-05-18 キヤノン株式会社 固体撮像装置、撮像システム及び固体撮像装置の駆動方法
JP2015103958A (ja) 2013-11-25 2015-06-04 ルネサスエレクトロニクス株式会社 撮像装置
JP2015153962A (ja) * 2014-02-18 2015-08-24 ソニー株式会社 固体撮像素子および製造方法、並びに電子機器
JP6075646B2 (ja) * 2014-03-17 2017-02-08 ソニー株式会社 固体撮像装置およびその駆動方法、並びに電子機器
JP2015185823A (ja) 2014-03-26 2015-10-22 ソニー株式会社 固体撮像素子、及び、撮像装置
WO2016009943A1 (ja) * 2014-07-15 2016-01-21 ブリルニクスジャパン株式会社 固体撮像装置、固体撮像装置の製造方法、および電子機器
JP7091080B2 (ja) * 2018-02-05 2022-06-27 キヤノン株式会社 装置、システム、および移動体
US20220190044A1 (en) 2019-02-22 2022-06-16 Peratech Holdco Ltd Light-emitting apparatus

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Publication number Publication date
JP7075881B2 (ja) 2022-05-26
JP7238875B2 (ja) 2023-03-14
JPWO2017150469A1 (ja) 2019-01-24
US12199126B2 (en) 2025-01-14
CN109076180B (zh) 2021-12-07
CN109076180A (zh) 2018-12-21
US10879300B2 (en) 2020-12-29
EP3425902A4 (en) 2019-09-18
US20250107254A1 (en) 2025-03-27
WO2017150469A1 (ja) 2017-09-08
EP3425902A1 (en) 2019-01-09
US20210074756A1 (en) 2021-03-11
US20190131338A1 (en) 2019-05-02
JP2021036589A (ja) 2021-03-04
EP3425902B1 (en) 2023-10-25

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