CN113566684B - 一种插针偏位的检测系统与检测方法 - Google Patents
一种插针偏位的检测系统与检测方法 Download PDFInfo
- Publication number
- CN113566684B CN113566684B CN202010359077.3A CN202010359077A CN113566684B CN 113566684 B CN113566684 B CN 113566684B CN 202010359077 A CN202010359077 A CN 202010359077A CN 113566684 B CN113566684 B CN 113566684B
- Authority
- CN
- China
- Prior art keywords
- pin
- sensing information
- area
- pressure
- contact pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/205—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using distributed sensing elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/003—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring position, not involving coordinate determination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L5/00—Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Force Measurement Appropriate To Specific Purposes (AREA)
Abstract
Description
插针偏位检测系统 | 100 |
传感器 | 110 |
压力感测单元 | 111、200 |
微控制器 | 120 |
弹性体层 | 210 |
印刷电极基材上层 | 220 |
第一绝缘层 | 230 |
力敏层 | 240、300 |
第二绝缘层 | 250 |
印刷电极基材下层 | 260 |
中心区域 | 310 |
右区域 | 320 |
上区域 | 330 |
左区域 | 340 |
下区域 | 350 |
电阻检测电路 | 400 |
压力感测电路 | 410 |
可变电阻 | 411 |
第一电阻 | 412 |
滤波电路 | 420 |
第二电阻 | 421 |
第一电容 | 422 |
流程步骤 | S501~S505 |
Claims (4)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010359077.3A CN113566684B (zh) | 2020-04-29 | 2020-04-29 | 一种插针偏位的检测系统与检测方法 |
TW109115429A TWI749548B (zh) | 2020-04-29 | 2020-05-08 | 一種插針偏位的檢測系統與檢測方法 |
US16/895,155 US11300635B2 (en) | 2020-04-29 | 2020-06-08 | Method for detecting pin misalignment in IC handling and installation and system for same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010359077.3A CN113566684B (zh) | 2020-04-29 | 2020-04-29 | 一种插针偏位的检测系统与检测方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113566684A CN113566684A (zh) | 2021-10-29 |
CN113566684B true CN113566684B (zh) | 2023-08-29 |
Family
ID=78158871
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010359077.3A Active CN113566684B (zh) | 2020-04-29 | 2020-04-29 | 一种插针偏位的检测系统与检测方法 |
Country Status (3)
Country | Link |
---|---|
US (1) | US11300635B2 (zh) |
CN (1) | CN113566684B (zh) |
TW (1) | TWI749548B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114295365B (zh) * | 2022-03-09 | 2022-07-08 | 深圳市信润富联数字科技有限公司 | 插针机精度异常监测方法、系统、设备及存储介质 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5111592A (en) * | 1991-07-12 | 1992-05-12 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Probe head of the switching type |
JP2009170597A (ja) * | 2008-01-15 | 2009-07-30 | Mitsumi Electric Co Ltd | プローブ針圧力不良検出用の半導体装置、プローブ針圧力不良検出システム及び半導体装置の製造方法 |
CN201681140U (zh) * | 2010-03-19 | 2010-12-22 | 中芯国际集成电路制造(上海)有限公司 | 一种偏压配置接口及带偏压配置接口的可靠性测试板 |
CN206258041U (zh) * | 2016-12-05 | 2017-06-16 | 中国矿业大学 | 一种重载连接器检测装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009130114A (ja) * | 2007-11-22 | 2009-06-11 | Tokyo Electron Ltd | 検査装置 |
US8517383B2 (en) * | 2008-06-20 | 2013-08-27 | Pure Imagination, LLC | Interactive game board system incorporating capacitive sensing and identification of game pieces |
US8289290B2 (en) * | 2009-07-20 | 2012-10-16 | Sony Ericsson Mobile Communications Ab | Touch sensing apparatus for a mobile device, mobile device and method for touch operation sensing |
JP2011099847A (ja) * | 2009-10-09 | 2011-05-19 | Tokyo Electron Ltd | 圧力センサ素子およびシート状圧力センサ |
US8838408B2 (en) * | 2010-11-11 | 2014-09-16 | Optimal Plus Ltd | Misalignment indication decision system and method |
TW201307876A (zh) * | 2011-08-12 | 2013-02-16 | United Microelectronics Corp | 探針的校正方法及校正裝置 |
US20130038336A1 (en) * | 2011-08-12 | 2013-02-14 | United Microelectronics Corporation | Probe Calibration Device and Calibration Method |
US20170177114A1 (en) * | 2014-08-07 | 2017-06-22 | 3M Innovative Properties Company | Force-sensing capacitor elements, deformable membranes and electronic devices fabricated therefrom |
EP3185026B1 (en) * | 2015-12-23 | 2020-10-28 | IMEC vzw | Probing device for testing integrated circuits |
TW201905668A (zh) * | 2017-06-15 | 2019-02-01 | 禾瑞亞科技股份有限公司 | 壓力感測觸控裝置 |
-
2020
- 2020-04-29 CN CN202010359077.3A patent/CN113566684B/zh active Active
- 2020-05-08 TW TW109115429A patent/TWI749548B/zh not_active IP Right Cessation
- 2020-06-08 US US16/895,155 patent/US11300635B2/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5111592A (en) * | 1991-07-12 | 1992-05-12 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Probe head of the switching type |
JP2009170597A (ja) * | 2008-01-15 | 2009-07-30 | Mitsumi Electric Co Ltd | プローブ針圧力不良検出用の半導体装置、プローブ針圧力不良検出システム及び半導体装置の製造方法 |
CN201681140U (zh) * | 2010-03-19 | 2010-12-22 | 中芯国际集成电路制造(上海)有限公司 | 一种偏压配置接口及带偏压配置接口的可靠性测试板 |
CN206258041U (zh) * | 2016-12-05 | 2017-06-16 | 中国矿业大学 | 一种重载连接器检测装置 |
Also Published As
Publication number | Publication date |
---|---|
US20210341549A1 (en) | 2021-11-04 |
CN113566684A (zh) | 2021-10-29 |
TW202141044A (zh) | 2021-11-01 |
TWI749548B (zh) | 2021-12-11 |
US11300635B2 (en) | 2022-04-12 |
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CB02 | Change of applicant information | ||
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Address after: The first floor, the second floor, the third floor and the fourth floor of the factory building No.1, f8d District, Foxconn science and Technology Industrial Park, east side of Minqing Road, Longhua street, Shenzhen City, Guangdong Province Applicant after: Shenzhen Fulian Fugui Precision Industry Co.,Ltd. Address before: The first floor, the second floor, the third floor and the fourth floor of the factory building No.1, f8d District, Foxconn science and Technology Industrial Park, east side of Minqing Road, Longhua street, Shenzhen City, Guangdong Province Applicant before: SHENZHEN FUGUI PRECISION INDUSTRIAL Co.,Ltd. |
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