CN112135929B - 包含抑制剂的用于锡或锡合金电镀的组合物 - Google Patents
包含抑制剂的用于锡或锡合金电镀的组合物 Download PDFInfo
- Publication number
- CN112135929B CN112135929B CN201980033676.1A CN201980033676A CN112135929B CN 112135929 B CN112135929 B CN 112135929B CN 201980033676 A CN201980033676 A CN 201980033676A CN 112135929 B CN112135929 B CN 112135929B
- Authority
- CN
- China
- Prior art keywords
- tin
- aqueous composition
- composition according
- ethylene oxide
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/30—Electroplating: Baths therefor from solutions of tin
- C25D3/32—Electroplating: Baths therefor from solutions of tin characterised by the organic bath constituents used
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/30—Electroplating: Baths therefor from solutions of tin
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/60—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of tin
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01231—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using blanket deposition
- H10W72/01233—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using blanket deposition in liquid form, e.g. spin coating, spray coating or immersion coating
- H10W72/01235—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using blanket deposition in liquid form, e.g. spin coating, spray coating or immersion coating by plating, e.g. electroless plating or electroplating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/231—Shapes
- H10W72/232—Plan-view shape, i.e. in top view
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electroplating And Plating Baths Therefor (AREA)
- Manufacturing & Machinery (AREA)
- Electroplating Methods And Accessories (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP18168462 | 2018-04-20 | ||
| EP18168462.2 | 2018-04-20 | ||
| PCT/EP2019/059344 WO2019201753A1 (en) | 2018-04-20 | 2019-04-11 | Composition for tin or tin alloy electroplating comprising suppressing agent |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112135929A CN112135929A (zh) | 2020-12-25 |
| CN112135929B true CN112135929B (zh) | 2023-12-15 |
Family
ID=62044554
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201980033676.1A Active CN112135929B (zh) | 2018-04-20 | 2019-04-11 | 包含抑制剂的用于锡或锡合金电镀的组合物 |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US11242606B2 (https=) |
| EP (1) | EP3781729B1 (https=) |
| JP (1) | JP2021522410A (https=) |
| KR (1) | KR102769982B1 (https=) |
| CN (1) | CN112135929B (https=) |
| IL (1) | IL278024A (https=) |
| SG (1) | SG11202009106XA (https=) |
| TW (1) | TWI813670B (https=) |
| WO (1) | WO2019201753A1 (https=) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4437167A1 (en) | 2021-11-22 | 2024-10-02 | Basf Se | Composition for tin or tin alloy electroplating comprising a pyrazole-type antioxidant |
| KR102568529B1 (ko) * | 2022-11-25 | 2023-08-22 | 주식회사 호진플라텍 | 보이드 생성이 억제되고 두께편차가 개선된 웨이퍼 범프용 주석 전기 도금액 |
| KR20250124510A (ko) * | 2024-02-13 | 2025-08-20 | 한국생산기술연구원 | 솔더 범프용 주석 도금액 |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1456710A (zh) * | 2002-03-05 | 2003-11-19 | 希普雷公司 | 控制锡或锡合金电镀液中氧化作用造成的锡损失的方法 |
| CN101515549A (zh) * | 2003-12-31 | 2009-08-26 | 微制造公司 | 在结构的电化学制造期间保持层的平行度和/或实现所期望层厚度的方法和装置 |
| TW201042097A (en) * | 2009-04-07 | 2010-12-01 | Basf Se | Composition for metal plating comprising suppressing agent for void free submicron feature filling |
| CN102304218A (zh) * | 2010-03-15 | 2012-01-04 | 罗门哈斯电子材料有限公司 | 镀液及镀覆方法 |
| CN102365396A (zh) * | 2009-04-07 | 2012-02-29 | 巴斯夫欧洲公司 | 包含抑制剂的无空隙亚微米结构填充用金属电镀组合物 |
| CN103361685A (zh) * | 2012-02-09 | 2013-10-23 | 罗门哈斯电子材料有限公司 | 镀液和电镀方法 |
| CN103898570A (zh) * | 2012-12-27 | 2014-07-02 | 罗门哈斯电子材料有限公司 | 锡或锡合金电镀液 |
| CN104674311A (zh) * | 2013-11-05 | 2015-06-03 | 罗门哈斯电子材料有限公司 | 镀液和镀覆方法 |
| CN104797633A (zh) * | 2012-11-09 | 2015-07-22 | 巴斯夫欧洲公司 | 用于金属电镀的包含调平剂的组合物 |
| CN104928730A (zh) * | 2014-03-18 | 2015-09-23 | 上村工业株式会社 | 锡或锡合金的电镀浴以及凸点的制备方法 |
| CN106609384A (zh) * | 2015-10-27 | 2017-05-03 | 罗门哈斯电子材料有限责任公司 | 从酸性铜电镀浴液向衬底上的通孔中电镀铜的方法 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4135991A (en) | 1977-08-12 | 1979-01-23 | R. O. Hull & Company, Inc. | Bath and method for electroplating tin and/or lead |
| GB1567235A (en) | 1978-05-15 | 1980-05-14 | Pmd Chemicals Ltd | Electrodeposition of tin or tin/lead alloys |
| US4871429A (en) | 1981-09-11 | 1989-10-03 | Learonal, Inc | Limiting tin sludge formation in tin or tin/lead electroplating solutions |
| US5174887A (en) | 1987-12-10 | 1992-12-29 | Learonal, Inc. | High speed electroplating of tinplate |
| JP3301707B2 (ja) | 1997-01-20 | 2002-07-15 | ディップソール株式会社 | 錫−銀合金酸性電気めっき浴 |
| JP4296358B2 (ja) | 1998-01-21 | 2009-07-15 | 石原薬品株式会社 | 銀及び銀合金メッキ浴 |
| US7628903B1 (en) | 2000-05-02 | 2009-12-08 | Ishihara Chemical Co., Ltd. | Silver and silver alloy plating bath |
| US6818545B2 (en) | 2001-03-05 | 2004-11-16 | Megic Corporation | Low fabrication cost, fine pitch and high reliability solder bump |
| TWI245402B (en) | 2002-01-07 | 2005-12-11 | Megic Corp | Rod soldering structure and manufacturing process thereof |
| TWI240979B (en) | 2004-10-28 | 2005-10-01 | Advanced Semiconductor Eng | Bumping process |
| KR100921919B1 (ko) | 2007-11-16 | 2009-10-16 | (주)화백엔지니어링 | 반도체 칩에 형성되는 구리기둥-주석범프 및 그의 형성방법 |
| JP5583894B2 (ja) | 2008-06-12 | 2014-09-03 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | 電気錫めっき液および電気錫めっき方法 |
| EP2199315B1 (en) | 2008-12-19 | 2013-12-11 | Basf Se | Composition for metal electroplating comprising leveling agent |
| CN104195602B (zh) * | 2009-04-07 | 2017-05-31 | 巴斯夫欧洲公司 | 包含抑制剂的无空隙亚微米结构填充用金属电镀组合物 |
| EP2504396B1 (en) * | 2009-11-27 | 2021-02-24 | Basf Se | Composition for copper electroplating comprising leveling agent |
| EP2655457B1 (en) * | 2010-12-21 | 2019-04-10 | Basf Se | Composition for metal electroplating comprising leveling agent |
| US8980077B2 (en) | 2012-03-30 | 2015-03-17 | Rohm And Haas Electronic Materials Llc | Plating bath and method |
| US20150122661A1 (en) * | 2013-11-05 | 2015-05-07 | Rohm And Haas Electronic Materials Llc | Plating bath and method |
| EP3177671A1 (en) | 2014-08-06 | 2017-06-14 | Basf Se | Improved process for preparing polymeric, ionic imidazolium compounds |
| CN107531859B (zh) * | 2015-04-28 | 2020-02-14 | 罗门哈斯电子材料有限责任公司 | 作为电镀浴添加剂的双酸酐与二胺的反应产物 |
| JP2019503420A (ja) | 2016-01-12 | 2019-02-07 | ビーエーエスエフ ソシエタス・ヨーロピアBasf Se | モノアルデヒドを使用しない又はモノアルデヒドをほぼ使用しない高分子イミダゾリウム化合物の製造方法 |
| US11926918B2 (en) * | 2016-12-20 | 2024-03-12 | Basf Se | Composition for metal plating comprising suppressing agent for void free filing |
| US11535946B2 (en) | 2017-06-01 | 2022-12-27 | Basf Se | Composition for tin or tin alloy electroplating comprising leveling agent |
-
2019
- 2019-04-11 EP EP19715960.1A patent/EP3781729B1/en active Active
- 2019-04-11 KR KR1020207031530A patent/KR102769982B1/ko active Active
- 2019-04-11 CN CN201980033676.1A patent/CN112135929B/zh active Active
- 2019-04-11 JP JP2020558445A patent/JP2021522410A/ja not_active Withdrawn
- 2019-04-11 SG SG11202009106XA patent/SG11202009106XA/en unknown
- 2019-04-11 US US17/048,770 patent/US11242606B2/en active Active
- 2019-04-11 WO PCT/EP2019/059344 patent/WO2019201753A1/en not_active Ceased
- 2019-04-18 TW TW108113573A patent/TWI813670B/zh active
-
2020
- 2020-10-13 IL IL278024A patent/IL278024A/en unknown
-
2021
- 2021-12-30 US US17/566,426 patent/US11840771B2/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1456710A (zh) * | 2002-03-05 | 2003-11-19 | 希普雷公司 | 控制锡或锡合金电镀液中氧化作用造成的锡损失的方法 |
| CN101515549A (zh) * | 2003-12-31 | 2009-08-26 | 微制造公司 | 在结构的电化学制造期间保持层的平行度和/或实现所期望层厚度的方法和装置 |
| TW201042097A (en) * | 2009-04-07 | 2010-12-01 | Basf Se | Composition for metal plating comprising suppressing agent for void free submicron feature filling |
| CN102365396A (zh) * | 2009-04-07 | 2012-02-29 | 巴斯夫欧洲公司 | 包含抑制剂的无空隙亚微米结构填充用金属电镀组合物 |
| CN102304218A (zh) * | 2010-03-15 | 2012-01-04 | 罗门哈斯电子材料有限公司 | 镀液及镀覆方法 |
| CN103361685A (zh) * | 2012-02-09 | 2013-10-23 | 罗门哈斯电子材料有限公司 | 镀液和电镀方法 |
| CN104797633A (zh) * | 2012-11-09 | 2015-07-22 | 巴斯夫欧洲公司 | 用于金属电镀的包含调平剂的组合物 |
| CN103898570A (zh) * | 2012-12-27 | 2014-07-02 | 罗门哈斯电子材料有限公司 | 锡或锡合金电镀液 |
| CN104674311A (zh) * | 2013-11-05 | 2015-06-03 | 罗门哈斯电子材料有限公司 | 镀液和镀覆方法 |
| CN104928730A (zh) * | 2014-03-18 | 2015-09-23 | 上村工业株式会社 | 锡或锡合金的电镀浴以及凸点的制备方法 |
| CN106609384A (zh) * | 2015-10-27 | 2017-05-03 | 罗门哈斯电子材料有限责任公司 | 从酸性铜电镀浴液向衬底上的通孔中电镀铜的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| IL278024A (en) | 2020-11-30 |
| KR20210002514A (ko) | 2021-01-08 |
| US20210180201A1 (en) | 2021-06-17 |
| CN112135929A (zh) | 2020-12-25 |
| US20220119972A1 (en) | 2022-04-21 |
| EP3781729B1 (en) | 2024-09-25 |
| US11242606B2 (en) | 2022-02-08 |
| KR102769982B1 (ko) | 2025-02-18 |
| JP2021522410A (ja) | 2021-08-30 |
| EP3781729A1 (en) | 2021-02-24 |
| WO2019201753A1 (en) | 2019-10-24 |
| US11840771B2 (en) | 2023-12-12 |
| TWI813670B (zh) | 2023-09-01 |
| SG11202009106XA (en) | 2020-11-27 |
| TW201943895A (zh) | 2019-11-16 |
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| US11840771B2 (en) | Composition for tin or tin alloy electroplating comprising suppressing agent | |
| CN111492095B (zh) | 包含抑制剂的锡或锡合金电镀组合物 | |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |