CN111983437B - 5G module product GPIO port test circuit and test method - Google Patents
5G module product GPIO port test circuit and test method Download PDFInfo
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- CN111983437B CN111983437B CN202010864437.5A CN202010864437A CN111983437B CN 111983437 B CN111983437 B CN 111983437B CN 202010864437 A CN202010864437 A CN 202010864437A CN 111983437 B CN111983437 B CN 111983437B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31912—Tester/user interface
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Human Computer Interaction (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention provides a 5G module product GPIO port test circuit and a test method, and belongs to the field of 5G module test. The 5G module product to be tested is provided with a self-checking program, a first testing pin and a second testing pin which are controlled by the self-checking program respectively, the GPIO port testing circuit of the 5G module product comprises a first switch module and a second switch module, the control end of the first switch module is connected with the first testing pin, one end of the first switch module is connected with a power supply, the other end of the first switch module is connected with one end of the second switch module, the other end of the second switch module is grounded, the controller of the second switch module is connected with the second testing pin, and all GPIO ports of the 5G module product are connected between the first switch module and the second switch module in parallel. The beneficial effects of the invention are as follows: the test efficiency is extremely high; the test effect is good, and the functional coverage is complete.
Description
Technical Field
The invention relates to a 5G module testing technology, in particular to a 5G module product GPIO port testing circuit and a testing method.
Background
As the 5G intelligent universal module has more module pins and large module size, once a customer discovers that the module is bad after attaching to a product, the module is difficult to disassemble and maintain, and therefore, the normal functions of each functional pin in the factory state of the module must be ensured.
Then, the module is provided with up to 30 GPIO ports, and the traditional mode of judging the normal pin of the module by using the function of the test pin cannot be adopted for production test, so that the traditional test mode is adopted for one-to-one test, the realization is difficult, and the test efficiency is very low.
Disclosure of Invention
In order to solve the problem that a 5G module GPIO port is inconvenient to test in the prior art, the invention provides a 5G module product GPIO port test circuit and a test method based on the 5G module product GPIO port test circuit.
The 5G module product to be tested is provided with a self-checking program, a first testing pin and a second testing pin which are controlled by the self-checking program respectively, the GPIO port testing circuit of the 5G module product comprises a first switch module and a second switch module, the control end of the first switch module is connected with the first testing pin, one end of the first switch module is connected with a power supply, the other end of the first switch module is connected with one end of the second switch module, the other end of the second switch module is grounded, the controller of the second switch module is connected with the second testing pin, and all GPIO ports of the 5G module product are connected between the first switch module and the second switch module in parallel.
The invention further improves, further comprises a test indication module, wherein the 5G module product is provided with a test indication pin for outputting a test result by the self-checking program, and the input end of the test indication module is connected with the indication pin.
The invention further improves, the test indication module is an indicator lamp or an audible alarm.
According to the invention, the test indication module is an LED lamp and further comprises a current limiting unit connected with the LED lamp in series.
The invention further improves, also comprises a filtering module, wherein the filtering module is arranged at the parallel connection ends of all GPIO ports.
According to the invention, the 5G module product is replaced by a singlechip which can detect the high and low levels of the GPIO ports of the 5G module product, the first test pin and the second test pin are arranged on the singlechip, and the singlechip is also respectively connected with all the GPIO ports of the 5G module product to be tested.
The invention also provides a test method based on the 5G module product GPIO port test circuit, which comprises the following initial steps: the 5G module product is in an initial state after being powered on: all GPIO ports are set in an input state;
the input function testing step of the GPIO port: controlling a first test pin to output a high level, and a second test pin to output a low level, wherein the first switch module is turned on, the second switch module is turned off, at the moment, the power supply voltage is applied to all GPIO ports to be tested of the 5G module product, a self-checking program polls all GPIO states for one time, whether the high level is judged, if so, the GPIO ports are normal, and if not, the corresponding GPIO ports are abnormal;
the output function test step of the GPIO port: and controlling the first test pin to be at a low level, and controlling the second test pin to be at a high level, wherein the first switch module is turned off, the second switch module is turned on, the self-checking program polls all GPIO states for one time, judges whether the GPIO states are at the low level, if so, the GPIO ports are normal, and if not, the corresponding GPIO ports are abnormal.
The invention further improves, further comprises a test result indication step: when the self-checking procedure is in the self-checking process, the GPIO port is abnormal, the control test indication module indicates the self-checking failure and stops the self-checking.
The invention is further improved, when all GPIO ports are normal in the input function test step of the GPIO ports and the output function test step of the GPIO ports, the 5G module product system is started normally, and the system records the self-checking passing result in the data structure.
Compared with the prior art, the invention has the beneficial effects that: 1. the problem that the GPIO port of the module is inconvenient to test is solved through low cost; 2. the self-checking test is adopted, so that the test efficiency is extremely high; 3. the test effect is good, and the functional coverage is complete.
Drawings
FIG. 1 is a block diagram of the structure of the present invention;
fig. 2 is a schematic circuit diagram of the present invention.
Detailed Description
The invention will be described in further detail with reference to the drawings and examples.
The invention combines the circuit characteristics of GPIO port with single function (input and output control), and the pins of the 5G module product (simply referred to as module) are basically all the direct lead-out of the pins of the CPU chip, and whether the functions of the module GPIO pins normally depend on the welding between the pins of the chip and the PCB, and the wiring of the PCB. Therefore, the invention combines the characteristic of strong function of the 5G module, designs a very simple test circuit, and can complete the test of all GPIO ports. The details thereof are described below.
As shown in FIG. 1, the 5G module product to be tested is provided with a self-checking program, a first test pin and a second test pin which are controlled by the self-checking program respectively, the GPIO port test circuit of the 5G module product comprises a first switch module and a second switch module, the control end of the first switch module is connected with the first test pin, one end of the first switch module is connected with a power supply, the other end of the first switch module is connected with one end of the second switch module, the other end of the second switch module is grounded, the controller of the second switch module is connected with the second test pin, and all GPIO ports of the 5G module product are connected between the first switch module and the second switch module in parallel. The test instruction module is characterized by further comprising a test instruction module, wherein the 5G module product is provided with a test instruction pin for outputting a test result by a self-checking program, and the input end of the test instruction module is connected with the instruction pin.
As shown in fig. 2, as an embodiment of the present invention, the first switch module and the second switch module in this example are all transistors, and the two test pins CTRL1 and CTRL2 are respectively connected to the bases of the transistors Q1 and Q2 through a resistor. The power supply Vcc is connected with the collector of the triode Q1 through a resistor R2, the emitter of the triode Q1 is connected with the collector of the triode Q2, and the emitter of the triode Q2 is grounded.
All the GPIO ports of the functional pins of the 5G module product are connected in parallel with the emitter of the triode Q1 and the collector of the triode Q2, and preferably, the parallel end of the GPIO ports is also connected with a grounding capacitor C1 with the function of debounce filtering. The stability of the test circuit is better. The first switch module and the second switch module in this example may be a switch tube, a field effect tube, or the like.
The test indication module of this example is the LED lamp, the anodal test indication pin LEDCTRL that connects of LED lamp, negative pole ground connection power. In the embodiment, the anode of the LED lamp is also connected with a current limiting resistor R4 in series, and the brightness of the LED lamp can be adjusted by adjusting the resistance value of the current limiting resistor R4.
The indication module of this example can also be a plurality of LED lamps to instruct different operating conditions, can also be audible alarm, audible and visual indication module such as bee calling organ.
As another embodiment of the invention, the test function of the 5G module product is replaced by a singlechip capable of detecting the high and low levels of the GPIO ports of the 5G module product, the first test pin, the second test pin and the test program are all arranged on the singlechip, and the singlechip is also respectively connected with all the GPIO ports of the 5G module product to be tested through different pins. In the embodiment, the level of all GPIO ports of the 5G module product to be tested is tested through a test program arranged in the singlechip, so that whether the GPIO ports are abnormal or not is judged.
The invention also provides a test method based on the test circuit of the GPIO ports of the 5G module product, and the test method realizes the test of all the GPIO ports by a self-checking program in the 5G module product.
The test method comprises the following initial steps:
1. initial state after module power-on: all GPIOs (gpio_1, 2,3,,, gpio_n) set inputs (suspended state).
2. Input function test of GPIO port: ctrl1=high; ctrl2=low, so that transistor Q1 is on and transistor Q2 is off. The Vcc supply voltage is applied through resistor R2 to all of the GPIO ports tested in the module, which should all be pulled high. At this time, the self-checking program polls all GPIO states once, and the GPIO pins with high values are all pairs, and the GPIO pins with low values are abnormal, which is caused by open circuit or damage of the CPU chip from the chip pins to the module pins.
3. And (3) testing the output function of the GPIO port: ctrl1=low; ctrl2=high, transistor Q1 is off and transistor Q2 is on. All GPIO ports under test should be forced low by Q2. At this time, the module self-checking program polls all GPIO states once, and the GPIO pins with high values are abnormal only when all GPIO states are low, which is caused by open circuit or damage of the CPU chip from the chip pin to the module pin.
4. When the test in the step 2 is abnormal, the system controls the LED lamp D1 to flash slowly through the LEDCTRL pin to prompt self-checking failure, and the self-checking process is stopped;
and when the test in the step 3 is abnormal, the system controls the LED lamp D1 to flash rapidly through the LEDCTRL pin to prompt self-checking failure, and the self-checking process is stopped. Of course, this example may indicate two anomalies by providing two different colored LED lights.
5. When the test result is passed, the module system is started normally, and the module system records the self-checking result in the NV data structure.
Compared with the prior art, the invention has the following advantages:
1. the structure is simple, the performance is stable, and the problem that the GPIO port of the module is inconvenient to test is solved through low cost;
2. the self-checking test is adopted, so that the test efficiency is extremely high;
3. the test effect is good, and the functional coverage is complete.
The above embodiments are preferred embodiments of the present invention, and are not intended to limit the scope of the present invention, which includes but is not limited to the embodiments, and equivalent modifications according to the present invention are within the scope of the present invention.
Claims (8)
1. The utility model provides a 5G module product GPIO mouth test circuit which characterized in that: the 5G module product to be tested is provided with a self-checking program, a first testing pin and a second testing pin which are controlled by the self-checking program respectively, the GPIO port testing circuit of the 5G module product comprises a first switch module and a second switch module, the control end of the first switch module is connected with the first testing pin, one end of the first switch module is connected with a power supply, the other end of the first switch module is connected with one end of the second switch module, the other end of the second switch module is connected with the power supply ground, the controller of the second switch module is connected with the second testing pin, all GPIO ports of the 5G module product are connected between the first switch module and the second switch module in parallel,
during testing, the self-checking program polls all GPIO port states once, judges whether the GPIO ports are abnormal according to high-level or low-level signals,
the test method for the GPIO port test circuit of the 5G module product comprises the following steps:
the initial steps are as follows: the 5G module product is in an initial state after being powered on: all GPIO ports are set in an input state;
the input function testing step of the GPIO port: controlling a first test pin to output a high level, and a second test pin to output a low level, wherein the first switch module is turned on, the second switch module is turned off, at the moment, the power supply voltage is applied to all GPIO ports to be tested of the 5G module product, a self-checking program polls all GPIO states for one time, whether the high level is judged, if so, the GPIO ports are normal, and if not, the corresponding GPIO ports are abnormal;
the output function test step of the GPIO port: and controlling the first test pin to be at a low level, and controlling the second test pin to be at a high level, wherein the first switch module is turned off, the second switch module is turned on, the self-checking program polls all GPIO states for one time, judges whether the GPIO states are at the low level, if so, the GPIO ports are normal, and if not, the corresponding GPIO ports are abnormal.
2. The 5G module product GPIO port test circuit of claim 1, wherein: the test instruction module is characterized by further comprising a test instruction module, wherein the 5G module product is provided with a test instruction pin for outputting a test result by a self-checking program, and the input end of the test instruction module is connected with the instruction pin.
3. The 5G module product GPIO port test circuit of claim 2, wherein: the test indication module is an indication lamp or an audible alarm.
4. A 5G module product GPIO port test circuit as in claim 3 wherein: the test indication module is an LED lamp and further comprises a current limiting unit connected with the LED lamp in series.
5. The 5G module product GPIO port test circuit of claim 1, wherein: the GPIO port parallel connection device further comprises a filtering module, wherein the filtering module is arranged at the parallel connection ends of all the GPIO ports.
6. The 5G module product GPIO port test circuit of any one of claims 1-5, wherein: the 5G module product is replaced by a singlechip which can detect the high level and the low level of the GPIO ports of the 5G module product, the first test pin, the second test pin and the self-checking program are arranged on the singlechip, and the singlechip is also respectively connected with all the GPIO ports of the 5G module product to be tested.
7. The 5G module product GPIO port test circuit of any one of claims 1-5, wherein: the test method further comprises a test result indication step: when the self-checking procedure is in the self-checking process, the GPIO port is abnormal, the control test indication module indicates the self-checking failure and stops the self-checking.
8. The 5G module product GPIO port test circuit of any one of claims 1-5, wherein: and when all the GPIO ports are normal in the input function test step of the GPIO ports and the output function test step of the GPIO ports, the 5G module product system is normally started, and the system records the self-checking passing result in the data structure.
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