CN206788314U - A kind of integrated circuit testing plate with self-checking function - Google Patents
A kind of integrated circuit testing plate with self-checking function Download PDFInfo
- Publication number
- CN206788314U CN206788314U CN201720425435.XU CN201720425435U CN206788314U CN 206788314 U CN206788314 U CN 206788314U CN 201720425435 U CN201720425435 U CN 201720425435U CN 206788314 U CN206788314 U CN 206788314U
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- Prior art keywords
- self
- chip
- integrated circuit
- testing plate
- relay
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Abstract
The utility model embodiment provides a kind of integrated circuit testing plate with self-checking function, is related to IC chip test technical field, including：Microprocessor and test board；Wherein, the test board includes control chip, predetermined number relay drive circuit and the first relay；Wherein, the microprocessor is communicated with the control chip and objective chip respectively by controlling bus；The control chip is controlling first relay drive circuit concurrently to send level signal to the objective chip to gate different paths.A kind of integrated circuit testing plate with self-checking function provided by the utility model, programme-control integrated circuit testing plate can be write for software engineer and carries out self-test, to find that test board is tested whether normally, so as to avoid producing bulk defective products to chip in time.
Description
Technical field
The utility model belongs to IC chip test technical field, particularly a kind of integrated circuit with self-checking function
Test board.
Background technology
With the continuous support of country policy, more and more enterprises put into the research dynamics to IC chip so that
The dependence to import is gradually broken away from the supply of domestic IC chip.Such as currently obtain on many smart mobile phones largely should
Touch-screen control chip just completes R ＆ D design for domestic enterprise.And in a chip by being designed into final matured product
During completion, to ensure the quality and performance of chip, the R ＆ D Enterprises of IC chip and manufacturer then need pair
Substantial amounts of chip carries out dependence test.Currently, more tests that chip is completed using integrated circuit testing plate, and prior art
In, once integrated circuit testing plate breaks down, it is difficult to and proper testing is carried out to chip, and is not found in time, largely
The test result of chip just may be inaccurate, so as to cause the appearance of bulk defective products.
Utility model content
The purpose of this utility model is to avoid weak point of the prior art and provide a kind of collection with self-checking function
Into circuit test plate, to find that integrated circuit testing plate tests whether normal to chip in time, bulk defective products is avoided
Occur.Concrete technical scheme is as follows：
A kind of integrated circuit testing plate with self-checking function is provided, including：Microprocessor and test board；Wherein, the survey
Test plate (panel) includes control chip, predetermined number relay drive circuit and the first relay；Wherein, the microprocessor passes through
Controlling bus communicates with the control chip and objective chip respectively；The control chip is controlling first relay to drive
Dynamic circuit concurrently send level signal to the objective chip to gate different test access.
Alternatively, the relay drive circuit includes：Main control circuit and regulation circuit；Wherein described main control circuit
Input connects the control chip；The regulation circuit input end connects the output end of the main control circuit；The regulation
The output end of circuit connects the input of the relay.
Alternatively, the main control circuit includes：One end of resistance (R1) is connected with the grid of metal-oxide-semiconductor (Q1), the electricity
The other end of (R1) and the source grounding of the metal-oxide-semiconductor (Q1) are hindered, the drain electrode of the MOS pipes (Q1) is as output end.
Alternatively, the regulation circuit includes：The emitter stage of triode (Q2) and the anode of diode (D1) connect 12 volts
Voltage, the base stage of the triode (Q2) are connected with one end of resistance (R2), the colelctor electrode and resistance of the triode (Q2)
(R3) one end is connected, the other end ground connection of the resistance (R3), the other end and the storage capacitor (EC1) of the resistance (R2)
Negative pole is connected, and the negative electrode of the diode (D1) is connected with the positive pole of the storage capacitor (EC1).
Alternatively, in addition to：Warning circuit, the warning circuit include the second relay and malfunction indicator lamp, and described
Two relays are connected with the microprocessor.
Alternatively, in addition to：Manual self-checking switch, the manual self-checking switch are connected with the microprocessor
Connect.
The beneficial effects of the utility model：Using the utility model, program can be write in microprocessor by user, if
Determine self-test entry condition, in real time, periodically or after certain condition is met, stop survey of the integrated circuit testing plate to chip
Trial work is made, into self-test flow：Dependent instruction is sent from microprocessor to control chip first, control chip refers to receiving this
Each relay drive circuit on test board is controlled by IO after order, so as to control relay, reaches the different tests of gating
The purpose of path, then send high level signal to the test access of gating, at the same microprocessor by control chip to target
Chip, i.e. chip under test send the instruction for carrying out corresponding path level detection, if corresponding path detects high level, show
The test access being strobed is normal；If can't detect high level, from objective chip to microprocessor feedback neutralization signal, micro- place
Reason device then stops self-test after being connected to the signal, and notification technique person carries out confirmation processing.As can be seen that electricity is integrated in the utility model
The self-checking function of road chip testing plate, it can find that the test board is tested whether normally, so as to avoid producing to chip in time
Bulk defective products.
Brief description of the drawings
, below will be to embodiment in order to illustrate more clearly of the utility model embodiment or technical scheme of the prior art
Or the required accompanying drawing used is briefly described in description of the prior art, it should be apparent that, drawings in the following description are only
It is some embodiments of the utility model, for those of ordinary skill in the art, is not paying the premise of creative work
Under, other accompanying drawings can also be obtained according to these accompanying drawings.
Fig. 1 is a kind of structural representation of the integrated circuit testing plate provided by the utility model with self-checking function；
Fig. 2 is main control circuit；
Fig. 3 is regulation circuit；
A kind of Fig. 4 another structural representations of the integrated circuit testing plate with self-checking function provided by the utility model.
Embodiment
Below in conjunction with the accompanying drawing in the utility model embodiment, the technical scheme in the embodiment of the utility model is carried out
Clearly and completely describing, it is clear that described embodiment is only the utility model part of the embodiment, rather than whole
Embodiment.Based on the embodiment in the utility model, those of ordinary skill in the art are not under the premise of creative work is made
The every other embodiment obtained, belong to the scope of the utility model protection.
Referring to Fig. 1, a kind of integrated circuit testing plate with self-checking function of the utility model embodiment, including microprocessor
And test board；Wherein, the test board includes control chip, relay drive circuit 1, relay K1, relay drive circuit
2nd, relay K2, relay drive circuit 3, relay K3；Wherein, the microprocessor by controlling bus respectively with the control
Coremaking piece and objective chip communication；The control chip is controlling first relay drive circuit to gate different tests
Path concurrently send level signal to the objective chip.
Specifically, the relay drive circuit includes：Main control circuit and regulation circuit；Wherein described main control circuit
Input connects the control chip；The regulation circuit input end connects the output end of the main control circuit；The regulation
The output end of circuit connects the input of the relay K1.
More specifically, as shown in Fig. 2 the main control circuit is made up of resistance R1 and metal-oxide-semiconductor Q1.
More specifically, as shown in figure 3, the regulation circuit is by triode Q2, diode D1, resistance R2, resistance R3 and electricity
Hold EC1 compositions.
It is understood that regulation circuit forms charging and discharging circuit, main control circuit using electric capacity EC1 charge-discharge characteristic
Multiplication of voltage loop is formed with regulation circuit connected in series, drives relay to work by the multiplication of voltage loop, passes through electric capacity EC1 discharge charge
Electricity carrys out the startup time of control relay, can realize that high and low pressure drives, and is adapted to different relay drivings, and circuit structure
Simply, securely and reliably, cost is relatively low.
The operation principle of the present embodiment is as follows：
Program can be write in microprocessor by user, sets self-test entry condition, in real time, periodically or full
After sufficient certain condition, stop test job of the integrated circuit testing plate to chip, into self-test flow：First from microprocessor to
Control chip sends dependent instruction, and control chip controls the relay driving electricity on test board after the instruction is received by IO
Road 1-3, so as to control relay K1-K3, reach the purpose for gating different test access, then sent to the test access of gating
High level signal, while microprocessor carries out corresponding path level by control chip to objective chip, i.e. chip under test transmission
The instruction of detection, if corresponding path detects high level, show that the test access that is strobed is normal；If it can't detect high electricity
Flat, then from objective chip to microprocessor feedback neutralization signal, microprocessor then stops self-test, notification technique after being connected to the signal
Member carries out confirmation processing.As can be seen that in the utility model IC chip test plate self-checking function, can find in time
The test board is tested whether normally, so as to avoid producing bulk defective products to chip.
In addition, after the completion of high level detection, identical method can also be used to carry out low level detection, to prevent by mesh
The pin of mark chip is all connected together and exports high level always, occurs so as to be mistaken as the normal phenomenon of test access,
More accurately confirm that the test board tests whether normally to chip, so as to preferably avoid producing bulk defective products.
If two kind detections are normal, then, self-test can be terminated to be sent from microprocessor to integrated circuit testing plate
Instruction, reconfigure the working condition into chip testing.
Further, on the basis of embodiment illustrated in fig. 1, as shown in figure 4, a kind of band self-test provided by the utility model
The integrated circuit testing plate of function, warning circuit can also be included, the warning circuit includes the second relay K4 and failure refers to
Show lamp, when finding that the integrated circuit testing plate is faulty in self-test, K4 can be driven, so as to light malfunction indicator lamp, to carry out
Alarm, more intuitively technician is prompted to carry out confirmation processing.
Specifically, a kind of integrated circuit testing plate with self-checking function provided by the utility model, can also include：Manually
Self-checking switchs, and the manual self-checking switch is connected with the microprocessor., can be by technician in practical application
Manually opened self-checking switch, makes integrated circuit testing plate enter self-test flow, specifically, can be detected in microprocessor
After the manually opened self-checking switch of technician, dependent instruction is sent to control chip, so as to open self-checking function.
It should be noted that herein, such as first and second or the like relational terms are used merely to a reality
Body makes a distinction with another entity, and not necessarily requires or imply between these entities any this actual relation be present
Or order.Moreover, term " comprising ", "comprising" or any other variant thereof is intended to cover non-exclusive inclusion, so as to
So that process, article or equipment including a series of elements not only include those key elements, but also including being not expressly set out
Other element, or also include for this process, article or the intrinsic key element of equipment.In the feelings not limited more
Under condition, the key element that is limited by sentence "including a ...", it is not excluded that in the process including the key element, article or equipment
In other identical element also be present.
Each embodiment in this specification is described by the way of related, identical similar portion between each embodiment
Divide mutually referring to what each embodiment stressed is the difference with other embodiment.
Preferred embodiment of the present utility model is the foregoing is only, is not intended to limit protection model of the present utility model
Enclose.All made within spirit of the present utility model and principle any modification, equivalent substitution and improvements etc., are all contained in this reality
With in new protection domain.
Claims (6)
- A kind of 1. integrated circuit testing plate with self-checking function, it is characterised in that including：Microprocessor and test board；Wherein, institute Stating test board includes control chip, predetermined number relay drive circuit and the first relay；Wherein, the microprocessor Communicated respectively with the control chip and objective chip by controlling bus；The control chip is controlling first relay Device drive circuit concurrently send level signal to the objective chip to gate different test access.
- A kind of 2. integrated circuit testing plate with self-checking function according to claim 1, it is characterised in that the relay Drive circuit includes：Main control circuit and regulation circuit；Wherein described main control circuit input connects the control chip；Institute State the output end that regulation circuit input end connects the main control circuit；The output end of the regulation circuit connects the relay Input.
- A kind of 3. integrated circuit testing plate with self-checking function according to claim 2, it is characterised in that the main control Circuit includes：One end of resistance (R1) is connected with the grid of metal-oxide-semiconductor (Q1), the other end and the metal-oxide-semiconductor of the resistance (R1) (Q1) source grounding, the drain electrode of the metal-oxide-semiconductor (Q1) is as output end.
- A kind of 4. integrated circuit testing plate with self-checking function according to claim 3, it is characterised in that the regulation electricity Road includes：The emitter stage of triode (Q2) and the anode of diode (D1) connect 12 volts of voltages, the base stage of the triode (Q2) It is connected with one end of resistance (R2), the colelctor electrode of the triode (Q2) is connected with one end of resistance (R3), the resistance (R3) Other end ground connection, the other end of the resistance (R2) is connected with the negative pole of storage capacitor (EC1), the moon of the diode (D1) Pole is connected with the positive pole of the storage capacitor (EC1).
- 5. a kind of integrated circuit testing plate with self-checking function according to claim 1, it is characterised in that also include：Report Alert circuit, the warning circuit include the second relay and malfunction indicator lamp, and second relay connects with the microprocessor Connect.
- 6. a kind of integrated circuit testing plate with self-checking function according to claim 1, it is characterised in that also include：Hand Dynamic self-checking switch, the manual self-checking switch are connected with the microprocessor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720425435.XU CN206788314U (en) | 2017-04-21 | 2017-04-21 | A kind of integrated circuit testing plate with self-checking function |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201720425435.XU CN206788314U (en) | 2017-04-21 | 2017-04-21 | A kind of integrated circuit testing plate with self-checking function |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206788314U true CN206788314U (en) | 2017-12-22 |
Family
ID=60707611
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201720425435.XU Expired - Fee Related CN206788314U (en) | 2017-04-21 | 2017-04-21 | A kind of integrated circuit testing plate with self-checking function |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN206788314U (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110806539A (en) * | 2019-11-26 | 2020-02-18 | 深圳赛意法微电子有限公司 | Detector for relay and driving chip |
| CN111781495A (en) * | 2020-09-04 | 2020-10-16 | 江苏金智科技股份有限公司 | Automatic detection platform and method for plug-in of intelligent protection device |
| CN111983437A (en) * | 2020-08-25 | 2020-11-24 | 深圳市旗开电子有限公司 | 5G module product GPIO port test circuit and test method |
| CN112816851A (en) * | 2020-12-31 | 2021-05-18 | 上海移远通信技术股份有限公司 | Chip reliability testing device and method |
| CN113560202A (en) * | 2021-07-26 | 2021-10-29 | 广东利扬芯片测试股份有限公司 | IC chip sorting detection auxiliary system |
| CN113655406A (en) * | 2021-08-12 | 2021-11-16 | 惠州Tcl云创科技有限公司 | RF coaxial cable connection detection circuit, detection method and mobile terminal |
| CN113687219A (en) * | 2021-09-15 | 2021-11-23 | 上海华岭集成电路技术股份有限公司 | On-line detection method of test board |
-
2017
- 2017-04-21 CN CN201720425435.XU patent/CN206788314U/en not_active Expired - Fee Related
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110806539A (en) * | 2019-11-26 | 2020-02-18 | 深圳赛意法微电子有限公司 | Detector for relay and driving chip |
| CN111983437A (en) * | 2020-08-25 | 2020-11-24 | 深圳市旗开电子有限公司 | 5G module product GPIO port test circuit and test method |
| CN111983437B (en) * | 2020-08-25 | 2023-09-08 | 深圳市旗开电子有限公司 | 5G module product GPIO port test circuit and test method |
| CN111781495A (en) * | 2020-09-04 | 2020-10-16 | 江苏金智科技股份有限公司 | Automatic detection platform and method for plug-in of intelligent protection device |
| CN111781495B (en) * | 2020-09-04 | 2020-11-20 | 江苏金智科技股份有限公司 | Automatic detection platform and method for plug-in of intelligent protection device |
| CN112816851A (en) * | 2020-12-31 | 2021-05-18 | 上海移远通信技术股份有限公司 | Chip reliability testing device and method |
| CN113560202A (en) * | 2021-07-26 | 2021-10-29 | 广东利扬芯片测试股份有限公司 | IC chip sorting detection auxiliary system |
| CN113655406A (en) * | 2021-08-12 | 2021-11-16 | 惠州Tcl云创科技有限公司 | RF coaxial cable connection detection circuit, detection method and mobile terminal |
| CN113687219A (en) * | 2021-09-15 | 2021-11-23 | 上海华岭集成电路技术股份有限公司 | On-line detection method of test board |
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| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20171222 Termination date: 20200421 |
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| CF01 | Termination of patent right due to non-payment of annual fee |