CN111524781B - 高频电源及等离子体处理装置 - Google Patents
高频电源及等离子体处理装置 Download PDFInfo
- Publication number
- CN111524781B CN111524781B CN202010070264.XA CN202010070264A CN111524781B CN 111524781 B CN111524781 B CN 111524781B CN 202010070264 A CN202010070264 A CN 202010070264A CN 111524781 B CN111524781 B CN 111524781B
- Authority
- CN
- China
- Prior art keywords
- frequency
- power
- frequency power
- generate
- plasma processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32155—Frequency modulation
- H01J37/32165—Plural frequencies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32128—Radio frequency generated discharge using particular waveforms, e.g. polarised waves
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32146—Amplitude modulation, includes pulsing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
- H01J37/32183—Matching circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32532—Electrodes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/451—Indexing scheme relating to amplifiers the amplifier being a radio frequency amplifier
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019018831A JP7122268B2 (ja) | 2019-02-05 | 2019-02-05 | プラズマ処理装置 |
| JP2019-018831 | 2019-02-05 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111524781A CN111524781A (zh) | 2020-08-11 |
| CN111524781B true CN111524781B (zh) | 2024-06-14 |
Family
ID=71837027
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010070264.XA Active CN111524781B (zh) | 2019-02-05 | 2020-01-21 | 高频电源及等离子体处理装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US11087960B2 (https=) |
| JP (1) | JP7122268B2 (https=) |
| KR (1) | KR102911143B1 (https=) |
| CN (1) | CN111524781B (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6846387B2 (ja) * | 2018-06-22 | 2021-03-24 | 東京エレクトロン株式会社 | プラズマ処理方法及びプラズマ処理装置 |
| JP7122268B2 (ja) * | 2019-02-05 | 2022-08-19 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP7201805B2 (ja) * | 2020-08-27 | 2023-01-10 | 株式会社日立ハイテク | プラズマ処理装置 |
| TWI906346B (zh) * | 2020-08-31 | 2025-12-01 | 日商東京威力科創股份有限公司 | 電漿處理裝置及電漿處理方法 |
| JP2022159653A (ja) * | 2021-04-05 | 2022-10-18 | 東京エレクトロン株式会社 | エッチング方法及びエッチング処理装置 |
| JP2023098203A (ja) | 2021-12-28 | 2023-07-10 | 株式会社ダイヘン | 高周波電源装置 |
| KR102803167B1 (ko) | 2022-02-07 | 2025-05-07 | 주식회사 뉴파워 프라즈마 | 고주파 펄스 전원 장치 및 그의 운전 방법 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1074598A (ja) * | 1996-04-30 | 1998-03-17 | Samsung Electron Co Ltd | Rf発生装置及びこれを用いたパルスプラズマ形成方法 |
| JP2017204467A (ja) * | 2016-05-10 | 2017-11-16 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
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| JPS6214754Y2 (https=) * | 1978-04-25 | 1987-04-15 | ||
| US10361802B1 (en) * | 1999-02-01 | 2019-07-23 | Blanding Hovenweep, Llc | Adaptive pattern recognition based control system and method |
| US6400996B1 (en) * | 1999-02-01 | 2002-06-04 | Steven M. Hoffberg | Adaptive pattern recognition based control system and method |
| US6794301B2 (en) | 1995-10-13 | 2004-09-21 | Mattson Technology, Inc. | Pulsed plasma processing of semiconductor substrates |
| US7904187B2 (en) * | 1999-02-01 | 2011-03-08 | Hoffberg Steven M | Internet appliance system and method |
| JP3839352B2 (ja) * | 2002-05-22 | 2006-11-01 | 株式会社日立製作所 | 情報記録媒体並びに情報再生方法及び装置 |
| WO2006023726A1 (en) * | 2004-08-19 | 2006-03-02 | Intrinsix Corporation | Hybrid heterodyne transmitters and receivers |
| US9123509B2 (en) | 2007-06-29 | 2015-09-01 | Varian Semiconductor Equipment Associates, Inc. | Techniques for plasma processing a substrate |
| KR101570174B1 (ko) * | 2011-05-04 | 2015-11-19 | 세메스 주식회사 | 기판 처리 장치 및 그 방법 |
| JP5808012B2 (ja) | 2011-12-27 | 2015-11-10 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP2012109605A (ja) * | 2012-02-13 | 2012-06-07 | Ulvac Japan Ltd | プラズマcvd装置 |
| US9209840B2 (en) * | 2012-07-30 | 2015-12-08 | Photonic Systems, Inc. | Same-aperture any-frequency simultaneous transmit and receive communication system |
| US20150364300A1 (en) * | 2014-06-16 | 2015-12-17 | Lam Research Corporation | Determining presence of conductive film on dielectric surface of reaction chamber |
| WO2016060938A2 (en) * | 2014-10-08 | 2016-04-21 | RF Micron, Inc. | Radio frequency identification (rfid) moisture tag(s) and sensors with extended sensing via capillaries |
| US10049857B2 (en) * | 2014-12-04 | 2018-08-14 | Mks Instruments, Inc. | Adaptive periodic waveform controller |
| TWI739335B (zh) * | 2015-05-12 | 2021-09-11 | 日商東京威力科創股份有限公司 | 電漿處理裝置及電漿處理方法 |
| KR102553462B1 (ko) * | 2015-07-21 | 2023-07-10 | 도쿄엘렉트론가부시키가이샤 | 플라즈마 처리 장치 및 플라즈마 처리 방법 |
| KR20170024922A (ko) * | 2015-08-26 | 2017-03-08 | 삼성전자주식회사 | 플라즈마 발생 장치 |
| US9947514B2 (en) * | 2015-09-01 | 2018-04-17 | Mks Instruments, Inc. | Plasma RF bias cancellation system |
| JP6643034B2 (ja) * | 2015-10-09 | 2020-02-12 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| US11255663B2 (en) * | 2016-03-04 | 2022-02-22 | May Patents Ltd. | Method and apparatus for cooperative usage of multiple distance meters |
| JP6541623B2 (ja) * | 2016-06-20 | 2019-07-10 | 東京エレクトロン株式会社 | プラズマ処理装置、及び波形補正方法 |
| JP6770868B2 (ja) * | 2016-10-26 | 2020-10-21 | 東京エレクトロン株式会社 | プラズマ処理装置のインピーダンス整合のための方法 |
| JP6793019B2 (ja) * | 2016-11-28 | 2020-12-02 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| JP6858095B2 (ja) * | 2017-08-18 | 2021-04-14 | 東京エレクトロン株式会社 | マイクロ波出力装置及びプラズマ処理装置 |
| EP3685555B1 (en) * | 2017-09-18 | 2025-12-17 | INTEL Corporation | Time encoded data communication protocol, apparatus and method for generating and receiving a data signal |
| JP2019091526A (ja) * | 2017-11-10 | 2019-06-13 | 東京エレクトロン株式会社 | パルスモニタ装置及びプラズマ処理装置 |
| JP6910320B2 (ja) * | 2018-05-01 | 2021-07-28 | 東京エレクトロン株式会社 | マイクロ波出力装置及びプラズマ処理装置 |
| US11432369B2 (en) * | 2018-06-19 | 2022-08-30 | Apple Inc. | Reference signal and control information processing in 5G-NR wireless systems |
| JP2020016592A (ja) * | 2018-07-27 | 2020-01-30 | 東京エレクトロン株式会社 | 検出装置、マイクロ波出力装置及びプラズマ処理装置 |
| JP7122268B2 (ja) * | 2019-02-05 | 2022-08-19 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| CN111524782B (zh) * | 2019-02-05 | 2023-07-25 | 东京毅力科创株式会社 | 等离子体处理装置 |
| JP6797273B2 (ja) | 2019-02-05 | 2020-12-09 | 東京エレクトロン株式会社 | プラズマ処理装置 |
-
2019
- 2019-02-05 JP JP2019018831A patent/JP7122268B2/ja active Active
-
2020
- 2020-01-21 CN CN202010070264.XA patent/CN111524781B/zh active Active
- 2020-01-22 KR KR1020200008820A patent/KR102911143B1/ko active Active
- 2020-01-27 US US16/773,800 patent/US11087960B2/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1074598A (ja) * | 1996-04-30 | 1998-03-17 | Samsung Electron Co Ltd | Rf発生装置及びこれを用いたパルスプラズマ形成方法 |
| JP2017204467A (ja) * | 2016-05-10 | 2017-11-16 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR102911143B1 (ko) | 2026-01-13 |
| JP2020126776A (ja) | 2020-08-20 |
| KR20200096734A (ko) | 2020-08-13 |
| US20200251308A1 (en) | 2020-08-06 |
| US11087960B2 (en) | 2021-08-10 |
| JP7122268B2 (ja) | 2022-08-19 |
| CN111524781A (zh) | 2020-08-11 |
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| GR01 | Patent grant | ||
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