CN110534470A - 陶瓷制静电夹头的制造方法 - Google Patents

陶瓷制静电夹头的制造方法 Download PDF

Info

Publication number
CN110534470A
CN110534470A CN201811011041.5A CN201811011041A CN110534470A CN 110534470 A CN110534470 A CN 110534470A CN 201811011041 A CN201811011041 A CN 201811011041A CN 110534470 A CN110534470 A CN 110534470A
Authority
CN
China
Prior art keywords
layer
ceramics
bonding layer
dielectric layer
electrostatic chuck
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201811011041.5A
Other languages
English (en)
Other versions
CN110534470B (zh
Inventor
松原学
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Haijingyan Co Ltd
Original Assignee
Haijingyan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Haijingyan Co Ltd filed Critical Haijingyan Co Ltd
Publication of CN110534470A publication Critical patent/CN110534470A/zh
Application granted granted Critical
Publication of CN110534470B publication Critical patent/CN110534470B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B37/00Joining burned ceramic articles with other burned ceramic articles or other articles by heating
    • C04B37/003Joining burned ceramic articles with other burned ceramic articles or other articles by heating by means of an interlayer consisting of a combination of materials selected from glass, or ceramic material with metals, metal oxides or metal salts
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B35/00Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • C04B35/622Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q3/00Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
    • B23Q3/15Devices for holding work using magnetic or electric force acting directly on the work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B18/00Layered products essentially comprising ceramics, e.g. refractory products
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B37/00Joining burned ceramic articles with other burned ceramic articles or other articles by heating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6831Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02NELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
    • H02N13/00Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/60Aspects relating to the preparation, properties or mechanical treatment of green bodies or pre-forms
    • C04B2235/608Green bodies or pre-forms with well-defined density
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2235/00Aspects relating to ceramic starting mixtures or sintered ceramic products
    • C04B2235/70Aspects relating to sintered or melt-casted ceramic products
    • C04B2235/74Physical characteristics
    • C04B2235/77Density
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/32Ceramic
    • C04B2237/34Oxidic
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/32Ceramic
    • C04B2237/34Oxidic
    • C04B2237/343Alumina or aluminates
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/32Ceramic
    • C04B2237/36Non-oxidic
    • C04B2237/366Aluminium nitride
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/30Composition of layers of ceramic laminates or of ceramic or metallic articles to be joined by heating, e.g. Si substrates
    • C04B2237/32Ceramic
    • C04B2237/36Non-oxidic
    • C04B2237/368Silicon nitride
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/50Processing aspects relating to ceramic laminates or to the joining of ceramic articles with other articles by heating
    • C04B2237/64Forming laminates or joined articles comprising grooves or cuts
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/50Processing aspects relating to ceramic laminates or to the joining of ceramic articles with other articles by heating
    • C04B2237/68Forming laminates or joining articles wherein at least one substrate contains at least two different parts of macro-size, e.g. one ceramic substrate layer containing an embedded conductor or electrode
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/50Processing aspects relating to ceramic laminates or to the joining of ceramic articles with other articles by heating
    • C04B2237/70Forming laminates or joined articles comprising layers of a specific, unusual thickness
    • C04B2237/704Forming laminates or joined articles comprising layers of a specific, unusual thickness of one or more of the ceramic layers or articles
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/50Processing aspects relating to ceramic laminates or to the joining of ceramic articles with other articles by heating
    • C04B2237/70Forming laminates or joined articles comprising layers of a specific, unusual thickness
    • C04B2237/708Forming laminates or joined articles comprising layers of a specific, unusual thickness of one or more of the interlayers
    • CCHEMISTRY; METALLURGY
    • C04CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
    • C04BLIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
    • C04B2237/00Aspects relating to ceramic laminates or to joining of ceramic articles with other articles by heating
    • C04B2237/50Processing aspects relating to ceramic laminates or to the joining of ceramic articles with other articles by heating
    • C04B2237/72Forming laminates or joined articles comprising at least two interlayers directly next to each other
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6831Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
    • H01L21/6833Details of electrostatic chucks

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Materials Engineering (AREA)
  • Structural Engineering (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

本发明提供了一种陶瓷制静电夹头的制造方法。该方法包含以下步骤:在由密度95%以上的陶瓷或复合陶瓷所构成的介电层中形成作为电极的图案的沟;在该沟中形成金属作为电极图案;在该介电层中形成用于接合的接合层;将该接合层加以研磨并进行活性化处理;以及将具有同样加以研磨并进行活性化处理的接合层的由密度95%以上的陶瓷或复合陶瓷所构成的绝缘体层接合至该介电层。

Description

陶瓷制静电夹头的制造方法
技术领域
本发明涉及陶瓷制静电夹头的制造方法,尤其涉及在半导体或液晶面板的生产中使用的陶瓷制静电夹头的制造方法。
背景技术
以往,就陶瓷制静电夹头的制造方法而言,一般为以下方法:将生胚与涂布有作为电极的钨或钼等高熔点金属膏剂的生胚加以迭层并同时烧成的方法;以及将作为电极的钨或钼等高熔点金属板以陶瓷粉末包夹并通过热压等同时烧成的方法。
专利文献1:日本特开2009-004649和专利文献2:日本特开平07-273164介绍了上述方法。
然而,在上述方法中,高温下的烧成由于陶瓷的收缩,形成的介电层的厚度会产生偏差。此外,在利用生胚的迭层所为的方法中,必须添加为了获得成形体的助剂以及为了获得与高熔点金属之密接性的扩散成分,因此不易获得陶瓷的高纯度化。再者,在利用热压所为的方法中,陶瓷与作为电极的高熔点金属板之界面容易发生空洞,因此电极必须做成网状,此为其限制。
发明内容
有鉴于上述问题,本发明提出一种能将介电层的高纯度化及厚度的偏差抑制到最小的陶瓷制静电夹头的制造方法,包含以下步骤:在密度95%以上的陶瓷或复合陶瓷介电层中形成作为电极的图案的沟;在该沟中形成金属作为电极图案;形成用于接合的活性化接合层;以及接合密度95%以上的陶瓷或复合陶瓷绝缘体层。
根据本发明的一个优选实施方案,该由陶瓷或复合陶瓷所构成的介电层及绝缘体层的体积电阻率在1.0E+8(Ωcm)以上。
根据本发明的另一优选实施方案,接合后的接合层的厚度为合计在50μm以下。
本发明无须已知方法中的用于提升烧结性的添加物,即使在为了具有控制电阻値等功能而加了某些添加物的复合陶瓷中,亦不含其他添加物。
附图说明
图1是根据本发明的方法制作的静电夹头的剖面图。
图2是本发明的方法的各步骤的剖面图。
图3是根据本发明的方法制作的其它静电夹头的剖面图。
图4是根据本发明的方法制作的其它静电夹头的剖面图。
具体实施方式
图1为本发明所制造的静电夹头的剖面图。
如图1所示,静电夹头1包含:介电层2;电极图案3-a;介电层侧的接合层4-a与第1绝缘体层侧的接合层4-b;以及第1绝缘体层5-a。
介电层2是由密度95%以上的陶瓷原料或复合陶瓷原料的烧结体所构成的介电质。就陶瓷原料而言,可使用Al2O3、蓝宝石、Y2O3、AlN、Si3N4等。就烧结体的陶瓷或复合陶瓷的体积电阻率而言,介电层及绝缘体层均可为例如1.0E+8(Ωcm)以上。此外,亦可将为了调整电阻值而添加SiC、TiO2、TiN等的复合材料均用于介电层及绝缘体层。
电极图案3-a是由在介电层2作为图案的沟中埋入的金属等材料所构成的电极。就金属而言,例如使用元素周期表的IVB族至IB族所含的金属或其合金。
介电层侧的接合层4-a及第1绝缘体层侧的接合层4-b用于接合介电层2与第1绝缘体层5-a,接合层4-a和接合层4-b由表面经过活性化的陶瓷所构成。接合层的厚度并不特别限定,但接合后的接合层优选地合计在50μm以下的程度。
第1绝缘体层5-a是由密度95%以上的陶瓷原料或复合陶瓷原料的烧结体所构成的绝缘体。
以下参照图2,说明本发明的陶瓷制静电夹头的制造方法。
将高纯度的陶瓷原料或复合陶瓷原料加以烧结,以预先准备密度95%以上的介电质。
如图2中的(A)所示,将上述烧结的密度95%以上的陶瓷或复合陶瓷的介电质加工成平面度在0.05mm以下,并加工成用于形成期望电极图案的沟,以作为介电层2。
接着,如图2中的(B)所示,在介电层2的加工有上述沟的面形成作为电极的金属层3-b。形成金属的方法可使用镀层、熔喷、CVD或PVD等金属化方法,但宜形成为厚于加工的沟的深度。然后,如图2中的(C)所示,通过将形成有金属层3-b的面加以研磨及抛光而使得仅有形成于沟内的金属露出表面,以作为电极图案3-a。
如图2中的(D)所示,在形成有介电层2的电极图案3的面形成用于与第1绝缘体层5-a接合的介电层侧的接合层4-a。介电层侧的接合层4-a的形成方法可使用CVD或PVD等的薄膜形成手法。介电层侧的接合层4-a的膜厚被形成为大于形成电极图案的面的表面粗度Rz。此外,预先准备与介电层2接合的第1绝缘体层5-a。与介电层2同样地,在第1绝缘体层5-a形成第1绝缘体层侧的接合层4-b。
介电层侧的接合层4-a及第1绝缘体侧的接合层4-b通过抛光调整表面粗度,从而在接合后不产生空隙。表面粗度Ra优选地为0.1μm以下。
将已调整表面粗度的介电层侧的接合层4-a及第1绝缘体侧的接合层4-b通过电浆等而加以活性化。
最后,将经过表面活性化的接合层彼此重迭,通过在低温低负载下接合,从而获得如图2中的(E)所示的内置有电极图案3的静电夹头1。因为可将经过烧结及加工的陶瓷或复合陶瓷彼此在低温低负载下接合,所以能制造出高纯度且抑制介电层厚度的偏差的静电夹头。
此外,如图3所示,在本方法中,在内置静电夹头电极之外,亦可内置作为加热器的金属。在图3的实施例中,先在第1绝缘体层5-a形成加热器图案6,再接合第2绝缘体层5-b。在此种情形下,4-c为加热器侧的接合层,4-d为第2绝缘体层侧的接合层。
再者,可如图4所示地,内置为了冷却吸附对象物而导入至吸附面的冷却气体等的沟。在图4的实施例中,在第1绝缘体层5-a形成有导入沟7,再接合有第2绝缘体层5-b。在此种情形下,4-e为导入沟侧的接合层,4-f为第2绝缘体层侧的接合层。
以上,已说明本发明的实施例及变形,但并非限定。本发明的权利要求,当然包含所属技术领域普通技术人员所能思及的变形、变更。
【符号说明】
1 静电夹头
2 介电层
3-a 电极图案
3-b 金属层
4-a 介电层侧的接合层
4-b 第1绝缘体层侧的接合层
4-c 加热器侧的接合层
4-d 第2绝缘体层侧的接合层
4-e 导入沟侧的接合层
4-f 第2绝缘体层侧的接合层
5-a 第1绝缘体层
5-b 第2绝缘体层
6 加热器图案
7 导入沟

Claims (3)

1.一种陶瓷制静电夹头的制造方法,其特征在于包含以下步骤:
在由密度95%以上的陶瓷或复合陶瓷所构成的介电层中形成作为电极的图案的沟;
在该沟中形成金属作为电极图案;
在该介电层中形成用于接合的接合层;
将该接合层加以研磨并进行活性化处理;以及
将具有同样加以研磨并进行活性化处理的接合层的由密度95%以上的陶瓷或复合陶瓷所构成的绝缘体层接合至该介电层。
2.如权利要求1所述的陶瓷制静电夹头的制造方法,其特征在于,该由陶瓷或复合陶瓷所构成的介电层及绝缘体层的体积电阻率在1.0E+8(Ωcm)以上。
3.如权利要求1或2所述的陶瓷制静电夹头的制造方法,其特征在于,接合后的接合层的厚度为合计在50μm以下。
CN201811011041.5A 2018-05-25 2018-08-31 陶瓷制静电夹头的制造方法 Active CN110534470B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018100819A JP6583897B1 (ja) 2018-05-25 2018-05-25 セラミック製静電チャックの製造方法
JP2018-100819 2018-05-25

Publications (2)

Publication Number Publication Date
CN110534470A true CN110534470A (zh) 2019-12-03
CN110534470B CN110534470B (zh) 2022-04-08

Family

ID=68095261

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811011041.5A Active CN110534470B (zh) 2018-05-25 2018-08-31 陶瓷制静电夹头的制造方法

Country Status (4)

Country Link
US (1) US10899670B2 (zh)
JP (1) JP6583897B1 (zh)
KR (1) KR102111291B1 (zh)
CN (1) CN110534470B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110676164A (zh) * 2019-10-14 2020-01-10 芯盟科技有限公司 半导体工艺部件及其形成方法、以及半导体工艺设备
JP6971346B2 (ja) * 2020-03-06 2021-11-24 ▲らん▼海精研股▲ふん▼有限公司 熱遮蔽効果を有するセラミック製ヒーターとセラミック製ヒーター付き静電チャックおよびそれらの製造方法
CN112358964A (zh) * 2020-10-14 2021-02-12 华南理工大学 一种应用强化高压静电场的发酵设备

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW379209B (en) * 1995-07-14 2000-01-11 Ngk Insulators Ltd Ceramics joined body and method of joining ceramics
TW200633947A (en) * 2005-02-16 2006-10-01 Ngk Insulators Ltd Joined body and manufacturing method for the same
CN101355013A (zh) * 2007-06-06 2009-01-28 S.O.I.Tec绝缘体上硅技术公司 制备无排除区的外延用结构的工艺
US20100155882A1 (en) * 2008-12-22 2010-06-24 Arnaud Castex Method for bonding two substrates
JP2011148688A (ja) * 2009-12-25 2011-08-04 Taiheiyo Cement Corp セラミックス接合体及びその製造方法
CN102276283A (zh) * 2010-05-27 2011-12-14 Toto株式会社 陶瓷接合体的制造方法
CN104067382A (zh) * 2012-01-26 2014-09-24 京瓷株式会社 静电夹头
CN107527851A (zh) * 2016-06-20 2017-12-29 北京华卓精科科技股份有限公司 陶瓷静电卡盘装置及其制备工艺

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0541400B1 (en) 1991-11-07 1998-03-18 Varian Associates, Inc. Anti-stick electrostatic chuck for a low pressure environment
JP2967024B2 (ja) 1994-03-29 1999-10-25 日本碍子株式会社 電極埋設品及びその製造方法
WO1995020838A1 (en) * 1994-01-31 1995-08-03 Applied Materials, Inc. Electrostatic chuck with conformal insulator film
US5883778A (en) * 1994-02-28 1999-03-16 Applied Materials, Inc. Electrostatic chuck with fluid flow regulator
JP3457477B2 (ja) * 1995-09-06 2003-10-20 日本碍子株式会社 静電チャック
JP3904746B2 (ja) * 1998-11-02 2007-04-11 京セラ株式会社 半導体製造装置用部材およびその製造方法
JP2001203257A (ja) * 2000-01-20 2001-07-27 Sumitomo Electric Ind Ltd 半導体製造装置用ウェハ保持体
JP2002176096A (ja) * 2000-06-30 2002-06-21 Toshiba Ceramics Co Ltd 半導体処理装置用セラミックス部材の製造方法
JP3989254B2 (ja) * 2002-01-25 2007-10-10 日本碍子株式会社 異種材料接合体及びその製造方法
KR100951613B1 (ko) 2003-03-11 2010-04-09 주식회사 코미코 하부전극의 상면에 돌출부들과 세라믹 판의 하부면에홈들을 갖는 정전척
JP4397271B2 (ja) * 2003-05-12 2010-01-13 東京エレクトロン株式会社 処理装置
JP2006073780A (ja) 2004-09-02 2006-03-16 Bondotekku:Kk 常温接合方法と装置及びデバイス
TWI271815B (en) * 2004-11-30 2007-01-21 Sanyo Electric Co Method for processing stuck object and electrostatic sticking method
JP2007207959A (ja) * 2006-02-01 2007-08-16 Taiheiyo Cement Corp 静電チャック用部材およびその表面抵抗の調整方法
US20070210037A1 (en) * 2006-02-24 2007-09-13 Toshifumi Ishida Cooling block forming electrode
US8284538B2 (en) * 2006-08-10 2012-10-09 Tokyo Electron Limited Electrostatic chuck device
US7672111B2 (en) * 2006-09-22 2010-03-02 Toto Ltd. Electrostatic chuck and method for manufacturing same
EP1986230A2 (en) * 2007-04-25 2008-10-29 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing SOI substrate and method of manufacturing semiconductor device
JP5111954B2 (ja) 2007-06-22 2013-01-09 新光電気工業株式会社 静電チャック及びその製造方法
CN101946318B (zh) * 2008-02-14 2014-01-08 三菱重工业株式会社 半导体元件模块及其制造方法
US8503155B2 (en) * 2008-02-26 2013-08-06 Kyocera Corporation Wafer support member, method for manufacturing the same and electrostatic chuck using the same
US8154116B2 (en) * 2008-11-03 2012-04-10 HeadwayTechnologies, Inc. Layered chip package with heat sink
US20110229837A1 (en) * 2008-11-25 2011-09-22 Kyocera Corporation Wafer Heating Apparatus, Electrostatic Chuck, and Method for Manufacturing Wafer Heating Apparatus
WO2012056808A1 (ja) * 2010-10-25 2012-05-03 日本碍子株式会社 セラミックス材料、半導体製造装置用部材、スパッタリングターゲット部材及びセラミックス材料の製造方法
WO2012121141A1 (ja) * 2011-03-07 2012-09-13 株式会社村田製作所 セラミック多層基板およびその製造方法
US8865507B2 (en) * 2011-09-16 2014-10-21 Sionyx, Inc. Integrated visible and infrared imager devices and associated methods
JP6231443B2 (ja) * 2014-06-27 2017-11-15 京セラ株式会社 接合体およびこれを用いたウエハ支持部材
JP6490296B2 (ja) * 2016-07-20 2019-03-27 日本特殊陶業株式会社 半導体製造装置用部品

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW379209B (en) * 1995-07-14 2000-01-11 Ngk Insulators Ltd Ceramics joined body and method of joining ceramics
TW200633947A (en) * 2005-02-16 2006-10-01 Ngk Insulators Ltd Joined body and manufacturing method for the same
CN101355013A (zh) * 2007-06-06 2009-01-28 S.O.I.Tec绝缘体上硅技术公司 制备无排除区的外延用结构的工艺
US20100155882A1 (en) * 2008-12-22 2010-06-24 Arnaud Castex Method for bonding two substrates
JP2011148688A (ja) * 2009-12-25 2011-08-04 Taiheiyo Cement Corp セラミックス接合体及びその製造方法
CN102276283A (zh) * 2010-05-27 2011-12-14 Toto株式会社 陶瓷接合体的制造方法
CN104067382A (zh) * 2012-01-26 2014-09-24 京瓷株式会社 静电夹头
CN107527851A (zh) * 2016-06-20 2017-12-29 北京华卓精科科技股份有限公司 陶瓷静电卡盘装置及其制备工艺

Also Published As

Publication number Publication date
JP6583897B1 (ja) 2019-10-02
KR20190134440A (ko) 2019-12-04
US10899670B2 (en) 2021-01-26
JP2019204923A (ja) 2019-11-28
CN110534470B (zh) 2022-04-08
US20190359530A1 (en) 2019-11-28
KR102111291B1 (ko) 2020-05-19

Similar Documents

Publication Publication Date Title
JP5841329B2 (ja) セラミックス接合体の製造方法
CN110534470A (zh) 陶瓷制静电夹头的制造方法
JP4942364B2 (ja) 静電チャックおよびウェハ保持部材並びにウェハ処理方法
KR20010076378A (ko) 반도체 제조 장치용 웨이퍼 지지체와 그 제조 방법 및반도체 제조 장치
KR20010076386A (ko) 반도체 제조 장치용 웨이퍼 보유체
JP2005347559A (ja) 静電チャック及びセラミック製の静電チャックの製造方法
JP2021176202A (ja) セラミック基板及び電子部品内蔵モジュール
JP2023518438A (ja) 多層複合セラミックスプレート及びその製造方法
JP5740637B2 (ja) セラミックス接合体及びその製造方法
JP6389802B2 (ja) 加熱装置及びその製造方法
JP2008124265A (ja) 低熱膨張セラミックス部材及びその製造方法
WO2020101856A3 (en) 3d interposer with through glas vias-method of increasing adhesion between copper and class surfaces and articles therefrom
TW201934794A (zh) 帶紋理的處理腔室部件及其製造方法
JP2016213237A (ja) 静電チャックおよびその製造方法
JP6438352B2 (ja) 加熱装置
TWI313897B (en) Ceramic susceptor for semiconductor manufacturing equipment
JP7519168B2 (ja) セラミックス部材の製造方法
US6986865B2 (en) Method for manufacturing an electrostatic chuck
US12020999B2 (en) Cover lid with selective and edge metallization and methods of making
JP6971346B2 (ja) 熱遮蔽効果を有するセラミック製ヒーターとセラミック製ヒーター付き静電チャックおよびそれらの製造方法
EP3673506B1 (en) Semiconductor substrate support with multiple electrodes and method for making same
JP3991887B2 (ja) 半導体製造装置用ウェハ保持体およびそれを搭載した半導体製造装置
WO2020262368A1 (ja) 静電チャックヒータ
JP2008244148A (ja) 静電チャック及びその製造方法
JP2007173592A (ja) 静電チャック

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant