CN110446936A - 波形信号检测方法及装置 - Google Patents

波形信号检测方法及装置 Download PDF

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CN110446936A
CN110446936A CN201880000261.XA CN201880000261A CN110446936A CN 110446936 A CN110446936 A CN 110446936A CN 201880000261 A CN201880000261 A CN 201880000261A CN 110446936 A CN110446936 A CN 110446936A
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capture
level value
waveform
termination condition
electric signal
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CN110446936B (zh
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冯春忆
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Shenzhen Goodix Technology Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

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Abstract

本发明实施例提供一种波形信号检测方法及装置。该波形信号检测方法包括在信号采集周期的采集时间到达时，芯片通过I/O端口读取自身输出的待测波形的电信号；确定电信号对应的捕获序号，并从预设的期望输出波形数据中，获取与捕获序号对应的期望电平值；若电信号的电平值与期望电平值一致，则生成与捕获序号对应的电信号捕获记录，其中，电信号捕获记录包括电信号的电平值和捕获时间；更新捕获序号，并在下一采集时间到达时，返回芯片通过I/O端口读取自身输出的待测波形的电信号的步骤继续执行，直至满足检测终止条件。该波形信号检测方法可以克服对芯片中通过I/O引脚输出波形的模块进行验证时，操作复杂，验证效率低下的缺陷。

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PCT国内申请，说明书已公开。

Claims (16)

  1. PCT国内申请，权利要求书已公开。
CN201880000261.XA 2018-03-05 2018-03-05 波形信号检测方法及装置 Active CN110446936B (zh)

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WO2019169524A1 (zh) 2019-09-12

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