CN110178010A - 面板检查系统 - Google Patents

面板检查系统 Download PDF

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Publication number
CN110178010A
CN110178010A CN201780083257.XA CN201780083257A CN110178010A CN 110178010 A CN110178010 A CN 110178010A CN 201780083257 A CN201780083257 A CN 201780083257A CN 110178010 A CN110178010 A CN 110178010A
Authority
CN
China
Prior art keywords
display panel
inspection
lighting
liquid crystal
crystal display
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201780083257.XA
Other languages
English (en)
Chinese (zh)
Inventor
小林正芳
斉藤谕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Sankyo Corp
Original Assignee
Nidec Sankyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidec Sankyo Corp filed Critical Nidec Sankyo Corp
Publication of CN110178010A publication Critical patent/CN110178010A/zh
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
CN201780083257.XA 2017-01-13 2017-12-27 面板检查系统 Withdrawn CN110178010A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017-004285 2017-01-13
JP2017004285A JP2018112515A (ja) 2017-01-13 2017-01-13 パネル検査システム
PCT/JP2017/046999 WO2018131489A1 (fr) 2017-01-13 2017-12-27 Système d'inspection de panneau

Publications (1)

Publication Number Publication Date
CN110178010A true CN110178010A (zh) 2019-08-27

Family

ID=62839469

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780083257.XA Withdrawn CN110178010A (zh) 2017-01-13 2017-12-27 面板检查系统

Country Status (4)

Country Link
JP (1) JP2018112515A (fr)
KR (1) KR20190085537A (fr)
CN (1) CN110178010A (fr)
WO (1) WO2018131489A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109387961B (zh) * 2018-11-07 2020-11-24 惠科股份有限公司 一种显示面板的检测方法和检测设备

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH095057A (ja) * 1995-06-22 1997-01-10 Dainippon Screen Mfg Co Ltd 透孔板の検査方法および検査装置
JPH10153645A (ja) * 1996-08-15 1998-06-09 Risutowan Andrew 導電性基板をテストする方法と装置
JP2007033976A (ja) * 2005-07-28 2007-02-08 Sanyo Epson Imaging Devices Corp 液晶表示装置の製造方法
CN1987559A (zh) * 2005-12-21 2007-06-27 安捷伦科技有限公司 显示面板的制造方法、检查方法以及检查装置
CN101566583A (zh) * 2008-04-23 2009-10-28 财团法人工业技术研究院 面板元件缺陷检测系统
JP2011002294A (ja) * 2009-06-17 2011-01-06 Sharp Corp 液晶表示パネルの検査方法
WO2011086634A1 (fr) * 2010-01-14 2011-07-21 シャープ株式会社 Procédé d'inspection d'un écran à cristaux liquides et dispositif
CN203950092U (zh) * 2013-06-25 2014-11-19 株式会社日本显示器 液晶显示面板的检查装置
CN105527295A (zh) * 2015-12-31 2016-04-27 苏州日和科技有限公司 显示屏全自动光学检测机器人

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011039121A (ja) 2009-08-06 2011-02-24 Panasonic Liquid Crystal Display Co Ltd 液晶表示装置の製造方法、液晶表示装置の製造システム、及び液晶表示装置
KR20150056713A (ko) * 2013-11-15 2015-05-27 삼성전자주식회사 영상표시장치의 비파괴 검사 시스템 및 방법과 이를 위한 비파괴 검사 장치

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH095057A (ja) * 1995-06-22 1997-01-10 Dainippon Screen Mfg Co Ltd 透孔板の検査方法および検査装置
JPH10153645A (ja) * 1996-08-15 1998-06-09 Risutowan Andrew 導電性基板をテストする方法と装置
JP2007033976A (ja) * 2005-07-28 2007-02-08 Sanyo Epson Imaging Devices Corp 液晶表示装置の製造方法
CN1987559A (zh) * 2005-12-21 2007-06-27 安捷伦科技有限公司 显示面板的制造方法、检查方法以及检查装置
CN101566583A (zh) * 2008-04-23 2009-10-28 财团法人工业技术研究院 面板元件缺陷检测系统
JP2011002294A (ja) * 2009-06-17 2011-01-06 Sharp Corp 液晶表示パネルの検査方法
WO2011086634A1 (fr) * 2010-01-14 2011-07-21 シャープ株式会社 Procédé d'inspection d'un écran à cristaux liquides et dispositif
CN203950092U (zh) * 2013-06-25 2014-11-19 株式会社日本显示器 液晶显示面板的检查装置
CN105527295A (zh) * 2015-12-31 2016-04-27 苏州日和科技有限公司 显示屏全自动光学检测机器人

Also Published As

Publication number Publication date
KR20190085537A (ko) 2019-07-18
WO2018131489A1 (fr) 2018-07-19
JP2018112515A (ja) 2018-07-19

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Application publication date: 20190827

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