CN109844606B - 试样观察装置及试样观察方法 - Google Patents

试样观察装置及试样观察方法

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Publication number
CN109844606B
CN109844606B CN201780062595.5A CN201780062595A CN109844606B CN 109844606 B CN109844606 B CN 109844606B CN 201780062595 A CN201780062595 A CN 201780062595A CN 109844606 B CN109844606 B CN 109844606B
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China
Prior art keywords
image data
observation
spim
light
sample
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CN201780062595.5A
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English (en)
Chinese (zh)
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CN109844606A (zh
Inventor
山本谕
松原正典
杉山范和
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Hamamatsu Photonics KK
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Hamamatsu Photonics KK
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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036Scanning details, e.g. scanning stages
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008Details of detection or image processing, including general computer control
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/16Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes

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  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN201780062595.5A 2016-10-11 2017-08-15 试样观察装置及试样观察方法 Active CN109844606B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2016-200075 2016-10-11
JP2016200075A JP6423841B2 (ja) 2016-10-11 2016-10-11 試料観察装置及び試料観察方法
PCT/JP2017/029367 WO2018070098A1 (ja) 2016-10-11 2017-08-15 試料観察装置及び試料観察方法

Publications (2)

Publication Number Publication Date
CN109844606A CN109844606A (zh) 2019-06-04
CN109844606B true CN109844606B (zh) 2025-09-23

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780062595.5A Active CN109844606B (zh) 2016-10-11 2017-08-15 试样观察装置及试样观察方法

Country Status (6)

Country Link
US (4) US10809509B2 (enExample)
EP (1) EP3528030B1 (enExample)
JP (1) JP6423841B2 (enExample)
CN (1) CN109844606B (enExample)
ES (1) ES2993344T3 (enExample)
WO (1) WO2018070098A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7207860B2 (ja) * 2018-04-09 2023-01-18 浜松ホトニクス株式会社 試料観察装置
CN115668027A (zh) * 2020-05-27 2023-01-31 浜松光子学株式会社 光照射装置和试样观察装置
EP4137864B1 (en) * 2020-06-01 2025-02-19 Hamamatsu Photonics K.K. Sample observation device and sample observation method
JP7754932B2 (ja) 2021-07-26 2025-10-15 浜松ホトニクス株式会社 試料観察装置及び試料観察方法
JP7746632B1 (ja) 2022-09-09 2025-09-30 シグニファイ ホールディング ビー ヴィ レーザ励起高強度白色光源を製造するためのアキシコンレンズと組み合わせた環状蛍光体
JP2024093373A (ja) 2022-12-27 2024-07-09 浜松ホトニクス株式会社 試料観察装置及び試料観察方法
JP2024093375A (ja) 2022-12-27 2024-07-09 浜松ホトニクス株式会社 試料観察装置及び試料観察方法

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105283791A (zh) * 2013-06-11 2016-01-27 浜松光子学株式会社 图像取得装置及图像取得装置的聚焦方法

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62180241A (ja) 1986-02-04 1987-08-07 Hamamatsu Photonics Kk 断層像観察装置
JPH03172815A (ja) 1989-12-01 1991-07-26 Fuji Photo Film Co Ltd 共焦点走査型顕微鏡
JPH11211439A (ja) 1998-01-22 1999-08-06 Takaoka Electric Mfg Co Ltd 表面形状計測装置
JP3736213B2 (ja) 1999-07-15 2006-01-18 横河電機株式会社 共焦点光スキャナ
DE10257423A1 (de) * 2002-12-09 2004-06-24 Europäisches Laboratorium für Molekularbiologie (EMBL) Mikroskop
US7009172B2 (en) * 2003-03-06 2006-03-07 Board Of Regents Of The University And Community College System Of Nevada, Reno Method and apparatus for imaging using continuous non-raster patterns
US7345814B2 (en) * 2003-09-29 2008-03-18 Olympus Corporation Microscope system and microscope focus maintaining device for the same
JP4621866B2 (ja) 2004-03-16 2011-01-26 学校法人日本大学 燃料の燃焼伝播解析及び火炎燃え広がりの測定装置、及び該装置を用いた燃料の火炎伝播モードの試験方法
US20050280892A1 (en) * 2004-05-28 2005-12-22 Nobuyuki Nagasawa Examination method and examination apparatus
JP4538633B2 (ja) 2005-03-29 2010-09-08 国立大学法人浜松医科大学 Dlp式スリット光走査顕微鏡
JP4890096B2 (ja) * 2006-05-19 2012-03-07 浜松ホトニクス株式会社 画像取得装置、画像取得方法、及び画像取得プログラム
CN101918816B (zh) * 2007-12-21 2015-12-02 哈佛大学 三维中的亚衍射极限图像分辨率
US9134521B2 (en) 2008-07-30 2015-09-15 The Regents Of The University Of California Multidirectional selective plane illumination microscopy
GB0814039D0 (en) * 2008-07-31 2008-09-10 Imp Innovations Ltd Optical arrangement for oblique plane microscopy
JP2010054391A (ja) * 2008-08-29 2010-03-11 Nano Photon Kk 光学顕微鏡、及びカラー画像の表示方法
US9116353B2 (en) * 2008-09-16 2015-08-25 Yokogawa Electric Corporation Microscope device
JP5311195B2 (ja) * 2008-09-16 2013-10-09 横河電機株式会社 顕微鏡装置
US8743195B2 (en) * 2008-10-24 2014-06-03 Leica Biosystems Imaging, Inc. Whole slide fluorescence scanner
JP2011180442A (ja) * 2010-03-02 2011-09-15 Sony Corp サンプル像取得装置、サンプル像取得方法及びサンプル像取得プログラム
US8711211B2 (en) * 2010-06-14 2014-04-29 Howard Hughes Medical Institute Bessel beam plane illumination microscope
WO2013010151A1 (en) 2011-07-14 2013-01-17 Howard Hughes Medical Institute Microscopy with adaptive optics
US9715095B2 (en) * 2011-10-11 2017-07-25 Carl Zeiss Microscopy Gmbh Microscope and method for SPIM microscopy
JP2013156286A (ja) 2012-01-26 2013-08-15 Olympus Corp 撮像装置
DE102012110077A1 (de) * 2012-10-23 2014-06-26 Karlsruher Institut für Technologie Mikroskop mit mindestens einem Beleuchtungsstrahl in Form einer Lichtscheibe
JP6086366B2 (ja) 2013-04-05 2017-03-01 国立研究開発法人理化学研究所 顕微鏡、焦準器具、流体保持器具、及び光学ユニット
DE102013107297B4 (de) * 2013-07-10 2025-04-24 Carl Zeiss Microscopy Gmbh Anordnung zur Lichtblattmikroskopie
JP2015135463A (ja) * 2013-12-19 2015-07-27 オリンパス株式会社 顕微鏡装置、及び、顕微鏡システム
US10061111B2 (en) * 2014-01-17 2018-08-28 The Trustees Of Columbia University In The City Of New York Systems and methods for three dimensional imaging
DE102014102215A1 (de) * 2014-02-20 2015-08-20 Carl Zeiss Microscopy Gmbh Verfahren und Anordnung zur Lichtblattmikroskopie
JP2016033620A (ja) * 2014-07-31 2016-03-10 キヤノン株式会社 画像取得装置
WO2016102200A1 (en) 2014-12-22 2016-06-30 Koninklijke Philips N.V. Method for simultaneous capture of image data at multiple depths of a sample
JP6605269B2 (ja) * 2015-09-24 2019-11-13 オリンパス株式会社 倒立顕微鏡及び倒立顕微鏡用遮光装置
JP2017191228A (ja) * 2016-04-14 2017-10-19 オリンパス株式会社 ライトシート顕微鏡およびサンプル観察方法
US10409052B2 (en) * 2016-09-28 2019-09-10 University Of Washington Inverted light-sheet microscope
EP3610313B1 (en) * 2017-04-11 2022-03-02 Calico Life Sciences LLC Fluorescence microscopy system and methods based on stimulated emission
US12133714B2 (en) * 2018-05-10 2024-11-05 Board Of Regents, The University Of Texas System Line excitation array detection microscopy
DE102019100184A1 (de) * 2019-01-07 2020-07-09 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105283791A (zh) * 2013-06-11 2016-01-27 浜松光子学株式会社 图像取得装置及图像取得装置的聚焦方法

Also Published As

Publication number Publication date
ES2993344T3 (en) 2024-12-27
CN109844606A (zh) 2019-06-04
US20220283420A1 (en) 2022-09-08
EP3528030A4 (en) 2020-05-27
US20200393661A1 (en) 2020-12-17
JP6423841B2 (ja) 2018-11-14
US11391934B2 (en) 2022-07-19
EP3528030B1 (en) 2024-10-09
EP3528030C0 (en) 2024-10-09
US20210382286A1 (en) 2021-12-09
US10809509B2 (en) 2020-10-20
WO2018070098A1 (ja) 2018-04-19
US20200041776A1 (en) 2020-02-06
EP3528030A1 (en) 2019-08-21
US11131839B2 (en) 2021-09-28
US11822066B2 (en) 2023-11-21
JP2018063292A (ja) 2018-04-19

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