CN109791926A - 半导体装置 - Google Patents

半导体装置 Download PDF

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Publication number
CN109791926A
CN109791926A CN201780060940.1A CN201780060940A CN109791926A CN 109791926 A CN109791926 A CN 109791926A CN 201780060940 A CN201780060940 A CN 201780060940A CN 109791926 A CN109791926 A CN 109791926A
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CN
China
Prior art keywords
mentioned
chip
switch element
conductor
lead frame
Prior art date
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Pending
Application number
CN201780060940.1A
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English (en)
Chinese (zh)
Inventor
林敬昌
户本俊介
森勇辅
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Denso Corp
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Denso Corp
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Application filed by Denso Corp filed Critical Denso Corp
Publication of CN109791926A publication Critical patent/CN109791926A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/146—Measuring arrangements for current not covered by other subgroups of G01R15/14, e.g. using current dividers, shunts, or measuring a voltage drop
    • G—PHYSICS
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    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
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    • H01L2924/191—Disposition
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    • H01L2924/19104—Disposition of discrete passive components in a stacked assembly with the semiconductor or solid state device on the semiconductor or solid-state device, i.e. passive-on-chip
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    • H01L2924/191—Disposition
    • H01L2924/19101—Disposition of discrete passive components
    • H01L2924/19107—Disposition of discrete passive components off-chip wires

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Inverter Devices (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
CN201780060940.1A 2016-10-07 2017-09-27 半导体装置 Pending CN109791926A (zh)

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US11107761B2 (en) * 2018-02-06 2021-08-31 Denso Corporation Semiconductor device
JP2019186403A (ja) 2018-04-11 2019-10-24 トヨタ自動車株式会社 半導体装置
DE102018207308B4 (de) * 2018-05-09 2020-07-02 Infineon Technologies Ag Halbleiterbauteil mit integriertem shunt-widerstand und verfahren zu dessen herstellung
JP2020047725A (ja) * 2018-09-18 2020-03-26 トヨタ自動車株式会社 半導体装置
JP7338204B2 (ja) * 2019-04-01 2023-09-05 富士電機株式会社 半導体装置
JP7479759B2 (ja) * 2020-06-02 2024-05-09 三菱電機株式会社 半導体装置の製造方法、および、半導体装置
US11555832B2 (en) * 2021-03-02 2023-01-17 Allegro Microsystems, Llc Integrated shunt and magnetic field current sensor
EP4443734A1 (en) * 2023-04-06 2024-10-09 Hamilton Sundstrand Corporation Shoot-through protection and current monitoring scheme for multilevel power converters

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WO2016075985A1 (ja) * 2014-11-13 2016-05-19 株式会社村田製作所 パワー半導体のパッケージ素子

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Application publication date: 20190521