CN108802595B - 电子部件试验装置用的载体 - Google Patents

电子部件试验装置用的载体 Download PDF

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Publication number
CN108802595B
CN108802595B CN201810365312.0A CN201810365312A CN108802595B CN 108802595 B CN108802595 B CN 108802595B CN 201810365312 A CN201810365312 A CN 201810365312A CN 108802595 B CN108802595 B CN 108802595B
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China
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opening
peripheral side
outer peripheral
inner peripheral
film
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CN201810365312.0A
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English (en)
Chinese (zh)
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CN108802595A (zh
Inventor
筬部明浩
伊藤明彦
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Advantest Corp
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Advantest Corp
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Publication of CN108802595A publication Critical patent/CN108802595A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Environmental & Geological Engineering (AREA)
CN201810365312.0A 2017-04-28 2018-04-20 电子部件试验装置用的载体 Active CN108802595B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-089438 2017-04-28
JP2017089438A JP6823534B2 (ja) 2017-04-28 2017-04-28 電子部品試験装置用のキャリア

Publications (2)

Publication Number Publication Date
CN108802595A CN108802595A (zh) 2018-11-13
CN108802595B true CN108802595B (zh) 2021-10-15

Family

ID=64093768

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810365312.0A Active CN108802595B (zh) 2017-04-28 2018-04-20 电子部件试验装置用的载体

Country Status (4)

Country Link
JP (1) JP6823534B2 (ko)
KR (1) KR102341037B1 (ko)
CN (1) CN108802595B (ko)
TW (1) TWI734002B (ko)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1575123A (zh) * 2003-05-23 2005-02-02 株式会社日立高新技术仪器 电子部件安装方法
CN101414572A (zh) * 2007-10-17 2009-04-22 松下电器产业株式会社 电子部件的搬送框架和电子部件的制造方法
CN101996766A (zh) * 2009-08-21 2011-03-30 Tdk株式会社 电子部件及其制造方法
CN103116041A (zh) * 2011-11-16 2013-05-22 株式会社爱德万测试 测试用载具及测试用载具的装配方法
KR20170037079A (ko) * 2015-09-25 2017-04-04 (주)제이티 소자핸들러

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06308196A (ja) * 1993-04-22 1994-11-04 Nitto Denko Corp テストヘッド構造
JPH0717591A (ja) * 1993-06-15 1995-01-20 Fujitsu Ltd Ｉｃキャリア
JP3412114B2 (ja) * 1995-07-26 2003-06-03 株式会社アドバンテスト Ｉｃ試験装置
SG98373A1 (en) * 1998-11-25 2003-09-19 Advantest Corp Device testing apparatus
AU2002236231A1 (en) * 2002-03-06 2003-09-16 Advantest Corporation Insert and electronic component handler comprising it
JP5268629B2 (ja) * 2008-12-26 2013-08-21 株式会社エンプラス 電気部品用キャリア
JP5307609B2 (ja) * 2009-04-17 2013-10-02 株式会社マキタ 打撃工具
US8720875B2 (en) * 2009-09-26 2014-05-13 Centipede Systems, Inc. Carrier for holding microelectronic devices
JP5549808B2 (ja) * 2010-05-24 2014-07-16 株式会社ノーリツ カシメ締結構造及びこのカシメ締結構造を有する燃焼装置
JP2012077769A (ja) * 2010-09-30 2012-04-19 Nippon Pop Rivets & Fasteners Ltd ブラインドリベット及びその締結方法
JP5872391B2 (ja) 2012-06-22 2016-03-01 株式会社アドバンテスト 電子部品試験装置
KR101348204B1 (ko) * 2012-12-28 2014-01-10 주식회사 아이에스시 테스트 소켓 및 소켓본체
KR101464990B1 (ko) * 2013-12-24 2014-11-26 주식회사 아이에스시 반도체 디바이스 얼라인 소켓유닛 및 이를 포함하는 반도체 디바이스 검사장치
KR101646628B1 (ko) 2014-09-04 2016-08-08 (주) 루켄테크놀러지스 반도체 패키지 검사용 소켓 및 그 제조방법
CN105527472B (zh) * 2014-10-17 2018-10-02 株式会社Isc 测试座
KR101706331B1 (ko) * 2014-10-17 2017-02-15 주식회사 아이에스시 검사용 소켓
JP6308196B2 (ja) 2015-11-06 2018-04-11 マツダ株式会社 自動車の後部整流構造

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1575123A (zh) * 2003-05-23 2005-02-02 株式会社日立高新技术仪器 电子部件安装方法
CN101414572A (zh) * 2007-10-17 2009-04-22 松下电器产业株式会社 电子部件的搬送框架和电子部件的制造方法
CN101996766A (zh) * 2009-08-21 2011-03-30 Tdk株式会社 电子部件及其制造方法
CN103116041A (zh) * 2011-11-16 2013-05-22 株式会社爱德万测试 测试用载具及测试用载具的装配方法
KR20170037079A (ko) * 2015-09-25 2017-04-04 (주)제이티 소자핸들러

Also Published As

Publication number Publication date
KR20180121360A (ko) 2018-11-07
JP6823534B2 (ja) 2021-02-03
TW201841811A (zh) 2018-12-01
JP2018189391A (ja) 2018-11-29
KR102341037B1 (ko) 2021-12-20
TWI734002B (zh) 2021-07-21
CN108802595A (zh) 2018-11-13

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