CN108414541A - X射线透视检查装置 - Google Patents

X射线透视检查装置 Download PDF

Info

Publication number
CN108414541A
CN108414541A CN201711220434.2A CN201711220434A CN108414541A CN 108414541 A CN108414541 A CN 108414541A CN 201711220434 A CN201711220434 A CN 201711220434A CN 108414541 A CN108414541 A CN 108414541A
Authority
CN
China
Prior art keywords
ray
inspection object
video camera
optical axis
speculum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201711220434.2A
Other languages
English (en)
Chinese (zh)
Inventor
新井佑也
富泽雅美
内田敏徳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba IT and Control Systems Corp
Original Assignee
Toshiba IT and Control Systems Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba IT and Control Systems Corp filed Critical Toshiba IT and Control Systems Corp
Publication of CN108414541A publication Critical patent/CN108414541A/zh
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N2021/1765—Method using an image detector and processing of image signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/03—Investigating materials by wave or particle radiation by transmission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201711220434.2A 2017-02-10 2017-11-28 X射线透视检查装置 Pending CN108414541A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017-022720 2017-02-10
JP2017022720A JP2018128401A (ja) 2017-02-10 2017-02-10 Ｘ線透視検査装置

Publications (1)

Publication Number Publication Date
CN108414541A true CN108414541A (zh) 2018-08-17

Family

ID=63125361

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201711220434.2A Pending CN108414541A (zh) 2017-02-10 2017-11-28 X射线透视检查装置

Country Status (3)

Country Link
JP (1) JP2018128401A (ja)
KR (1) KR101999156B1 (ja)
CN (1) CN108414541A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110715944A (zh) * 2019-10-21 2020-01-21 中国科学院高能物理研究所 一种x射线稳定成像的装置及方法

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7321637B2 (ja) * 2019-01-28 2023-08-07 ヤマハ発動機株式会社 ノズルメンテナンス方法、ノズル検査装置
CN112014404A (zh) * 2020-08-27 2020-12-01 Oppo（重庆）智能科技有限公司 组件检测方法、装置、系统、电子设备及存储介质
WO2024121648A1 (en) * 2022-12-09 2024-06-13 Veolia Nuclear Solutions, Inc. Systems and methods for camera protection in hazardous environments

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1132856A (zh) * 1994-11-23 1996-10-09 唐志宏 X射线(或γ射线)无损检查系统
JPH11295242A (ja) * 1998-04-10 1999-10-29 Matsushita Electric Ind Co Ltd Ｘ線基板検査装置とｘ線用可視光反射膜
CN2549906Y (zh) * 2002-06-01 2003-05-14 大连诚高科技股份有限公司 多路多尺寸图象输出x光透视装置
CN1671323A (zh) * 2002-07-22 2005-09-21 株式会社日立医药 X射线图像诊断装置
CN101581572A (zh) * 2008-05-13 2009-11-18 骏泽科技股份有限公司 一种透视检测系统及方法
CN102870401A (zh) * 2010-04-05 2013-01-09 高通股份有限公司 组合来自多个图像传感器的数据
CN204795370U (zh) * 2014-04-18 2015-11-18 菲力尔系统公司 监测系统及包含其的交通工具

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5953500B2 (ja) * 1978-06-06 1984-12-25 株式会社東芝 Ｘ線透視検査装置
JPH0252246A (ja) * 1988-08-15 1990-02-21 Tokyo Electron Ltd Ｘ線検査装置
JP3456718B2 (ja) * 1993-01-27 2003-10-14 株式会社東芝 Ｘ線撮影装置
JPH1023203A (ja) * 1996-07-01 1998-01-23 Ricoh Co Ltd 紙分類装置
JP2000258584A (ja) * 1999-03-12 2000-09-22 Toshiba Corp 現場点検装置
TW415050B (en) 1999-04-16 2000-12-11 Shen Ming Dung Semiconductor chipset module and the manufacturing method of the same
JP2002005842A (ja) * 2000-06-21 2002-01-09 Techno Ishii:Kk 非接触検出装置
JP2004340583A (ja) * 2003-05-13 2004-12-02 Matsushita Electric Ind Co Ltd Ｘ線測定装置
JP2004347525A (ja) * 2003-05-23 2004-12-09 Toshiba Corp 半導体チップ外観検査方法およびその装置
JP2006177890A (ja) * 2004-12-24 2006-07-06 Jt Engineering Inc 異物検査装置
WO2015098342A1 (ja) * 2013-12-26 2015-07-02 浜松ホトニクス株式会社 画像処理方法、画像処理装置、画像処理プログラム、及び画像処理プログラムを記憶した記憶媒体
JP3204649U (ja) * 2016-03-28 2016-06-09 浜松ホトニクス株式会社 放射線画像取得装置及び撮像ユニット

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1132856A (zh) * 1994-11-23 1996-10-09 唐志宏 X射线(或γ射线)无损检查系统
JPH11295242A (ja) * 1998-04-10 1999-10-29 Matsushita Electric Ind Co Ltd Ｘ線基板検査装置とｘ線用可視光反射膜
CN2549906Y (zh) * 2002-06-01 2003-05-14 大连诚高科技股份有限公司 多路多尺寸图象输出x光透视装置
CN1671323A (zh) * 2002-07-22 2005-09-21 株式会社日立医药 X射线图像诊断装置
CN101581572A (zh) * 2008-05-13 2009-11-18 骏泽科技股份有限公司 一种透视检测系统及方法
CN102870401A (zh) * 2010-04-05 2013-01-09 高通股份有限公司 组合来自多个图像传感器的数据
CN204795370U (zh) * 2014-04-18 2015-11-18 菲力尔系统公司 监测系统及包含其的交通工具

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110715944A (zh) * 2019-10-21 2020-01-21 中国科学院高能物理研究所 一种x射线稳定成像的装置及方法
CN110715944B (zh) * 2019-10-21 2021-03-30 中国科学院高能物理研究所 一种x射线稳定成像的装置及方法

Also Published As

Publication number Publication date
JP2018128401A (ja) 2018-08-16
KR101999156B1 (ko) 2019-07-11
KR20180092801A (ko) 2018-08-20

Similar Documents

Publication Publication Date Title
CN108414541A (zh) X射线透视检查装置
JPH06233330A (ja) 表示装置
EP0166567A2 (en) Imaging system and method
CN103339684B (zh) 闪烁器面板
JP4111832B2 (ja) ３ｄまたは４ｄ画像を見るための電子式仮想レンズ
CN106896398A (zh) 放射线图像取得装置
CN101971614A (zh) 用于获取多层全景图像的设备和用于获取全景图像的方法
WO2012108187A1 (ja) 立体視用画像生成装置および方法、並びにプログラム
US20120027170A1 (en) Radiological image capturing and displaying method and apparatus
Evans Development of a 3-D X-ray system
JP2012165358A (ja) 立体視画像表示装置
JP5658818B2 (ja) 放射線乳房画像表示方法、放射線乳房画像表示装置ならびにプログラム
WO2012056695A1 (ja) 立体視画像表示装置および方法並びにプログラム
JP5695524B2 (ja) 立体視画像表示装置および方法並びにプログラム
KR20060038336A (ko) 의료용 디지털 ｘ선촬영 장치, ｘ선촬영 시스템 및ｘ선형광상을 디지털·데이터로서 촬영하는 방법
JP2012050517A (ja) 放射線画像撮影装置
WO2012056718A1 (ja) 放射線立体視画像表示装置および方法並びにプログラム
WO2012105188A1 (ja) 立体視画像表示装置および方法並びにプログラム
Zhang et al. Image Acquisition Modes
WO2012063419A1 (ja) 立体視画像表示装置および方法並びにプログラム
WO2012056679A1 (ja) 立体視画像表示システムおよび立体視画像用表示装置
JP2000135211A (ja) Ｘ線撮像装置及びｘ線撮像方法並びにｘ線撮像方法を実現するプログラムの記録された記録媒体及び伝送される伝送媒体
JP2012170044A (ja) 立体視画像表示装置
CN117898747A (zh) 呈现目标的方法、装置、系统、存储介质和程序产品
WO2012132453A1 (ja) 放射線乳房画像表示方法、放射線乳房画像表示装置ならびにプログラム

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20180817