CN108151901B - 温度测量电路和方法以及微型计算机单元 - Google Patents

温度测量电路和方法以及微型计算机单元 Download PDF

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Publication number
CN108151901B
CN108151901B CN201711096414.9A CN201711096414A CN108151901B CN 108151901 B CN108151901 B CN 108151901B CN 201711096414 A CN201711096414 A CN 201711096414A CN 108151901 B CN108151901 B CN 108151901B
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temperature
temperature sensor
digital value
circuit
sensor
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CN108151901A (zh
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熊原千明
小山哲弘
平野政明
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Renesas Electronics Corp
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Renesas Electronics Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
    • G01K1/14—Supports; Fastening devices; Arrangements for mounting thermometers in particular locations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G01K15/007—Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/32—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using change of resonant frequency of a crystal

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Semiconductor Integrated Circuits (AREA)
CN201711096414.9A 2016-12-05 2017-11-09 温度测量电路和方法以及微型计算机单元 Active CN108151901B (zh)

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JP2016-235730 2016-12-05
JP2016235730A JP6678094B2 (ja) 2016-12-05 2016-12-05 温度計測回路、方法、及びマイクロコンピュータユニット

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CN108151901A CN108151901A (zh) 2018-06-12
CN108151901B true CN108151901B (zh) 2021-10-29

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US10664027B2 (en) * 2018-10-09 2020-05-26 Intel Corporation Methods, systems and apparatus for dynamic temperature aware functional safety
JP7134160B2 (ja) * 2019-12-18 2022-09-09 本田技研工業株式会社 ガス制御装置及びガス制御方法
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KR102804069B1 (ko) 2019-12-27 2025-05-09 삼성전자주식회사 빌트-인 셀프 테스트 회로 및 이를 포함하는 온도 측정 회로
CN111787428B (zh) * 2020-06-24 2022-03-08 Oppo广东移动通信有限公司 用户终端设备
DE112022003987T5 (de) * 2021-08-16 2024-06-06 Rohm Co., Ltd. Halbleitervorrichtung und fahrzeuggerät
US20230366754A1 (en) * 2022-05-11 2023-11-16 Cirrus Logic International Semiconductor Ltd. Single-point temperature calibration of resistance-based temperature measurements
EP4296639B1 (en) * 2022-06-20 2025-01-29 Carrier Corporation Temperature sensor testing
CN115183899B (zh) * 2022-08-24 2025-08-08 威海威高瑞影医疗科技有限公司 一种体温检测方法、装置、介质及体温检测仪
CN117824870A (zh) * 2022-09-27 2024-04-05 华为技术有限公司 检测电路及其控制方法、车载终端设备
CN118706292B (zh) * 2024-08-30 2025-01-21 中国计量大学 基于柔性温度传感器的动力系统温度原位校准装置及方法

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US10670478B2 (en) 2020-06-02
JP2018091741A (ja) 2018-06-14
CN108151901A (zh) 2018-06-12
US20180156675A1 (en) 2018-06-07
JP6678094B2 (ja) 2020-04-08

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