CN102466523A - 温度检测装置 - Google Patents
温度检测装置 Download PDFInfo
- Publication number
- CN102466523A CN102466523A CN2011103291950A CN201110329195A CN102466523A CN 102466523 A CN102466523 A CN 102466523A CN 2011103291950 A CN2011103291950 A CN 2011103291950A CN 201110329195 A CN201110329195 A CN 201110329195A CN 102466523 A CN102466523 A CN 102466523A
- Authority
- CN
- China
- Prior art keywords
- temperature
- circuit
- detecting device
- voltage
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
- G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
- G05F1/567—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/32—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using change of resonant frequency of a crystal
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K2215/00—Details concerning sensor power supply
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Electromagnetism (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Control Of Temperature (AREA)
- Oscillators With Electromechanical Resonators (AREA)
- Electronic Switches (AREA)
Abstract
Description
Claims (7)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010242622 | 2010-10-28 | ||
JP2010-242622 | 2010-10-28 | ||
JP2011-054907 | 2011-03-13 | ||
JP2011054907A JP2012108087A (ja) | 2010-10-28 | 2011-03-13 | 温度検知装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102466523A true CN102466523A (zh) | 2012-05-23 |
CN102466523B CN102466523B (zh) | 2015-04-29 |
Family
ID=45996033
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201110329195.0A Active CN102466523B (zh) | 2010-10-28 | 2011-10-26 | 温度检测装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US8531234B2 (zh) |
JP (1) | JP2012108087A (zh) |
KR (1) | KR101861370B1 (zh) |
CN (1) | CN102466523B (zh) |
TW (1) | TWI536135B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108151901A (zh) * | 2016-12-05 | 2018-06-12 | 瑞萨电子株式会社 | 温度测量电路和方法以及微型计算机单元 |
CN111258364A (zh) * | 2018-11-30 | 2020-06-09 | 艾普凌科有限公司 | 过热保护电路以及具备该过热保护电路的半导体装置 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4636461B2 (ja) * | 2009-01-13 | 2011-02-23 | セイコーインスツル株式会社 | 電源電圧監視回路、および該電源電圧監視回路を備える電子回路 |
US9148057B2 (en) * | 2011-03-03 | 2015-09-29 | SK Hynix Inc. | Semiconductor apparatus |
KR20130073395A (ko) * | 2011-12-23 | 2013-07-03 | 에스케이하이닉스 주식회사 | 반도체 장치 |
DE102013100045B4 (de) * | 2012-12-18 | 2022-07-14 | Endress + Hauser Wetzer Gmbh + Co Kg | Verfahren und Vorrichtung zur Bestimmung einer Prozessgröße |
JP6557562B2 (ja) * | 2015-03-17 | 2019-08-07 | ルネサスエレクトロニクス株式会社 | 送信回路及び半導体装置 |
JP7207576B2 (ja) * | 2020-02-04 | 2023-01-18 | 富士電機株式会社 | 検出回路、スイッチング制御回路、電源回路 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6078208A (en) * | 1998-05-28 | 2000-06-20 | Microchip Technology Incorporated | Precision temperature sensor integrated circuit |
CN1461011A (zh) * | 2002-05-14 | 2003-12-10 | 恩益禧电子股份有限公司 | 具有两个基准电压产生电路的内部电源电压控制装置 |
US20030234680A1 (en) * | 2002-05-29 | 2003-12-25 | Ricardo Erckert | Reference voltage circuit and method of generating a reference voltage |
US20070182477A1 (en) * | 2006-02-05 | 2007-08-09 | Hynix Semiconductor Inc. | Band gap reference circuit for low voltage and semiconductor device including the same |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59120833A (ja) * | 1982-12-27 | 1984-07-12 | Omron Tateisi Electronics Co | 電子温度計 |
JPH0713643A (ja) | 1993-06-29 | 1995-01-17 | Mitsubishi Electric Corp | 半導体集積回路の過熱保護回路 |
US5455801A (en) * | 1994-07-15 | 1995-10-03 | Micron Semiconductor, Inc. | Circuit having a control array of memory cells and a current source and a method for generating a self-refresh timing signal |
GB9505769D0 (en) * | 1995-03-22 | 1995-05-10 | Switched Reluctance Drives Ltd | Pulsed temperature monitoring circuit and method |
JP3554123B2 (ja) * | 1996-12-11 | 2004-08-18 | ローム株式会社 | 定電圧回路 |
US6052035A (en) * | 1998-03-19 | 2000-04-18 | Microchip Technology Incorporated | Oscillator with clock output inhibition control |
US6412977B1 (en) * | 1998-04-14 | 2002-07-02 | The Goodyear Tire & Rubber Company | Method for measuring temperature with an integrated circuit device |
JP3621586B2 (ja) * | 1998-06-02 | 2005-02-16 | グローリー工業株式会社 | 抵抗値測定回路及びその測定方法 |
US6695475B2 (en) * | 2001-05-31 | 2004-02-24 | Stmicroelectronics, Inc. | Temperature sensing circuit and method |
JP4824230B2 (ja) | 2001-09-27 | 2011-11-30 | オンセミコンダクター・トレーディング・リミテッド | 温度検知回路 |
US6630859B1 (en) * | 2002-01-24 | 2003-10-07 | Taiwan Semiconductor Manufacturing Company | Low voltage supply band gap circuit at low power process |
US6853258B2 (en) * | 2002-02-15 | 2005-02-08 | Analog Devices, Inc. | Stable oscillator |
JP2004294117A (ja) * | 2003-03-25 | 2004-10-21 | Sony Corp | 温度検出回路および記憶装置 |
US7285943B2 (en) * | 2003-04-18 | 2007-10-23 | Semiconductor Components Industries, L.L.C. | Method of forming a reference voltage and structure therefor |
TW200524139A (en) * | 2003-12-24 | 2005-07-16 | Renesas Tech Corp | Voltage generating circuit and semiconductor integrated circuit |
KR100666928B1 (ko) * | 2004-02-19 | 2007-01-10 | 주식회사 하이닉스반도체 | 온도변화에 따라 최적의 리프레쉬 주기를 가지는 반도체메모리 장치 |
KR100791918B1 (ko) * | 2006-05-08 | 2008-01-04 | 삼성전자주식회사 | 셀프 보정 기능을 가지는 온도 센서 회로 및 그 방법 |
US7583135B2 (en) * | 2006-10-03 | 2009-09-01 | Analog Devices, Inc. | Auto-nulled bandgap reference system and strobed bandgap reference circuit |
JP4253739B2 (ja) * | 2006-10-05 | 2009-04-15 | Okiセミコンダクタ株式会社 | 発振回路 |
US7637658B2 (en) * | 2007-04-23 | 2009-12-29 | Texas Instruments Incorporated | Systems and methods for PWM clocking in a temperature measurement circuit |
JP2009098802A (ja) * | 2007-10-15 | 2009-05-07 | Toshiba Corp | 基準電圧発生回路 |
JP5213175B2 (ja) * | 2008-11-14 | 2013-06-19 | セイコーインスツル株式会社 | 温度センサ |
JP2010151458A (ja) * | 2008-12-24 | 2010-07-08 | Seiko Instruments Inc | 温度検出回路 |
-
2011
- 2011-03-13 JP JP2011054907A patent/JP2012108087A/ja not_active Withdrawn
- 2011-09-19 US US13/236,043 patent/US8531234B2/en active Active
- 2011-10-04 TW TW100135913A patent/TWI536135B/zh active
- 2011-10-25 KR KR1020110109304A patent/KR101861370B1/ko active IP Right Grant
- 2011-10-26 CN CN201110329195.0A patent/CN102466523B/zh active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6078208A (en) * | 1998-05-28 | 2000-06-20 | Microchip Technology Incorporated | Precision temperature sensor integrated circuit |
CN1461011A (zh) * | 2002-05-14 | 2003-12-10 | 恩益禧电子股份有限公司 | 具有两个基准电压产生电路的内部电源电压控制装置 |
US20030234680A1 (en) * | 2002-05-29 | 2003-12-25 | Ricardo Erckert | Reference voltage circuit and method of generating a reference voltage |
US20070182477A1 (en) * | 2006-02-05 | 2007-08-09 | Hynix Semiconductor Inc. | Band gap reference circuit for low voltage and semiconductor device including the same |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108151901A (zh) * | 2016-12-05 | 2018-06-12 | 瑞萨电子株式会社 | 温度测量电路和方法以及微型计算机单元 |
CN108151901B (zh) * | 2016-12-05 | 2021-10-29 | 瑞萨电子株式会社 | 温度测量电路和方法以及微型计算机单元 |
CN111258364A (zh) * | 2018-11-30 | 2020-06-09 | 艾普凌科有限公司 | 过热保护电路以及具备该过热保护电路的半导体装置 |
CN111258364B (zh) * | 2018-11-30 | 2023-09-15 | 艾普凌科有限公司 | 过热保护电路以及具备该过热保护电路的半导体装置 |
Also Published As
Publication number | Publication date |
---|---|
TW201234157A (en) | 2012-08-16 |
KR20120044894A (ko) | 2012-05-08 |
KR101861370B1 (ko) | 2018-05-28 |
US8531234B2 (en) | 2013-09-10 |
TWI536135B (zh) | 2016-06-01 |
US20120105132A1 (en) | 2012-05-03 |
JP2012108087A (ja) | 2012-06-07 |
CN102466523B (zh) | 2015-04-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160323 Address after: Chiba County, Japan Patentee after: DynaFine Semiconductor Co.,Ltd. Address before: Chiba County, Japan Patentee before: Seiko Instruments Inc. |
|
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: Chiba County, Japan Patentee after: ABLIC Inc. Address before: Chiba County, Japan Patentee before: DynaFine Semiconductor Co.,Ltd. |
|
CP02 | Change in the address of a patent holder | ||
CP02 | Change in the address of a patent holder |
Address after: Nagano Patentee after: ABLIC Inc. Address before: Chiba County, Japan Patentee before: ABLIC Inc. |