CN107924921B - 基于金属栅极工艺的低成本闪速存储器制造流程 - Google Patents

基于金属栅极工艺的低成本闪速存储器制造流程 Download PDF

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CN107924921B
CN107924921B CN201680045464.1A CN201680045464A CN107924921B CN 107924921 B CN107924921 B CN 107924921B CN 201680045464 A CN201680045464 A CN 201680045464A CN 107924921 B CN107924921 B CN 107924921B
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drain
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CN107924921A (zh
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N·谭
W·田
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Texas Instruments Inc
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CN201680045464.1A 2015-08-05 2016-08-05 基于金属栅极工艺的低成本闪速存储器制造流程 Active CN107924921B (zh)

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US14/819,401 US9431253B1 (en) 2015-08-05 2015-08-05 Fabrication flow based on metal gate process for making low cost flash memory
PCT/US2016/045895 WO2017024274A1 (en) 2015-08-05 2016-08-05 Low cost flash memory fabrication flow based on metal gate process

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US10868027B2 (en) * 2018-07-13 2020-12-15 Taiwan Semiconductor Manufacturing Co., Ltd. Structure and method for preventing silicide contamination during the manufacture of micro-processors with embedded flash memory
EP3742476B1 (en) * 2019-05-20 2024-11-06 Infineon Technologies AG Method of implanting an implant species into a substrate at different depths
CN113130516A (zh) 2020-01-15 2021-07-16 联华电子股份有限公司 半导体影像感测元件及其制作方法
US20250351346A1 (en) * 2024-05-10 2025-11-13 Stmicroelectronics International N.V. Non-volatile memory cell with single poly floating gate and contact control gate

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US9431253B1 (en) 2016-08-30
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