CN106662601A - 物理量传感器 - Google Patents
物理量传感器 Download PDFInfo
- Publication number
- CN106662601A CN106662601A CN201580030809.1A CN201580030809A CN106662601A CN 106662601 A CN106662601 A CN 106662601A CN 201580030809 A CN201580030809 A CN 201580030809A CN 106662601 A CN106662601 A CN 106662601A
- Authority
- CN
- China
- Prior art keywords
- mentioned
- angular
- rate sensor
- acceleration transducer
- physical quantity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000001133 acceleration Effects 0.000 claims abstract description 98
- 239000000758 substrate Substances 0.000 claims description 49
- 239000007767 bonding agent Substances 0.000 claims description 30
- 230000002093 peripheral effect Effects 0.000 claims description 11
- 229910052751 metal Inorganic materials 0.000 claims description 8
- 239000002184 metal Substances 0.000 claims description 8
- 238000000034 method Methods 0.000 claims description 4
- 238000001514 detection method Methods 0.000 abstract description 29
- 230000005540 biological transmission Effects 0.000 abstract description 8
- 239000004065 semiconductor Substances 0.000 description 6
- 238000006073 displacement reaction Methods 0.000 description 5
- 230000003071 parasitic effect Effects 0.000 description 5
- 238000010276 construction Methods 0.000 description 4
- 238000005538 encapsulation Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000003466 welding Methods 0.000 description 3
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 230000000994 depressogenic effect Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 2
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 230000003213 activating effect Effects 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5607—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks
- G01C19/5621—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks the devices involving a micromechanical structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/02—Microstructural systems; Auxiliary parts of microstructural devices or systems containing distinct electrical or optical devices of particular relevance for their function, e.g. microelectro-mechanical systems [MEMS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5607—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces using vibrating tuning forks
- G01C19/5628—Manufacturing; Trimming; Mounting; Housings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
- G01C19/5783—Mountings or housings not specific to any of the devices covered by groups G01C19/5607 - G01C19/5719
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/071—Mounting of piezoelectric or electrostrictive parts together with semiconductor elements, or other circuit elements, on a common substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/01—Manufacture or treatment
- H10N30/07—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
- H10N30/072—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
- H10N30/073—Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies by fusion of metals or by adhesives
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/101—Piezoelectric or electrostrictive devices with electrical and mechanical input and output, e.g. having combined actuator and sensor parts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/30—Piezoelectric or electrostrictive devices with mechanical input and electrical output, e.g. functioning as generators or sensors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N30/00—Piezoelectric or electrostrictive devices
- H10N30/80—Constructional details
- H10N30/88—Mounts; Supports; Enclosures; Casings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P2015/0805—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration
- G01P2015/0808—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate
- G01P2015/0811—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass
- G01P2015/0814—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values being provided with a particular type of spring-mass-system for defining the displacement of a seismic mass due to an external acceleration for defining in-plane movement of the mass, i.e. movement of the mass in the plane of the substrate for one single degree of freedom of movement of the mass for translational movement of the mass, e.g. shuttle type
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Gyroscopes (AREA)
- Pressure Sensors (AREA)
- Micromachines (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2014-121688 | 2014-06-12 | ||
| JP2014121688A JP6311469B2 (ja) | 2014-06-12 | 2014-06-12 | 物理量センサ |
| PCT/JP2015/002921 WO2015190105A1 (ja) | 2014-06-12 | 2015-06-11 | 物理量センサ |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106662601A true CN106662601A (zh) | 2017-05-10 |
Family
ID=54833216
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201580030809.1A Pending CN106662601A (zh) | 2014-06-12 | 2015-06-11 | 物理量传感器 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US20170074653A1 (enExample) |
| JP (1) | JP6311469B2 (enExample) |
| CN (1) | CN106662601A (enExample) |
| DE (1) | DE112015002777T5 (enExample) |
| MY (1) | MY186015A (enExample) |
| WO (1) | WO2015190105A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6464749B2 (ja) * | 2015-01-06 | 2019-02-06 | セイコーエプソン株式会社 | 物理量センサー、電子機器および移動体 |
| JP6641878B2 (ja) * | 2015-10-21 | 2020-02-05 | セイコーエプソン株式会社 | 物理量センサー、電子機器および移動体 |
| US10352960B1 (en) * | 2015-10-30 | 2019-07-16 | Garmin International, Inc. | Free mass MEMS accelerometer |
| US10495663B2 (en) * | 2016-02-19 | 2019-12-03 | The Regents Of The University Of Michigan | High aspect-ratio low noise multi-axis accelerometers |
| JP2019120559A (ja) * | 2017-12-28 | 2019-07-22 | セイコーエプソン株式会社 | 物理量センサー、物理量センサーの製造方法、物理量センサーデバイス、電子機器および移動体 |
| US11493531B2 (en) * | 2019-11-07 | 2022-11-08 | Honeywell International Inc. | Resonator electrode configuration to avoid capacitive feedthrough for vibrating beam accelerometers |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5531091A (en) * | 1993-09-28 | 1996-07-02 | Robert Bosch Gmbh | Sensor with quartz tuning fork |
| JP2008082812A (ja) * | 2006-09-27 | 2008-04-10 | Denso Corp | センサ装置およびその製造方法 |
| CN101189489A (zh) * | 2005-06-09 | 2008-05-28 | 松下电器产业株式会社 | 复合传感器 |
| JP2009103530A (ja) * | 2007-10-22 | 2009-05-14 | Denso Corp | センサ装置 |
| CN101796374A (zh) * | 2007-09-03 | 2010-08-04 | 松下电器产业株式会社 | 惯性力传感器 |
| CN101821586A (zh) * | 2007-10-10 | 2010-09-01 | 松下电器产业株式会社 | 角速度及加速度检测用复合传感器 |
| JP2011117858A (ja) * | 2009-12-04 | 2011-06-16 | Seiko Epson Corp | 物理量検出装置 |
| TW201245725A (en) * | 2011-03-11 | 2012-11-16 | Panasonic Corp | Sensor |
| CN103575261A (zh) * | 2012-07-23 | 2014-02-12 | 精工爱普生株式会社 | 振动片及其制法、振子、电子装置、电子设备及移动体 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4534912B2 (ja) * | 2005-08-30 | 2010-09-01 | 株式会社デンソー | 角速度センサの取付構造 |
| JP2007248328A (ja) * | 2006-03-17 | 2007-09-27 | Matsushita Electric Ind Co Ltd | 複合センサ |
| WO2012049825A1 (ja) * | 2010-10-15 | 2012-04-19 | 日立オートモティブシステムズ株式会社 | 物理量検出装置 |
-
2014
- 2014-06-12 JP JP2014121688A patent/JP6311469B2/ja active Active
-
2015
- 2015-06-11 CN CN201580030809.1A patent/CN106662601A/zh active Pending
- 2015-06-11 MY MYPI2016704072A patent/MY186015A/en unknown
- 2015-06-11 US US15/308,866 patent/US20170074653A1/en not_active Abandoned
- 2015-06-11 DE DE112015002777.7T patent/DE112015002777T5/de not_active Ceased
- 2015-06-11 WO PCT/JP2015/002921 patent/WO2015190105A1/ja not_active Ceased
-
2019
- 2019-06-18 US US16/444,160 patent/US20190301866A1/en not_active Abandoned
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5531091A (en) * | 1993-09-28 | 1996-07-02 | Robert Bosch Gmbh | Sensor with quartz tuning fork |
| CN101189489A (zh) * | 2005-06-09 | 2008-05-28 | 松下电器产业株式会社 | 复合传感器 |
| JP2008082812A (ja) * | 2006-09-27 | 2008-04-10 | Denso Corp | センサ装置およびその製造方法 |
| CN101796374A (zh) * | 2007-09-03 | 2010-08-04 | 松下电器产业株式会社 | 惯性力传感器 |
| CN101821586A (zh) * | 2007-10-10 | 2010-09-01 | 松下电器产业株式会社 | 角速度及加速度检测用复合传感器 |
| JP2009103530A (ja) * | 2007-10-22 | 2009-05-14 | Denso Corp | センサ装置 |
| JP2011117858A (ja) * | 2009-12-04 | 2011-06-16 | Seiko Epson Corp | 物理量検出装置 |
| TW201245725A (en) * | 2011-03-11 | 2012-11-16 | Panasonic Corp | Sensor |
| CN103575261A (zh) * | 2012-07-23 | 2014-02-12 | 精工爱普生株式会社 | 振动片及其制法、振子、电子装置、电子设备及移动体 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6311469B2 (ja) | 2018-04-18 |
| WO2015190105A1 (ja) | 2015-12-17 |
| US20170074653A1 (en) | 2017-03-16 |
| JP2016001156A (ja) | 2016-01-07 |
| DE112015002777T5 (de) | 2017-03-02 |
| US20190301866A1 (en) | 2019-10-03 |
| MY186015A (en) | 2021-06-14 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20170510 |