CN106373954A - 一种采用纳米银焊膏的烧结式igbt模块及制备方法 - Google Patents
一种采用纳米银焊膏的烧结式igbt模块及制备方法 Download PDFInfo
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- CN106373954A CN106373954A CN201610898201.7A CN201610898201A CN106373954A CN 106373954 A CN106373954 A CN 106373954A CN 201610898201 A CN201610898201 A CN 201610898201A CN 106373954 A CN106373954 A CN 106373954A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
- H01L25/162—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits the devices being mounted on two or more different substrates
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/29139—Silver [Ag] as principal constituent
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/832—Applying energy for connecting
- H01L2224/83201—Compression bonding
- H01L2224/83203—Thermocompression bonding, e.g. diffusion bonding, pressure joining, thermocompression welding or solid-state welding
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CN201610898201.7A CN106373954A (zh) | 2016-10-14 | 2016-10-14 | 一种采用纳米银焊膏的烧结式igbt模块及制备方法 |
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CN201610898201.7A CN106373954A (zh) | 2016-10-14 | 2016-10-14 | 一种采用纳米银焊膏的烧结式igbt模块及制备方法 |
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Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106825998A (zh) * | 2017-02-28 | 2017-06-13 | 哈尔滨工业大学深圳研究生院 | 一种用作大功率芯片封装的无氧化纳米铜焊膏及其制备方法 |
CN107731695A (zh) * | 2017-11-06 | 2018-02-23 | 安徽华东光电技术研究所 | 共晶芯片组件的烧结方法 |
CN107731701A (zh) * | 2017-09-18 | 2018-02-23 | 全球能源互联网研究院有限公司 | 一种半导体器件的烧结方法及半导体器件的制造方法 |
CN107731696A (zh) * | 2017-09-13 | 2018-02-23 | 全球能源互联网研究院有限公司 | 一种功率芯片封装方法和结构 |
CN107749399A (zh) * | 2017-09-13 | 2018-03-02 | 全球能源互联网研究院有限公司 | 一种功率芯片封装方法和结构 |
CN107799428A (zh) * | 2017-09-13 | 2018-03-13 | 全球能源互联网研究院有限公司 | 一种功率芯片封装方法和结构 |
CN107845617A (zh) * | 2017-09-19 | 2018-03-27 | 全球能源互联网研究院有限公司 | 一种芯片烧结品、子单元、igbt封装模块及制备方法 |
CN108063096A (zh) * | 2017-11-15 | 2018-05-22 | 全球能源互联网研究院有限公司 | 一种半导体功率器件子模组及其生产方法及压接式igbt模块 |
WO2018161416A1 (zh) | 2017-03-09 | 2018-09-13 | 宁波新瑞清科金属材料有限公司 | 一种具有反熔特性的液态金属热界面材料及其制备方法 |
CN109962020A (zh) * | 2017-12-14 | 2019-07-02 | 华为技术有限公司 | 一种用于封装芯片的方法 |
CN109979846A (zh) * | 2017-12-28 | 2019-07-05 | 全球能源互联网研究院有限公司 | 烧结卡具、压接式igbt模块单面烧结方法及制得的子模组 |
CN109979826A (zh) * | 2017-12-28 | 2019-07-05 | 全球能源互联网研究院有限公司 | 双面烧结卡具、压接式igbt模块烧结方法及其制得的子模组 |
CN109994373A (zh) * | 2019-04-12 | 2019-07-09 | 中国电子科技集团公司第三十八研究所 | 一种微组装裸芯片连接及返修方法 |
CN110508970A (zh) * | 2019-07-15 | 2019-11-29 | 天津大学 | 一种三峰体系混合银焊膏及其应用 |
CN110640354A (zh) * | 2019-08-27 | 2020-01-03 | 北京康普锡威科技有限公司 | 一种预成型焊料及其制备方法 |
CN112420619A (zh) * | 2020-10-30 | 2021-02-26 | 北京时代民芯科技有限公司 | 立体集成阵列式整流二极管模组封装结构及方法 |
CN113066785A (zh) * | 2021-03-18 | 2021-07-02 | 重庆大学 | 压接型功率半导体模块结构及其子单元和制作方法 |
CN118248574A (zh) * | 2024-05-29 | 2024-06-25 | 诚联恺达科技有限公司 | 一种纳米级银烧结方法、芯片及焊接设备 |
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CN102738099A (zh) * | 2012-06-05 | 2012-10-17 | 嘉兴斯达微电子有限公司 | 一种新型高可靠功率模块 |
CN103035587A (zh) * | 2012-12-11 | 2013-04-10 | 国网智能电网研究院 | 一种大功率igbt模块封装结构 |
CN104392942A (zh) * | 2014-11-05 | 2015-03-04 | 天津大学 | 无压低温烧结纳米银焊膏封装大功率igbt器件的方法 |
CN105479026A (zh) * | 2015-12-09 | 2016-04-13 | 天津大学 | 一种提高纳米银浆与化学镀镍金基板连接强度的方法 |
CN105514095A (zh) * | 2015-12-18 | 2016-04-20 | 华北电力大学 | 一种凸台高度可变的压接式igbt模块 |
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CN102738099A (zh) * | 2012-06-05 | 2012-10-17 | 嘉兴斯达微电子有限公司 | 一种新型高可靠功率模块 |
CN103035587A (zh) * | 2012-12-11 | 2013-04-10 | 国网智能电网研究院 | 一种大功率igbt模块封装结构 |
CN104392942A (zh) * | 2014-11-05 | 2015-03-04 | 天津大学 | 无压低温烧结纳米银焊膏封装大功率igbt器件的方法 |
CN105479026A (zh) * | 2015-12-09 | 2016-04-13 | 天津大学 | 一种提高纳米银浆与化学镀镍金基板连接强度的方法 |
CN105514095A (zh) * | 2015-12-18 | 2016-04-20 | 华北电力大学 | 一种凸台高度可变的压接式igbt模块 |
Cited By (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106825998A (zh) * | 2017-02-28 | 2017-06-13 | 哈尔滨工业大学深圳研究生院 | 一种用作大功率芯片封装的无氧化纳米铜焊膏及其制备方法 |
CN106825998B (zh) * | 2017-02-28 | 2019-04-05 | 哈尔滨工业大学深圳研究生院 | 一种用作大功率芯片封装的无氧化纳米铜焊膏及其制备方法 |
WO2018161416A1 (zh) | 2017-03-09 | 2018-09-13 | 宁波新瑞清科金属材料有限公司 | 一种具有反熔特性的液态金属热界面材料及其制备方法 |
CN107799428B (zh) * | 2017-09-13 | 2020-08-25 | 全球能源互联网研究院有限公司 | 一种功率芯片封装方法和结构 |
CN107731696B (zh) * | 2017-09-13 | 2020-08-25 | 全球能源互联网研究院有限公司 | 一种功率芯片封装方法和结构 |
CN107731696A (zh) * | 2017-09-13 | 2018-02-23 | 全球能源互联网研究院有限公司 | 一种功率芯片封装方法和结构 |
CN107749399A (zh) * | 2017-09-13 | 2018-03-02 | 全球能源互联网研究院有限公司 | 一种功率芯片封装方法和结构 |
CN107799428A (zh) * | 2017-09-13 | 2018-03-13 | 全球能源互联网研究院有限公司 | 一种功率芯片封装方法和结构 |
CN107749399B (zh) * | 2017-09-13 | 2020-08-25 | 全球能源互联网研究院有限公司 | 一种功率芯片封装方法和结构 |
CN107731701A (zh) * | 2017-09-18 | 2018-02-23 | 全球能源互联网研究院有限公司 | 一种半导体器件的烧结方法及半导体器件的制造方法 |
CN107845617A (zh) * | 2017-09-19 | 2018-03-27 | 全球能源互联网研究院有限公司 | 一种芯片烧结品、子单元、igbt封装模块及制备方法 |
CN107731695B (zh) * | 2017-11-06 | 2019-12-27 | 安徽华东光电技术研究所有限公司 | 共晶芯片组件的烧结方法 |
CN107731695A (zh) * | 2017-11-06 | 2018-02-23 | 安徽华东光电技术研究所 | 共晶芯片组件的烧结方法 |
CN108063096A (zh) * | 2017-11-15 | 2018-05-22 | 全球能源互联网研究院有限公司 | 一种半导体功率器件子模组及其生产方法及压接式igbt模块 |
CN109962020A (zh) * | 2017-12-14 | 2019-07-02 | 华为技术有限公司 | 一种用于封装芯片的方法 |
CN109979826A (zh) * | 2017-12-28 | 2019-07-05 | 全球能源互联网研究院有限公司 | 双面烧结卡具、压接式igbt模块烧结方法及其制得的子模组 |
CN109979846A (zh) * | 2017-12-28 | 2019-07-05 | 全球能源互联网研究院有限公司 | 烧结卡具、压接式igbt模块单面烧结方法及制得的子模组 |
CN109994373A (zh) * | 2019-04-12 | 2019-07-09 | 中国电子科技集团公司第三十八研究所 | 一种微组装裸芯片连接及返修方法 |
CN110508970A (zh) * | 2019-07-15 | 2019-11-29 | 天津大学 | 一种三峰体系混合银焊膏及其应用 |
CN110640354A (zh) * | 2019-08-27 | 2020-01-03 | 北京康普锡威科技有限公司 | 一种预成型焊料及其制备方法 |
CN112420619A (zh) * | 2020-10-30 | 2021-02-26 | 北京时代民芯科技有限公司 | 立体集成阵列式整流二极管模组封装结构及方法 |
CN113066785A (zh) * | 2021-03-18 | 2021-07-02 | 重庆大学 | 压接型功率半导体模块结构及其子单元和制作方法 |
CN118248574A (zh) * | 2024-05-29 | 2024-06-25 | 诚联恺达科技有限公司 | 一种纳米级银烧结方法、芯片及焊接设备 |
CN118248574B (zh) * | 2024-05-29 | 2024-08-13 | 诚联恺达科技有限公司 | 一种纳米级银烧结方法、芯片及焊接设备 |
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