CN106057660A - 半导体衬底的制造方法 - Google Patents

半导体衬底的制造方法 Download PDF

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Publication number
CN106057660A
CN106057660A CN201610191515.3A CN201610191515A CN106057660A CN 106057660 A CN106057660 A CN 106057660A CN 201610191515 A CN201610191515 A CN 201610191515A CN 106057660 A CN106057660 A CN 106057660A
Authority
CN
China
Prior art keywords
semiconductor substrate
agent composition
impurity diffusion
diffusing agent
diffusion component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610191515.3A
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English (en)
Chinese (zh)
Inventor
泽田佳宏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Ohka Kogyo Co Ltd
Original Assignee
Tokyo Ohka Kogyo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Ohka Kogyo Co Ltd filed Critical Tokyo Ohka Kogyo Co Ltd
Publication of CN106057660A publication Critical patent/CN106057660A/zh
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/22Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
    • H01L21/225Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photovoltaic Devices (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
CN201610191515.3A 2015-04-03 2016-03-30 半导体衬底的制造方法 Pending CN106057660A (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2015076884 2015-04-03
JP2015-076884 2015-04-03
JP2016046024A JP6616712B2 (ja) 2015-04-03 2016-03-09 半導体基板の製造方法
JP2016-046024 2016-03-09

Publications (1)

Publication Number Publication Date
CN106057660A true CN106057660A (zh) 2016-10-26

Family

ID=57358609

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610191515.3A Pending CN106057660A (zh) 2015-04-03 2016-03-30 半导体衬底的制造方法

Country Status (3)

Country Link
JP (1) JP6616712B2 (ja)
CN (1) CN106057660A (ja)
TW (1) TW201705224A (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6986425B2 (ja) * 2016-12-22 2021-12-22 東京応化工業株式会社 不純物拡散剤組成物、及び半導体基板の製造方法

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0555158A (ja) * 1991-08-23 1993-03-05 Tokyo Electron Ltd 半導体装置の製造方法
US6090677A (en) * 1998-04-29 2000-07-18 Micron Technology, Inc. Methods of thermal processing and rapid thermal processing
US20010024728A1 (en) * 1999-08-02 2001-09-27 Nippon Sheet Glass Co., Ltd., Japan Article coated with water-repellent film, liquid composition for coating with water-repellent film, and process for producing article coated with water-repellent film
JP2008218863A (ja) * 2007-03-07 2008-09-18 Shin Etsu Chem Co Ltd 単結晶シリコン太陽電池の製造方法及び単結晶シリコン太陽電池
JP2009253145A (ja) * 2008-04-09 2009-10-29 Tokyo Ohka Kogyo Co Ltd 拡散層形成時の前処理方法
WO2010007956A1 (ja) * 2008-07-17 2010-01-21 旭硝子株式会社 撥水性基体およびその製造方法
US20100081264A1 (en) * 2008-09-30 2010-04-01 Honeywell International Inc. Methods for simultaneously forming n-type and p-type doped regions using non-contact printing processes
WO2013038613A1 (ja) * 2011-09-12 2013-03-21 東京応化工業株式会社 拡散剤組成物、不純物拡散層の形成方法および太陽電池
US20130280883A1 (en) * 2012-04-24 2013-10-24 Globalfoundries Inc. Methods of forming bulk finfet devices so as to reduce punch through leakage currents

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0555158A (ja) * 1991-08-23 1993-03-05 Tokyo Electron Ltd 半導体装置の製造方法
US6090677A (en) * 1998-04-29 2000-07-18 Micron Technology, Inc. Methods of thermal processing and rapid thermal processing
US20010024728A1 (en) * 1999-08-02 2001-09-27 Nippon Sheet Glass Co., Ltd., Japan Article coated with water-repellent film, liquid composition for coating with water-repellent film, and process for producing article coated with water-repellent film
JP2008218863A (ja) * 2007-03-07 2008-09-18 Shin Etsu Chem Co Ltd 単結晶シリコン太陽電池の製造方法及び単結晶シリコン太陽電池
JP2009253145A (ja) * 2008-04-09 2009-10-29 Tokyo Ohka Kogyo Co Ltd 拡散層形成時の前処理方法
WO2010007956A1 (ja) * 2008-07-17 2010-01-21 旭硝子株式会社 撥水性基体およびその製造方法
US20100081264A1 (en) * 2008-09-30 2010-04-01 Honeywell International Inc. Methods for simultaneously forming n-type and p-type doped regions using non-contact printing processes
WO2013038613A1 (ja) * 2011-09-12 2013-03-21 東京応化工業株式会社 拡散剤組成物、不純物拡散層の形成方法および太陽電池
US20130280883A1 (en) * 2012-04-24 2013-10-24 Globalfoundries Inc. Methods of forming bulk finfet devices so as to reduce punch through leakage currents

Also Published As

Publication number Publication date
JP2016197714A (ja) 2016-11-24
TW201705224A (zh) 2017-02-01
JP6616712B2 (ja) 2019-12-04

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Application publication date: 20161026