CN105102189B - 模板组件及模板组件的制造方法 - Google Patents
模板组件及模板组件的制造方法 Download PDFInfo
- Publication number
- CN105102189B CN105102189B CN201480016816.1A CN201480016816A CN105102189B CN 105102189 B CN105102189 B CN 105102189B CN 201480016816 A CN201480016816 A CN 201480016816A CN 105102189 B CN105102189 B CN 105102189B
- Authority
- CN
- China
- Prior art keywords
- template
- template portion
- liner
- notch part
- ring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B31/00—Machines or devices designed for polishing or abrading surfaces on work by means of tumbling apparatus or other apparatus in which the work and/or the abrasive material is loose; Accessories therefor
- B24B31/12—Accessories; Protective equipment or safety devices; Installations for exhaustion of dust or for sound absorption specially adapted for machines covered by group B24B31/00
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2013-060418 | 2013-03-22 | ||
JP2013060418A JP5821883B2 (ja) | 2013-03-22 | 2013-03-22 | テンプレートアセンブリ及びテンプレートアセンブリの製造方法 |
PCT/JP2014/000997 WO2014147969A1 (ja) | 2013-03-22 | 2014-02-26 | テンプレートアセンブリ及びテンプレートアセンブリの製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN105102189A CN105102189A (zh) | 2015-11-25 |
CN105102189B true CN105102189B (zh) | 2017-05-10 |
Family
ID=51579672
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201480016816.1A Active CN105102189B (zh) | 2013-03-22 | 2014-02-26 | 模板组件及模板组件的制造方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US20160008947A1 (de) |
JP (1) | JP5821883B2 (de) |
KR (1) | KR102058923B1 (de) |
CN (1) | CN105102189B (de) |
DE (1) | DE112014001031T5 (de) |
SG (1) | SG11201507321WA (de) |
TW (1) | TWI577501B (de) |
WO (1) | WO2014147969A1 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6398939B2 (ja) * | 2015-10-07 | 2018-10-03 | 信越半導体株式会社 | テンプレートの測定方法及び評価方法 |
JP6508003B2 (ja) * | 2015-11-06 | 2019-05-08 | 信越半導体株式会社 | テンプレートアセンブリの製造方法及びこのテンプレートアセンブリを用いた研磨方法並びにテンプレートアセンブリ |
JP6394569B2 (ja) * | 2015-11-06 | 2018-09-26 | 信越半導体株式会社 | ウェーハの研磨方法及び研磨装置 |
US20170252893A1 (en) * | 2016-03-03 | 2017-09-07 | P.R. Hoffman Machine Products Inc. | Polishing machine work piece holder |
US10556317B2 (en) | 2016-03-03 | 2020-02-11 | P.R. Hoffman Machine Products Inc. | Polishing machine wafer holder |
JP6508123B2 (ja) * | 2016-05-13 | 2019-05-08 | 信越半導体株式会社 | テンプレートアセンブリの選別方法及びワークの研磨方法並びにテンプレートアセンブリ |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5588902A (en) * | 1994-02-18 | 1996-12-31 | Shin-Etsu Handotai Co., Ltd. | Apparatus for polishing wafers |
CN101934495A (zh) * | 2010-07-30 | 2011-01-05 | 清华大学 | 嵌入式化学机械抛光用的保持环 |
JP5143151B2 (ja) * | 2010-02-01 | 2013-02-13 | 富士紡ホールディングス株式会社 | 研磨加工方法 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2849533B2 (ja) | 1993-08-18 | 1999-01-20 | 長野電子工業株式会社 | ウェーハの研磨方法 |
JP3072962B2 (ja) * | 1995-11-30 | 2000-08-07 | ロデール・ニッタ株式会社 | 研磨のための被加工物の保持具及びその製法 |
US6146259A (en) * | 1996-11-08 | 2000-11-14 | Applied Materials, Inc. | Carrier head with local pressure control for a chemical mechanical polishing apparatus |
JPH11333711A (ja) * | 1998-05-21 | 1999-12-07 | Nikon Corp | 研磨ヘッド及びそれを用いた研磨装置 |
US6251215B1 (en) * | 1998-06-03 | 2001-06-26 | Applied Materials, Inc. | Carrier head with a multilayer retaining ring for chemical mechanical polishing |
JP2000233363A (ja) * | 1999-02-16 | 2000-08-29 | Ebara Corp | ポリッシング装置及び方法 |
US6527624B1 (en) * | 1999-03-26 | 2003-03-04 | Applied Materials, Inc. | Carrier head for providing a polishing slurry |
US7255637B2 (en) * | 2000-09-08 | 2007-08-14 | Applied Materials, Inc. | Carrier head vibration damping |
US6676497B1 (en) * | 2000-09-08 | 2004-01-13 | Applied Materials Inc. | Vibration damping in a chemical mechanical polishing system |
JP3969069B2 (ja) * | 2000-12-04 | 2007-08-29 | 株式会社東京精密 | ウェーハ研磨装置 |
TWI261009B (en) * | 2001-05-02 | 2006-09-01 | Hitoshi Suwabe | Polishing machine |
US6835125B1 (en) * | 2001-12-27 | 2004-12-28 | Applied Materials Inc. | Retainer with a wear surface for chemical mechanical polishing |
DE10247179A1 (de) * | 2002-10-02 | 2004-04-15 | Ensinger Kunststofftechnologie Gbr | Haltering zum Halten von Halbleiterwafern in einer chemisch-mechanischen Poliervorrichtung |
US7063604B2 (en) * | 2004-03-05 | 2006-06-20 | Strasbaugh | Independent edge control for CMP carriers |
US7033252B2 (en) * | 2004-03-05 | 2006-04-25 | Strasbaugh | Wafer carrier with pressurized membrane and retaining ring actuator |
JP2006068882A (ja) * | 2004-09-06 | 2006-03-16 | Nitta Haas Inc | 被加工物保持部材 |
JP2008093811A (ja) | 2006-10-16 | 2008-04-24 | Shin Etsu Handotai Co Ltd | 研磨ヘッド及び研磨装置 |
JP2008093810A (ja) * | 2006-10-16 | 2008-04-24 | Shin Etsu Handotai Co Ltd | リテーナリング及び研磨ヘッド並びに研磨装置 |
JP5169321B2 (ja) | 2008-03-04 | 2013-03-27 | 信越半導体株式会社 | ワークの研磨方法 |
JP2012130993A (ja) * | 2010-12-22 | 2012-07-12 | Shin Etsu Handotai Co Ltd | 研磨方法、研磨装置及び研磨布 |
WO2012142305A2 (en) * | 2011-04-13 | 2012-10-18 | Applied Materials, Inc. | Carrier head with shims |
JP5789869B2 (ja) * | 2011-07-28 | 2015-10-07 | 東邦エンジニアリング株式会社 | 研磨パッド用補助板および研磨パッド用補助板を備えた研磨装置 |
KR101597870B1 (ko) * | 2012-04-02 | 2016-02-25 | 강준모 | 화학 기계적 연마 장치 용 캐리어 헤드 |
US9368371B2 (en) * | 2014-04-22 | 2016-06-14 | Applied Materials, Inc. | Retaining ring having inner surfaces with facets |
US10252397B2 (en) * | 2014-10-30 | 2019-04-09 | Applied Materials, Inc. | Methods and apparatus for profile and surface preparation of retaining rings utilized in chemical mechanical polishing processes |
-
2013
- 2013-03-22 JP JP2013060418A patent/JP5821883B2/ja active Active
-
2014
- 2014-02-26 DE DE112014001031.6T patent/DE112014001031T5/de not_active Withdrawn
- 2014-02-26 KR KR1020157025269A patent/KR102058923B1/ko active IP Right Grant
- 2014-02-26 US US14/771,967 patent/US20160008947A1/en not_active Abandoned
- 2014-02-26 WO PCT/JP2014/000997 patent/WO2014147969A1/ja active Application Filing
- 2014-02-26 CN CN201480016816.1A patent/CN105102189B/zh active Active
- 2014-02-26 SG SG11201507321WA patent/SG11201507321WA/en unknown
- 2014-03-10 TW TW103108183A patent/TWI577501B/zh active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5588902A (en) * | 1994-02-18 | 1996-12-31 | Shin-Etsu Handotai Co., Ltd. | Apparatus for polishing wafers |
JP5143151B2 (ja) * | 2010-02-01 | 2013-02-13 | 富士紡ホールディングス株式会社 | 研磨加工方法 |
CN101934495A (zh) * | 2010-07-30 | 2011-01-05 | 清华大学 | 嵌入式化学机械抛光用的保持环 |
Also Published As
Publication number | Publication date |
---|---|
WO2014147969A1 (ja) | 2014-09-25 |
SG11201507321WA (en) | 2015-10-29 |
TWI577501B (zh) | 2017-04-11 |
KR102058923B1 (ko) | 2019-12-24 |
KR20150133714A (ko) | 2015-11-30 |
DE112014001031T5 (de) | 2015-12-17 |
CN105102189A (zh) | 2015-11-25 |
US20160008947A1 (en) | 2016-01-14 |
TW201505761A (zh) | 2015-02-16 |
JP2014184511A (ja) | 2014-10-02 |
JP5821883B2 (ja) | 2015-11-24 |
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Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |