CN104793366A - 经亮点修复后的液晶面板及其亮点修复方法 - Google Patents

经亮点修复后的液晶面板及其亮点修复方法 Download PDF

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CN104793366A
CN104793366A CN201510198399.3A CN201510198399A CN104793366A CN 104793366 A CN104793366 A CN 104793366A CN 201510198399 A CN201510198399 A CN 201510198399A CN 104793366 A CN104793366 A CN 104793366A
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electrode
pixel cell
electrically connected
liquid crystal
pixel electrode
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CN104793366B (zh
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衣志光
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TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Priority to KR1020177023536A priority patent/KR101937418B1/ko
Priority to RU2017134893A priority patent/RU2663270C1/ru
Priority to GB1712000.7A priority patent/GB2550726B/en
Priority to US14/780,049 priority patent/US9703160B2/en
Priority to JP2017554352A priority patent/JP6518786B2/ja
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Abstract

本发明公开了一种经亮点修复后的液晶面板以及亮点修复方法，该液晶面板包括阵列基板，所述阵列基板至少包括一经亮点修复后的像素结构，该像素结构包括：主像素单元和次像素单元，被配置为在第一条扫描线的驱动下分别接收数据信号而具有相同的电压；电荷分享单元，被配置为在第二条扫描线的驱动下改变次像素单元的电压，使其与主像素单元的电压产生差异；其中，所述次像素单元为具有亮点缺陷的像素单元，修复为暗点后的次像素单元中，薄膜晶体管的漏极与天线处于断开连接状态，天线与次像素电极处于断开连接状态，天线电性连接至主像素电极，次像素电极电性连接至共用电极配线；并且所述电荷分享单元与主像素单元和次像素单元均处于断开连接状态。

Description

经亮点修复后的液晶面板及其亮点修复方法
技术领域
本发明涉及液晶显示器技术领域,尤其涉及一种液晶面板的亮点修复方法以及经亮点修复后的液晶面板。
背景技术
液晶显示器(Liquid Crystal Display，LCD)，为平面超薄的显示设备，它由一定数量的彩色或黑白像素组成，放置于光源或者反射面前方。液晶显示器功耗很低，并且具有高画质、体积小、重量轻的特点，因此倍受大家青睐，成为显示器的主流。目前液晶显示器是以薄膜晶体管(Thin Film Transistor，TFT)液晶显示器为主，液晶面板是液晶显示器的主要组件。
液晶面板通常由薄膜晶体管阵列基板、彩色滤光基板和液晶层组成。其中，薄膜晶体管阵列基板上以阵列的形式排布有多个像素单元(Pixel)，每一个像素单元至少包括一个薄膜晶体管，以及与薄膜晶体管对应配置的像素电极(Pixel Electrode)。薄膜晶体管作为启动像素单元工作的开关元件，与扫描线(Scan Line)和数据线(Data Line)连接，在扫描信号的驱动下，将数据信号的电压加载在对应的像素电极上，从而实现图像信息的显示。此外，像素电极的部分区域会覆盖在扫描线或基板的共用电极配线(Common Line)上，重叠的部分即作为存储电容Cst，用于稳定加载在像素电极的数据信号的电压，从而保持画面显示品质。
目前，为了提高大视角的显示品质，即使斜视角与正视角的颜色一致性好，液晶面板的像素结构通常会采用一种称作电荷分享型的像素结构(charge-share pixel)。如图1为现有的一种电荷分享型像素结构的结构示意图。如图1所示，由于采用电荷分享技术，该像素结构包括主像素单元和次像素单元，还包括一电荷分享单元。其中：主像素单元包括主像素电极P1和第一薄膜晶体管T1，该第一薄膜晶体管T1的栅极电性连接到第一扫描线S1，源极电性连接到数据线D，漏极电性连接到所述主像素电极P1；次像素单元包括次像素电极P2和第二薄膜晶体管T2，该第二薄膜晶体管T2的栅极电性连接到第一扫描线S1，源极电性连接到数据线D，漏极通过一天线L电性连接到次像素电极P2，所述天线L横跨所述主像素电极P1；电荷分享单元包括第三薄膜晶体管T3，该第三薄膜晶体管T3的栅极电性连接到第二扫描线S2，漏极电性连接到次像素电极P2，源极与主像素电极P1之间形成第一电荷电容Ccs1，同时源极还与对应的共用电极配线COM之间形成第二电荷电容Ccs2。该电荷分享型像素结构的等效电路图如图2所示。其中，Cgs1为主像素单元的寄生电容，Cst1为主像素单元的储存电容，Clc1为主像素单元的液晶电容；Cgs2为次像素单元的寄生电容，Cst2为次像素单元的储存电容，Clc2为次像素单元的液晶电容。
电荷分享技术的基本原理是：首先当第一扫描线S1传来扫描信号时，第一薄膜晶体管T1和第二薄膜晶体管T2的漏极和源极导通，使主像素电极P1和次像素电极P2的电压在数据线D传来的数据信号的作用下达到相同的电位；然后当第二扫描线S2传来扫描信号时，第一薄膜晶体管T1和第二薄膜晶体管T2的漏极和源极截止，同时第三薄膜晶体管T3的漏极和源极导通，致使次像素电极P2上的电荷通过第二电荷电容Ccs2向共用电极配线COM转移，使次像素电极P2的电压与主像素电极P1的电压产生电压差，进而使次像素单元的液晶与主像素单元的液晶以不同的偏转角度进行偏转，达到多畴显示补偿大视角色偏的技术效果。
在液晶面板的制作过程中，包含有制程工艺以及转运，这个过程中会产生许多颗粒物(particle)，这些颗粒物一部分会被清洗机台所清洗掉，而部分颗粒物会残留于液晶面板上(Array side or CF side，阵列基板或彩膜基板)，这些残留于液晶面板上的颗粒物，会造成液晶面板点亮时产生亮点、亮(暗)线、碎亮点以及弱亮(暗)线等，这些影响都不允许出现在液晶面板上的。因此我们会以YAG laser(钇铝石榴石激光器)对液晶面板进行修补，将颗粒物移除，或者将亮点修补成暗点。为保证液晶面板的品质以及人眼的感官，亮点是绝不可有的，因此需要将亮点修补成暗点。
对于如图1所示的电荷分享型的像素结构，当亮点出现在次像素单元时，现有的将次像素单元的亮点修补成暗点的方法为：参阅图3的示意图，首先将第二薄膜晶体管T2的漏极与天线L的连接处切断，并且将第三薄膜晶体管T3的漏极和源极的接线切断(图3中的x所示)，然后将次像素电极P2和共用电极配线COM焊接短路(如图3中的L0所示)，从而将有缺陷的次像素单元修复成常暗状态，提升液晶面板的良率。在该方法中，修复后的次像素单元中的天线L具有与共用电极配线COM相当的电位，并且由于天线L横跨所述主像素电极P1，这会使得主像素单元的储存电容Cst1增大。
在一个像素单元中，薄膜晶体管不断的重复开启和关闭后会产生一个馈通(feed through)电压ΔV。具体到如上像素结构中的主像素单元来说，馈通电压其中Vgh为第一薄膜晶体管T1的开启电压，Vgl为第一薄膜晶体管T1的关闭电压。图4为一个像素单元接收到的电压信号的波形图，图中Vd表示数据信号驱动电压的波形，Vg表示扫描信号驱动电压的波形，Vp表示像素电极接收到的实际电压信号的波形,Vcom为公共电压信号。如图4所示的，由于馈通电压ΔV的存在，不管是在数据信号驱动电压Vd的正半周期还是负半周期，像素电极充电完成后的电压Vp均小于驱动电压Vd，其差值正好为ΔV，并且，正半周期中的Vp与Vcom的差值和负半周期中的Vp与Vcom的差值的绝对值相等。因此，对于主像素单元来说，当储存电容Cst1增大时，从前述ΔV的计算公式可知ΔV变小，在公共电压Vcom不变的情况下，在数据信号驱动电压Vd的正半周期，Vp与Vcom的差值增加(显示画面偏暗，但频率较快，偏暗态不易感知)；而在数据信号驱动电压Vd的负半周期，Vp与Vcom的差值减小(显示画面偏亮)。最终整体显示上感觉会是一个微亮点。因此，在修复次像素单元后，应当尽量避免其对主像素单元的储存电容Cst1的影响。
发明内容
鉴于现有技术存在的不足，本发明提供了一种液晶面板的亮点修复方法以及经亮点修复后的液晶面板，在对电荷分享型像素结构的次像素单元进行亮点修复后，不改变主像素单元的储存电容，避免影响到主像素单元的馈通(feedthrough)电压，保证了液晶面板的显示质量。
为了实现上述目的，本发明采用了如下的技术方案：
一种经亮点修复后的液晶面板，该液晶面板包括阵列基板，所述阵列基板至少包括一经亮点修复后的像素结构，该像素结构包括：
一数据线；
第一扫描线和第二扫描线；
一共用电极配线；
主像素单元和次像素单元，被配置为在所述第一条扫描线扫描信号的驱动下分别接收数据线上的数据信号而具有相同的电压；所述主像素单元至少包括主像素电极，所述次像素单元至少包括次像素电极和第二薄膜晶体管，所述第二薄膜晶体管的漏极通过一天线连接到所述次像素电极，所述天线横跨所述主像素电极；
电荷分享单元，被配置为在所述第二条扫描线扫描信号的驱动下改变所述次像素单元的电压，使其与所述主像素单元的电压产生差异；
其中，所述次像素单元为因具有亮点缺陷而被修复为暗点后的像素单元，在被修复为暗点后的所述次像素单元中，所述第二薄膜晶体管的漏极与所述天线处于断开连接状态，所述天线与所述次像素电极处于断开连接状态，所述天线电性连接至所述主像素电极，所述次像素电极电性连接至所述共用电极配线；并且所述电荷分享单元与所述主像素单元和所述次像素单元均处于断开连接状态。
其中，所述断开连接状态是通过切割的方式使两个部件相互绝缘。
其中，所述天线通过第一修补线电性连接至所述主像素电极，所述次像素电极通过第二修补线电性连接至所述共用电极配线。
其中，所述主像素单元还包括第一薄膜晶体管，该第一薄膜晶体管的栅极电性连接到所述第一扫描线，源极电性连接到所述数据线，漏极电性连接到所述主像素电极。
其中，所述第二薄膜晶体管的栅极电性连接到所述第一扫描线，源极电性连接到所述数据线。
其中，所述电荷分享单元包括第三薄膜晶体管，将所述次像素单元修复为暗点后，所述第三薄膜晶体管的漏极与所述次像素电极处于断开连接状态，且所述第三薄膜晶体管的源极与所述主像素电极和所述共用电极配线之间均处于断开连接状态。
如上所述的液晶面板的亮点修复方法，包括步骤：通过激光切割的方式，将所述第二薄膜晶体管的漏极与所述天线的连接处断开绝缘，将所述天线与所述次像素电极的连接处断开绝缘，将所述电荷分享单元与所述主像素单元和次像素单元的连接处均断开绝缘；通过激光焊接的方式，将所述天线电性连接至所述主像素电极，将所述次像素电极电性连接至所述共用电极配线。
其中，通过激光焊接修补线的方式，将所述天线电性连接至所述主像素电极，将所述次像素电极电性连接至所述共用电极配线。
相比于现有技术，本发明实施例提供的液晶面板的亮点修复方法，在对电荷分享型像素结构的次像素单元进行亮点修复时，将横跨于主像素电极的天线两端均断开绝缘，并且将天线电性连接至主像素电极。经过该方法修复后的液晶面板中，天线与主像素电极之间不会形成储存电容，不增大主像素单元的储存电容，避免影响到主像素单元的馈通(feed through)电压，保证了液晶面板的显示质量。
附图说明
图1为一种电荷分享型像素结构的结构示意图。
图2为如图1的电荷分享型像素结构的等效电路图。
图3为现有技术中对次像素单元进行亮点修复的图示。
图4为一个像素单元接收到的电压信号的波形图。
图5为本发明实施例中对次像素单元进行亮点修复的图示。
图6为本发明实施例中对次像素单元进行亮点修复后的等效电路图。
具体实施方式
为了进一步说明本发明的目的、技术方案和技术效果，下面参照现有技术中大尺寸液晶面板薄膜晶体管阵列基板上，采用的2G1D像素结构(像素结构中，像素单元与两条扫描线和一条数据线电性连接)的结构示意图和等效电路图，详细地介绍本发明提供的修复方法的工作原理及实施方式，以及与现有技术相比更好的技术效果。需要说明的是，虽然本发明是针对2G1D像素结构进行说明，但是不应局限于此。不同厂商设计的像素单元其结构不尽相同，会有多种变形，例如还存在一种1G2D像素结构(像素结构中，像素单元与一条扫描线和两条数据线电性连接)，因此任何本发明所属技术领域内的技术人员，在不脱离本发明所揭露的精神的前提下，在技术方案实施的形式上和细节上做出任何的修改与变化均在本发明要求保护的范围内。
本实施例提供液晶面板包括薄膜晶体管阵列基板，所述阵列基板上阵列设置有多个电荷分享型像素结构。参阅图1所示的电荷分享型像素结构的结构示意图以及图2所示的该像素结构的等效电路图。该像素结构包括数据线D、第一扫描线S1、第二扫描线S2、共用电极配线COM、主像素单元、次像素单元以及电荷分享单元。
其中，主像素单元和次像素单元被配置为在所述第一条扫描线S1扫描信号的驱动下分别接收数据线D上的数据信号而具有相同的电压。具体地，主像素单元包括主像素电极P1和第一薄膜晶体管T1，该第一薄膜晶体管T1的栅极电性连接到第一扫描线S1，源极电性连接到数据线D，漏极电性连接到所述主像素电极P1。次像素单元包括次像素电极P2和第二薄膜晶体管T2，该第二薄膜晶体管T2的栅极电性连接到第一扫描线S1，源极电性连接到数据线D，漏极通过一天线L电性连接到次像素电极P2，所述天线L横跨所述主像素电极P1。
其中，电荷分享单元被配置为在所述第二条扫描线S2扫描信号的驱动下改变所述次像素单元的电压，使其与所述主像素单元的电压产生差异。具体地，电荷分享单元包括第三薄膜晶体管T3，该第三薄膜晶体管T3的栅极电性连接到第二扫描线S2，漏极电性连接到次像素电极P2，源极与主像素电极P1之间耦合形成第一电荷电容Ccs1，同时源极还与对应的共用电极配线COM之间耦合形成第二电荷电容Ccs2。
其中，在图2的等效电路图中，Cgs1为主像素单元的寄生电容，Cst1为主像素单元的储存电容，Clc1为主像素单元的液晶电容；Cgs2为次像素单元的寄生电容，Cst2为次像素单元的储存电容，Clc2为次像素单元的液晶电容。
如背景技术中介绍的，在液晶面板的制作过程中，包含有制程工艺以及转运，这个过程中会产生许多颗粒物(particle)，这些颗粒物一部分会被清洗机台所清洗掉，而部分颗粒物会残留于液晶面板上(Array side or CF side，阵列基板或彩膜基板)，这些残留于液晶面板上的颗粒物，会造成液晶面板点亮时产生亮点、亮(暗)线、碎亮点以及弱亮(暗)线等。
当颗粒物出现在如上结构的电荷分享型像素结构的次像素单元时，本发明实施例提供了如下的亮点修复方法。
参阅图5所示的像素结构的结构示意图以及图6所示的该像素结构的等效电路图。该方法具体包括步骤：
一、通过激光切割的方式，将所述第二薄膜晶体管T2的漏极与所述天线L的连接处断开绝缘(附图中采用x标示)，将所述天线L与所述次像素电极P2的连接处断开绝缘(附图中采用x标示)。
二、通过激光切割的方式，将第三薄膜晶体管T3的漏极和源极的连接处断开绝缘(附图中采用x标示)，以使第三薄膜晶体管T3的漏极与所述次像素电极P2处于断开连接状态，并且使第三薄膜晶体管T3的源极与所述主像素电极P1和所述共用电极配线COM之间均处于断开连接状态。
三、通过激光焊接的方式，将所述天线L通过第一修补线L1电性连接至所述主像素电极P1。
四、通过激光焊接的方式，将所述次像素电极P2通过第二修补线L2电性连接至所述共用电极配线COM。
按照如上的方法，最终得到了经亮点修复后的液晶面板。该液晶面板的多个像素结构中，至少有一个像素结构是采用了如上亮点修复方法修复后的像素结构。另外，修复后的像素单元会形成暗点，但是暗点的数量也有一定规范，暗点颗数太多也会降低液晶面板的等级甚至报废。
综上所述，相比于现有技术，本发明实施例提供的液晶面板的亮点修复方法，在对电荷分享型像素结构的次像素单元进行亮点修复时，将横跨于主像素电极的天线两端均断开绝缘，并且将天线电性连接至主像素电极。经过该方法修复后的液晶面板中，天线与主像素电极之间不会形成储存电容，不增大主像素单元的储存电容，避免影响到主像素单元的馈通(feed through)电压，保证了液晶面板的显示质量。
需要说明的是，在本文中，诸如第一和第二等之类的关系术语仅仅用来将一个实体或者操作与另一个实体或操作区分开来，而不一定要求或者暗示这些实体或操作之间存在任何这种实际的关系或者顺序。而且，术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含，从而使得包括一系列要素的过程、方法、物品或者设备不仅包括那些要素，而且还包括没有明确列出的其他要素，或者是还包括为这种过程、方法、物品或者设备所固有的要素。在没有更多限制的情况下，由语句“包括一个……”限定的要素，并不排除在包括所述要素的过程、方法、物品或者设备中还存在另外的相同要素。
以上所述仅是本申请的具体实施方式，应当指出，对于本技术领域的普通技术人员来说，在不脱离本申请原理的前提下，还可以做出若干改进和润饰，这些改进和润饰也应视为本申请的保护范围。

Claims (8)

1.一种经亮点修复后的液晶面板，该液晶面板包括阵列基板，所述阵列基板至少包括一经亮点修复后的像素结构，该像素结构包括：
一数据线；
第一扫描线和第二扫描线；
一共用电极配线；
主像素单元和次像素单元，被配置为在所述第一条扫描线扫描信号的驱动下分别接收数据线上的数据信号而具有相同的电压；所述主像素单元至少包括主像素电极，所述次像素单元至少包括次像素电极和第二薄膜晶体管，所述第二薄膜晶体管的漏极通过一天线连接到所述次像素电极，所述天线横跨所述主像素电极；
电荷分享单元，被配置为在所述第二条扫描线扫描信号的驱动下改变所述次像素单元的电压，使其与所述主像素单元的电压产生差异；
其特征在于，所述次像素单元为因具有亮点缺陷而被修复为暗点后的像素单元，在被修复为暗点后的所述次像素单元中，所述第二薄膜晶体管的漏极与所述天线处于断开连接状态，所述天线与所述次像素电极处于断开连接状态，所述天线电性连接至所述主像素电极，所述次像素电极电性连接至所述共用电极配线；并且所述电荷分享单元与所述主像素单元和所述次像素单元均处于断开连接状态。
2.根据权利要求1所述的经亮点修复后的液晶面板，其特征在于，所述断开连接状态是通过切割的方式使两个部件相互绝缘。
3.根据权利要求1所述的经亮点修复后的液晶面板，其特征在于，所述天线通过第一修补线电性连接至所述主像素电极，所述次像素电极通过第二修补线电性连接至所述共用电极配线。
4.根据权利要求1所述的经亮点修复后的液晶面板，其特征在于，所述主像素单元还包括第一薄膜晶体管，该第一薄膜晶体管的栅极电性连接到所述第一扫描线，源极电性连接到所述数据线，漏极电性连接到所述主像素电极。
5.根据权利要求1所述的经亮点修复后的液晶面板，其特征在于，所述第二薄膜晶体管的栅极电性连接到所述第一扫描线，源极电性连接到所述数据线。
6.根据权利要求1所述的经亮点修复后的液晶面板，其特征在于，所述电荷分享单元包括第三薄膜晶体管，将所述次像素单元修复为暗点后，所述第三薄膜晶体管的漏极与所述次像素电极处于断开连接状态，且所述第三薄膜晶体管的源极与所述主像素电极和所述共用电极配线之间均处于断开连接状态。
7.如权利要求1-6任一所述的液晶面板的亮点修复方法，其特征在于，包括步骤：
通过激光切割的方式，将所述第二薄膜晶体管的漏极与所述天线的连接处断开绝缘，将所述天线与所述次像素电极的连接处断开绝缘，将所述电荷分享单元与所述主像素单元和次像素单元的连接处均断开绝缘；
通过激光焊接的方式，将所述天线电性连接至所述主像素电极，将所述次像素电极电性连接至所述共用电极配线。
8.根据权利要求所述的液晶面板的亮点修复方法，其特征在于，通过激光焊接修补线的方式，将所述天线电性连接至所述主像素电极，将所述次像素电极电性连接至所述共用电极配线。
CN201510198399.3A 2015-04-23 2015-04-23 经亮点修复后的液晶面板及其亮点修复方法 Active CN104793366B (zh)

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